Ninl Spec (1) - For Sms Lab (Imported) On 28.10.09

NEELACHAL ISPAT NIGAM LIMITED
TECHNICAL SPECIFICATION FOR LABORATORY EQUIPMENT
(PHASE II) IMPORTED EQUIPMENT

03. LABORATORY FACILITIES (IMPORTED) List of equipme t fo! "#$o!#to!% f#&i"ities (P'ASE(II) S". )o. 03.01. 03.02. 03.03. 03.0 . 03.0#. 03.0&. 03.0(. Des&!iptio X-ray fluorescence spectrometer (sequential type) Optical emission spectrometer Simultaneous carbon-sulphur analyzer Simultaneous o!y"en-nitro"en analyser $utomate% hy%ro"en %eterminator S'in" "rin%in" mill )riquettin" press *t%.+ )o. 1 2 1 1 1 1 1
Laboratory Facilities (Imported)

2009 MEC ! Limite"# $ll %ig&ts %eser'e"(
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03. List of equipme t # , $!o#, spe&ifi&#tio fo! "#$o!#to!% f#&i"ities ( P-#se ( II ) S". )o. 03.0 . Des&!iptio /0!#% f"uo!es&e &e spe&t!omete! (seque ti#" t%pe) *he equipment shall be use% for sequential analysis of chemical constituents in the samples of hot metal+ burnt lime+ calcine% %olomite+ iron ore lump+ spon"e iron+ )O, sla" + Si--n+ ,e-Si+ ,e--n+ ,e . *i+ ,e-/+ ,e-0b+ ,e-) an% other ferro-alloys in the steel ma1in" unit of an inte"rate% steel plant. ,or analysis of hot metal samples+ typical precision of analysis of the offere% equipment shall be in line 'ith the stipulations of $S*- 2-322+ (latest e%ition). *he X-ray fluorescence spectrometer
shall be pro3i%e% 'ith facilities for analysis of C#!$o # , Bo!o + hi"h alumina bric1s+ lo' alumina bric1s+ silica bric1s+ la%le sla"+ sli%e "ate san%+ continuous castin" po'%er+ petroleum co1e ash+ fly ash+ S-S slu%"e+ lime stone+ %olomite either by pro3i%in" t'o number of fi!e% channels for %etermination of 4arbon an% )oron + hi"h alumina bric1s+ lo' alumina bric1s+ silica bric1s+ la%le sla"+ sli%e "ate san%+ continuous castin" po'%er+ petroleum co1e ash+ fly ash+ S-S slu%"e+ lime stone+ %olomite or throu"h pro3ision of separate crystals for analysis of 4arbon an% )oron + hi"h alumina bric1s+ lo' alumina bric1s+ silica bric1s+ la%le sla"+ sli%e "ate san%+ continuous castin" po'%er+ petroleum co1e ash+ fly ash+ S-S slu%"e+ lime stone+ %olomite. 2lement-'ise 5o'er 5imit of 6etection (5.5.6.) fi"ures
*t%.+ )o. .
an% accuracy fi"ures for X-ray ,luorescence Spectrometer at Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page 2 of 40


S". )o. Des&!iptio %ifferent concentration le3els shall be furnishe% by the ten%erer. $ typical analytical pro"ram for the equipment is in%icate% in table-7 an% table 77 of this specification. *he X-ray fluorescence spectrometer shall be of 'a3elen"th %ispersi3e type an% shall consist of hi"h 3olta"e X-ray "enerator+ spectrometer 'ith mounte% optics+ countin" an% control electronics+ computer+ laser printer+ colour "raphic monitor+ multime%ia 1eyboar%+ 'ater chiller+ etc. as a composite unit. *he hi"h 3olta"e "enerator shall supply stabilise% po'er supply to X-ray tube. -ain components of the hi"h 3olta"e X-ray "enerator shall be hi"h 3olta"e stabilise% po'er supply system+ filament po'er supply system+ safety circuits+ X-ray tube 'ith coolin" arran"ement+ etc. *he selection of parameters shall be automatic throu"h computer. *he X-ray tube shall be 8h tar"et 'ith )eryllium 'in%o' of (# micron or less thic1ness 'ith hi"h purity 8ho%ium tar"et an% pro3i%e% 'ith requisite 0os. of filters for remo3al of interferin" lines an% for impro3ement in lo'er limit of %etection. *ube life+ to be "uarantee%+ shall be specifie%. 7t shall be possible to store X-ray tube un%er normal laboratory con%ition. 9ser:s certificate re"ar%in" tube life shall be furnishe%. *he %esi"n of the spectrometer shall pro3i%e 3ery close couplin" bet'een the X-ray tube ano%e an% sample. *he Spectrometer chamber shall be maintaine% at a hi"h le3el of 3acuum Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page ) of 40
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S". )o. Des&!iptio an% shall house collimator+ "oniometer mounte% 'ith crystals an% %etectors+ multi position area limitin" %iaphra"m e!chan"er (mas1)+ crystal chan"er 'ith crystals fitte%. *he equipment shall ha3e automatic 10 (minimum) sample chan"er an% sample chamber un%er 3acuum. *he spee% of rotation of the sample shall be sufficient to suppress the effect of non- homo"enities in the specimen. 7t shall ha3e facility for quic1 chan"eo3er of samples. *he "oniometer shall be fully automatic an% microprocessor controlle%. *he equipment shall be capable of analysin" 2# mm to #0 mm %iameter samples. *t%.+ )o.
0ecessary har%'are an% soft'are for remote %ia"nostic facility shall be pro3i%e%. *he combination of 1/ an% m$ 3alues for ;* "enerator shall be selecte% by the equipment supplier < manufacturer+ 1eepin" in 3ie' the analytical pro"ram+ the precision an% accuracy of analysis. Selection of slit 'i%th+ crystal+ %etector+ collimator+ primary beam filter (*i)+ flo' counter+ 'in%o' (of minimum thic1ness)+ etc. shall be optimum to pro3i%e ma!imum intensity an% spectral resolution. *he repro%ucibility+ precision an% accuracy of analysis for each element shall be finishe% in tabular form. *he e!citation con%itions+ the "eometry an% X-ray optics of the spectrometer shall pro3i%e for lar"e si"nal to bac1"roun% ratio+ stable an% repro%ucible results an% lo' %etection limits

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S". )o. Des&!iptio 'ith shortest measurin" time. *he equipment shall be pro3i%e% 'ith electronic %e3ices li1e pulse hei"ht analyser+ scalar 'ith hi"h countin" capacity+ timer+ etc. *he spectrometer shall ha3e built-in computer 'ith 'in%o's base% soft'are to control instrument parameters+ e3aluate an% correct the analysis results+ select pre-set analytical pro"ramme an% print out analytical results+ soft'are shall also ha3e capability for transmission of results to an upper computer. It s-#"" $e p!o2i,e, 3itBOF "e2e"0II #utom#tio s%stem. $ suitable 'ater chiller for coolin" of the X-ray tube shall be pro3i%e% an% shall 'or1 at #0=4. *he chiller 'ater pump must be sin"le phase an% separate 'irin" to be pro3i%e% from the 1# >/$ 9?S. *he instrument shall be calibrate% at the users plant 'ith samples pro3i%e% by the user. ;o'e3er+ # sets of international 48- stan%ar%s to be supplie% alon" 'ith the equipment for each of the matri!+ in%icate% in *able-7 an% also for calibration at user site. Sample hol%er+ mas1s+ etc. shall be inclu%e% in the scope of supply. Supply of the spectrometer shall be complete in e3ery respect inclu%in" 2 0os. of ?-10 "as shall be pro3i%e% 'ith its purity certificate @ e!plosi3e certificate+ fille% - in cylin%er 'ith re"ulators+ 3olta"e stabiliser of Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page * of 40
*t%.+ )o.
e&ess#!% f#&i"ities (&ompute!
i te!f#&i 4) so t-#t it is #$"e to t!# smit # #"%ti&#" !esu"ts ,i!e&t"% to


