Considerationsfora StandardizedTestfor PotentialInducedDegradationofCrystalline Silicon PVModules

2012PVMRW PeterHacke February29,2012

NREL/PR-5200-54581

NRELisanationallaboratoryoftheU.S.DepartmentofEnergy,OfficeofEnergyEfficiencyandRenewableEnergy,operatedby theAllianceforSustainableEnergy,LLC.

Majorcontributionsfrom:
SteveGlick RyanSmith MikeKempe SteveJohnston JoelPankow SarahKurtz KentTerwilliger DirkJordan SteveRummel AlanAnderberg BillSekulic

Motivation
Ohno!ourmodulesaredown40%, wethinkitispotentialinduceddegradation
anonymousmodulemanufacturer,2010 Overthepastdecade,therehavebeenobservationsofmodule degradationandpowerlossbecauseofthestressthatsystem voltagebiasexerts.

Moresensitivemodules Highersystemvoltage

Thisresultsinpartfromqualificationtestsandstandardsnot adequatelyevaluatingforthedurabilityofmodulestothelongterm effectsofhighvoltagebiasthattheyexperienceinfieldedarrays. Thistalkdealswithfactorsforconsideration,progress,and informationstillneededforastandardizedtestfordegradationdue tosystemvoltagestress.

Timelineforsystemvoltagedurability
Needforabetterstandardforsystemvoltagedurabilitybroughtup severaltimesinthelastdecades,butdidnotgettraction.Lackoffield data,proposedtestsoverlyharsh. IbroughtthisupagainintheFall2010WorkingGroup2(WG2)meeting (Kln)andgotasmallworkingtogether,butmostpeoplewereinthe processofgettingexperienceaboutsystemvoltageeffects. Spring2011WG2meeting(Shanghai),indicationsofincreasedurgency forastandard,assembledmorepeopleforthistaskteam. Fall2011WG2meeting(Montreal),presentedaninitialdraftfor comments. Presentday
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Goalsforastandard twosteps
1. Standalonetest(newstandard):
Systemvoltagedurabilitytestforcrystallinesilicon modules designqualificationandtypeapproval, submittedasaNewWorkItemProposaltoIEC,Dec. 2011.

2. IncorporatetestintoIEC61215
Seektoincorporateabovestandalonetestwithany necessarysupplementswithinIEC61215 addtestafterclause10.13,DampHeatTest1000h
underconsideration.

Designstandardforaclimate:Kppen climateclassification

Consider for standard: Humid subtropical, and Humid Oceanic. Need to design for the market. More stressful environments exist, and that should be noted in the eventual standard.

GROUPC:Temperate/mesothermal climates
Maritime/oceanic climates: (Cfb, Cwb, Cfc) Humid subtropical climates (Cfa, Cwa)

ExperimentalOverview
1) HV Test bed in Florida USA 2 module types fielded in February 2011 2) Chamber testing of the same 2 module designs tested in Florida 85% RH; 85C, 60C, 50C Pmax vs t 3) Comparison of failure rates for determination of acceleration factors and failure mechanisms for input into standardized test

Definitions
Electrochemicalcorrosion cSi Mon&Ross JPL,1985 Polarization cSi Swanson SunPower,2005

ElectroluminescenceofmcSimodulestringsindicating shuntinginthenegativeportionofacentermounted or floatingstring

S.Pingeletal.,PotentialInducedDegradationofSolarCellsandPanels,35thIEEEPVSC,Honolulu,2010,pp.28172822.

Delamination,corrosion aSi Otherpowerloss Wohlgemuth thinfilms BPSolar,2000

unpublished

?
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Definitions
Electrochemicalcorrosion cSi Mon&Ross JPL,1985 Polarization cSi Swanson SunPower,2005

Needsan unambiguous name

ElectroluminescenceofmcSimodulestringsindicating shuntinginthenegativeportionofacentermounted or floatingstring

S.Pingeletal.,PotentialInducedDegradationofSolarCellsandPanels,35thIEEEPVSC,Honolulu,2010,pp.28172822.

