US008370181B2

(12) United States Patent

Shah-Hosseini
(54) SYSTEM AND METHOD FOR SUPPLY CHAIN
DATA MINING AND ANALYSIS

(10) Patent N0.: (45) Date of Patent:

(56)

US 8,370,181 B2
Feb. 5, 2013

References Cited
U.S. PATENT DOCUMENTS

(75)

Inventor:

Amin Shah-Hosseini, Santa Clara, CA

(US)

5,596,712 A *
2005/0216429 A1 *
2006/0178918 A1 *

1/1997 Tsuyama et a1 ,,,,,,,,,,,, 714/26

9/2005
8/2006

Hertz et a1. ...... ..

Mikurak ...... ..

707/1
705/7

(73)

Assignee:

Camstar Systems, Inc., Charlotte, NC

2007/0124130 A1 *

5/2007

Brunet et a1~

~~~~~~

~ ~ ~ ~~ 703/23

(Us)
_ _ _ _ _

2009/0271066 A1 *
* cited by examiner

10/2009 Underdal et a1. ............. .. 701/35

(*)

Notice:

Subject to any disclaimer, the term of this patent is extended or adjusted under 35

USC 1546)) by 621 days

Primary ExamineriNga B_ Nguyen (74) Attorney, Agent, or Firm *Christie, Parker & Hale,

(21) Appl. N0.: 12/579,106

(22) Filed:
(65)

LLP
(57) ABSTRACT A method and system for supply chain data analysis. The method includes storing supply chain data including test data, genealogy data, repair data, some factors and some items, in
one or more databases and selecting a portion of the factors

Oct. 14, 2009

Prior Publication Data

Us 2010/0095158 A1
_ _ _ _

Apr 15 2010

Related US Application Data

(60) PrOVlslOnal aPPhCatlC/n NO- 61/105,255, ?led On 00114, 2008Int C1 G06Q 30/00

from the stored data, and a time range for analysis. The
method then selects one or more criterion for analysis;

extracts a portion of the stored data; analyzes the extracted portion of the stored data to detect a combination of factors that result in a test failure, according to the selected factors,
the time range, and the selected one or more criterion. The method then detects a root cause for the detected combination

(51)

(52) (58)

(2006-01) U-s- Cl- ~~~~~~~~~~~~~~~~~~~~~ ~~ 705/7; 705/8; 705/9; 705/10 Field Of Classi?cation Search ................ .. 705/7, 8,

of factors; performs correlation analysis betWeen the selected factors; and performs trend analysis on the selected factors.

705/9, 10 See application ?le for complete search history.

22 Claims, 19 Drawing Sheets

I
/ i I I 1

OPTIMIZATION

P\

IWHATS THE BEST THAT CAN HAPPEN?

PREDICTIVE MODELING

WHAT WILL HAPPEN NEXT?

//
EORECASTING/EXTRAPOLAT/ION O /
COMPETITIVE ADVANTAGE / O / STATISTICAL ANAIZYSIS /
ALERTS /
/

I
WHAT IF THESE TRENDS CONTINUE?
WHY IS THIS HAPPENING?
WHAT ACTIONS ARE NEEDED?

ANALYTICS

@ /

QUERY/WILL DQWN m,
V

WHERE EXACTLY IS THE PROBLEM?

HOW MANY, HOW OEIEN, WHERE?

ACCESS AND

R E P O RTI N G

AD )(00 REPCRTS (7 /
U /

STgDARD REPORTS

WHAT HAPPENED?
DEGREE OF INTELLIGENCE

US. Patent

Feb. 5, 2013

Sheet 2 0f 19

US 8,370,181 B2

wow

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82:82
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US. Patent

Feb. 5, 2013

Sheet 3 0f 19

US 8,370,181 B2

mom

mom

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5m

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US. Patent

Feb. 5, 2013

Sheet 4 0f 19

US 8,370,181 B2

5.325%
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65 3

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US. Patent

Feb. 5, 2013

Sheet 5 0f 19

US 8,370,181 B2

E25%8
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5ma2m

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2 82

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US. Patent

