Pulse echo A- scan test method :

Pulse echo test method uses reflected ultrasound as a means of collecting test information. A single crystal probe is normally used for ultrasound generation as well as reception. The transmitter circuit of the flaw detector supplies short excitation pulses of few hundred volts at regular interval to the probe crystal. The excitation pulse oscillates the crystal to generate short burst of ultrasound such that the arrival of each returning echo may be identifiable as a discrete event. During the interval between two successive pulses, the crystal is at rest and detects any return echo such as from the back wall. A large percentage of the sound is reflected from the front surface of the test part and the remainder is reflected by the back surface or discontinuities. The flaw detectors CRT screen displays the whole operation by producing separated signals of transmission and the time of arrival of defect echo and the back wall echo. The transmission pulse and subsequent echoes appear as peaks rising out of the CRTs base line. The distance between the peaks is a measure of the defects location or the parts thickness. Transmission of high frequency ultrasound cannot takes place in air. It is carried out through an intermediate liquid, in bulk or as a thin layer. Oily substances or water are generally used. They are called couplants. The initial or transmitter pulse appears first in time and represents the electrical zero. This is the exact start time of crystal excitation. The exact point in time when ultrasound enters the test material is called acoustical zero. Acoustical zero is superimposed within the initial pulse and is not distinguishable. The next pulse represents the total elapsed time for sound to travel from the entry surface to the reflector and back to the entry surface again. At the instant the electrical pulse is removed the oscillations of the crystal do not cease immediately but decreases in an exponential manner until they reach zero. A dead zone is produced, starting immediately after entry into the test surface, in which echoes can not be detected. One single test cycle is so fast that it is not physically visible in the detectors screen. Hence the flaw detector repeats the test cycle several times per second by supplying successive excitation pulses to the crystal and make the event appear as constant due to persistence of vision. The number of times, the crystal is electrically pulsed per second is called the pulse repetition rate.

A sufficient amount of time between successive pulses is necessary to allow ultrasound to travel through the material under examination. Higher pulse repetition rate produces brighter screen display. Very high pulse repetition rate produces spurious signals [ ghost echoes ] on the CRT screen. The ultrasonic pulses used by the flaw detector are radio frequency type and have a serrated look. The pulses are filtered and rectified to smooth looking shapes by the flaw detector before display. Pulse echo A-scan method displays distance along the horizontal scale called the baseline and amplitude of the reflection along the vertical scale. Because of similar return path, the screen is calibrated to display one way travel only. A scan test method can accurately locate a discontinuity. The amplitude of the return signal is a relative measure of the amount of reflected energy and depends on the area and orientation of the reflecting surface. Amplitude of the signal can be used for accept / reject decision.

K. Chatterjee, 75643

Center for NDT

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