Delamination,corrosion aSi Otherpowerloss Wohlgemuth thinfilms BPSolar,2000

unpublished

?
9

Definitions thisstandardwillcover
Electrochemicalcorrosion cSi Mon&Ross JPL,1985 Polarization cSi Swanson SunPower,2005

ElectroluminescenceofmcSimodulestringsindicating shuntinginthenegativeportionofacentermounted or floatingstring

S.Pingeletal.,PotentialInducedDegradationofSolarCellsandPanels,35thIEEEPVSC,Honolulu,2010,pp.28172822.

Delamination,corrosion aSi Otherpowerloss Wohlgemuth thinfilms BPSolar,2000

unpublished

?
10

Definitions thisstandardwillcover
Polarization cSi Swanson SunPower,2005

ElectroluminescenceofmcSimodulestringsindicating shuntinginthenegativeportionofacentermounted or floatingstring

S.Pingeletal.,PotentialInducedDegradationofSolarCellsandPanels,35thIEEEPVSC,Honolulu,2010,pp.28172822.

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Systemvoltagedurability
DesignedtocovercSi MorethanjustPIDofconventionalcells/modules Polarization(likeSunPower) NonreversibleelementsofPID Rearjunctionbifacialcells.ECNbifacial/YingliPanda HITcells Framed/unframedmodulesofvarioustypes

Longtermviewforharmonizationwiththinfilm systemvoltagedurability

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Factorsfortest leakagecurrent
Voltagepotentialofactivelayer,andleakagefromthat voltagetogroundgoverndegradationinsusceptiblemodules
Circuitresistancefactors cuttingrelevantseriesRcutsdegradation
Glassface (H2O,conductivedirt) Glass(Nacontent) Framematerials, tapes,anddesign Interfaces Encapsulant

Groundingscheme (groundedvs.ungrounded)
T.J.McMahone,Prog.Photovolt:Res.Appl.2004;12:235248
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Testfactors
Voltage Mounting/grounding Humidity,surface conductivity Temperature
Power Loss vs. Position in String: Polarization, SunPower Modules
1 5% 0% %change in power -5% -10% -15% -20% -25% -30% -35% -40% Voltage position (1=negative, 9=most positive) 2 3 4 5 6 7 8 9

R . M. Swanson, The surface polarization effect in high-efficiency solar cells, PVSEC-15, Shanghai

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Testfactors
Voltage Mounting/grounding Humidity,surface conductivity Temperature

Completingthecircuittogroundinamanner representativeofmfg.modulemountingscheme Leakagecurrentmaybemeasuredasinindicatorof modulepackageresistance

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Testfactors
Voltage Mounting/grounding Humidity,surface conductivity Temperature
Photo:ErikEikelboom2011:10:17

Alfoil,carbonfilm,etc,forsurfaceconductivity +Quick/cheap +Goodscreeningtest Wontdifferentiatehumidityeffects (waterleachesNalimeglass) unclearhowitconnectstotexturedglass bypassesframeorlaminatemountsabilityto reducedegradation,limitingfixestoPID

From:C.R.Osterwald,SolarEnergyMaterials&SolarCells79(2003)2133 *Modulesthatlackaframeandusemountingpointsbondedtothebacksheetglass shownodamage[totheextenttested]. *Damageratescanbeslowedifleakagecurrentsthatarecausedbyvoltage potentialsbetweentheframeandtheinternalcircuitryarereduced.
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www.bangkoksolar.com

Testfactors
Voltage Mounting/grounding Humidity,surface conductivity Temperature
Module leakage vs. humidity

Surfaceconductivityofsodalimeglassvs.humidity
P.Hackeet.al.,25th EPVSEC,610September2010,Valencia,Spain

Becauseweneedtomeasurethe performanceofnotonlythemodule laminate,buttheframeormounts,the standardaswrittenuseshumidityforthe circuittoground.

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Testfactors
Voltage Mounting/grounding Humidity,surface conductivity Temperature
Degradation vs. time of mc-Si modules, -600 V, 85% RH

50C 60C

85C

RH=85%

P. Hacke et al., Testing and Analysis for Lifetime Prediction of Crystalline Silicon PV Modules Undergoing Degradation by System Voltage Stress, 38th IEEE PVSC, Austin, 2012

Temperature dependence, repeatable Arrhenius behavior over temperature range, unless alternate conduction paths exist
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Testlevels
Voltage Mounting/grounding Humidity,surface conductivity Temperature Systemvoltage,noweffectively governedbyIEC617302s partialdischargetest,notPID, generally Testatratedsystemvoltage
Maximumnameplatevalue(behindthe fence/utilitiesdontruntoULcode) Bothpolarities(ifnotpolarityisspecified) SlightaccelerationsinceactualoperatingV lower

