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Technical information,

Responsible person, Terms of


use/Tehnine specifikacije,
odgovorna oseba, Pogoji uporabe

Research
Institution
/Raziskovalna
organizacija

Manufacturer/Pro
izvajalec

Tag/Oznaka

PLD (Pulsed Laser Deposition)


chamber and corresponding
equipment

TSST B.V., 2012

synthesis

ve

more information

CO Nanocenter

Excimer laser and corresponding


equipment COMPex Pro 205F

COHERENT Inc.,
2012

synthesis

ve

more information

CO Nanocenter

Molecular Beam epitaxy - MBE

Molecular beam epitaxy (MBE)


system

Omicron GmbH,
2013

synthesis

ve

more information

CO Nanocenter

Atomic Layer Deposition - ALD

ALD System TFS 200

Beneq Oy, 2013

synthesis

ve

more information

CO Nanocenter

REGA 9050-PW short Pulse AMP

RegA 50-fs system

more information

IJS F7

Eqipment title/Naziv opreme

Pulsed Laser Deposition - PLD

Equipment description/Opis
opreme

Argonski ionski laser

Coherent, 2001

UB/VIS absorpcijski spektrometer

HP 8453 Hewlet
Packard, 1995

characterization

IJS F7

characterization

IJS F7

FTIR absorpcijski spektrometer

MB-160, MB-102

Bomeme, 1994

Legend 35-fs high energy laser


source

Legend elite

Coherent, 2008

RegA 50-fs system:3-pulse pumpprobe station

Dynamic Light Scattering - DLS

ALV 5000/60X

2004

Rainbow 7-fs pump probe system

Digitalni merilnik reaktivnosti

IJS F7

more information

IJS F7

more information

IJS F7

more information

IJS F7
IJS F7

DMR01- DMR03, In use for


measurement and reactor practice
TRIGA and NEK for F8 department,
RIC, ICJT

199x-2012

IJS F8

Strip Chart Recorder

Goerz Servogor 124, In use for


measurement and reactor practice
TRIGA and NEK for F8 department,
RIC, ICJT

2000

IJS F8

Sistem za gama spektroskopijo

Ortec GEM40P4-PLUS Ortec Dspec

2007

IJS F8

Sistem za nevtronsko radiografijo

Del TRIGA Mark II reactor L/D


razmerje kolimatorja nevtronov
~60 nevtronski fluks ~3*105

Nano Indenter G200

Nano Indenter G200

Lithography

ProtoLaser LDI and Electron Beam


Lithography - EBL

LPKF Laser &


Elektronika d.o.o.,
2011

processing

ve

more information

CO Nanocenter

Focused Ion Beam - FIB

Helios Nanolab 650

Keithley
Instruments Inc.,
2010

prosessing,
characterization

ve

more information

CO Nanocenter

INK-JET printer

Ink-jet printer for ceramic sols

FUJIFILM Dimatics
Inc., 2011

processing

ve

more information

CO Nanocenter

Glovebox workstations

Glove box MB200MOD (1800/1200)


