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DATA SHEET
M3D082
Philips Semiconductors
Product specication
BRY39
PINNING PIN 1 2 3 4 cathode cathode gate anode gate (connected to case) anode DESCRIPTION
handbook, halfpage
a ag
1
book, halfpage
DESCRIPTION Silicon planar PNPN switch or trigger device in a TO-72 metal package. It is an integrated PNP/NPN transistor pair with all electrodes accessible.
MGL168
emitter-base voltage
open collector
NPN TRANSISTOR
collector-base voltage repetitive peak emitter current total power dissipation junction temperature forward on-state voltage holding current turn-on time turn-off time
open emitter Tamb 25 C IA = 50 mA; IAG = 0; RKG-K = 10 k IAG = 10 mA; VBB = 2 V; RKG-K = 10 k
V A mW C V mA s s
Programmable unijunction transistor gate-anode voltage anode current (DC) junction temperature peak point current VS = 10 V; RG = 10 k Tamb 25 C 70 175 150 0.2 V mA C A
1997 Jul 24
Philips Semiconductors
Product specication
BRY39
UNIT mW C C C
Silicon controlled switch collector-base voltage PNP NPN VCER collector-emitter voltage PNP NPN VCEO collector-emitter voltage PNP NPN VEBO emitter-base voltage PNP NPN IC collector current (DC) PNP NPN ICM peak collector current PNP NPN IE emitter current (DC) PNP NPN IERM repetitive peak emitter current PNP NPN Programmable unijunction transistor VGA IA gate-anode voltage anode current (AV) Tamb 25 C 70 175 V mA tp = 10 s; = 0.01 2.5 2.5 A A 175 175 mA mA note 2 175 mA note 1 175 mA open collector 70 5 V V open base 70 V V RBE = 10 k 70 V V open emitter 70 70 V V
1997 Jul 24
Philips Semiconductors
Product specication
BRY39
MAX. 2.5 A A
UNIT
A/s
2. During switching on, the device can withstand the discharge of a capacitor of a maximum value of 500 pF. This capacitor is charged when the transistor is in cut-off condition, with a collector supply voltage of 160 V and a series resistance of 100 k. THERMAL CHARACTERISTICS SYMBOL Rth j-a PARAMETER thermal resistance from junction to ambient CONDITIONS in free air VALUE 450 UNIT K/W
CHARACTERISTICS Tamb = 25 C unless otherwise specied. SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
IB = 0; VCE = 70 V; Tj = 150 C IC = 0; VEB = 70 V; Tj = 150 C IE = 1 mA; VCE = 5 V VCE = 70 V; RBE = 10 k IC = 0; VEB = 5 V; Tj = 150 C IC = 10 mA; IB = 1 mA IC = 10 mA; IB = 1 mA IC = 10 mA; VCE = 2 V IE = ie = 0; VCB = 20 V IC = ic = 0; VEB = 1 V; f = 1 MHz IC = 10 mA; VCE = 2 V; f = 100 MHz RKG-K = 10 k IA = 50 mA; IAG = 0 IA = 50 mA; IAG = 0; Tj = 55 C IA = 1 mA; IAG = 10 mA
3 50 100
10 10 15
A A
collector cut-off current emitter cut-off current collector-emitter saturation voltage base-emitter saturation voltage DC current gain collector capacitance emitter capacitance transition frequency
nA A A V V pF pF MHz
COMBINED DEVICE
V V V mA
IH
holding current
1997 Jul 24
Philips Semiconductors
Product specication
BRY39
PARAMETER
CONDITIONS VKG-K = 0.5 to 4.5 V; RKG-K = 1 k; see Figs 15 and 16 VKG-K = 0.5 to 0.5 V; RKG-K = 10 k RKG-K = 10 k; see Figs 17 and 18 VS = 10 V; RG = 10 k; see Figs 3 and 8 VS = 10 V; RG = 100 k; see Figs 3 and 8 6
MIN.
MAX.
UNIT s s s A A A A V nA nA V V ns
ton
turn-on time
0.25 1.5 15
toff Ip
turn-off time
Programmable unijunction transistor peak point current 0.2 0.06 2 1 10 100 1.4 80
Iv
offset voltage gate-anode leakage current gate-cathode leakage current anode-cathode voltage peak output voltage rise time
typical curve; IA = 0; for VP and VS see Fig.8 IK = 0; VGA = 70 V VAK = 0; VKG = 70 V IA = 100 mA VAA = 20 V; C = 10 nF; see Figs 9 and 11 VAA = 20 V; C = 10 nF; see Fig.11
Explanation of symbols For application of the BRY39 as a programmable unijunction transistor, only the anode gate is used. To simplify the symbols, the term gate instead of anode gate will be used (see Fig.2).
handbook, halfpage
anode a g gate
k cathode
MBB700
Fig.2
1997 Jul 24
Philips Semiconductors
Product specication
BRY39
+VB
a IA (1) C 1 nF
RG R2 DUT
DUT
VS R1
MEA142 MEA141
Fig.3
Programmable unijunction transistor test circuit for peak and valley points.