S". )o. Des&!iptio require% capacity+ A# >/$ 9?S+ mechanical tool set (1 0o.) for re"ular maintenance an% initial 3 months consumption etc. *hese items shall be supplie% from in%i"enous sources. M#5o! te&- i&#" p#!#mete!s *he equipment shall "enerally conform to the follo'in" technical parameters. X-ray "enerator X-ray tube B )eryllium 'in%o' of (# micron or less thic1ness 'ith hi"h purity 8ho%ium tar"et preferably 'ith ceramic insulation an% tapere% nose+ output 6.0 78 (mi .). 4ombination of e!citation potential up to &0 1/ an% filament current up to 12# (min) m$ but hi"her filament current is preferre%. *he supplier shoul% %emonstrate performance of X8, at %ifferent m$ an% 1/ 1C 'ith settin". *t%.+ )o.
*he ten%erer shall "uarantee for the tube life an% pro3i%e certificate for a minimum perio% of 12 months. *he X-ray tube shall be manufacture% by the supplier of the X-ray spectrometer. X-ray tube coolin" B 4lose% circuit+ usin" %eionise% 'ater ;* "enerator B ,ull 'a3e rectification+ ratin" .0 1C (min.) 120 m$ (min.)+ stability of tube current an% tube 3olta"e shall be D0.0001E for D1E fluctuations in input 3olta"e an% current. 7t shall support iso-'att s'itchin". Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page + of 40


S". )o. Des&!iptio Spectrometer chamber B X-ray beam 23acuation system 4rystal B /acuum path B 8otary 3acuum pump 'ith oil mist filter system B $ combination of minimum ei"ht 0o. of %ifferent crystals (e!cept those use% for fi!e% channels) li1e 5i, (200)+ 5i, 220+ ?2*+ F2+ *$?+ F2 111 etc.+ in line 'ith the requirement of the analytical pro"ram an% other synthetic crystals of latest technolo"y.. Out of the ei"ht crystals t'o or more crystals must be co3ere%. 6etector B $ combination of minimum three %etectors (,lo' proportional counter+ Scintilation counter+ 7nert "as seal% proportional counter) 'ith countin" electronics for optimum co3era"e of all elements in the ran"e of )oron to 9ranium. ,-?4 'ith "as %ensity stabiliser for li"ht elements an% S4 for hea3y element. Foniometer co3era"e *emperature B 0o - 1 G o (2) (min.) B ?76 control to 1eep the temperature of chamber 'ithin D 0.0# o 4 for ambient temperature ran"e of 1G o4 to 2G o4. S#mp"e -# ,"i 4 s%stem Sample type -a!imum sample %imension Laboratory Facilities (Imported)
*t%.+ )o.
9 B B Soli% @ briquette% po'%er #0 mm %ia ! 30 mm hei"ht
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S". )o. Des&!iptio Sample spin B 30 rpm ( typical ) *t%.+ )o.
Cou ti 4 # , &o t!o" e"e&t!o i&s 7tems to be controlle% B$ll mechanical motions+ controls+ linearity of countin" up to 1.# million counts per secon% or better an% %ata transfer. 6ea% time correction ,ast an"ular rotation 7nte"ration time -emory bac1-up Compute! s%stem (-#!,3#!e ) 7t shall be pro3i%e% 'ith 4ore 2 6uo < ?entium processor 'ith latest 3ersion alon" 'ith 1( inch *,* colour monitor+ ;66 of 2#0 F) an% 6/6 Criter < 8ea%er. 7t shall be pro3i%e% 'ith full 1ey boar% 'ith a%%itional function 1eys+ mouse+ 8S 2324 interface+ -icrosoft Cin%o's of latest 3ersion+ etc. Compute! soft3#!e *he soft'are pac1a"e shall be comprehensi3e an% shall inclu%e all pro"rammes 'hich are necessary for control of equipment+ analysis+ online an% off-line %ata processin"+ report ma1in" an% %ata transmission+ etc. 7n "eneral+ it shall inclu%e. - )ac1 "roun% correction @ %rift correction Laboratory Facilities (Imported)
B )etter than 20 nano- secon%s B H20000<minute or better B 0.1 . III sec B *hrou"h stan%-by battery
;i"h repro%ucibility of an"ular position B D0.00020 or better
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S". )o. Des&!iptio - 7nternal stan%ar% correction @ matri! correction ?rocess parameter calculations Stan%ar%isation @ calibration 8e"ression analysis ?reparation of calibration cur3es 8epeat analysis *t%.+ )o.
- 8eportin" - *ransmission to e!ternal 4?9 Stan%ar% less analysis ?ea1 search+ pea1 i%entification+ ?;$ a%Justment+ selection of output for chart+ etc. 6ialo"ue functions 2quipment monitorin" Job *heoretical matri! calculation - $ll mounte% electrics an% instrumentations alon" 'ith computer har%'are /acuum pump 7nterface an% soft'are for %ata transmission up%ate% free of char"e %urin" 'arranty - *he license% copy of the X8, soft'are shall be pro3i%e% in 468O- alon" 'ith the necessary help Spares for t'o years of operation an%
*he equipment shall be quote% alon" 'ith the follo'in" items B
- 46 soft'are for ser3icin" of the equipment+ the soft'are shall be

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S". )o. Des&!iptio maintenance as recommen%e% by the manufacturer the manufacturer samples. Suitable require% stan%ar%s (settin" up type) are to be inclu%e% in the supply. Semi quantitati3e analysis also shoul% co3er the ran"e of elements form ) to 9. 8emote %ia"nostic pac1a"e 'ith suitable soft'are for accessin" the manufacturer for remote ser3icin". *he equipment<computer shoul% be equippe% 'ith suitable soft'are an% har%'are li1e mo%em an% < or internet net'or1 boar% < car%+ etc. %ifferent elements. 8#!!# t% # , suppo!t *he instrument an% its accessories < au!iliaries li1e 4hiller+ ;y%raulic ?ress+ /ibratory %isc mill+ 9?S+ etc. shoul% ha3e minimum fi3e years 'arranty. Laboratory Facilities (Imported)
*t%.+ )o. 4ommissionin" spares as recommen%e% by Stan%ar% accessories. 7nitial fill of oil an% "rease an% consumables
for three months of operation after commissionin" Semi quantitati3e < stan%ar% less soft 'are pac1a"e is to be inclu%e% for analysis of non-routine or un1no'n
,acility for settin" quality control limits for
*he spectrometer an% its all parts shoul%

