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Modeling, Design and Optimization

of On-Chip Inductors and Transformers


Sunderarajan S. Mohan

Center for Integrated Systems


Stanford University

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

THE GOAL

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Simple, Accurate Expressions for Inductance


S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

OUTLINE

Background
Current Sheet Approach
Accurate Inductance Expressions
Optimization of Inductor Circuits
Transformer Modeling
Contributions
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

ON-CHIP INDUCTORS AND TRANSFORMERS

Essential for radio frequency integrated circuits (RFICs)


Narrowband circuits
{ Low noise amplifiers, oscillators, filters,
matching networks, baluns

Broadband circuits
{ Shunt-peaking to enhance bandwidth

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

ON-CHIP INDUCTOR OPTIONS

Attribute

Bond wire

Inductance

0.5 4nH 0.2 100nH


30 60
< 10
CBondpad Rs , Cox , Csi , Rsi

Q
Parasitics
Fluctuations

Large

Planar Spiral

Small

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

LATERAL PARAMETERS
w
dout

din

din
dout
s

Square

Hexagonal

s
din

dout
Octagonal

din
dout

Circular

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

LATERAL PARAMETERS
1. Shape: square, hexagonal, octagonal, . . .
2. Number of turns, n
3. Conductor width, w
4. Conductor spacing, s
d

5. dout , din , davg = 0.5(dout +din ), or = dout +din


out
in

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

VERTICAL PARAMETERS
w

dout
din

tM
tox,M1M2
tM,u
tox
underpass

contact

oxide

substrate

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

MODELING APPROACHES

3-D field solvers


Segmented models
Lumped, Scalable models

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

3-D FIELD SOLVERS


General Purpose Tools
{ Solve Maxwells equations numerically
{ Accurate, but slow and memory intensive
{ Examples: Maxwell, MagNet

Custom Tools for Spiral Inductors and Transformers


{ Electrostatic and Magnetostatic approximations
{ Good for verification, but inconvenient for circuit design and synthesis
{ Examples: ASITIC, SPIRAL

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

SEGMENTED MODELS

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

LUMPED, SCALABLE MODELS


Cs

port 1

Rs

L
Cox

Rsi

port 2

Cox

Csi

Csi

Rsi

substrate

Simple expressions for Rs , Cox and Cs


NEED simple, accurate expression for inductance!
Limitations:

{ Magnetic coupling to substrate NOT modeled


{ Lumped approximation not valid beyond self-resonant frequency

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

GREENHOUSE APPROACH
Find self inductance of, and mutual inductance between
every segment of spiral:

Mgen,i,j

L1
M1,2
. . . M1,(n1)
M1,n
M1,2

L
.
.
.
M
M
2
2,n
2,(n1)

=
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
M1,(n1) M2,(n1) . . . L(n1) Mn,(n1)
M1,n
M2,n
. . . Mn,(n1)
Ln
n

LT =

Li +
i=1

Mi,j
i=1 j=1,j=i

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

PREVIOUSLY REPORTED EXPRESSIONS

Voorman :
Dill :
Bryan :
Ronkanien :
Crols :

Lvoo
Ldil
Lbry
Lron
Lcro

=
=
=
=
=

103 n2 davg
8.5 104 n5/3 davg
2.41 103 n5/3 davg log(4/)
1.50 n2 e3.7(n1)(w+s)/dout
1.3 104 (d3out /w2 )a5/3 w1/4

Empirical expressions
Significant mean offset errors
Even when corrected, errors > 15 20%
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

DERIVATION OF ACCURATE EXPRESSIONS

Use equivalent current sheet to simplify problem:

Use GMD, AMD and AMSD to derive simple expression


S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

GEOMETRIC MEAN DISTANCE (GMD)

For distances d1 and d2 :


GMD =

d1 d2

1
[ln(d1 ) + ln(d2 )]
ln(GMD) =
2
For n distances:
1
ln(GMD) = [ln(d1 ) + ln(d2 ) + ln(dn )]
n
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

GMD IN INDUCTANCE CALCULATIONS

Need to evaluate of GMD of conductor cross-section(s):


{ Self: GMD of conductor cross-section from itself
{ Mutual: GMD between two conductor cross-sections

