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Features
n 5.0V ± 10% for read and write operations n Typical 100,000 program/erase cycles per sector
n Access times: n 20-year data retention at 125°C
- 55/70/90/120/150 (max.) - Reliable operation for the life of the system
n Current: n Compatible with JEDEC-standards
- 20 mA typical active read current - Pinout and software compatible with single-power-
- 30 mA typical program/erase current supply Flash memory standard
- 1 µA typical CMOS standby - Superior inadvertent write protection
n Flexible sector architecture n Data Polling and toggle bits
- 16 Kbyte/ 8 KbyteX2/ 32 Kbyte/ 64 KbyteX3 sectors - Provides a software method of detecting completion
- Any combination of sectors can be erased of program or erase operations
- Supports full chip erase n Erase Suspend/Erase Resume
- Sector protection: - Suspends a sector erase operation to read data
A hardware method of protecting sectors to prevent from, or program data to, a non-erasing sector, then
any inadvertent program or erase operations within resumes the erase operation
that sector
n Hardware reset pin ( RESET )
n Top or bottom boot block configurations available
n Embedded Erase Algorithms - Hardware method to reset the device to reading
- Embedded Erase algorithm will automatically erase array data (not available on A290021)
the entire chip or any combination of designated n Package options
sectors and verify the erased sectors - 32-pin P-DIP, PLCC, or TSOP(Forward type)
- Embedded Program algorithm automatically writes
and verifies bytes at specified addresses
The device requires only a single 5.0 volt power supply for
General Description both read and write functions. Internally generated and
regulated voltages are provided for the program and erase
The A29002 is a 5.0 volt-only Flash memory organized as operations.
262,144 bytes of 8 bits each. The A29002 offers the The A29002 is entirely software command set compatible
RESET function, but it is not available on A290021. The with the JEDEC single-power-supply Flash standard.
256 Kbytes of data are further divided into seven sectors for Commands are written to the command register using
flexible sector erase capability. The 8 bits of data appear on standard microprocessor write timings. Register contents
I/O0 - I/O7 while the addresses are input on A0 to A17. The serve as input to an internal state-machine that controls the
A29002 is offered in 32-pin PLCC, TSOP, and PDIP erase and programming circuitry. Write cycles also
packages. This device is designed to be programmed in- internally latch addresses and data needed for the
system with the standard system 5.0 volt VCC supply. programming and erase operations. Reading data out of the
Additional 12.0 volt VPP is not required for in-system write device is similar to reading from other Flash or EPROM
or erase operations. However, the A29002 can also be devices.
programmed in standard EPROM programmers. Device programming occurs by writing the proper program
The A29002 has the first toggle bit, I/O6, which indicates command sequence. This initiates the Embedded Program
whether an Embedded Program or Erase is in progress, or it algorithm - an internal algorithm that automatically times the
is in the Erase Suspend. Besides the I/O6 toggle bit, the program pulse widths and verifies proper program margin.
A29002 has a second toggle bit, I/O2, to indicate whether Device erasure occurs by executing the proper erase
the addressed sector is being selected for erase. The command sequence. This initiates the Embedded Erase
A29002 also offers the ability to program in the Erase algorithm - an internal algorithm that automatically
Suspend mode. The standard A29002 offers access times of preprograms the array (if it is not already programmed)
55, 70, 90, 120, and 150 ns, allowing high-speed before executing the erase operation. During erase, the
microprocessors to operate without wait states. To eliminate device automatically times the erase pulse widths and
bus contention the device has separate chip enable ( CE ), verifies proper erase margin.
write enable ( WE ) and output enable ( OE ) controls.
The host system can detect whether a program or erase sectors of memory. This can be achieved via programming
operation is complete by reading the I/O7 ( Data Polling) equipment.
and I/O6 (toggle) status bits. After a program or erase cycle The Erase Suspend feature enables the user to put erase on
has been completed, the device is ready to read array data hold for any period of time to read data from, or program
or accept another command. data to, any other sector that is not selected for erasure.