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S". )o. Des&!iptio ha3e inspection certificate. of the equipment. 4omplete set of %ra'in"s of 3acuum pump+ spectrometer ('ith 3arious O-rin"s mar1e% on it) shoul% be supplie% alon" 'ith the equipments. "i3en. elements in each 6e%icate% 8, earthin" to be pro3i%e%. 7nstallation+ commissionin" an% I st#""#tio : Commissio i 4: Demo st!#tio 9 %emonstration shoul% be %one an% trainin" shoul% be "i3en. $ll "roup mentione% in the table-1 shoul% be ?re-requisites material shoul% be supplie%. *rainin" on operation+ maintenance an% calibration to be pro3i%e% at site. 5ist of users (?referable in steel plant) since year 2000 to be pro3i%e%. C#"i$!#tio : st# ,#!,i;#tio # , Routi e A #"%sis. for installation an% %emonstrate% for as1e% ran"e. commissionin" shoul% "i3en after placement of or%er. ,8 earthin" ?re-installation %etails 'ith necessary instructions to be pro3i%e%. 6etaile% electrical specification to be Supplier shoul% "i3e "uarantee that the spare parts 'ill not be obsolete for ne!t 1# years from the %ate of supply *t%.+ )o.

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S". )o. Des&!iptio 7n%i3i%ual calibration for each element+ co3erin" the entire ran"e for each "roup mentione% in the *able-7 an% *able- 77 ha3e to be pro3i%e%. $t least fi3e stan%ar% samples ha3in" certificate% shoul% be incorporate% for each "roup. Stan%ar% sample use% for calibration shoul% be -); or )$S ma1e certifie% 8eference -aterial. ?referably each "roup shoul% ha3e stan%ar% of same ma1e. plotte% foun% ,in%in" correction coefficient ;ar% copy for each "roup calibrate%+ 'ith abo3e information to be pro3i%e%. $fter stan%ar%ization the instrument shall be han%e% o3er for routine analysis of anlytes. 03.0 Opti&#" emissio spe&t!omete! <
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*t%.+ )o.
Stan%ar% calibration soft'are shoul% capable of %oin" follo'in" Jobs. ?lottin" of calibration cur3es ,in%in" re"ression coefficients -easurin" ra' intensities ?ro3i%in" ori"inal an% calculate% concentration of stan%ar% samples use% for calibration Stan%ar% error of calibration for each "raph Stan%ar% sample ha3in" ma! %e3iation to be



S". )o. < Des&!iptio *he equipment shall be in a steel plant. 7t computer controlle%+ sin"le < composite *t%.+ )o.
equipment+ floor mounte% type an% suitable for in%ustrial application shall be use% for fast an% accurate analysis of 4u+ 4r+ chemical constituents in steel samples 'ith hi"h accuracy an% precision for simultaneous measurement of elements (4+ -n+ ?+ S+ Si+ $l+ 0i+ -o+ /+ C+ *i+ )+ 0b+ 4o+ $s+ ?b + Sn+ Kn+ Kr+ Sb+ -"+ *e+ 4a+ )i+ 0 + ) from trace le3el to concentration le3el ( in concentration E) in steel lollypop ( %isc-pin type ) samples. *he spectrometer shall be capable of analysin" #&i, so"u$"e an% #&i, i so"u$"e aluminium an% calcium separately. *ypical analytical pro"ram for this spectrometer is in%icate% in *able-777 of this specification. 7t shall also be capable of analysin" small %iameter ro% + 'ire+ scre'+ an% nut + etc. 'ith necessary a%opters. *he spectrometer shall be %esi"ne% to ta1e care of the e!ternal temperature an% humi%ity fluctuations an% shall pro3i%e stable an% accurate analytical results. 7t shall be pro3i%e% 'ith facility for %ata transmission. 7t shall be fully microprocessor ( ?.4. ) controlle%+ %irect rea%in" type an% the entire operation from initiation of spar1 to printin" of analytical results shall be fully automatic. 8ecommen%e% precision requirements of the offere% equipment shall be in line 'ith the stipulations of $S*- . 2 100I (latest re3ision). 7t shall be pre-calibrate%+ co3erin" the entire ran"e from traces to hi"her concentration+ a3ailable in the international stan%ar%s.

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S". )o. Des&!iptio *he equipment shall consist of the follo'in" maJor components as a combine% unit B Spar1 unit Source unit Optical system $nalytical channels Spectrometer control an% %ata processin" system 4olour monitor >ey boar% an% mouse ?rinter *he spar1 stan% shall consist of a sample hol%in" %e3ice+ a counter electro%e an% mechanism for a%Justin" the analytical "ap. 7t shall be open < close $r"on flushe% 'ith thoriate% *un"sten electro%e to "enerate hi"h 3olta"e spar1 e!citation. shape an% size of samples. *he source unit shall be pro3i%e% 'ith e!citation parameters confi"ure% accor%in" to the analytical pro"ramme. *he optical system of the spectrometer shall consist of entrance slit+ e!it slits+ photomultiplier tubes+ etc. *he optical system shall be stabilise% a"ainst fluctuation in temperature. *he spectrometer shall ha3e hi"h. resolution "ratin" 'ith 3&00 "ro3es<mm or more. *he optical system shall either be a 3acuum optics or inert "as fille% optics an% shall ha3e a focal len"th of (#0 mm ( minimum ) + base% on 8o'lan%:s circle. 7t shall be pro3i%e% 'ith ?hoto -ultiplier *ube ( ?-* ) < 4har"e 4ouple Laboratory Facilities (Imported)
*t%.+ )o.
*he sample stan% shall be flushe% 'ith accommo%ate o%%
an inert "as li1e ar"on. 7t shall be %esi"ne% to
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S". )o. Des&!iptio 6e3ice ( 446 ) base% %etector system or a combination of these t'o %etector system+ 6i"ital 4urrent 4ontrol Source an% facility for *ime 8esol3e% Spectroscopy for better precision+ impro3e% %etection limits+ etc. *he analytical 'a3elen"th ran"e shall be from .<0 m to =00 m o! mo!e: in line 'ith the analytical pro"ram . 6epen%in" on the analytical pro"ramme+ the number of channels shall be %eci%e% by the ten%erer. It s-#"" $e p!o2i,e, 3ite&ess#!% f#&i"ities ( &ompute! s%stem. *t%.+ )o.
i te!f#&i 4) so t-#t it is #$"e to t!# smit # #"%ti&#" !esu"ts ,i!e&t"% to BOF: SR> # , CCP "e2e" II #utom#tio
*he spectrometer shall be pro3i%e% 'ith 1(L colour monitor. *he %ata printer shall be laser type. *he operatin" me%ia shall be Cin%o's X? or latest 3ersion. *he equipment shall be pro3i%e% 'ith facility for %etermination of aci% soluble an% aci% insoluble aluminium an% calcium. *he soft'are pac1a"e shall be Cin%o' base% an% shall inclu%e all pro"rammes 'hich are necessary for control of equipment+ analysis+ %ata processin"+ report ma1in" an% %ata transmission. 7t shall inclu%e B Selection of proper spectrometer parameters an% automatic selection of pro"rams Selection of correct calibration cur3e Selection of stan%ar%isation mo%e+ up%atin" of calibration $utomatic s'itchin" o3er of spectral lines accor%in" to their concentration ran"es

