International Journal of Computational Intelligence Research ISSN 0973-1873 Volume 9, Number 2 (2013), pp.

115-119 Research India Publications http://www.ripublication.com/ijcir.htm

Artificial Neural Network based Classification of IC through Extracting the Feature Set of IC Images using 2-Dimensional Discrete Wavelet Transform
Kushal Kumar1, Anamika Yadav2 and Himanshi Rani3 (Electronics and Communication Engineering, Jaypee University of Engineering and Technology, Guna, India) 2 (Electronics and Communication Engineering, Bhagwan Parshuram Institute of Technology, Delhi, India) 3 (Electronics and Communication Engineering, Vellore Institute of Technology, Chennai, India) ABSTRACT Machine Vision has rapidly increased its capabilities in the last few decades and Artificial Neural Networks (ANN) have played an important part in doing so. ANNs have been shown to be very effective tools for classification and sorting of data. In this paper, we use artificial neural networks and discrete wavelet (DWT) techniques for IC pin analysis and classification. Features are extracted from the wavelet transformed IC pin images and then fed into the ANN. The paper is limited to using two dimensional discrete wavelet transform and perceptron/ back-propagation algorithms of ANN. Keywords - 2-D DWT, Artificial Neural Network, IC pin, Image processing, Perceptron, Back propagation
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INTRODUCTION
In industrial automation, line production techniques are used for PCB manufacturing and packaging. The faulty IC pins are difficult to identify unless it is fully automated. In this paper a novel method is proposed for analysis of IC pins using features of images extracted by two dimensional discrete wavelet transform and then classifying them using Artificial Neural Network (ANN). In the present investigation, a series of steps are performed in a systematic way to get the desired results. First, the gray scale image of the IC is decomposed during discrete wavelet transformed and then reconstructed using only the high frequency components of the image. Then the pins have to be segmented from the whole image

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of the IC. We have seen in [1] K. Kumar et al that canny edge detection when used on 2-D wavelet pre-processed images is the best way to detect IC pins on an IC to analyze them further. The features of this image containing segmented pins are then extracted and input into an Artificial Neural Network machine. We use two types of learning algorithms, namely Perceptron learning and Backpropagation, and compare them stating the merits and de merits of using the methods. A new way, more advanced way thn ANNs is also proposed for further research in the area.

DISCRETE WAVELET TRANSFORM

Wavelets are the small portion of the wave. Wavelet transform uses wavelets to capture different frequency components of the signal whose resolution matches up with its scale. This technique is known as Multi-resolution Analysis. It comprises of a scaling function and a wavelet function. Scaling function gives the series of approximation of the signal, where each approximated signal differs by a factor of two. Wavelet functions are used to add the detailed information in the difference of the two neighboring approximations. Hence in wavelet analysis we get the approximated part and the detailed part of the signal. In case of images, the wavelet analysis is carried out in two dimensions, the X and Y directions respectively. The two dimensional wavelet decomposition is known as filter bank analysis. It consists of high pass and low pass filters. First the analysis is done along the columns (along n) and then along the rows (along m). The output of the low pass filter gives the approximated coefficients and the output of the high pass filter gives detailed coefficients. The approximated coefficients at scale j+1 are used to construct the detailed and approximated coefficients at scale j. In case of two dimensions we get three sets of detailed coefficients and one set of approximated coefficient.

ARTIFICIAL NEURAL NETWORKS

An artificial neural network is an abstract simulation of a real nervous system and its study corresponds to a growing interdisciplinary field which considers the systems as adaptive, distributed and mostly nonlinear, three of the elements found in the real applications [2]. Many new ways of computing denominated Artificial Intelligence, which through different methods are capable of managing the imprecision and uncertainties that appear when trying to solve problems related to the real world by the traditional methods, offer strong solution and easy implementation. Artificial Neural Networks (ANN) is definitely in this category of new learning based algorithms [2]. The ANNs are used in many important engineering and scientific applications, some of these are, signal enhancement, noise cancellation, pattern classification, system identification, prediction, and control. Besides, they are used in many commercial products, such as modems, image processing and recognition systems, speech recognition, and bio-medical instrumentation.