The sector erase architecture allows memory sectors to be True background erase can thus be achieved.
erased and reprogrammed without affecting the data Power consumption is greatly reduced when the device is
contents of other sectors. The A29002 is fully erased when placed in the standby mode.
shipped from the factory. The hardware RESET pin terminates any operation in
The hardware sector protection feature disables operations progress and resets the internal state machine to reading
for both program and erase in any combination of the array data (This feature is not available on the A290021).
Pin Configurations
n DIP n PLCC
NC on A290021 NC on A290021
RESET
RESET 1 32 VCC
VCC
A12
A16
A17
A15
WE
A16 2 31 WE
A15 3 30 A17
4
3
2
1
32
31
30
A12 4 29 A14
A7 5 A14
A29002/A290021
A7 5 28 A13 29
A6 6 27 A8 A6 6 28 A13
A5 7 26 A9 A5 7 27 A8
A4 8 A11 A4 8 26 A9
25 A29002L/
A3 9 24 OE A3 9 25 A11
A10 A2 10
A290021L 24 OE
A2 10 23
A1 11 22 CE A1 11 23 A10
A0 12 21 I/O7 A0 12 22 CE
I/O0 13 20 I/O6 I/O 0 13 21 I/O7
14
15
16
17
18
19
20
I/O1 14 19 I/O5
I/O2 15 18 I/O4
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
VSS
VSS 16 17 I/O3
A11 1 32 OE
A9 2 31 A10
A8 3 30 CE
A13 4 29 I/O7
A14 5 28 I/O6
A17 6 27 I/O5
WE 7 26 I/O4
VCC 8
9
A29002V/A290021V 25
24
I/O3
VSS
RESET
A16 10 23 I/O2
NC on A290021 A15 11 22 I/O1
A12 12 21 I/O0
A7 13 20 A0
A6 14 19 A1
A5 15 18 A2
A4 16 17 A3
Block Diagram
I/O 0 - I/O 7
VCC
VSS Input/Output
Erase Voltage
Buffers
Generator
WE State
Control
RESET
(N/A A290021) Command PGM Voltage
Register Generator
Chip Enable
Output Enable STB
CE Data Latch
Logic
OE
Y-Decoder
STB Y-Gating
Address Latch
VCC Detector Timer
X-decoder
Cell Matrix
A0-A17
Pin Descriptions
CE Chip Enable
WE Write Enable
OE Output Enable
Device Bus Operations execute the command. The contents of the register serve
as inputs to the internal state machine. The state machine
This section describes the requirements and use of the outputs dictate the function of the device. The appropriate
device bus operations, which are initiated through the device bus operations table lists the inputs and control
internal command register. The command register itself levels required, and the resulting output. The following
does not occupy any addressable memory location. The subsections describe each of these operations in further
register is composed of latches that store the commands, detail.
along with the address and data information needed to
Legend:
L = Logic Low = VIL, H = Logic High = VIH, VID = 12.0 ± 0.5V, X = Don't Care, DIN = Data In, DOUT = Data Out, AIN = Address In
Note: 1. See the "Sector Protection/Unprotection" section and Temporary Sector Unprotect for more information.
2. This function is not available on A290021.
Requirements for Reading Array Data more information, and to each AC Characteristics section
for timing diagrams.