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S". )o. Des&!iptio -
*t%.+ )o.
6rift correction or a%%iti3e an% multiplicati3e inter elementary correction an% bac1"roun% calculation $nalysis of percenta"e composition an% print out of analytical results 4alculation of stan%ar% %e3iations Stora"e of analytical results $%3ice of incomplete analysis or other errors $3era"e calculation 'ith user control 4alculation for a%%itional statistical %ata ( S6 + 8S6 ) -atrices correction $utomatic chec1in" of repro%ucibility ,la""in" of results beyon% calibration ran"e )a% sample %etection system *ransmission of result to remote printers < terminals $utomatic < user controlle% %ata transmission to e!ternal computers
*he scope of supply shall inclu%e the follo'in" itemsB 7nterface an% soft'are for transmission of analytical results $r"on purifier (sircal) 4onsumables for t'enty four months of operation after commissionin"+ as recommen%e% by manufacturer inclu%in" electro%es+ electro%e cleanin" brush+ 3acuum "rease+ lens+ printer paper+ etc. *ool 1it ( 1 set ) + containin" set of scre' %i3ers+ $llen 1eys+ spanners+ sol%er iron + etc. $r"on cylin%er (2 0os.) purity II.II#E 'ith pipin"s+ re"ulators an% manifol%s ( all 2 0os. ) $r"on purification an% pur"in" system in line 'ith the international < manufacturer stan%ar% Set of international spectro- chemical stan%ar%s ( reference
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S". )o. Des&!iptio sample) ( )$S stan%ar%s)+ co3erin" the analytical pro"ramme+ in%icate% in *able-777. One set of set . up stan%ar% for stan%ar%ization an% re calibration ?ersonal 4omputer ( 4ore 2 6uo < latest processor ) 'ith 1( inch *,* colour monitor + ;66 of 1&0 F) or more an% 6/6 C<8 9?S system for optical emission spectrometer 9?S ( 1.0 1/$ or more ) for ?4+ monitor an% printer 6- printer + $3 size *ool 1it 'ith 6-Stan%ar% samples for calibration for ma!imum an% minimum concentration ran"e as per analytical pro"ramme shall be supplie% in line 'ith the rele3ant $S*-<)S stan%ar%. 4omplete set of electrical %ia"rams (in 2n"lish lan"ua"e) of the instrument+ its accessories an% printe% circuit boar%s shoul% be "i3en alon" 'ith the instrument. 8#!!# tee # , suppo!t *he instrument a% its accessories < au!iliaries shoul% ha3e minimum fi3e years 'arranty. *he spectrometer an% its all parts shoul% ha3e inspection certificate from its principal. Supplier shoul% "i3e "uarantee that the spare parts 'ill not be obsolete for ne!t 1# years operation an% Ser3ice -anuals B full sets in 2n"lish shoul% be "i3en alon" 'ith the instrument. I st#""#tio : Commissio i 4: Demo st!#tio 9 7nstallation+ commissionin" an% %emonstration shoul% be %one an% trainin" shoul% be "i3en. $ll elements in each "roup mentione% in the *able-777 shoul% be %emonstrate% for as1e%
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S". )o. Des&!iptio ran"e. ?re-requisites for installation an% commissionin" shoul% be "i3en after placement of or%er. *rainin" on operation+ maintenance an% calibration to be pro3i%e% at site. 5ist of users (?referably in steel plant) since year 2000 to be pro3i%e%. C#"i$!#tio : St# ,#!,i;#tio # , Routi e A #"%sis 9 7n%i3i%ual calibration for each element+ co3erin" the entire ran"e for each "roup mentione% in the *able-777 has to be pro3i%e%. $t least fi3e stan%ar% samples ha3in" certificate% shoul% be incorporate% for each "roup. Stan%ar% sample use% fro calibration shoul% be -); or )$S ma1e 4ertifie% 8eference -aterial. ?referably each "roup shoul% ha3e stan%ar%s of same ma1e. $fter stan%ar%ization the instrument shall be han%e% o3er for routine analysis of anlytes. 03.0 3 Simu"t# eous &#!$o 0su"p-u! # #"%;e! 7t shall be microprocessor controlle% an% shall be use% for rapi%+ accurate an% simultaneous %etermination of carbon an% sulphur content in blast furnace hot metal+ steel samples+ ferro-alloys+ 4opper-alloys+ $luminium alloy+ 4arbi%es+ ceramics+ san%+ ores+ etc. 7t shall basically consist of hi"h po'er in%uction furnace+ analyser an% control console. $nalytical results shall appear %irectly in 'ei"ht percent of carbon an% sulphur. *he %etection metho% shall be infra-re% absorption for both carbon an% sulphur. B!o#, p#!#mete!s of equipme t Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page 1- of 40
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S". )o. Des&!iptio 8an"e ('ith 1" sample) 4arbon B 0.& ppm to &.00E Sulphur B 0.& ppm to 0. 0E P!e&isio 4arbon Sulphur B 0.3 ppm or 0.#E 8S6+ 'hiche3er is "reater B 0.3 ppm or 0.#E 8S6+ 'hiche3er is "reater *t%.+ )o.
8ea%ability B 0.001 ppm *he equipment shall be quote% alon" 'ith the follo'in" itemsB manufacturer 4onsumables < operatin" supplies require% for 1000 analyses+ as recommen%e% by the manufacturer *'o (2) 0os. of "as cylin%er+ one each for o!y"en (purity II.#E) an% instrument quality compresse% air 'ith pipin"+ re"ulator an% manifol%. 4alibration samples One 0o. sample cuttin" %e3ice for cuttin" of pin portion (1.0" sample) from lollypop sample+ 'ith abrasi3e %isc 1it+ recommen%e% cuttin" 'heel Silicon 4arbi%e to re%uce heat "eneration. 0 Laboratory Facilities (Imported)
7nterface an% soft'are for %ata transmission Spares for 2 years of operation an% maintenance+ as recommen%e% by the manufacturer 4ommissionin" spares+ as recommen%e% by the
Stan%ar% accessories an% items as recommen%e% by the manufacturer
/olta"e stabiliser of require% capacity (in%i"enous

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S". )o. Des&!iptio ma1e) $ny other item 'hich is not mentione% in this specification but is require% for smooth an% proper functionin" of the equipment for the inten%e% purpose. *he %eterminator must incorporate must incorporate pro"rammable automatic 6ual Kone cleanin" mechanism for both -etal ,ilter an% combustion tube remo3al 3acuum cleaner en3ironment. *he equipment shall be complete in all respects inclu%in" cablin" an% special earthin" if require% It s-#"" $e p!o2i,e, 3it- e&ess#!% f#&i"ities (&ompute! i te!f#&i 4) so t-#t it is #$"e to t!# smit # #"%ti&#" !esu"ts ,i!e&t"% to BOF: SR> # , CCP "e2e" II #utom#tio s%stem. 8#!!# tee # , Suppo!t. *he instrument an% its accessories < au!iliaries shoul% ha3e minimum fi3e years 'arranty. *he spectrometer an% its all parts shoul% ha3e inspection certificate from its principal. Supplier shoul% "i3e "uarantee that the spare parts 'ill not be obsolete for ne!t 1# years from the %ate of supply of the equipment. Operation an% ser3ice -anuals alon" 'ith the instrument. Laboratory Facilities (Imported)
*t%.+ )o.
full sets in 2n"lish shoul% be "i3en
Page 20 of 40


