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Typical Applications
IRF1503S IRF1503L
VDSS = 30V RDS(on) = 3.3m
14V Automotive Electrical Systems 14V Electronic Power Steering Advanced Process Technology Ultra Low On-Resistance 175C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax
Benefits
G S
ID = 75A
Description
Specifically designed for Automotive applications, this Stripe Planar design of HEXFET Power MOSFETs utilizes the lastest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this HEXFET power MOSFET are a 175C junction operating temperature, fast switching speed and improved repetitive avalanche rating. These benefits combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications.
D2Pak IRF1503S
TO-262 IRF1503L
Max.
190 130 75 960 200 1.3 20 510 980 See Fig.12a, 12b, 15, 16 -55 to + 175 300 (1.6mm from case ) 10 lbfin (1.1Nm)
Units
A
W W/C V mJ A mJ C
Thermal Resistance
Parameter
RJC RCS RJA Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient
Typ.
0.50
Max.
0.75 62
Units
C/W
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1
12/11/02
IRF1503S/IRF1503L
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
V(BR)DSS
V(BR)DSS/TJ
RDS(on) VGS(th) gfs IDSS IGSS Qg Qgs Qgd td(on) tr td(off) tf LD LS Ciss Coss Crss Coss Coss Coss eff.
Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance Internal Source Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance
Min. 30 2.0 75
Typ. 0.028 2.6 130 36 41 17 130 59 48 5.0 13 5730 2250 290 7580 2290 3420
Max. Units Conditions V VGS = 0V, ID = 250A V/C Reference to 25C, ID = 1mA 3.3 m VGS = 10V, ID = 140A 4.0 V VDS = 10V, ID = 250A S VDS = 25V, ID = 140A 20 VDS = 30V, VGS = 0V A 250 VDS = 24V, VGS = 0V, TJ = 150C 200 VGS = 20V nA -200 VGS = -20V 200 ID = 140A 54 nC VDS = 24V 62 VGS = 10V VDD = 15V ID = 140A ns RG = 2.5 VGS = 10V D Between lead, 6mm (0.25in.) nH G from package and center of die contact S VGS = 0V pF VDS = 25V = 1.0MHz, See Fig. 5 VGS = 0V, VDS = 1.0V, = 1.0MHz VGS = 0V, VDS = 24V, = 1.0MHz VGS = 0V, VDS = 0V to 24V
VSD trr Qrr ton Notes: Repetitive rating; pulse width limited by max. junction temperature. (See fig. 11). Starting TJ = 25C, L = 0.049mH RG = 25, IAS = 140A. (See Figure 12). ISD 140A, di/dt 110A/s, VDD V(BR)DSS, TJ 175C Pulse width 400s; duty cycle 2%.
Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time
Conditions D MOSFET symbol 190 showing the A G integral reverse 960 S p-n junction diode. 1.3 V TJ = 25C, IS = 140A, VGS = 0V 71 110 ns TJ = 25C, IF = 140A 110 170 nC di/dt = 100A/s Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Coss eff. is a fixed capacitance that gives the same charging time
as Coss while VDS is rising from 0 to 80% VDSS .
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IRF1503S/IRF1503L
1000
VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP
1000
100
VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP
100
4.5V
10
4.5V
1000
200
T J = 25C T J = 175C
Gfs, Forward Transconductance (S)
T J = 175C 160
120
100
T J = 25C
80
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IRF1503S/IRF1503L
10000 VGS = 0V, f = 1 MHZ C iss = C gs + C gd , C ds SHORTED Crss Coss = Cgd =C ds + Cgd
20 ID= 140A
8000
VDS= 24V
16
C, Capacitance (pF)
6000
Ciss
12
4000
Coss
2000
Crss
0 1 10 100
1000.0
1000
100
100sec 1msec
1.0
10msec
0.1
100
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IRF1503S/IRF1503L
200
2.0
I D = 240A
LIMITED BY PACKAGE
160
1.5
120
(Normalized)
1.0
80
0.5
40
V GS = 10V
0.0 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
TC , Case Temperature ( C)
( C)
(Z thJC )
D = 0.50
0.20
Thermal Response
0.1
0.10 P DM 0.05 t1 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = 2. Peak T t1/ t
2
J = P DM x Z thJC
+T C 1
0.01 0.00001
0.0001
0.001
0.01
0.1
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IRF1503S/IRF1503L
EAS , Single Pulse Avalanche Energy (mJ)
15V
1400 1200 1000 800 600 400 200 0 25 50 75 100 125 150 175
VDS
DRIVER
RG
20V VGS
D.U.T
IAS tp
+ V - DD
0.01
10 V
QGS VG QGD
VGS(th) Gate threshold Voltage (V)
4.0
3.0
Charge
ID = 250A
2.0
D.U.T. VGS
3mA
+ V - DS
T J , Temperature ( C )
IG ID
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IRF1503S/IRF1503L
10000
0.01
100
0.05 0.10
10
Allowed avalanche Current vs avalanche pulsewidth, tav assuming Tj = 25C due to avalanche losses. Note: In no case should Tj be allowed to exceed Tjmax
tav (sec)
600
500
400
300
200
100
Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of T jmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 12a, 12b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. I av = Allowable avalanche current. 7. T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25C in Figure 15, 16). tav = Average time in avalanche. 175 D = Duty cycle in avalanche = tav f ZthJC(D, tav ) = Transient thermal resistance, see figure 11) PD (ave) = 1/2 ( 1.3BVIav) = DT/ ZthJC Iav = 2DT/ [1.3BVZth] EAS (AR) = PD (ave)tav
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IRF1503S/IRF1503L
D.U.T
Driver Gate Drive
P.W.
Period
D=
Circuit Layout Considerations Low Stray Inductance Ground Plane Low Leakage Inductance Current Transformer
D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt
RG
dv/dt controlled by R G Driver same type as D.U.T. I SD controlled by Duty Factor "D" D.U.T. - Device Under Test
V DD
VDD
+ -
Body Diode
Forward Drop
Ripple 5%
ISD
* VGS = 5V for Logic Level Devices Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET Power MOSFETs
RD
V DS V GS RG 10V
Pulse Width 1 s Duty Factor 0.1 %
D.U.T.
+
-V DD
10% VGS
td(on) tr t d(off) tf
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IRF1503S/IRF1503L
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IRF1503S/IRF1503L
D2Pak Tape & Reel Information
TRR
1.60 (.063) 1.50 (.059) 4.10 (.161) 3.90 (.153)
1.60 (.063) 1.50 (.059) 0.368 (.0145) 0.342 (.0135)
TRL
10.90 (.429) 10.70 (.421) 1.75 (.069) 1.25 (.049) 16.10 (.634) 15.90 (.626) 4.72 (.136) 4.52 (.178)
FEED DIRECTION
NOTES : 1. COMFORMS TO EIA-418. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION MEASURED @ HUB. 4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
Data and specifications subject to change without notice. This product has been designed and qualified for Industrial market. Qualification Standards can be found on IRs Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. 12/02
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