TWI TRAINING & CERTIFICATION

TOFD Course Work No.1

Enter all answers on answer sheet
Chapter 1
1.
Who is generally credited with the introduction of the TOFD technique?
a.
b.
c.
d.

J.A.G. Temple
M. Silk
J.P. Charlesworth
H. Harwell

2.
PISC I, PISC II, and DDT are commonly referenced when discussing benefits of TOFD. What are
these abbreviated items?
a.
b.
c.
d.

Round-robin trials
Digital processing techniques
TOFD electronic systems from the 1970s
TOFD severity ratings for flaws

3.
In the NIL/KINT thin plate project, what did TOFD have the lowest percentage score in?
a.
b.
c.
d.

Probability of detection
Sizing accuracy
False Call
Reliability

4.
Beam boundary sizing (e.g. 6dB or 20dB drop) techniques suffer from ______?
a.
b.
c.
d.

Flaw orientation considerations

Flaw surface texture considerations
Flaw size relative to beam size
All of the above

Chapter 2
5.
What does Huygens Principle relate to?
a.
b.
c.
d.

Phase interference of wavefronts

Diffraction angles
Point generators of moving wavefronts
Shear mode conversion off compression modes

6.
TWI UT CW 1 Issue 0

TWI TRAINING & CERTIFICATION

TOFD Course Work No.1
The basic setup for a TOFD configuration uses how many probes?
a. 1
b. 2
c. 3
d. 4
7.
What aspect of grey-scale presentations make flaws apparent as compared to single A-scans on a
standard UT instrument?
a.
b.
c.
d.

Pattern recognition capability

Zero offset ability (bias)
Acoustic impedance
Signal averaging

8.
What is not an advantage of TOFD?
a.
b.
c.
d.

Easy discrimination of defects and geometry

Less sensitive to defect orientation
Coupling status
Near surface resolution

TWI UT CW 1 Issue 0

TWI TRAINING & CERTIFICATION

TOFD Course Work No.1

Students Name:
Date:

Question No.

Answer

1
2
3
4
5
6
7
8

TWI UT CW 1 Issue 0

TWI TRAINING & CERTIFICATION

TOFD Course Work No.1
Question No.

Answer

1
2
3
4
5
6
7
8

B
A
C
D
C
B
A
D

TWI UT CW 1 Issue 0