S". )o. Des&!iptio *t%.+ )o.
I st#""#tio : Commissio i 4: Demo st!#tio 9 7nstallation+ commissionin" an% %emonstration shoul% be %one an% trainin" shoul% be "i3en. $ll elements in each "roup mentione% in )oar% ?arameters of 7nstrument shoul% be %emonstrate% for as1e% ran"e. ?re-requisites for installation an% commissionin" shoul% be "i3en after placement of or%er. *rainin" on operation+ maintenance an% calibration to be pro3i%e% at site. 5ist of users (?referably in steel plant) since year 2000 to be pro3i%e%. C#"i$!#tio : St# ,#!,i;#tio # , Routi e A #"%sis 9 7n%i3i%ual calibration for each element+ co3erin" the entire ran"e for each "roup mentione% in the )oar% ?arameters of 7nstrument has to be pro3i%e%. $t least fi3e stan%ar% samples ha3in" certificate shoul% be incorporate% for each "roup. Stan%ar% sample use% for calibration shoul% be -); or )$S ma1e 4ertifie% 8eference -aterial. $fter stan%ar%ization the instrument shall be han%e% o3er for routine analysis of anlytes. 03.0 6 Simu"t# eous o?%4e 0 it!o4e # #"%se! *he equipment shall be use% for rapi%+ accurate an% simultaneous Laboratory Facilities (Imported)
Page 21 of 40


S". )o. Des&!iptio %etermination of o!y"en an% nitro"en content in steel samples. *he analytical operation of the equipment shall be microprocessor controlle% an% analytical results shall appear %irectly in 'ei"ht percent of o!y"en an% nitro"en. *he equipment shall basically consist of the follo'in" main 2lectro%e furnace $nalytical unit 4ontrol console unitsB *t%.+ )o.
*he electro%e furnace shall be able to "enerate uniform an% controllable temperature up to 3000o4. 7t shall be pro3i%e% 'ith appropriate sensors an% microprocessor electronics 'hich shall ensure repro%ucible fusion con%itions for each sample. *he electro%e system shall be %esi"ne% in such a 'ay that only the electro%e tip assembly nee%s replacement in case of occurrence of 'ear. *he crucible shall be raise% pneumatically to ensure uniform contact pressure 'ith the upper electro%e. *he electro%e furnace shall be pro3i%e% 'ith soli% state in%icators at the front panel for important electrical parameters. 2!ternal chiller for the furnace shall be offere% as an optional item. *he analytical unit shall contain the basic analytical system inclu%in" a thermal con%ucti3ity %etector for nitro"en %etermination an% an infra-re% %etector for o!y"en %etermination+ a "as flo' system 'ith controllers+ an inte"ral balance 'ith automatic 'ei"ht compensation an% all the instrument electronics. *he control console shall control the instrument functions throu"h touch Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page 22 of 40


S". )o. Des&!iptio 1ey boar% an% shall consist of 3isual %isplay unit for %irect %i"ital %isplay of o!y"en an% nitro"en content+ operatin" calibration an% ser3ice information+ automatic printer for permanent recor% of o!y"en an% nitro"en content+ etc. *he equipment shall ha3e automatic-cum-manual calibration facility. *he calibration shall not 3ary more than 1E in a 'ee1. *he equipment shall ha3e an au%io alarm system 'hich shall %isplay the cause of alarm an% the analytical cycle 'oul% not function till the cause of the alarm is rectifie%. M#5o! p#!#mete!s of t-e equipme t R# 4e ('ith 1" sample) O!y"en 0itro"en P!e&isio O!y"en 0itro"en B B B B 0.0# ppm to 1E 0.0# ppm to 0.#E 0.02# ppm or 0.#E 8S6+ 'hiche3er is "reater 0.02# ppm or 0.#E 8S6+ 'hiche3er is "reater *t%.+ )o.
*he equipment shall be quote% alon" 'ith the follo'in" itemsB 7nterface an% soft'are for %ata transmission Spares for 2 years of operation an% maintenance+ as recommen%e% by the manufacturer 4ommissionin" spares+ as recommen%e% by the manufacturer 4onsumables < operatin" supplies + require% for 1000 analyses+ as recommen%e% by the manufacturer Si! numbers of "as cylin%er+ t'o each for nitro"en (purity II.IIE)+ carbon %io!i%e (purity II.II#E) : helium (purity
Page 2) of 40



S". )o. Des&!iptio II.II#E) an% instrument quality compresse% air 'ith pipin"+ re"ulators an% manifol%s. 4alibration samples One 0o. of sample cuttin" %e3ice for cuttin" of pin portion ( 1.0 " sample ) from lollypop sample+ 'ith abrasi3e %isc 1it. 8ecommen%e% cuttin" 'heel is Silicon 4arbi%e to re%uce heat "eneration. *'o 0os. of special type of scissor (for cuttin" of sample 'ithout heat "eneration) shall also be offere%. *'o 0os. of special type of file to remo3e impurities from the sample surface+ for sample preparation Stan%ar% accessories an% items as recommen%e% by the manufacturer /olta"e stabiliser of require% capacity (in%i"enous ma1e) $ny other item 'hich is not mentione% in this specification but is require% for smooth an% proper functionin" of the equipment for the inten%e% purpose. *he supply shoul% inclu%e pro"rammable automation cleaner for cleanin" both 5o'er @ 9pper electro%es simultaneously after each sample analysis. *he equipment as a 'hole an% analysis proce%ure shall conform strictly to latest $S*- specification. *he instrument shall be supplie% 'ith a set of international stan%ar% samples an% a number of settin" up samples (S9S) an% control stan%ar%s. *he instrument shall be factory calibrate% an% the %ata of the calibration shall be submitte% before pac1in" of the instrument of facilitate the user for conformin" the accuracy+ ran"e+ result
Page 24 of 40
*t%.+ )o.



S". )o. Des&!iptio format etc. *he instrument shall ha3e multi-point calibration facility. *he equipment shall be complete in all respects inclu%in" cablin" an% special earthin" if require% an% a set of international stan%ar% samples for calibration. It s-#"" $e p!o2i,e, 3it- e&ess#!% f#&i"ities ( &ompute! i te!f#&i 4) so t-#t it is #$"e to t!# smit # #"%ti&#" !esu"ts ,i!e&t"% to BOF: SR> # , CCP "e2e" 0II #utom#tio 8#!!# tee # , Suppo!t. *he instrument an% its accessories < au!iliaries shoul% ha3e minimum fi3e years 'arranty. *he spectrometer an% its all parts shoul% ha3e inspection certificate from its principal. Supplier shoul% "i3e "uarantee that the spare parts 'ill not be obsolete for ne!t 1# years from the %ate of supply of the equipment. Operation an% ser3ice -anuals alon" 'ith the instrument. I st#""#tio : Commissio i 4: Demo st!#tio 9 7nstallation+ commissionin" an% %emonstration shoul% be %one an% trainin" shoul% be "i3en. $ll elements in each "roup mentione% in )oar% ?arameters of 7nstrument shoul% be %emonstrate% for as1e% ran"e. ?re-requisites for installation an% commissionin" shoul% be "i3en after Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page 2* of 40
*t%.+ )o.
s%stem.
full sets in 2n"lish shoul% be "i3en