Use continuous variable definition of GMD


{ Need integrals rather than sums

GMD introduced in to inductance calculations by


J. C. Maxwell

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

GMD IN INDUCTANCE CALCULATIONS

For cross sections in one dimension (current sheets):


l1 l2 ln(GMD) =

ln(r) dx dx

{ l1 and l2 are the lengths of the cross-sections


{

dx and dx are the elements of the cross-sections

r is the distance between the elements

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

GMD BETWEEN TWO LINES


w
x1

w
(d x1 x2 )

x2

1
ln(GMD) =
w2

0.5w

0.5w

0.5w

0.5w

ln |d x1 x2 |dx1 dx2

w2
w4
ln(d)

...
2
4
12d
60d
Basis for mutual inductance calculations in
Greenhouse method
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

GMD, AMD AND AMSD OF A LINE


w
2

w
2

x1
1
ln(GMD) =
w2
1
AMD =
w2
AMSD2

1
=
w2

0.5w

x2
0.5w

0.5w

0.5w

0.5w

0.5w

0.5w
0.5w
0.5w

ln |x1 + x2 |dx1 dx2 = ln(w) 1.5

w
|x1 + x2 |dx1 dx2 =
3
0.5w
0.5w

2
w
|x1 + x2 |2 dx1 dx2 =
6
0.5w

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

PARALLEL LINES OF EQUAL LENGTH

l
R R2
M
ln(2l) ln(R) 1 + 2
2
l
4l

for

R
l

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

INDUCTANCE OF CURRENT SHEET

R
l

l
R R2
M =
ln(2l) ln(R) 1 + 2
2
l
4l
Ls

l
AMD AMSD2

=
ln(2l) ln(GMD) 1 +
2
l
4l2
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

INDUCTANCE OF RECTANGULAR CURRENT SHEET


w
2

w
2

w
w
< x 1 , x2 <
2
2

ln (GMD) = ln |x1 + x2 | = ln w 1.5


w
AMD = |x1 + x2 | =
3
2
w
AMSD2 = (x1 + x2 )2 =
6

l
ln
L=
2

2l
w

w
w2
+ 0.5 +
3l 24l2

x1 x2
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

EQUIVALENT RECTANGULAR CURRENT SHEET


1

(n1)

...
I

w s w

w s w

n2 l
2
L=
ln
2

nI
l = nw + (n 1)s
2


+ 0.5 +
3 24

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

APPROXIMATING A SQUARE SPIRAL


dout = (1 + )davg
w

davg
nI
s

davg
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

ONE SIDE OF A SQUARE SPIRAL:

Ls

1
2
(n1)

davg

...
I

wsw

davg
nI

wsw

davg = nw + (n 1)s

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

OPPOSITE SIDES OF A SQUARE SPIRAL:

Mopp

davg

nI

davg

davg

90o

90o

nI

davg

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

CURRENT SHEET EXPRESSION FOR A SQUARE SPIRAL


davg

nI

davg

90o

nI

90o

nI
Lsq = 4(Ls + Mopp )
2.067
2n2 davg
ln
=

nI
davg

+ 0.178 + 0.1252

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

CONCENTRIC CIRCULAR CONDUCTORS


I
I
I
1

2 ... n

davg = nw+(n1)s
w

w w

n2 davg
1
L
ln
2

+ 0.9 + 0.22

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

nI

CURRENT SHEET EXPRESSIONS

Lcursh

n2 davg c1
2
=
ln(c2 /) + c3 + c4
2
Layout

c1

c2

c3

c4

Square

1.27

2.07

0.18

0.13

Hexagonal

1.09

2.23

0.00

0.17

Octagonal

1.07

2.29

0.00

0.19

Circle

1.00

2.46

0.00

0.20

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

OTHER INDUCTANCE EXPRESSIONS

Monomial Expression :
Lmon =

1
2 3 4 5
dout w davg n s

Modified Wheeler Expression :