Feb. 5, 2013

Sheet 6 0f 19

US 8,370,181 B2

Seiectfabtors lobe
inciuded in the anatysis

/ 502

4,
Select the date range
for the anaysis '

f 504

|,______.___.___ .............

AutnDiscaver

/A@a?c HOW! detection? /

506

I Select a factar

512
Use (me of indimtms to sort data

Probiem identi?cation

i v

514

seiect one or

\_ mare items in
interest

516

l
Sekect Diiter
F0 u ads

520 X
Bmws the charts to
see an usuai

518
V

Use Root Cause Anaiysm to

Detecting the probiem mot

investigate the cause of

pattern
1

\ 522
\ 524

i Soiution Suggestinn
Use ?ies-Ms) that demonstrated

betler performanna

FIG. 5

US. Patent

Feb. 5, 2013

Sheet 7 0f 19

US 8,370,181 B2

Read UnitReport Data UnitReportData ~> Dictionary; Key(integer), value (array of integers) Key = Unit report id
Value = List of factor ids
7

f 602

Read Station Properties Data StationPropertydata ~> Dictionary: key(string), value(integer)

Key = Composite key or unit report id and property id

Value = Property value id

f 604

Read Unit Report Properties Data UnitReportPropertyData ~> Dictionary: key(string), value(integer) Key = Composite key of unit report id and property id
Value = Property value id
7

f 606

Read Product Properties Data ProductPropertyData -> Dictionary: key(string), value(integer) Key = Composite key of unit report id and property id
Value a Property value id

f 608

integrate Data
MainData ~> Dictionary: key(string), value<array of integer)

Key = Unit report to

Value = Property value ids

f 610

l
FindCombinatioris _/ 612
Read Subtest Data

SubtestData -> Dictionary: key(strlng), value?nteger) Key = Composite key of unit report id and subtest id
Value = Property value id

f 614

Match Subset Data with combinations / 616

Read Value Data
ValueData -> Dictionary: key(string), valuelintager)

Key = Composite key of unit report id, value id, and limit id
Value = Property value id
7

f 618
,

Match Values Data with combinations

i

f 620

Find Genealogy
Find Test Structure

Find Value Structure

Find Test Limits "

f 622

FIG. 6

US. Patent

Feb. 5, 2013

Sheet 8 0f 19

US 8,370,181 B2

702
StartLeveE = 0 f

Create
1

'

704

Cambination for 1, Node

7

Compute V and

706

F for
Combination

No

f 709
Node =
Go8ack(Node) MYES ''''' M

f 708

NO

r/ 716
Add
Combination to q---------NQ . . . . . . . . . _

_
_

YES

710

'

l
Node =

714
__

f GoFoxwardWode)

Node ' ("nose

'7 12

f 718
StartLevel += 1
Node = J YES

WYES

StartLeveknFactcr

(StartLeveLO)

720

Mm

FIG. 7

US. Patent

Feb. 5, 2013

Sheet 9 0f 19

US 8,370,181 B2

392
m 3== Nn?e?}
J = Modem

808

\
Node ==

806

(i~1,Naxt(i)}

Node = (NH)

812

Node m "050%"

L .... ..

Bi

Return Node

FIG. 8

US. Patent

Feb. 5, 2013

Sheet 10 0f 19

US 8,370,181 B2

I =Node(0) J = Node(1)

902

906
904
+YES l < nFactor

I = I +1 J=0 Next(i) = 0

NO

910

I
Node = (i,j)

908

J < maxLeveI(i)

NO

914

YES
912

Node = "Close"

Node = GoBack(l,j)

916
y
Return Node

FIG. 9

US. Patent

Feb. 5, 2013

Sheet 11 0119

US 8,370,181 B2

f 1002
De?ne: FactorCcmb -> Array of Dictionary: key(integer), value (array of integer) Array: Stores Dictionaries for each factor
Key = item id Value = List of related Combinations

l 004
Find list of combinations related to the selected value id
Combinations = FactorComb(valueid)

i
For each 0 in Combinations

1 006

Items += CombinationData (c)

FIG. 10

US. Patent

Feb. 5, 2013

Sheet 12 0f 19

US 8,370,181 B2

FIG. 77

SETUP
SIGMADISCOVER MULTIDIMENSIONAL FAILURE ANALYSIS