S". )o. Des&!iptio placement of or%er. *rainin" on operation+ maintenance an% calibration to be pro3i%e% at site. 5ist of users (?referably in steel plant) since year 2000 to be pro3i%e%. *t%.+ )o.
C#"i$!#tio : St# ,#!,i;#tio # , Routi e A #"%sis 9 7n%i3i%ual calibration for each element+ co3erin" the entire ran"e for each "roup mentione% in the )oar% ?arameters of 7nstrument has to be pro3i%e%. $t least fi3e stan%ar% samples ha3in" certificate shoul% be incorporate% for each "roup. Stan%ar% sample use% for calibration shoul% be -); or )$S ma1e 4ertifie% 8eference -aterial. $fter stan%ar%ization the instrument shall be han%e% o3er for routine analysis of anlytes. 03.0 @ Autom#te, -%,!o4e ,ete!mi #to! *he equipment shall be use% for rapi% an% accurate %etermination of hy%ro"en content in steel samples. *he analytical operation of the equipment shall be microprocessor controlle% an% analytical results shall appear %irectly in ppm of hy%ro"en. 7t shall analyse both %iffusible an% resi%ual hy%ro"en. *he equipment shall basically consist of the follo'in" main units. .

Page 2+ of 40


S". )o. Des&!iptio 8esistance furnace $nalyser alon" 'ith *hermal 4on%ucti3ity 6etector 4ontrol console 4omputer an% printer *t%.+ )o.
*he furnace shall be resistance furnace+ current+ po'er an% temperature controlle%. 6etector shall be *hermal 4on%ucti3ity type. B!o#, p#!#mete!s of t-e equipme t 8an"e ('ith 1" sample) B 0.1 ppm to #0 ppm or more ?recision 8ea%ability B 0.02 ppm or 2.0E 8S6+ 'hiche3er is "reater B 0.001 ppm
*he equipment shall be quote% alon" 'ith the follo'in" itemsB 7nterface an% soft'are for %ata transmission Spares for 2 years of operation an% maintenance+ as recommen%e% by the manufacturer 4ommissionin" spares+ as recommen%e% by the manufacturer 4onsumables < operatin" supplies require% for 1000 analyses inclu%in" special e3acuate% quartz probes for sample collection for %etermination of resi%ual an% %iffusible hy%ro"en+ as recommen%e% by the manufacturer 4alibration samples *'o numbers of nitro"en "as cylin%er+ (purity II.IIE) an% instrument quality compresse% air (2 0os. of cylin%er ) 'ith pipin"+ re"ulators an% manifol%s 4alibration samples
Page 2, of 40



S". )o. Des&!iptio Stan%ar% accessories an% items as recommen%e% by the manufacturer /olta"e stabiliser of require% capacity (in%i"enous ma1e) 4omputer 'ith colour monitor+ 1eyboar% an% printer $ny other item 'hich is not mentione% in this specification but is require% for smooth an% proper functionin" of the equipment for the inten%e% purpose. ,acilities shoul% be pro3i%e% to control @ monitor carrier "as flo' alon" 'ith necessary traps for remo3in" moisture+ hy%ro"en+ an% other hy%rocarbons from the carrier "as. *hermal con%ucti3ity %etector 'ith impro3e% si"nal to noise ratio+ lo'er %etection limit+ impro3e% stability an% e!pan%e% %ynamic ran"e shall be use% for %eterminin" hy%ro"en content. 6etector si"nal shall be automatically processe% to percenta"e concentration an% %isplaye% on the instrument panel an% also printe% out simultaneously. 7nstrument shall be capable of stan%ar%+ -ulti-point @ "as %ose% calibration. $utomatic 'ei"ht compensation %urin" instrument calibration as 'ell as for un1no'n sample analysis shall be a stan%ar% feature of the instrument. *he instrument shall be supplie% 'ith a set of international stan%ar% samples an% a number of settin" .up samples (S9S) an% control stan%ar%s. *he equipment as 'hole an% analysis proce%ure shall conform strictly to latest $S*- Specification. Supply shall be complete in all respect an% all optional items necessary to achie3e %esire% instrumental performance shoul% be inclu%e% in the offer. Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page 2- of 40
*t%.+ )o.


S". )o. Des&!iptio It s-#"" $e p!o2i,e, 3ite&ess#!% f#&i"ities ( &ompute! s%stem. *t%.+ )o.
i te!f#&i 4) so t-#t it is #$"e to t!# smit # #"%ti&#" !esu"ts ,i!e&t"% to BOF: SR> # , CCP "e2e" II #utom#tio 8#!!# tee # , Suppo!t. *he instrument an% its accessories < au!iliaries shoul% ha3e minimum fi3e years 'arranty. *he spectrometer an% its all parts shoul% ha3e inspection certificate from its principal. Supplier shoul% "i3e "uarantee that the spare parts 'ill not be obsolete for ne!t 1# years from the %ate of supply of the equipment. Operation an% ser3ice -anuals alon" 'ith the instrument. I st#""#tio : Commissio i 4: Demo st!#tio 9 7nstallation+ commissionin" an% %emonstration shoul% be %one an% trainin" shoul% be "i3en. $ll elements in each "roup mentione% in )oar% ?arameters of 7nstrument shoul% be %emonstrate% for as1e% ran"e. ?re-requisites for installation an% commissionin" shoul% be "i3en after placement of or%er. *rainin" on operation+ maintenance an% calibration to be pro3i%e% at site. full sets in 2n"lish shoul% be "i3en

Page 29 of 40


S". )o. Des&!iptio 5ist of users (?referably in steel plant) since year 2000 to be pro3i%e%. C#"i$!#tio : St# ,#!,i;#tio # , Routi e A #"%sis 9 7n%i3i%ual calibration for each element+ co3erin" the entire ran"e for each "roup mentione% in the )oar% ?arameters of 7nstrument has to be pro3i%e%. $t least fi3e stan%ar% samples ha3in" certificate shoul% be incorporate% for each "roup. Stan%ar% sample use% for calibration shoul% be -); or )$S ma1e 4ertifie% 8eference -aterial. $fter stan%ar%ization the instrument shall be han%e% o3er for routine analysis of anlytes. 0A.0 B S3i 4 4!i ,i 4 mi"" *he equipment shall be use% for pul3erisin" materials li1e steelma1in" sla"+ iron ore+ limestone+ calcine% lime+ ra' %olomite+ burnt %olomite+ Si-n+ ,e-Si+ ,e--n+ ,e-/+ ,e-0b + ,e-/ an% other ferro-alloys+ etc.+ for "ettin" uniform composition for X-ray spectrometric analysis. 7t shall consist of a bo'l+ a rin" an% a hammer. *he sample shall be 1ept in the space bet'een the bo'l+ rin" an% hammer. *he top of the bo'l shall be close% an% it shall be clampe% on a 3ibratory platform 'hich shall impart 1inetic ener"y to the rin" an% hammer. *he "rin%in" 3essel shall be of 100 cc 3olume. -aterial of construction of "rin%in" 3essel shall be tun"sten carbi%e (2 for each machine) an% chrome steel (& 0os. for each machine). *he mill an% the %ri3e mechanism shall be house% in a suitable metallic . *t%.+ )o.