To read array data from the outputs, the system must drive
the CE and OE pins to VIL. CE is the power control and Standby Mode
selects the device. OE is the output control and gates When the system is not reading or writing to the device, it
array data to the output pins. WE should remain at VIH all can place the device in the standby mode. In this mode,
the time during read operation. The internal state machine current consumption is greatly reduced, and the outputs
is set for reading array data upon device power-up, or after are placed in the high impedance state, independent of the
a hardware reset. This ensures that no spurious alteration OE input.
of the memory content occurs during the power transition. The device enters the CMOS standby mode when the CE
No command is necessary in this mode to obtain array
& RESET pins ( CE only on A290021) are both held at VCC
data. Standard microprocessor read cycles that assert
valid addresses on the device address inputs produce valid ± 0.5V. (Note that this is a more restricted voltage range
data on the device data outputs. The device remains than VIH.) The device enters the TTL standby mode when
enabled for read access until the command register CE is held at VIH, while RESET (Not available on
contents are altered. A290021) is held at VCC±0.5V. The device requires the
See "Reading Array Data" for more information. Refer to standard access time (tCE) before it is ready to read data.
the AC Read Operations table for timing specifications and If the device is deselected during erasure or programming,
to the Read Operations Timings diagram for the timing the device draws active current until the operation is
waveforms, lCC1 in the DC Characteristics table represents completed.
the active current specification for reading array data. ICC3 in the DC Characteristics tables represents the standby
current specification.
Writing Commands/Command Sequences
Output Disable Mode
To write a command or command sequence (which
includes programming data to the device and erasing When the OE input is at VIH, output from the device is
sectors of memory), the system must drive WE and CE disabled. The output pins are placed in the high impedance
to VIL, and OE to VIH. An erase operation can erase one state.
sector, multiple sectors, or the entire device. The Sector
RESET : Hardware Reset Pin (N/A on A290021)
Address Tables indicate the address range that each sector
occupies. A "sector address" consists of the address inputs The RESET pin provides a hardware method of resetting
required to uniquely select a sector. See the "Command the device to reading array data. When the system drives
Definitions" section for details on erasing a sector or the
the RESET pin low for at least a period of tRP, the device
entire chip, or suspending/resuming the erase operation.
immediately terminates any operation in progress, tristates
After the system writes the autoselect command sequence,
all data output pins, and ignores all read/write attempts for
the device enters the autoselect mode. The system can
the duration of the RESET pulse. The device also resets
then read autoselect codes from the internal register (which
is separate from the memory array) on I/O7 - I/O0. Standard the internal state machine to reading array data. The
read cycle timings apply in this mode. Refer to the operation that was interrupted should be reinitiated once
"Autoselect Mode" and "Autoselect Command Sequence" the device is ready to accept another command sequence,
sections for more information. to ensure data integrity.
ICC2 in the Characteristics table represents the active The RESET pin may be tied to the system reset circuitry.
current specification for the write mode. The "AC A system reset would thus also reset the Flash memory,
Characteristics" section contains timing specification tables enabling the system to read the boot-up firmware from the
and timing diagrams for write operations. Flash memory.
Refer to the AC Characteristics tables for RESET
Program and Erase Operation Status parameters and diagram.
During an erase or program operation, the system may
check the status of the operation by reading the status bits
on I/O7 - I/O0. Standard read cycle timings and ICC read
specifications apply. Refer to "Write Operation Status" for
Figure 3 illustrates the algorithm for the erase operation. The system must write the Erase Resume command
Refer to the Erase/Program Operations tables in the "AC (address bits are "don't care") to exit the erase suspend
Characteristics" section for parameters, and to the Sector mode and continue the sector erase operation. Further
Erase Operations Timing diagram for timing waveforms. writes of the Resume command are ignored. Another Erase
Suspend command can be written after the device has
Erase Suspend/Erase Resume Commands resumed erasing.
