EEG 383 Measurement and Instrumentation

CHAPTER 0 Course Outline

Prof. Fawzy Ibrahim Electronics and Communication Department Misr International University (MIU)
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Chapter Contents
0.1 Course Description 0.2 Course Objectives 0.3 Course Administration 0.4 Course Outline 0.5 Grade Distribution

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EEG383 Ch.0 Course Outline

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0.1 Course Description

EEG 284 Electronics II
Structure of measurement systems - Units, dimensions and standards Measurement errors - Static and dynamic characteristics of measurement systems - Measurement errors - Techniques of basic electric measurements: DC and AC current and voltage, passive elements, resistance (R), inductance (L) and capacitance (C) - Design basic electronic circuits of measuring instruments - Techniques of: Frequency measurement, Phase shift measurement and phase sensitive detection - Design electronic circuits used to pull weak signal from noise - Data acquisition systems: structure, design, programming and applications.

Course goals
Ability to understand, analyze, design, implement some measurement systems.

Course prerequisites
EEG281 Electric Circuits I

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EEG383 Ch.0 Course Outline

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0.2 Course Objectives

Upon a successful completion of this course, the student will be able to: Understand of the basic fundamentals of measuring systems. Design basic electronic circuits of measuring instruments. Design electronic circuits to measure specific physical quantities; Understand of the basic fundamentals of errors in measuring systems Design electronic circuits used to pull weak signal from noise; Understand of the basic fundamentals of data acquisition systems and build-up data a practical one.

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EEG383 Ch.0 Course Outline

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0.3 Course Administration

Instructors: Prof. Fawzy Ibrahim fawzy.ibrahim@miuegypt.edu.eg The Main Building Room 205
Tuesdays and Wednesdays 10:30-10:00

Lectures: TA: Labs: Building URL: Text:

Eng. Main Building Room 225 Office Hrs: S & R 10:00-11:30 Electronic Lab, Rooms 3210-330, Main www.miuegypt.edu.eg/sso
Robert B. Northrop, Introduction to Instrumentations and Measurements, 2nd ed., Taylor and Francis,2005. Alan S. Morris; Measurements and Instrumentation Principles; Elsevier Butterworth Heinemann, 2005

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LectureEEG383 slides and Assignments areProf onFawzy the Ibrahim web Ch.0 Course Outline

0.4 Course Outline

Week Lec. 1 Items/Topics Assignments Chapter 0 Course Objectives and Outline 0.1 Course Description 0.2 Course Objectives 0.3 Course Administration 0.4 Course Outline Lab #1 0.5 Grade Distribution Electronic Lab Chapter 1 Structure of Measurement System orientation and 1.1 Units, Dimensions and Standards Identification of 1.1.1 Standard Units Lab Intruments. 1.1.2 Electrical Units 1.1.3 Electrical Constants 1.1.4 Metric Prefixes 1.2 Structure of Measurement Systems 1.2.1 The sensor Element Lab #2 1.2.2 Signal Conditioning or Variable conversion element Experiment #1 1.2.3 The Signal processing Element 1.2.4 The Data Presentation and Display Elements Measurement of 1.3 Instrument Types Transistor I-V 1.3.1 Active and passive instruments Characteristics 1.3.2 Null-type and deflection-type instruments of Diodes and 1.3.3 Analog and digital instruments Transistors 1.3.4 Indicating instruments and instruments with a signal output using Measuring 1.3.5 Smart and Non-Smart Instruments Instruments 1.4 Examples of Laboratory Instruments
EEG383 Ch.0 Course Outline Prof Fawzy Ibrahim

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0.4 Course Outline (Continued)

Week Lec. Items/Topics Chapter 2 Characteristics of Measuring Intruments 2.1 Static Characteristics of Instruments 2.1.1 Accuracy and inaccuracy (measurement uncertainty) 2.1.2 Precision/repeatability/reproducibility 2.1.3 Tolerance 2.1.4 Range or span 2.1.5 Linearity 2.1.6 Sensitivity of measurement 2.1.7 Threshold 2.1.8 Resolution 2.1.10 Sensitivity to disturbance 2.1.10 Hysteresis effects 2.1.11 Dead space 2.2 Dynamic Characteristics of Instruments 2.2.1 Zero order instrument 2.2.2 First order instrument 2.2.3 Second order instrument
EEG383 Ch.0 Course Outline

Assignments

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Lab #3 Experiment #2 Measurement of Transistor I-V Characteristics of Diodes and Transistors using LABVIEW Software

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Problem Set #1 Measurement system Structure and characteristics

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0.4 Course Outline (Continued)

Week Lec. Items/Topics Chapter 3 Measurement Errors 3.1 Gross Errors 3.2 Systematic Errors 3.3 Absolute Errors 3.4 Relative Errors 3.5 Accuracy 3.6 Precision 3.7 Resolution 3.8 Significant Figures Quiz #1 Chapter 4 Analog Measuring Intruments 4.1 DC Analog Multimeter 4.1.1 AArsonval Movement 4.1.2 Ohmmeter 4.2 DC Digital Multimeter 4.2.1 Digital to Analog Converter (DAC) 4.2.2 Analog to Digital Converter (ADC) 4.3 Analog AC measurements 4.3.1 AC Voltage Measurement 4.3.2 Electronic AC Voltmeter
EEG383 Ch.0 Course Outline

Assignments

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Problem Set #1 (Continued) Measurement system Structure and characteristics

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Problem Set #2 Measurement Errors

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Problem Set #3 DC Measurements Problem Set #4 AC Measurements

Prof Fawzy Ibrahim

0.4 Course Outline (Continued)

Week Lec. 17 10 18 110 20 21 22 23 11 24 4.3.6 phase Shift Measurements Chapter 5 Data acquisition systems 5.1 DAS Function 5.2 DAS Block Diagram 5.3 The Instrumentation Amplifier 5.4 Active Filters Items/Topics 4.3.3 Measurement of Coil Parameters 4.3.4 Measurement of Capacitance Parameters Assignments Lab #4 Experiment #3 DC and AC Measurements

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Midterm Exam 4.3.5 Frequency Measurements Project Assignment Problem Set #5 Frequency and Phase Measurements Training on LABVIEW Software And Project Implementation

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0.4 Course Outline (Continued)

Week

Lec. 25 26 27 28 210

Items/Topics 5.5 Transducer Functions and Characteristics 5.6 Types of Transducers Chapter 5 Measurement of Weak Noisy Signals

Assignments Training on LABVIEW Software And Project Implementati on Project Lab Evaluation

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Project Presentation 30

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0.5 Grade Distribution

Class Participation Quizzes Mid-term examination Final-term examination Practical Exam and Term Project Total 10 10 30 40 10 100 % % % % % %

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