I. SELECT DIMENSIONS FROM THE LIST, OR LOAD FROM FAVORITE LIST TO BE INCLUDED IN THE ANALYSIS:

I SELECT ALL I | REMOVE ALLI

UPRODUCT EISTATION EIITEST EIASSEMBLY LINE IIIOPERATOR UVERSION UDEBUC IIIFIXTURE USLOT USYMPTOM CODE

LOAD A FAVOR|TE:|:IZ|
IIADDITIONAL PRODUCT CODE USOFTWARE VERSION UMANUFACTURINC LOCATION IISUBTEST DMEASUREMENT

|OOSTOM|ZE...I ISAvE EAvORITEI

2. SELECT THE TIME FRAME FOR THE ANALYSIS:

UPLOAD DATA FROMIFRIDAY , JULY OEZOOOIVI (ON OR AFTER 6/25/2009)

TOIFRIDAY , JULY D3,2oD9|v|(0N OR BEFORE 7/3/2009)

BASED ON ITEST DATE

Iv|

3. SET THE FOLLOWING OPTIONS TO ADJUST THE REQUIRED COMPUTATION ON YOUR MACHINE:

TREND ANALYSIS:
OUTCOME DETAILS:

@ON @OEE
@ON @OEE

IDAILY

Ivl

PARAMEIRIC DATA DDMPRESSIOMQON @OEE

SHOW TOOLS EEG
SIGMA QUEST

US. Patent

Feb. 5, 2013

Sheet 14 0119

US 8,370,181 B2

FIGJSA
@AUTODTSQOVER QE@
sEEEcET TME DIMENSIONS 10 BE INCLUDED IN COMBINATIONS: SIGMAQUEST @PRODUCT UTEST UOPERATOR EDEBUG EISTATION CHAMBER EITEST SPEC-REVISION UTEST SPEC-REVISION E1STATION UASSHNBLY UNE EIVERSION EHXNJRE INFO. mTESTHNPINNSRANVENS|0NE1TEST SPEO~REV|S|ON
<|1 >

COMBINATIONS ANALYSIS MORE... @MEASUREMENT ANALYSIS OCOMBNNATION ANAYLSIS @STANDARD REPORT osMART REPORT

18 ITEMS FOUND

NUO0ET SIZNMINIMUM NUMBER 0E TESTS): CE :U:1010% 0E T0TA1 13130 TEsTs

NUGGET SIGNIFICANCE(M|NINUM FAIL RATE(%)): [1 :0:

MEASUREMENTS WITH PPK LESS THAN:
PAN RATE
1%? a

m
X

4
T. 0 10

0.04

0.24

0.44

0.04 W 0.84
f

1.04

1.24
0

STATION NIXNJRE lNFO. TESTER PROGRAM-V... A

L
/

// y...

.'

'

a"

-.4

4 5 6 7

4 NXPONER@HIGHLEVEL..12 21 0.38 T000 4 TRANsMTT BER 0 0.1 .036 21.20 4 TRANsMN FER 0 1 0.36 14.00 5 DCOWR CHECK 1.2 95 0.40 5.77

035 RF-DE... 0.10 RF-DE... 005 RF-DE... 0.13WINMU...

RF-DECTOlS-XPTUBNQ- 00124-00005... RF-DECTOTS-XPTUBTN-Ol 00124-00005... RF-DECTOTS-XPTUNNNJ 00124-000000- _ 12 000M0120011100000011

NUMBER 0E TESTS: 1TT1

NUMBER 0T FAILS: 105

1/

00:15
AA A

DCPWRCHECKLSL:1.5USL:290
.A

[1512290

\
r

K 0 0.01113 4

70011504

140000410

210005202

2110001140

549.03 \

10

IKXXITESTER PRocRAM-vERsloN @HNNURE MPO m

mSNANON @PR0000T1

US. Patent

Feb. 5, 2013

Sheet 15 0119

US 8,370,181 B2

FIGJSB
E AUTODTSCOVER Qgg
516M AQUEST SELECET THE DIMENSIONS 10 BE INCLUDED 11 COMBINATTONS: 0111001101 @TEST 00111111011 BDEBUG MSTATION BASSEMBLY 1111 BVERSION B11101

COMBINATIONS ANALYSIS 110111... @MEASUREMENT ANALYSIS OCOMBTNATTON ANAYLSTS

5 116116 100110

OSTANDARD REPORT

@SMART 11111011; 1110101 @61111011116116

RUN AUTODISCOVER

F111R11E1:U:PP1
2

m
x

11115
22
1 2 6 4 1 1 1 1

11112 11161

0.12

0.62

0.62

1.02

1.22

1.42

1.62

1.62

2.02

2.22

2.42

2.62

2.82

6.02

6.22

6.42

6.62

6.62
/

PPK

NOTCEUSTERTTTMEASURMENTI LSL IUSL T11101|1111 RATETPPKI PRODUCTT STATION T TEST 61111101

SPKR_ST... SPKRJ... SPKR_A... CODE... 64 0.1 0... 660 66 7.71 16.94 6.76 DEFAULT... USIMX... 1 7.71 17.61 2.10 DEFAULT... USTMX... 0... 7.71 25.58 0.61 DEFAULT... UST-MX... 4207.66 1.05 DEFAULT... USl-MX... MAINSE... MAINSE... MATNSE... MAINSE... DEBUB DEBUB DEBUB DEBUB

NUMBER OF TESTS: 301

NUMBER OF FAILS: 7T

EXPORT TABLE

SPKR_AMPLTTUDE_T200HZLSL:0.82 USL:0.92

ESLIOBZ USL=IT92

l m 011111011 @1661 122161111011 @PRODUCT

El

US. Patent

Feb. 5, 2013

Sheet 19 0f 19

US 8,370,181 B2

[U077
CHART SETUP SELECT ENTITY

TD NAME

T %\/0LT FAIL RATE |

PARETO

TREND CHART

TECH/ART

SEX

TOO

80

1/1/2009 2/1/2009 9/1/2009 4/1/2009 5/1/2009 0/1/2009 1/1/2009 0/1/2009