Documente Academic
Documente Profesional
Documente Cultură
Research
Institution
/Raziskovalna
organizacija
Manufacturer/Pro
izvajalec
Tag/Oznaka
synthesis
ve
more information
CO Nanocenter
COHERENT Inc.,
2012
synthesis
ve
more information
CO Nanocenter
Omicron GmbH,
2013
synthesis
ve
more information
CO Nanocenter
synthesis
ve
more information
CO Nanocenter
more information
IJS F7
Equipment description/Opis
opreme
Coherent, 2001
HP 8453 Hewlet
Packard, 1995
characterization
IJS F7
characterization
IJS F7
MB-160, MB-102
Bomeme, 1994
Legend elite
Coherent, 2008
ALV 5000/60X
2004
IJS F7
more information
IJS F7
more information
IJS F7
more information
IJS F7
IJS F7
199x-2012
IJS F8
2000
IJS F8
2007
IJS F8
Lithography
processing
ve
more information
CO Nanocenter
Keithley
Instruments Inc.,
2010
prosessing,
characterization
ve
more information
CO Nanocenter
INK-JET printer
FUJIFILM Dimatics
Inc., 2011
processing
ve
more information
CO Nanocenter
Glovebox workstations
processing
ve
more information
CO Nanocenter
various, 2011
processing
ve
more information
CO Nanocenter
Fritsch GmbH,
Anton Paar GmbH,
2010
processing
ve
Andor Technology
Ltd.,2013
processing
more
2012
IJS F8
CO Vesolje
CO Nanocenter
processing
Reometer
characterization
Refractometer
ATAGO CO Ltd.,
2013
characterization
Lake Shore
Inc.,2010
characterization
CO Nanocenter
more information
ve
more information
CO Nanocenter
CO Nanocenter
ve
more information
CO Nanocenter
Agilent
Electronic module for AFM PicoTREC Teechnologies Inc.,
2010
characterization
ve
more information
IJS F7
characterization
ve
more information
CO Nanocenter
Jeol
characterization
ve
more information
IJS CEMM
characterization
ve
more information
CO Nanocenter
2013
characterization
ve
more information
CO Nanocenter
characterization
ve
more information
CO Nanocenter
Magnetometer
NMR STM
LT STM
Low-temperature scanning
tunneling microscope with
supplements (LT STM)
characterization
ve
more information
CO Nanocenter
Confocal microscope
Leica, 2011
characterization
ve
more information
CO Nanocenter
Ellipsometer
Accurion GmbH,
2012
characterization
ve
more information
CO Nanocenter
Oxford Instruments
Omicron
NanoScience, 2013
characterization
ve
more information
CO Nanocenter
Cryofree spectomag 7T 4K
Oxford Inst.
Nanoscience, 2012
characterization
ve
more information
CO Nanocenter
Scratch Tester
CSM Instruments,
2011
characterization
ve
more information
CO Nanocenter
QUANTACHROME,
2010
characterization
ve
more information
CO Nanocenter
Tribometer
CSM Instruments,
2011
characterization
ve
more information
CO Nanocenter
ZetaSizer
ZEN 3600
Malvern
Instruments, 2010
characterization
ve
more information
CO Nanocenter
ROFA, 2011
characterization
ve
more information
CO Nanocenter
XRD system
PANalytical B.V.,
2013
characterization
ve
more information
CO Nanocenter
Keithley
Instruments Inc.,
2010
characterization
more information
CO Nanocenter
MAKCMC, 2011
characterization
ve
more information
CO Nanocenter
Olympus, 2011
characterization
ve
more information
CO Nanocenter
characterization
ve
IJS CEMM
SEM JSM-5800
characterization
ve
IJS CEMM
SEM JXA-840A
characterization
ve
IJS CEMM
TEM JEM-2100
characterization
ve
IJS CEMM
TEM JEM-2010F
characterization
ve
IJS CEMM
JEOL JSM-760F
PECS
characterization
ve
IJS CEMM
characterization
ve
IJS CEMM
Vakuumski suilnik
VC 50 SalvicLab Vacucenter
characterization
ve
IJS CEMM
Stereo Mikroskop
Nikon SMZ645
Ultrazvoni rezalnik
Nikon
characterization
ve
IJS CEMM
characterization
ve
IJS CEMM
characterization
ve
IJS CEMM
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