Lmw

n2 davg
= K1 0
1 + K2

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

COMPARISON TO FIELD SOLVERS: PREVIOUS WORK

% Inductors exceeding abs. error

100
Crols
Voorman
Bryan
Ron
Dill

80
60

Min

L(nH)
OD(m)
n
s/w

40

Max

0.1
70
100 400
1
20
0.02
3
0.03 0.95

20

19, 000 simulations


0

20

60
40
% Absolute error

80

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

COMPARISON TO FIELD SOLVERS: NEW WORK

% Inductors exceeding abs. error

100

Current Sheet
Monomial Fit
Modified Wheeler

80

Min

L(nH)
OD(m)
n
s/w

60
40

Max

0.1
70
100 400
1
20
0.02
3
0.03 0.95

20

19, 000 simulations


0

6
8
% Absolute error

10

12

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

EXPERIMENTAL SET-UP
S parameters

HP8720B
network analyzer
Coplanar GSG probes

DUT
port 1

port 2

50 environment
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

COMPARISON TO EXPERIMENTS: PREVIOUS WORK

% Inductors exceeding abs. error

100
Crols
Voorman
Bryan
Ron
Dill

80
60
40
20
0

20

60
40
% Absolute error

80

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

COMPARISON TO EXPERIMENTS: NEW WORK

% Inductors exceeding abs. error

100

ASITIC
Current Sheet
Modified Wheeler
Monomial Fit

80
60
40
20
0

8
12
% Absolute error

16

20

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

PARAMETERS OF INTEREST
Inductor quality factor (QL )
QL = 2

[peak magnetic energy peak electric energy]


energy loss in one oscillation cycle

Tank quality factor (Qtank )


Qtank = 2

peak magnetic energy


energy loss in one oscillation cycle

Self-resonance frequency (res ), frequency at which QL = 0


S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

EXAMPLE: MAXIMUM QL @ 2GHz FOR L

= 8nH

6
5

QL

4
3

Square
Hexagonal
Octagonal
Circular

2
1
0

2
3
Frequency (GHz)

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

EXAMPLE: SHUNT-PEAKED AMPLIFIER


Common Source Amplifier

Shunt-peaked Amplifier

Vdd

Vdd
L

R
vin

vout
C

vin

vout
C

Bandwidth enhancement using zeros


No additional power dissipation
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

ON-CHIP SHUNT PEAKING


Vdd

Work with inductor parasitics


L

Rs is not an issue

CL

(now part of load resistance)

Rs

Inductor Q is not relevant

(R Rs )

Minimize area and CL

vout
vin

Cd
Cg

Cload

L determined by
R, Cload , CL and Cd

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

SHUNT-PEAKED TRANSIMPEDANCE AMPLIFIER


Vdd
L

CL

Input current drive

Rs

Cascode stage

(R Rs )
vout
Cd

Rf

iin

Cin

Cload

On-chip shunt-peaking
Feedback

Cg

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

DESIGN METHODOLOGY
1. Design and optimize transimpedance stage
without shunt peaking
2. Transistor current determines conductor width, w
3. Lithography sets spacing, s
4. Choose n and AD to realize desired L
while minimizing parasitic capacitance and area
5. Maximize transimpedance resistance, Rf

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

TRANSFORMER
+
v1

+
M

i1

v2
L1

i2
L2

v1 = L1 it1 + M it2
v2 = L2 it2 + M it1
Mutual coupling coefficient, k =

M
L1 L2

|k| 1
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

NON-IDEAL TRANSFORMER

L1
R1

k=

M
L1 L2

L2
M

R2

< 1.

Series resistance.
Port-to-port & port-to-substrate capacitances
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

TAPPED TRANSFORMER

advantages:
{ High L1 , L2
{ Top metal layer
Inner
spiral

{ Low port-to-port
capacitance

disadvantages:
{ Asymmetric
Outer spiral

{ Low k(

0.3 0.5)

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

INTERLEAVED TRANSFORMER
advantages:
{ Medium k
( 0.7 0.8)
{ Symmetric
{ Top metal layer

disadvantages:
{ Medium port-to-port
capacitance
Primary

Secondary

{ Low L1 , L2

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

STACKED TRANSFORMER
Top View

advantages:
{ High k( 0.9)
{ High L1 , L2
{ Area efficient

disadvantages:
{ Multiple metal layers
Side View
top spiral

{ High port-to-port &


port-to-substrate
capacitances

bottom spiral
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

STACKED TRANSFORMER VARIATIONS


Bottom spiral

Top spiral

ys
xs

ds
xs

Shift top and bottom spirals laterally or diagonally


Trade-off lower k for reduced port-to-port capacitance
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

COMPARISON OF TRANSFORMER REALIZATIONS


Transformer

Area

type

Coupling

Self-

Self-resonant

coefficient, k

inductance

frequency

Tapped

High

Low

Mid

High

Interleaved

High

Mid

Low

High

Stacked

Low

High

High

Low

Non-idealities result in trade-offs


Optimal choice determined by circuit application
Transformer models needed for comparison
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

TAPPED TRANSFORMER MODEL

Port1

Ls,i

(inner)

Rs,o
Cox,o

Cov,o
Ls,o

Ls,i
Rs,i

Port2

Cox,i

Ls,o (outer)

Evaluate Cov,o , Cox,o , Cox,i ,


Rs,o & Rs,i by extending
previous work

Use inductance expression for


Ls,o , Ls,i
Calculate M

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

MUTUAL INDUCTANCE CALCULATION


Single inductor.

