Extra Credit Assignment

In the lecture given by Professor I. Cevdet Noyan, I learned about the ongoing
analysis of powder diffraction from nanostructures and how these structures are
analyzed. In order to yield the best results for his experiments, he needs to have
ideal specimens. With an ideal specimen, the scattering pattern is known, so the
Patterson analysis can give results that is truly representative of the specimen.
Additionally, the absolute error of the X-ray techniques is a small 1nm. However,
because nanoparticle powders were used, obtaining a single, average shape was
difficult, and it influenced the results of the X-ray diffraction. To determine the
acceptable error of using such non-ideal specimens, statistical analysis of the data
obtained was done.
In order to measure the diffraction patterns of the x-rays on the specimens,
particular equations such as Braggs Law are necessary. Professor Noyan noted that
the basic theories in introductory books for such mathematics are insufficient. For
example, the application of Braggs Theory requires x-ray layers, and it does not
allow multiple scattering nor say anything about x-ray peak slopes. On the other
hand, if the sample being used in the experiment fits all assumptions, then
transmission electron microscopy can be used to analyze the results by obtaining
cross sections of the SOI substrate layer of the sample. Sample results obtained by
the transmission electron microscope should be close to values obtained from the
Scherrer equation and the Fourier analysis. They are not accurate at first, however,
because these values are not corrected for the broadening of the instrument being
used. Once broadening is altered appropriately, the analysis thickness of the sample
will be more accurate.