EXT

MBRAUN InertgasSysteme GmbH,


2011

processing

ve

more information

CO Nanocenter

Minimizing mechanical vibrations

Equipment for minimizing


mechanical vibrations

various, 2011

processing

ve

more information

CO Nanocenter

Equipment for processing and


characterization

Laser granulometer Analysette 12


Dyna Sizer, Laboratory Pressure
Vessel

Fritsch GmbH,
Anton Paar GmbH,
2010

processing

ve

Spectograph with detector

Shamrock Spectrograph SR-500I-D2

Andor Technology
Ltd.,2013

processing

more

2012

Infrared Lamp Heating System


MILA-5000-UHV

IJS F8

CO Vesolje

CO Nanocenter

processing

Reometer

Rheometer Physica MCR 501

Anton Paar GmbH,


2011

characterization

Refractometer

Refraktometer ATAGO NAR-4T

ATAGO CO Ltd.,
2013

characterization

Low Temperature Probestation


TTPX

Low-temperature probe station


TTPX Probe Station

Lake Shore
Inc.,2010

characterization

CO Nanocenter

more information
ve

more information

CO Nanocenter
CO Nanocenter

ve

more information

CO Nanocenter

Atomic Force Microscope - AFM

Agilent
Electronic module for AFM PicoTREC Teechnologies Inc.,
2010

Low Temperature pobestation with Low Temperature pobestation with


vertical magnetic field CPX-VF
vertical magnetic field CPX-VF

Transmission Electron Microscope JEM 2100 HR


TEM

characterization

ve

more information

IJS F7

Specs GmbH, 2012

characterization

ve

more information

CO Nanocenter

Jeol

characterization

ve

more information

IJS CEMM

Lake Shore Inc.,


2011

characterization

ve

more information

CO Nanocenter

2013

characterization

ve

more information

CO Nanocenter

Specs GmbH, 2012

characterization

ve

more information

CO Nanocenter

Magnetometer

Vibrating Sample Magnetometer


7404 VSM

NMR STM

Nuclear magnetic resonance


scanning tunneling microscope with
supplements (NMR STM)

LT STM

Low-temperature scanning
tunneling microscope with
supplements (LT STM)

Raman Imaging microscope - AFM

Confocal Raman spectrometer with


AFM

NT-MDT Co., 2012

characterization

ve

more information

CO Nanocenter

Confocal microscope

Confocal microscope LEICA TCS SP5


X

Leica, 2011

characterization

ve

more information

CO Nanocenter

Ellipsometer

Spectroscopic Nulling Imaging


Elipsometer nanofilm_ep3se

Accurion GmbH,
2012

characterization

ve

more information

CO Nanocenter

4-probe STM UHV system

4-probe UHV STM/SEM microscopy


system

Oxford Instruments
Omicron
NanoScience, 2013

characterization

ve

more information

CO Nanocenter

Optical superconducting magnet

Cryofree spectomag 7T 4K

Oxford Inst.
Nanoscience, 2012

characterization

ve

more information

CO Nanocenter

Scratch Tester

Revetest Scratch tester

CSM Instruments,
2011

characterization

ve

more information

CO Nanocenter

Acoustic and Electroacoustic


Spectrometer DT1200

DT 1200 Acoustic Spectrometer

QUANTACHROME,
2010

characterization

ve

more information

CO Nanocenter

Tribometer

Tribometer 220V 50/60Hz

CSM Instruments,
2011

characterization

ve

more information

CO Nanocenter

ZetaSizer

ZEN 3600

Malvern
Instruments, 2010

characterization

ve

more information

CO Nanocenter

MiniFlexII benchtop XRD Analyzer

MiniFlexII benchtop XRD Analyzer

ROFA, 2011

characterization

ve

more information

CO Nanocenter

Empyrean diffractometer XRD


system

XRD system

PANalytical B.V.,
2013

characterization

ve

more information

CO Nanocenter

Keithley
Instruments Inc.,
2010

characterization

more information

CO Nanocenter

Xenon Chamber Xe-3-HS

MAKCMC, 2011

characterization

ve

more information

CO Nanocenter

Optical Microscope Olympus BX51,


Metalografic microscope BX-51TRF

Olympus, 2011

characterization

ve

more information

CO Nanocenter

characterization

ve

IJS CEMM

SEM JSM-5800

characterization

ve

IJS CEMM

SEM JXA-840A

characterization

ve

IJS CEMM

TEM JEM-2100

characterization

ve

IJS CEMM

TEM JEM-2010F

characterization

ve

IJS CEMM

KEI 6517B Electrometer/High


Resistance Meter with IEEE
Interface; KEI 6430 Sub-Femtoamp
Remote SourceMeter (R)

JEOL JSM-760F

Field Emission Scanning Electron


Microscope

PECS

Model 682, Ion beam based etching


and high resolution sputter coating
system

characterization

ve

IJS CEMM

BAL-TEC SCD 005

BAL-TEC SCD 005, sputtering,


napaevalnik

characterization

ve

IJS CEMM

Vakuumski suilnik

VC 50 SalvicLab Vacucenter

characterization

ve

IJS CEMM

Pritrditev vzorcev na vroi ploi

Gatan Model 623 40002

Stereo Mikroskop

Nikon SMZ645

Ultrazvoni rezalnik

Model 380 SoniCut

Nikon

characterization

ve

IJS CEMM

characterization

ve

IJS CEMM

characterization

ve

IJS CEMM

For skilled users/za izuene


uporabnike

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