Artificial Neural Network based Classification of IC

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PROPOSED METHOD
In the method that we propose, we have to analyze the image by extracting the features using discrete wavelet transform, Table 1 and Table 2, and then use the ANN to classify the pins. What we are striving to achieve here is a low computational time using learning based algorithms as the traditional algorithms fail to handle large data, when the number of images increase, and so does their feature set. Here we limit our research to extracting two features, namely mean and standard deviation. First we have to train our ANN algorithms and after that we can test an IC for broken or damaged pins. We train both the perceptron and back-propagation ANNs, test the results in both the algorithms and comparing them too. The above are examples of After obtaining this feature set, we input this data in the ANN algorithms. For perceptron we see that it sorts the IC data The original IC image is shown in Fig. 1. The segmented IC pin image after using 2-D DWT and Canny is shown in Fig. 2. Fig. 3 shows an IC with a broken pin. After training the algorithms, the separation hyper-planes for perceptron and back-propagation are shown in Fig. 4 and Fig. 5 respectively.

Fig. 1 Original IC image

Fig. 2 Segmented IC-pins after DWT and canny procedure.

Fig. 3 Original IC image with broken pin

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at distinguishes Fig. 4 Graph for training set of Perceptron, showing a hyperplane tha the working IC and defect tive IC (green dots- Working IC pins and red d dots Defective IC pins)

ng set of Back-propagation, showing a hyperplane h that Fig. 5 Graph for trainin distinguishes the working IC and defective IC (green dots- Working IC I pins and red dots Defective IC pins) Table 1: The featur re set obtained for an image of IC with all pin ns intact: Mean Standard Deviation 0.3053 0.6839 0.3150 0.6897 0.3052 0.6985

Artificial Neural Network based Classification of IC Table 2: The feature set obtained for an image of IC with one pin broken: Mean Standard Deviation 0.2959 0.6787 0.3020 0.6873 0.2796 0.6669

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CONCLUSION
This research paper demonstrates the use of Artificial Neural Network in the area of Machine Vision. Here we sorted out the ICs with defective IC pins from ICs with working pins by using Image processing, taking help of Discrete Wavelet Transform along the way and then feeding the extracted features of the image into ANNs. We saw that ANN is a very preferable way of doing it. The research could be extended to use other superior learning algorithms like Support Vector Machine.

REFERENCES
[1] K Kumar, A Yadav, H Rani, Y Nijhawan, S Radhika, 2-Dimensional Wavelet pre-processing to extract IC-Pin information for disarrangement analysis, IOSR Journal of Electronics and Communication Engineering, Vol. 7(6), 2013, 3638. [2] Dr. Eduardo Gasca A, Artificial Neural Intelligence ( Institute of technology, Mexico.) [3] K. Somyot, S. Anakapon and K. Anantawat, Pattern recognition technique for IC pins inspection using wavelet transform with chain code discrete Fourier Transform and signal correlation, International Journal of Physical Sciences, Vol.7 (9), 2009, 1326-1332 [4] Ying Huang, Qi Pan, Qi Liu, Xin Peng He, Yun Feng Liu, Yong Quan Yu, Application of Improved Canny Algorithm on the IC Chip pin Inspection, Advanced Materials Research, Vols. 317-319, 2011, 854-858. [5] A.W. Galli, G.T. Heydt and P.F. Ribeiro, Exploring the power of Wavelet Analysis, IEEE Computer Applications in Power, October 1996. [6] Pai Hui Hsu and Peng Gong, Spectral feature extraction of Hyperspectral Images using Wavelet Transform, Journal of photogrammtery and remote sensing, Volume 11, No. 1, 2006. [7] Tim Edwards, Discrete Wavelet Transform: Implementation and theory, Stanford University, USA, September 1991.

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