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International Journal of Emerging Trends & Technology in Computer Science (IJETTCS)
Web Site: www.ijettcs.org Email: editor@ijettcs.org, editorijettcs@gmail.com
Volume 3, Issue 2, March – April 2014 ISSN 2278-6856
International Journal of Emerging Trends & Technology in Computer Science (IJETTCS)
Web Site: www.ijettcs.org Email: editor@ijettcs.org, editorijettcs@gmail.com
Volume 3, Issue 2, March – April 2014 ISSN 2278-6856
International Journal of Emerging Trends & Technology in Computer Science (IJETTCS)
Web Site: www.ijettcs.org Email: editor@ijettcs.org, editorijettcs@gmail.com
Volume 3, Issue 2, March – April 2014 ISSN 2278-6856
International Journal of EmergingTrends & Technology in Computer Science(IJETTCS)
Web Site: www.ijettcs.org Email: editor@ijettcs.org, editorijettcs@gmail.com
Volume 3, Issue 2, March April 2014 ISSN 2278-6856
Volume 3, Issue 2 March April 2014 Page 81
Abstract: Paper deals with the quality analysis of copper wire using ARM 7 processor. Copper wire used in transformer/motor windings is enameled by polyurethane, polyamide, or polyester resins [1]. This enamel coating is thin, act as resistant to heat, high voltage and is of high temperature rating [1]. During transport the enamel coating may get lost due to mishandling. The flaws in enamel coating further leads to increment in losses and resistivity. So, such lossy wires are not capable of withstanding high voltage and temperature ratings [2][3]. The threshold establishment is necessary for rejection of copper wire on the basis of enamel coating thickness, flaws due to manufacturing and transport. Currently ARM 7 processor is widely used in industry as in speed it competes with DSP processor as well as it is small in size, cost and power consumption as compare to Microcontroller 89S51, DSP processor. So, for the automation ARM 7 processor is used as decision device. Evaluation metric for this analysis is based on accuracy of detection, response time and power consumption of the overall circuit.
Keywords: Advance RISC Machine (ARM); Analog to Digital Converter (ADC); Complex Instruction Set Computers (CISC); Digital Signal Processing (DSP); Incoming Quality Inspection Test (IQIT); Reduced Instruction Set Computer (RISC).
1. INTRODUCTION In agriculture, selection of seed is very much necessary, and only then we can expect healthy and quality plants and finally it will lead into good production. Similarly the primary and profound step in any industrial manufacturing and production is Incoming Quality Inspection Test (IQIT). In this paper the incoming quality test of copper wire used in transformer/motor is established by using ARM 7 processor. Traditionally this test was done by manual means or by using mecha-electronics equipments. In those traditional systems the main drawbacks were of accuracy, response time and manual database creation. As these traditional systems were manual they had high losses and high probability of errors. So, it is necessary to modify the traditional ways in concern with above mentioned parameters. Due to the flaws in enamel coating of copper wire, such as abrasion it may lead to short circuit when such faulty wire is used as transformer/motor winding. It finally affects the gross production and the rejected wire overheads might get add into the cost per unit. Sometimes use of such faulty motors/transformers causes major accidents. Lifetime or work hours of such motors/transformers may degrade due to uninspected raw material or inaccurate quality analysis of raw material. ARM 7 is the 32 bit Advance RISC Machine Processor, where RISC stands for Reduced Instruction Set Computer. RISC architecture supports software sophistication, multiple instruction execution in single cycle called as pipelining, and simple in design. ARM 7 uses Von Neumann architecture which supports same program and data memory, saves hardware, power consumption and additional cost. ARM 7 [5] plays important role in the monitoring of enamel coating thickness, acquisition of data, processing and storing of data. It will create a huge database of tested wires on personal computer which will further useful in taking corrective actions. Paper is organized in seven sections. Section one of paper explains selection of processor, what are the important features of processor which make processor capable for the given application. Section two highlights the needs of analog to digital converter and selection of 24-bit modulator. The very next section three gives architecture of abrasion and thermal resistivity tester and execution of commands. Section four elaborate algorithm and program flow of ADS 1248 and communication with ARM 7. Section five generates result parameters of the established system. Section six is the concluding remark and seven is the system Photograph.