Page )0 of 40


S". )o. Des&!iptio enclosure so that not much noise is "enerate%. *he sample "rin%in" area shall be co3ere% by a li% 'hich can be lifte% an% close% easily for operatin" safely. One electronic<electromechanical timer shall be pro3i%e% for automatically stoppin" the mill after a preset perio% of operation. *he actual time count%o'n shall also be %isplaye%. *he timer shall ha3e %ust proof co3erin" an% tactile 1eys<1nobs for easy settin" of time. *he transmission of rotational force require% shall be throu"h sprin"s of a%equate stren"th. 7t Shall ha3e auto trippin" on motor o3er loa% for safety of motor. 7t shall ha3e enou"h electrical capacity to 'or1 continuously. 7t shall ha3e enou"h spee% for pul3erizin" the sample to the require% size for the set time. 7t shall also be pro3i%e% start an% stop button. 7t shall be pro3i%e% 'ith safety s'itches to pre3ent start of the operation if li% is open. *he input size shall be (-) # mm an% the output size of the sample shall be less than 200 mesh+ suitable for briquettin". *he scope of supply shall inclu%e spares for t'o years of operation an% maintenance+ commissionin" spares+ stan%ar% accessories+ foun%ation bolts+ initial fill of oil an% "rease+ starter an% s'itch fuse unit+ consumables for three months of operation after commissionin" an% any other item 'hich is not mentione% in this specification but is require% for smooth an% proper functionin" of the equipment for the inten%e% purpose. 8#!!# tee # , Suppo!t. *he instrument an% its accessories < au!iliaries shoul% ha3e minimum fi3e years 'arranty from %ate of supply. 03.0 B!iquetti 4 p!ess .
Page )1 of 40
*t%.+ )o.



S". )o. A Des&!iptio *he equipment shall be use% for preparin" pellets from po'%ere% samples for X-ray spectrometric analysis. ?ressure shall be applie% to a %ie fi!e% to a cross-arm by means of an electro-hy%raulic system. *here shall be pro3ision for a%Justin" the press force from 0 to 0 tf. $ timer shall be pro3i%e% for applyin" the pre-set pressure for pre-set perio% of time. *hus a time limit relay shall automatically s'itch-off the po'er supply to the hy%raulic pump after the lapse of the pre-set time. *he timer shall also in%icate the countin" of time from start to en%. 7t shall be pro3i%e% 'ith %ust proof co3erin" an% tactile 1eys < 1nobs for easy settin" of time. *he scope of supply shall inclu%e #00 0os. of aluminium cups for initial perio% an% bin%in" material of # 1" for facilitatin" compaction. ;o'e3er+ the bin%er material shall be such that it %oes not interfere 'ith the analytical 'or1. *he hy%raulic oil use% for the pressin" ener"y shall be easily a3ailable an% shall be of correct "ra%e to support pressin" of the concerne% material for the set time in or%er to "enerate a "oo% sample surface for X8, analysis. *he pressin" pressure shall not be affecte% by the temperature of the oil. *he top li% of the press tool shall be capable of bein" fi!e% ti"htly onto the sample 'ith the help of a scre' mechanism. 7t shall be pro3i%e% 'ith facility for remo3al < fittin" of the press tools ha3in" %ifferent %iameters. *he scope of supply shall inclu%e spares for t'o years of operation an% Laboratory Facilities (Imported)
2009 MEC ! Limite"# $ll %ig&ts %eser'e"( Page )2 of 40
*t%.+ )o.


S". )o. Des&!iptio maintenance+ commissionin" spares+ stan%ar% accessories+ foun%ation bolts+ initial fill of oil an% "rease+ starter an% s'itch fuse unit+ consumables for three months of operation after commissionin" an% any other item 'hich is not mentione% in this specification but is require% for smooth an% proper functionin" of the equipment for the inten%e% purpose. *he ten%erer shall stan% "uarantee for the o3erall performance of the equipment co3ere% un%er this specification. 8#!!# tee # , Suppo!t. *he instrument an% its accessories < au!iliaries shoul% ha3e minimum fi3e years 'arranty from %ate of supply.
T#$"e0I T%pi&#" # #"%ti&#" p!o4!#m fo! seque ti#" /0!#% f"uo!es&e &e spe&t!omete! Bu! t Stee" m#7i 4 Spo 4e 'ot met#" Bu! t "ime I!o o!e ,o"omite s"#4 i!o 0.20 -#.00 0.10 -2.00 0.10-2.00 0.00# . 1.00 0.0# . 1.00 &#.0 .I0.0 1.0- #.0 0.10-10.0 #.0 . ##.0 30.0- 0.0 0.10 . 10.0 3#.00-&0.00 &.00 . 1#.00 12.00 . 20.00 2.00. .00 0.10-0.# 0.01-0.0# 0.10-1.00 0.01 . 0.0# 0.02 - 0.10 0.#0 . #.00 1.00 . 2.00
*t%.+ )o.
E"eme t 4 Si -n S ? 0i $l 4aO -"O SiO2
Fe!!o0 i&7e" 0.01 . 0.10 0.10 . 0.G0 0.10 . 0.G0 0.01 . 0.0G 0.01 . 0.0G

Page )) of 40


E"eme t $l2O3 ,e ,eO ?2O# -nO 0i 'ot met#" Bu! t "ime 2.0 . &.0 Bu! t ,o"omite 1.00 .&.0 Stee" m#7i 4 s"#4 0.# . 3.0 1#.0 .2#.0 0.#0 .3.0 3.00 .(.0 Spo 4e i!o 1.#0. 3.0 G0.00 . I2.00 10.0.13.0 I!o o!e Fe!!o0 i&7e"
1.00 . 2.00 &0.00 . &(.00 0.00 . #0.00 0.00 . #0.00
T#$"e0I ( &o t,. ) E"eme t 4 Fe!!o ( Fe!!o0 tit# ium $o!o 0.10 . 10.00 0.10 . #.00 0.01 -0.G0 0.01 -0.G0 3.00 . (.00 3#.00 . 0.00 0.01 . 0.G0 0.01 . 0.G0 3.00 (.00 0.10 -10.00 0.10 -#.00 Fe!!o0 m# 4# ese 0.10-10.00 Fe!!o0 si"i&o 0.10 . 10.00 &#-(# 0.#0 . #.00 0.010.G0 0.01 . 0.G0 0.#0 3.00 1.00 . #.00 0.10 . 0.G0 Si"i&o0 Fe!!o Fe!!o0 m# 4# ese 0&-!omium 2# #,ium 0.10-3.00 0.0#-(.00 0.10 . #.00 1.00 . #.00 0.10 . 1.00 0.01 . 0.G0 0.01 . 0.G0 0.01 . 0.20 0.10 . 0.#0 0.01 . 0.G0 0.01 . 0.G0 Fe!!o0 )io$ium 1.00. 3.#0 1.00 . #.00 Fe!!o mo"%$,e um 0.10 . 10.00
Si -n S ? 0i $l *i
0.#0-3.00 &#.0-(#.0 0.01-0.G0 0.01-0.G0
12.0-30.0 G.0-(G.0 0.01-0.G0 0.01-0.G0
1.00 . (.00 0.01-0.G0 0.10-0.G0
1.00 . #.00