The Erase Suspend command allows the system to interrupt
a sector erase operation and then read data from, or
program data to, any sector not selected for erasure. This START
command is valid only during the sector erase operation,
including the 50µs time-out period during the sector erase
command sequence. The Erase Suspend command is
ignored if written during the chip erase operation or Write Erase
Embedded Program algorithm. Writing the Erase Suspend Command
command during the Sector Erase time-out immediately Sequence
terminates the time-out period and suspends the erase
operation. Addresses are "don't cares" when writing the
Erase Suspend command. Data Poll
When the Erase Suspend command is written during a from System
Embedded
sector erase operation, the device requires a maximum of
Erase
20µs to suspend the erase operation. However, when the algorithm in
Erase Suspend command is written during the sector erase progress
time-out, the device immediately terminates the time-out
period and suspends the erase operation. No
After the erase operation has been suspended, the system Data = FFh ?
can read array data from or program data to any sector not
selected for erasure. (The device "erase suspends" all
sectors selected for erasure.) Normal read and write timings Yes
and command definitions apply. Reading at any address
within erase-suspended sectors produces status data on I/O7
- I/O0. The system can use I/O7, or I/O6 and I/O2 together, to Erasure Completed
determine if a sector is actively erasing or is erase-
suspended. See "Write Operation Status" for information on
these status bits. Note :
After an erase-suspended program operation is complete, 1. See the appropriate Command Definitions table for erase
the system can once again read array data within non- command sequences.
suspended sectors. The system can determine the status of 2. See "I/O 3 : Sector Erase Timer" for more information.
the program operation using the I/O7 or I/O6 status bits, just
as in the standard program operation. See "Write Operation Figure 3. Erase Operation
Status" for more information.
The system may also write the autoselect command
sequence when the device is in the Erase Suspend mode.
The device allows reading autoselect codes even at
addresses within erasing sectors, since the codes are not
stored in the memory array. When the device exits the
autoselect mode, the device reverts to the Erase Suspend
mode, and is ready for another valid operation. See
"Autoselect Command Sequence" for more information.
Cycles
Sequence First Second Third Fourth Fifth Sixth
(Note 1)
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Read (Note 5) 1 RA RD
Reset (Note 6) 1 XXX F0
Manufacturer ID 4 555 AA 2AA 55 555 90 X00 37
Autoselect
(Note 7) Device ID Top 4 555 AA 2AA 55 555 90 X01 8C
Bottom 0D
Continuation ID 4 555 AA 2AA 55 555 90 X11 7F
Legend:
X = Don't care
RA = Address of the memory location to be read.
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE or CE pulse,
whichever happens later.
PD = Data to be programmed at location PA. Data latches on the rising edge of WE or CE pulse, whichever happens first.
SA = Address of the sector to be verified (in autoselect mode) or erased. Address bits A17 - A13 select a unique sector.
Note:
1. See Table 1 for description of bus operations.
2. All values are in hexadecimal.
3. Except when reading array or autoselect data, all bus cycles are write operation.
4. Address bits A17 - A12 are don't cares for unlock and command cycles, unless SA or PA required.
5. No unlock or command cycles required when reading array data.
6. The Reset command is required to return to reading array data when device is in the autoselect mode, or if I/O5 goes
high (while the device is providing status data).
7. The fourth cycle of the autoselect command sequence is a read cycle.
8. The data is 00h for an unprotected sector and 01h for a protected sector. See "Autoselect Command Sequence" for
more information.
9. The system may read and program in non-erasing sectors, or enter the autoselect mode, when in the Erase Suspend
mode.
10. The Erase Resume command is valid only during the Erase Suspend mode.
I/O6: Toggle Bit I which sectors are selected for erasure. Thus, both status
bits are required for sector and mode information. Refer to
Toggle Bit I on I/O6 indicates whether an Embedded Table 6 to compare outputs for I/O2 and I/O6.
Program or Erase algorithm is in progress or complete, or Figure 5 shows the toggle bit algorithm in flowchart form,
whether the device has entered the Erase Suspend mode. and the section " I/O2: Toggle Bit II" explains the algorithm.
Toggle Bit I may be read at any address, and is valid after See also the " I/O6: Toggle Bit I" subsection. Refer to the
the rising edge of the final WE pulse in the command Toggle Bit Timings figure for the toggle bit timing diagram.
sequence (prior to the program or erase operation), and The I/O2 vs. I/O6 figure shows the differences between I/O2
during the sector erase time-out. and I/O6 in graphical form.
