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Investigation of the sample for identification of the elements present will be carried out. A wide scan over the sample will provide strong peaks for the elements present. The slope of the background will also be studied for 1-10nm thickness.
Temperature Dependent Optical Red Shift, Adv. Studies Theor. Phys., Vol. 5, 2011.
[4] M. Chen et. al., X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped
[6]
Y Zhang et. al., X-ray photoelectron spectroscopy study of ZnO films grown by metal. organic chemical vapor deposition, Journal of Crys. Growth, 252, 2003.