Page )4 of 40


) 4r / 0b -o ,e )alance )alance )alance )alance )alance )alance )alance 1#.00 . 20.00 &0.00 . G0.00 (0.00 . G0.00 #0.00 . (#.00 1.00 . 3.00 )alance ##.00 . (0.00 )alance
T#$"e0II
'i4- A. ( B!i&7s 9 E"eme t + Compou , $l2O3 ,e2O3 *iO2 4aO -"O 0a2O >2O Lo3 A. ( B!i&7s 9 Laboratory Facilities (Imported)
R# 4e C (0 .0 . IG.0 0.0 . 3.# 0.0 . 3.# 0.0 . 3.0 0.0 . 2.0 0.0 . 2.0 0.0 . 2.0
A&&u!#&% 1.00 0.10 0.10 0.10 0.10 0.10 0.10
Page )* of 40


E"eme t + Compou , $l2O3 ,e2O3 *iO2 4aO -"O 0a2O >2O Si"i&# B!i&7s 9 E"eme t + Compou , SiO2 ,e2O3 *iO2 4aO -"O 0a2O >2O C! 0 M#4 esi# 9 E"eme t + Compou , 4r ,e2O3 -"O R# 4e C 30 .0 . (0.0 0.0 . 3.0 0.0 . 3.# 0.0 . 3.0 0.0 . 2.0 0.0 . 2.0 0.0 . 2.0 R# 4e C G0 - IG 0.0 . 3.# 0.0 . 3.# 0.0 . 3.0 0.0 . 2.0 0.0 . 2.0 0.0 . 2.0 R# 4e C 10 . 30 0.0 . 1# 0.0 . (0 A&&u!#&% 1.00 0.10 0.10 0.10 0.10 0.10 0.10 A&&u!#&% 1.00 0.10 0.10 0.10 0.10 0.10 0.10 A&&u!#&% 1.00 1.00 1.00
L#,"e s"#4 9 E"eme t + Compou , SiO2 ,e (element) 4aO -nO -"O $l2O3 S"i,e D#te S# , 9 Laboratory Facilities (Imported)
R# 4e C #. # 0 . 20 # . #0 3 . 30 0 . 1# 0- 0
A&&u!#&% 1.00 1.00 1.00 1.00 1.00 1.00
Page )+ of 40


E"eme t + Compou , SiO2 4r2O3 $l2O3 ,e2O3 Co ti uous C#sti 4 Po3,e! 9 E"eme t + Compou , SiO2 $l2O3 4aO 4 , Pet!o"eum Co7e As- 9 E"eme t + Compou , $l2O3 ,e2O3 4aO -"O 0a2O >2O SiO2 ? S R# 4e C #0 . G# # . 2# 0 . 10 0.0 . #.0 R# 4e C 1# . 0 0 . 2# 1# . 0 0 . 20 0-# R# 4e C 10 . 0 0.00 . 1# 0.0 . 1# 0.0 . 10 0.0 . 2.0 0.0 -3.0 30 . (0 0.2 0-2 A&&u!#&% 1.00 1.00 0.#0 0.#0 A&&u!#&% 1.00 1.00 1.00 1.00 0.10 A&&u!#&% 1.00 0.#0 0.#0 0.#0 0.10 0.10 1.00 0.1 0.1
F"% As- 9 E"eme t + Compou , $l ,e 4a 0a > S Laboratory Facilities (Imported)

R# 4e C 10 . 1# 0.00 . 1# 0.0 . 10 0.0 . #.0 0.0 . #.0 10 - 30
A&&u!#&% 1.00 1.00 0.#0 0.#0 0.#0 1.00

Page ), of 40


SMS S"u,4e 9 E"eme t + Compou , SiO2 $l2O3 4aO -"O ,e2O3 4
R# 4e C #. 0 0 . 2# 1# . 0 # . 10 0.00 - 1# 0 - 20
A&&u!#&% 1.00 1.00 1.00 0.#0 0.#0 1.00
T#$"e 0 III T%pi&#" # #"%ti&#" p!o4!#mme of opti&#" emissio spe&t!omete! S". E"eme t Co &e t!#tio !# 4e (3ei4-t pe!&e t#4e)

Page )- of 40


)o. 01. 02. 03. 0 . 0# 0&. 0(. 0G. 0I. 10. 11. 12. 13. 1 . 1#. 1&. 1(. 1G. 1I. 20. 21. 22. 23. 2 . 2#. 23. 2 . 2#. 4arbon -an"anese ?hosphorous Sulphur Silicon $luminium 4hromium 0ic1el /ana%ium -olyb%enum *itanium *un"sten 4obalt 4opper 0iobium 4alcium Kinc Kirconium $ntimony )ismuth $rsenic )oron 0itro"en -a"nesium *in 5ea% *ellurium ,e ( matri! ) Mi 0.001 0.1 0.0003 0.0003 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.0001 0.0001 0.0001 0.0001 0.0001 0.0001 0.0001 0.000# 0.0001 0.0001 0.0001 0.0001 M#?. #.00 2#.00 1.#0 0.#0 G.00 #.00 3#.00 0.00 10.00 10.00 2.00 2#.00 10.00 #.00 3.00 0.10 0.10 0.30 0.#0 0.30 0.30 0.#0 0.#0 0.30 0.30 0.30 0.10
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Page )9 of 40


i) 6etails of all the equipment offere%+ printe% catalo"ues+ %escripti3e literature an% Feneral $rran"ement %ra'in" for each equipment in%icatin" ma1e an% mo%el offere%+ list of spares an% essential accessories ii) iii) 5ist of users (preferably in certificate $ny %e3iation from the *S in%icatin" clause number of the *S an% reasons for such %e3iations steel plants) for each equipment alon" 'ith user

Page 40 of 40

Ninl Spec (1) - For Sms Lab (Imported) On 28.10.09

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Ninl Spec (1) - For Sms Lab (Imported) On 28.10.09

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NEELACHAL ISPAT NIGAM LIMITED

TECHNICAL SPECIFICATION FOR LABORATORY EQUIPMENT

(PHASE II) IMPORTED EQUIPMENT

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

e&ess#!% f#&i"ities (&ompute!

i te!f#&i 4) so t-#t it is #$"e to t!# smit # #"%ti&#" !esu"ts ,i!e&t"% to

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

9 B B Soli% @ briquette% po'%er #0 mm %ia ! 30 mm hei"ht

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

;i"h repro%ucibility of an"ular position B D0.00020 or better

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

*he equipment shall be quote% alon" 'ith the follo'in" items B

- 46 soft'are for ser3icin" of the equipment+ the soft'are shall be

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

,acility for settin" quality control limits for

*he spectrometer an% its all parts shoul%

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

*he sample stan% shall be flushe% 'ith accommo%ate o%%

an inert "as li1e ar"on. 7t shall be %esi"ne% to

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

Laboratory Facilities (Imported)

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT

Stan%ar% accessories an% items as recommen%e% by the manufacturer

/olta"e stabiliser of require% capacity (in%i"enous

NEELACHAL ISPAT NIGAM LIMITED

(PHASE II) IMPORTED EQUIPMENT