Fig.4
handbook, halfpage
IA
handbook, halfpage
RG = VAK DUT VS =
R1 R2 R1 R2 VB I GAO
DUT
R1 R1 R2
VGA
MBB697 MBB699
Fig.5
Fig.6
Programmable unijunction transistor equivalent test circuit for gate-anode leakage current.
1997 Jul 24
Philips Semiconductors
Product specication
BRY39
IA handbook, halfpage
handbook, halfpage
Fig.7
Programmable unijunction transistor equivalent test circuit for gate-cathode leakage current.
Fig.8
handbook, halfpage
handbook, halfpage
VAA
VO VOM
MBB701
90 % 16 k
1.5 M DUT
C 20
VO 27 k
MBB698
10 % tr time
Fig.9
1997 Jul 24
Philips Semiconductors
Product specication
BRY39
P N P
N P N e1
MBB681
c 1,b 2
k (cathode) (e1 )
MBB680
handbook, halfpage
handbook, halfpage
kg
MBB683
Fig.14 Silicon controlled switch equivalent test circuit for holding current.
1997 Jul 24
Philips Semiconductors
Product specication
BRY39
V (V)
MBB687
90 % 2.7 k 16 k RKG-K VI
MBB685
handbook, halfpage
+12 V
VAK +50 V
0 0.5
10 % time
VAG-K
ton
time
Fig.16 Silicon controlled switch pulse duration increased until dashed curve disappears.
VAK halfpage handbook, (V) +12 V handbook, halfpage 1 k C VAK mercury wetted contact RKG-K 0 tq C < Copt 2.7 k +50 V 16 k 12 C = Copt
MBB686
time
MBB684
12
Fig.18 Silicon controlled switch capacitance increased until C = Copt dashed curve disappears.
1997 Jul 24
Philips Semiconductors
Product specication
BRY39
MBB584
MBB583
handbook, halfpage
1.2
handbook, halfpage
1.8
h FE X 1.4
0.4
1.0
Fig.19 Silicon controlled switch normalized DC current gain as a function of anode gate current.
Fig.20 Silicon controlled switch normalized DC current gain as a function of ambient temperature.
MBB581
handbook, halfpage
1.2
handbook, halfpage
1.2
MBB587
IH VAK X 1 X 1.1
0.8 0.9
0.8 50
50
Fig.21 Silicon controlled switch normalized anode-cathode voltage as a function of ambient temperature.
Fig.22 Silicon controlled switch normalized holding current as a function of ambient temperature.
1997 Jul 24
10
Philips Semiconductors
Product specication
BRY39
MBB580
handbook, halfpage
300
100
MBB582
10
10
1 10 5
10 4
10 3
10 2
10 1
10
10 2
10 3
t p (s)
10 4
1997 Jul 24
11
Philips Semiconductors
Product specication
BRY39
10
MBB585
IA (A)
= 0.01
0.02 0.05
101
101
10
tp (ms)
102
10
MBB586
IA (A)
= 0.01
0.02 1 0.05 0.1 0.2 0.5 101
101
10
tp (ms)
102
1997 Jul 24
12
Philips Semiconductors
Product specication
BRY39
SOT18/9
j B
seating plane w M A M B M
1
k
b D1
4 2 3
a A D A L
5 scale
10 mm
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions) UNIT mm A 5.31 4.74 a 2.54 b 0.46 0.42 D 5.45 5.30 D1 4.70 4.55 j 1.05 0.95 k 1.0 0.9 L 14.5 13.5 w 0.36 45
EUROPEAN PROJECTION
1997 Jul 24
13
Philips Semiconductors
Product specication
BRY39
This data sheet contains target or goal specications for product development. This data sheet contains preliminary data; supplementary data may be published later. This data sheet contains nal product specications.
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specication is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specication. LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
1997 Jul 24
14
Philips Semiconductors
Product specication
BRY39
1997 Jul 24
15
For all other countries apply to: Philips Semiconductors, Marketing & Sales Communications, Building BE-p, P.O. Box 218, 5600 MD EINDHOVEN, The Netherlands, Fax. +31 40 27 24825 Philips Electronics N.V. 1997
Internet: http://www.semiconductors.philips.com
SCA55
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights.
117047/00/01/pp16
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