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A typical diverter switch type OLTC showing both tap selector switch and diverter switch (MR)
LTC135 (PS)
LV windings shorted
Measure test current and voltage over the winding Calculate R (source impedance >> resistor value)
Typical LTC sequence of events when tap is switched from one position to next.
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Test equipment:
TM1800 CB-DRM analyzer
Multi-channel voltage and current measurements OLTC control Static and dynamic resistance measurements
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Time
DRM with constant current source Blue Voltage/Resistance, Red Test current. H1 1-2 tap change with LV shorted. Transition times and resistor values easily recognized
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Resistor values, H1
R1 and R2 transition resistance values per tap (value/10). All within spec ( 10%)
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Static and Dynamic Resistance Measurements on a load tap-changer in one operation (patent pending)
Computer for detailed analysis and reporting DC test current
LTC135 (PS)
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R1 and R2 transition resistor values per tap (value/10). All within spec ( 10%)
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Dynamic analysis, utilizing new method (patent pending) for calculating resistance
Test current HV voltage Resistance LV voltage T1 T1//2 T2 Tswitch Rwinding R1 R// R2 70 ms 8 ms 56 ms 134 ms 0.52 2.94 1.42 2.83
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Test equipment:
TM1700 CB-DRM analyzer
Multi-channel voltage and current measurements OLTC control Static and dynamic resistance measurements
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Dynamic analysis, ASEA Lepper 6 MVA with LTC ASEA UZEDT, start time
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Dynamic analysis, ASEA Lepper 6 MVA with LTC ASEA UZEDT, switch time
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Dynamic analysis, ASEA Lepper 6 MVA with LTC ASEA UZEDT, start time
Start time, ms
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Dynamic analysis, ASEA Lepper 6 MVA with LTC ASEA UZEDT, switch time
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Test equipment:
TM1700 CB-DRM analyzer
Multi-channel voltage and current measurements OLTC control Static and dynamic resistance measurements
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Measure dynamic current/ripple on primary with a constant voltage source and secondary shortcircuited
Current drop value is slightly pending test current/winding inductance Contact switching/timing can be measured Diverter resistor values cannot be measured
Measure dynamic resistance on primary with a constant current source and secondary shortcircuited
Contact switching/timing can be measured Actual diverter resistor values can be measured (high impedance source)
Measure dynamic resistance by measuring dynamic voltage on primary and secondary windings
Contact switching/timing can be measured Actual diverter resistor values can be measured (patent pending)
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