D.Buemi,ThinFilmPVPowerstheNumber1GlobalSolar Integrator,davebuemi.com,accessedFeb22,2012

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Testlevels
Voltage Mounting/grounding Humidity,surface conductivity Temperature
Draftstandard:
Forcontinuousmetallicframesencasingthe perimeterofthemodule,thegroundterminalofthe highvoltagepowersupplyshallbeconnectedtoa modulegroundingpointofthemodule. If(1)thePVmoduleisprovidedorisspecifiedforuse withmeansformountingand(2)themoduleis designedandspecifiednottobeconnectedtoground, thensuchmethodofmountingthemoduleshallbe implementedtotheextentpossible.

http://www.solarframeworks.com SolarFrameWorksCo,BIPVCoolPly AccessedFeb22,2012 20

Testlevels
Voltage Mounting/grounding Humidity,surface conductivity Temperature

85%RHdampheatchamber,alevelthatchambers arecapableofholding,uniformly

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Testlevels
Voltage Mounting/grounding Humidity,surface conductivity Temperature

Whatlevelofstressinanacceleratedtestsreproduces wellthefailuremodesweseektotestfor? Howlongshoulditbestressedatthattemperature? Whatistheaccelerationfactor?

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Failuremodeinfieldedmodule
ModulemountedinFlorida,USAaftertenmonthswiththeactivelayerbiasedat 1500Vduringthedaydegradedto0.35Pmax_0

PL(inVoc) Dark=recombination

PL(inJsc) Light=seriesresistance

EL

Thermography

Seriesresistancelosses,asseeninchambertests,arenot yetobservedinthefield
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Stepstressfordeterminationoffailuremode
SiNx oxidation:notseeninfield! Optical

PIDrecombination EL PL(inVoc) Dark=recombination

Thermography

50C,50%RH 70C,70%RH Eachstep: 1000Vstress145h +1000Vrecovery145h (145hpreconditioningatT&RHlevel

85C,85%RH

Mixedmode Seriesresistance/recombination

PL(inJsc) Light=seriesresistance
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Performanceoftwomoduletypes
333days

InFlorida,USA 600Vapplied logarithmicallywith irradiance

Type1

Type2

Inchamber 85%RH 600V

Type2,50

Type2,60

Type2,85

Moredetailsat2012IEEEPVSC
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Performanceoftwomoduletypes
333days

InFlorida,USA 600Vapplied logarithmicallywith irradiance

Type1

Type2

Inchamber 85%RH 600V

ModuleType1:Acceptable performanceinthefield surviveswithlessthan5% powerdropinchamber with85%RH,60C,rated systemvoltage,for96h

Type2,50

Type2,60

Type2,85

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Performanceoftwomoduletypes
333days

InFlorida,USA 600Vapplied logarithmicallywith irradiance

Type1

Type2

Inchamber 85%RH 600V ModuleType2:5% powerdropin4934h inFloridaand12h in chamberat60 C, (consideredafailing module)

ModuleType1:Acceptable performanceinthefield surviveswithlessthan5% powerdropinchamber with85%RH,60C,rated systemvoltage,for96h

Type2,50

Type2,60

Type2,85

Moredetailsat2012IEEEPVSC
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Testlevels
Voltage Mounting/grounding Humidity,surface conductivity Temperature
Draftstandard: Thefollowingconditionsshallbeapplied: Chamberairtemperature60C 2C Chamberrelativehumidity85% 5%RH Testduration96h Voltage:moduleratedsystemvoltageandpolarities (onemoduleperpolarity)
Usecondition:Florida,USA,600VsimulatedarrayV Accelerationcondition:85%RH,Tasplotted Failure:0.95Pmax_0

AF=427at60C,85%RH Testduration,96h Fieldequivalent:4.7y

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Nextsteps:Testingatmultiplelabs
Determinereproducibility 23samplespercondition
Presumably85%RH60C,butconsideralternates forpostIEC61215tests NREL ASU letusknowifyouareinterested!

5labs

Samplesfrom3manufacturers

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Thankyou