During an Embedded Program or Erase algorithm
operation, successive read cycles to any address cause Reading Toggle Bits I/O6, I/O2
I/O6 to toggle. (The system may use either OE or CE to Refer to Figure 5 for the following discussion. Whenever
control the read cycles.) When the operation is complete, the system initially begins reading toggle bit status, it must
I/O6 stops toggling. read I/O7 - I/O0 at least twice in a row to determine
After an erase command sequence is written, if all sectors whether a toggle bit is toggling. Typically, a system would
selected for erasing are protected, I/O6 toggles for note and store the value of the toggle bit after the first
approximately 100µs, then returns to reading array data. If read. After the second read, the system would compare
not all selected sectors are protected, the Embedded the new value of the toggle bit with the first. If the toggle
Erase algorithm erases the unprotected sectors, and bit is not toggling, the device has completed the program
ignores the selected sectors that are protected. or erase operation. The system can read array data on
The system can use I/O6 and I/O2 together to determine I/O7 - I/O0 on the following read cycle.
whether a sector is actively erasing or is erase-suspended. However, if after the initial two read cycles, the system
When the device is actively erasing (that is, the Embedded determines that the toggle bit is still toggling, the system
Erase algorithm is in progress), I/O6 toggles. When the also should note whether the value of I/O5 is high (see the
device enters the Erase Suspend mode, I/O6 stops section on I/O5). If it is, the system should then determine
toggling. However, the system must also use I/O2 to again whether the toggle bit is toggling, since the toggle bit
determine which sectors are erasing or erase-suspended. may have stopped toggling just as I/O5 went high. If the
Alternatively, the system can use I/O7 (see the subsection toggle bit is no longer toggling, the device has successfully
on " I/O7 : Data Polling"). completed the program or erase operation. If it is still
If a program address falls within a protected sector, I/O6 toggling, the device did not complete the operation
successfully, and the system must write the reset
toggles for approximately 2µs after the program command
command to return to reading array data.
sequence is written, then returns to reading array data.
The remaining scenario is that the system initially
I/O6 also toggles during the erase-suspend-program
determines that the toggle bit is toggling and I/O5 has not
mode, and stops toggling once the Embedded Program
gone high. The system may continue to monitor the toggle
algorithm is complete.
bit and I/O5 through successive read cycles, determining
The Write Operation Status table shows the outputs for
the status as described in the previous paragraph.
Toggle Bit I on I/O6. Refer to Figure 5 for the toggle bit
Alternatively, it may choose to perform other system tasks.
algorithm, and to the Toggle Bit Timings figure in the "AC
In this case, the system must start at the beginning of the
Characteristics" section for the timing diagram. The I/O2
algorithm when it returns to determine the status of the
vs. I/O6 figure shows the differences between I/O2 and I/O6
operation (top of Figure 5).
in graphical form. See also the subsection on " I/O2:
Toggle Bit II". I/O5: Exceeded Timing Limits
I/O2: Toggle Bit II I/O5 indicates whether the program or erase time has
exceeded a specified internal pulse count limit. Under
The "Toggle Bit II" on I/O2, when used with I/O6, indicates
these conditions I/O5 produces a "1." This is a failure
whether a particular sector is actively erasing (that is, the
condition that indicates the program or erase cycle was
Embedded Erase algorithm is in progress), or whether that
not successfully completed.
sector is erase-suspended. Toggle Bit II is valid after the
The I/O5 failure condition may appear if the system tries to
rising edge of the final WE pulse in the command program a "1 "to a location that is previously programmed
sequence. to "0." Only an erase operation can change a "0" back to a
I/O2 toggles when the system reads at addresses within "1." Under this condition, the device halts the operation,
those sectors that have been selected for erasure. (The and when the operation has exceeded the timing limits,
system may use either OE or CE to control the read I/O5 produces a "1."
cycles.) But I/O2 cannot distinguish whether the sector is Under both these conditions, the system must issue the
actively erasing or is erase-suspended. I/O6, by reset command to return the device to reading array data.
comparison, indicates whether the device is actively
erasing, or is in Erase Suspend, but cannot distinguish
No
Toggle Bit
= Toggle ?