Tapped transformer.

L1

(inner)

LT

L2 (outer)

Interleaved transformer.

LT = L1 + L2 + 2M
L1 (primary)

L2 (secondary)

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

STACKED TRANSFORMER MODEL


Port1

Rs,t
Cox,t
Ls,t

ys

xs

Cov
Ls,b

Coxm

Evaluate Cov , Cox,t , Coxm ,


Cox,b , Rs,t & Rs,b by extending
previous work

Rs,b
Port2

Cox,b

Use inductance
expression for Ls,t , Ls,b
Calculate M

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

CURRENT SHEET APPROACH FOR k

ys

ds
xs

ys

ds
xs

Reduce complexity by 4n2


Use symmetry
Derive simple expression using electromagnetic theory
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

Mutual Coupling Coefficient (k )

k FOR STACKED TRANSFORMERS


1.0
0.8

Ls,b

k (0.9 dnorm )
(for k > 0.2)

Ls,t

0.6
0.4
0.2
0.0

predicted k
measured k

0.2

ys

ds
xs

0.4

0.6

M =k

(Ls,t Ls,b )

xs 2 +ys 2
ds
dnorm = AD = AD
Metal and oxide thicknesses have only 2nd order effects on k
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

EXPERIMENTAL SET-UP
port 1

port 2

S parameters

L1

HP8720B
network analyzer

L2
port 3

Coplanar GSG probes


port 1

port 3

DUT
port 1

port 2

L1

L2

port 3

50 environment

port 2

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

EXPERIMENTAL VERIFICATION: TAPPED


1.0

0.5

S11

ODo = 290m,
no = 2.5
ODi = 190m,
ni = 4.25
w = 13m, s = 7m

-0.5

-1.0
0.8

1.0

S22

S21

1.2

1.6
2.0
Frequency (GHz)

2.4

0.5

0.0

-1.0
0.8

real(S11) meas
imag(S11) meas
real(S11) calc
imag(S11) calc

1.0

0.5

-0.5

0.0

real(S21) meas
imag(S21) meas
real(S21) calc
imag(S21) calc

1.2

1.6
2.0
Frequency (GHz)

0.0

-0.5

2.4

-1.0
0.8

real(S22) meas
imag(S22) meas
real(S22) calc
imag(S22) calc

1.2

1.6
2.0
Frequency (GHz)

2.4

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

EXPERIMENTAL VERIFICATION: STACKED 1


1.0

Stacked transformer with

0.5

S11

top spiral overlapping bottom one


OD = 180m, n = 11.75,
w = 3.2m, s = 2.1m
xs = 0m, ys = 0m,
ds = 0m

0.0

-0.5

-1.0
0.0

real(S11) meas
imag(S11) meas
real(S11) calc
imag(S11) calc

0.5
1.0
Frequency (GHz)

1.5

1.0
1.0
0.5

0.0
S22

S21

0.5

-0.5

-1.0
0.0

real(S21) meas
imag(S21) meas
real(S21) calc
imag(S21) calc

0.5
1.0
Frequency (GHz)

0.0

-0.5

1.5

-1.0
0.0

real(S22) meas
imag(S22) meas
real(S22) calc
imag(S22) calc

0.5
1.0
Frequency (GHz)

1.5

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

FUTURE WORK

Incorporate inductive coupling to substrate:


significant in CMOS epi processes

Improve expressions for the series resistance


to include proximity effects

Extend current sheet approach


to handle non-uniform current distributions

S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

CONTRIBUTIONS

Current sheet approach to inductance calculation


Simple accurate expression for inductance of
sdquare, hexagonal, octagonal and circular spirals

Expressions for mutual inductance and


mutual coupling coefficient

On-chip transformer models


Basis for design and synthesis of
on-chip inductor and transformer circuits

Shunt-peaked amplifier with optimized on-chip inductor


S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

SO WHAT ?

Design
{ Scalable, analytical models for
synthesis and optimization

Verification
{ Field solvers
S. S. Mohan, PhD Oral Exam, June 9, 1999, CIS, Stanford University

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