Yes
Program/Erase
Program/Erase
Operation Not
Operation
Commplete, Write
Commplete
Reset Command
Notes :
1. Read toggle bit twice to determine whether or not it is
toggling. See text.
2. Recheck toggle bit because it may stop toggling as I/O 5
changes to "1". See text.
Notes:
1. I/O7 and I/O2 require a valid address when reading status information. Refer to the appropriate subsection for further
details.
2. I/O5 switches to “1” when an Embedded Program or Embedded Erase operation has exceeded the maximum timing
limits. See “I/O5: Exceeded Timing Limits” for more information.
20ns 20ns
+0.8V
-0.5V
-2.0V
20ns
20ns
VCC+2.0V
VCC+0.5V
2.0V
20ns 20ns
DC Characteristics
TTL/NMOS Compatible
Parameter
Parameter Description Test Description Min. Typ. Max. Unit
Symbol
ILI Input Load Current VIN = VSS to VCC. VCC = VCC Max ±1.0 µA
VCC = VCC Max,
ILIT A9, OE & RESET Input Load Current 50 µA
A9, OE & RESET =12.5V
ILO Output Leakage Current VOUT = VSS to VCC. VCC = VCC Max ±1.0 µA
ICC1 VCC Active Read Current
CE = VIL, OE = VIH 20 30 mA
(Notes 1, 2)
ICC2 VCC Active Write (Program/Erase) 30 40 mA
CE = VIL, OE =VIH
Current (Notes 2, 3, 4)
ICC3 VCC Standby Current (Note 2) CE = VIH, RESET = VCC ± 0.5V 0.4 1.0 mA
VIL Input Low Level -0.5 0.8 V
VIH Input High Level 2.0 VCC+0.5 V
VID Voltage for Autoselect and VCC = 5.25 V 10.5 12.5 V
Temporary Unprotect Sector
VOL Output Low Voltage IOL = 12mA, VCC = VCC Min 0.45 V
VOH Output High Voltage IOH = -2.5 mA, VCC = VCC Min 2.4 V
CMOS Compatible
Parameter
Parameter Description Test Description Min. Typ. Max. Unit
Symbol
ILI Input Load Current VIN = VSS to VCC, VCC = VCC Max ±1.0 µA
VCC = VCC Max,
ILIT A9, OE & RESET Input Load Current 50 µA
A9, OE & RESET = 12.5V
ILO Output Leakage Current VOUT = VSS to VCC, VCC = VCC Max ±1.0 µA
ICC1 VCC Active Read Current 20 30 mA
CE = VIL, OE = VIH
(Notes 1,2)
ICC2 VCC Active Program/Erase Current 30 40 mA
CE = VIL, OE = VIH
(Notes 2,3,4)
ICC3 VCC Standby Current (Notes 2, 5) CE = RESET = VCC ± 0.5 V 1 5 µA
VIL Input Low Level -0.5 0.8 V
VIH Input High Level 0.7 x VCC VCC+0.3 V
VID Voltage for Autoselect and
VCC = 5.25 V 10.5 12.5 V
Temporary Sector Unprotect
VOL Output Low Voltage IOL = 12.0 mA, VCC = VCC Min 0.45 V
VOH1 IOH = -2.5 mA, VCC = VCC Min 0.85 x VCC V
Output High Voltage
VOH2 IOH = -100 µA. VCC = VCC Min VCC-0.4 V
AC Characteristics
Read Only Operations
Notes:
1. Output driver disable time.
2. Not 100% tested.
tRC
tACC
CE
tDF
tOE
OE
tOEH
WE tCE tOH
High-Z High-Z
Output Output Valid
0V
RESET Timings
CE, OE
tRH
RESET
tRP
tReady
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
~
~
RESET
tRP
0 or 5V 0 or 5V
RESET
tVIDR tVIDR
Program or Erase Command Sequence
CE
~
~
WE
~
~
tRSP
AC Characteristics
Erase and Program Operations
Notes:
1. Not 100% tested.
2. See the "Erase and Programming Performance" section for more information.
Program Command Sequence (last two cycles) Read Status Data (last two cycles)
tWC tAS
~
~
Addresses 555h PA PA PA
~ ~
~
tAH
~
CE
tCH
tGHWL
~
~
OE
tWP
tWHWH1
~
~
WE
tCS tWPH
tDS
tDH
Status
tVCS
~
~
VCC
Note : PA = program addrss, PD = program data, Dout is the true data at the program address.
~
~
Addresses 2AAh SA VA VA
~ ~
~
555h for chip erase
tAH
~
CE
tGHWL
~
~
tCH
OE
tWP
~
~
WE
tWPH
tWHWH2
tCS
tDS
tDH
In
Data 55h 30h ~
~ Complete
Progress
VCC
tRC
~
~
Addresses VA VA VA
~ ~
~
tACC
~
CE tCE
tCH
tOE
~
~
OE
tOEH tDF ~
~
WE
tOH
High-Z
Valid Data
~
~
High-Z
I/O0 - I/O 6 Status Data Status Data True Valid Data
~
~
Note : VA = Valid Address. Illustation shows first status cycle after command sequence, last status read cycle, and array data
read cycle.
tRC
~
~
Addresses VA VA VA VA
~ ~
~
tACC
~
CE tCE
tCH
tOE
OE
~
~
tOEH tDF
~
~
WE
tOH
I/O6 , I/O2
~
~
Valid Status Valid Status Valid Status Valid Status
Note: VA = Valid Address; not required for I/O6. Illustration shows first two status cycle after command sequence, last
status read cycle, and array data read cycle.
Enter
Erase Enter Erase Erase
Embedded
Suspend Suspend Program Resume
Erasing ~
~
~
~
~
~
~
~
~
~
WE
Erase
Erase Erase Suspend Erase Suspend Erase Erase
Suspend
Read Read Complete
Program
~
~
~
~
~
~
~
~
I/O6 ~
~
~
~
~
~
~
~
~
~
~
~
I/O2
Note : Both I/O 6 and I/O 2 toggle with OE or CE. See the text on I/O 6 and I/O 2 in the section "Write Operation Statue" for
more information.
AC Characteristics
Erase and Program Operations
Alternate CE Controlled Writes
Notes:
3. Not 100% tested.
4. See the "Erase and Programming Performance" section for more information.
Timing Waveforms for Alternate CE Controlled Write Operation ( RESET =VIH on A29002)
PA for program
555 for program SA for sector erase
2AA for erase 555 for chip erase
Data Polling
~
~
Addresses PA
~
~
tWC tAS
tWH tAH
~
~
WE
tGHEL
~
~
OE
tCP tWHWH1 or 2
~
~
tCPH tBUSY
CE
tWS
tDS
tDH ~
~
Data I/O 7 DOUT
tRH
A0 for program PD for program
55 for erase 30 for sector erase
10 for chip erase
Note :
1. PA = Program Address, PD = Program Data, SA = Sector Address, I/O 7 = Complement of Data Input, D OUT = Array Data.
2. Figure indicates the last two bus cycles of the command sequence.
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 5.0V VCC, 100,000 cycles. Additionally,
programming typically assumes checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 4.5V (4.75V for -55), 100,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most
bytes program faster than the maximum byte program time listed. If the maximum byte program time given is exceeded,
only then does the device set I/O5 = 1. See the section on I/O5 for further information.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the four-bus-cycle command sequence for programming. See
Table 4 for further information on command definitions.
6. The device has a guaranteed minimum erase and program cycle endurance of 100,000 cycles.
Latch-up Characteristics
Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at time. RESET N/A on A290021
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0MHz
Notes:
3. Sampled, not 100% tested.
4. Test conditions TA = 25°C, f = 1.0MHz
Data Retention
Test Conditions
Test Specifications
Test Setup
5.0 V
2.7 KΩ
Device
Under
Test
Ordering Information
Top Boot Sector Flash
A29002T-55
32Pin DIP
A290021T-55
A29002TL-55
55 20 30 1 32Pin PLCC
A290021TL-55
A29002TV-55
32Pin TSOP
A290021TV-55
A29002T-70
32Pin DIP
A290021T-70
A29002TL-70
70 20 30 1 32Pin PLCC
A290021TL-70
A29002TV-70
32Pin TSOP
A290021TV-70
A29002T-90
32Pin DIP
A290021T-90
A29002TL-90
90 20 30 1 32Pin PLCC
A290021TL-90
A29002TV-90
32Pin TSOP
A290021TV-90
A29002T-120
32Pin DIP
A290021T-120
A29002TL-120
120 20 30 1 32Pin PLCC
A290021TL-120
A29002TV-120
32Pin TSOP
A290021TV-120
A29002T-150
32Pin DIP
A290021T-150
A29002TL-150
150 20 30 1 32Pin PLCC
A290021TL-150
A29002TV-150
32Pin TSOP
A290021TV-150
A29002U-55
32Pin DIP
A290021U-55
A29002UL-55
55 20 30 1 32Pin PLCC
A290021UL-55
A29002UV-55
32Pin TSOP
A290021UV-55
A29002U-70
32Pin DIP
A290021U-70
A29002UL-70
70 20 30 1 32Pin PLCC
A290021UL-70
A29002UV-70
32Pin TSOP
A290021UV-70
A29002U-90
32Pin DIP
A290021U-90
A29002UL-90
90 20 30 1 32Pin PLCC
A290021UL-90
A29002UV-90
32Pin TSOP
A290021UV-90
A29002U-120
32Pin DIP
A290021U-120
A29002UL-120
120 20 30 1 32Pin PLCC
A290021UL-120
A29002UV-120
32Pin TSOP
A290021UV-120
A29002U-150
32Pin DIP
A290021U-150
A29002UL-150
150 20 30 1 32Pin PLCC
A290021UL-150
A29002UV-150
32Pin TSOP
A290021UV-150
Package Information
32 17
E
1 16
E1
C
A1
A2
A
Base Plane
Seating Plane
L
B
e θ EA
B1
B - 0.018 - - 0.457 -
B1 - 0.050 - - 1.270 -
C - 0.010 - - 0.254 -
D 1.645 1.650 1.655 41.783 41.91 42.037
E 0.537 0.542 0.547 13.64 13.767 13.894
E1 0.590 0.600 0.610 14.986 15.240 15.494
EA 0.630 0.650 0.670 16.002 16.510 17.018
e - 0.100 - - 2.540 -
L 0.120 0.130 0.140 3.048 3.302 3.556
θ 0° - 15° 0° - 15°
Notes:
1. The maximum value of dimension D includes end flash.
2. Dimension E does not include resin fins.
Package Information
HD
D
13 5
14 4
HE
1
E
32
20 30
21 29
A2
L
c
e b
A1
b1 GE
y
D
GD θ
Notes:
1. Dimensions D and E do not include resin fins.
2. Dimensions GD & GE are for PC Board surface mount pad pitch
design reference only.
Package Information
A2
A
E
c
A1
θ
L
LE
HD
Detail "A"
Detail "A"
y
D
S b
Notes:
1. The maximum value of dimension D includes end flash.
2. Dimension E does not include resin fins.
3. Dimension S includes end flash.