3. SELECTION OF PROCESSOR ARM 7 is the 32 bit RISC processor. In speed, it competes with the powerful DSP chips even, while in cost and interfacing methods, surpasses them. Size, power consumption and number of on-chip peripherals available with ARM 7 are more as compared with simple 89c51 processor. In addition its precision is high. ARM 7processor is very useful for industrial control, medical systems, protocol converter and for communication. Input power supply requirement is very low for ARM 7, about 3.3v and can operate upto 72MHz. The ARM architecture is based on Reduced Instruction Set Computer (RISC) principles, and the instruction set and related decode mechanism are much simpler than those of micro-programmed complex instruction set computers (CISC). This simplicity results in a high Automatic Resistance detection and Abrasion testing of copper wire used in transformer or motor windings by ARM 7 processor
Amruta Patil and Prof. R. M. Khaire
Department of E&TC Engg., BVDUCOE, Pune International Journal of EmergingTrends & Technology in Computer Science(IJETTCS) Web Site: www.ijettcs.org Email: editor@ijettcs.org, editorijettcs@gmail.com Volume 3, Issue 2, March April 2014 ISSN 2278-6856
Volume 3, Issue 2 March April 2014 Page 82
instruction throughput and impressive real-time interrupt response from a small and cost-effective processor core. GPIO registers are relocated to the ARM local bus so that the fastest possible I/O timing can be achieved. The ARM 7 -LPC2364/66/68 [5] each contain four UARTs. In addition to standard transmit and receive data lines, UART1 also provide a full modem control handshake interface. The UARTs include a fractional baud rate generator. Standard baud rates such as 115200 can be achieved with any crystal frequency above 2 MHz [5]. The LPC2364/66/68 each contains two SSP controllers. The SSP controller is capable of operation on a SPI, 4- wire SSI, or Microwire bus. It can interact with multiple masters and slaves on the bus. Only a single master and a single slave can communicate on the bus during a given data transfer. The SSP supports full duplex transfers, with frames of 4 bits to 16 bits of data flowing from the master to the slave and from the slave to the master. In practice, often only one of these data flows carries meaningful data [5].
4. SELECTION OF ANALOG TO DIGITAL CONVERTER The ADS 1248 is 24 bit, Analog to Digital Converter IC for temperature sensors such as thermocouples, thermistors, RTDs [6]. It can be useful for pressure measurement in industrial process control. Figure 1 shows internal block schematic of ADS 1248 [6]. It has onboard low noise, programmable gain amplifier, a precision delta sigma ADC with a single cycle settling digital filter and in internal oscillator. An input multiplexer supports four differential inputs for the ADC 1248. Multiplexer additionally contains sensor burnout detect facility, monitoring and general digital IOs.
Figure 1 Internal Block schematic with pin-outs of ADS 1248
It accepts analog inputs through AIN0 AIN7, select any input by internal multiplexer according to the status of AVDD, GPIO and VBIAS. The output of multiplexer is further amplified by internal programmable gain amplifier and provide as analog input to 24 bit modulator or analog to digital converter (ADC). It will sample by ADC and again filtered by Digital filter. This output will take on Dout of ADS 1248 as corresponding to that of analog input [6].
5. ARCHITECTURE OF ABRASION TESTER AND THERMAL RESISTIVITY TESTER
Figure 2 Abrasion tester and Thermal resistivity detector
Figure 2 shows simple block representation of the tester which consists of power supply unit, ADS 1248 modulator, ARM processor kit, MAX RS232 protocol analyzer and computer as a Result display device [4]. The flow of tasks is given as: 1) Power on circuit by turning on power supply unit for each block. 2) Initialize ADS 1248- 24 bit modulator, ARM 7 processor with its GPIOs, UART, SPI Bus and other references. 3) Apply current to copper wire through current source at its one terminal and measure it at copper wires output terminal. Resultant current will be proportional to change in conductivity due to abrasion or add on resistance. 4) Convert output current to voltage by C to V converter and apply it to 24 bit ADC modulator. Further modulator will be sample and send digital count corresponding to analog input through SPI bus to ARM 7 processor. 5) At ARM 7 processor the data will classify as command or data count in software comparator. Through MAX RS 232 the data count corresponding to voltage affected by resistance of copper wire will be display on hyper-terminal.
6. PROGRAM FLOW Figure 3 shows the system flowchart. Flowchart clearly explain work done by ADS 1248. After initialization of ADS 1248, peripherals, timers, UART, SPI ADC modulator converts analog input to digital count. That output will be send on SPI bus, It will again read at SPI i/p , featch and scaled at SPI o/p. Then ADS 1248 establish comunication with ARM 7 through UART(Universal Asynchronous Receiver Transmitter) where the ADC result will be packatize for serial communication. ARM 7 will be continuously send the given result to computer and able to view on its hyper- terminal.
International Journal of EmergingTrends & Technology in Computer Science(IJETTCS) Web Site: www.ijettcs.org Email: editor@ijettcs.org, editorijettcs@gmail.com Volume 3, Issue 2, March April 2014 ISSN 2278-6856
Volume 3, Issue 2 March April 2014 Page 83
Figure 3 Work- flow of ADC commands, communication of ADS 1248, ARM 7 and Computer
7. RESULT PARAMETERS The following tables compare various effective parameters of Traditional System , new innovative Abrasion tester and resistance detector. Table 1: Comparison of traditional systemand abrasion detector
Power consumption in Watt Response time of one Fault detection Traditional Equipment Abrasion Tester Traditional Equipment Abrasion Tester 10W 500mW 5 to 10 minits 800ms to 1sec Table 2: Comparison of traditional systemand abrasion detector Accuracy in tems of No. of accurate test/No. of test performed) * 100% Cost in rupees Traditional Equipment Abrasion Tester Traditional Equipment Abrasion Tester 70% 93% 10000 to 15000/- 5000 to 7000/-
As the establised abrasion tester is the test and build circuit with no. of test/check points. For industrial application the size of PCB will be further reduced with all effective parameters except accuracy. It will be improved upto 99% by reducing software errors and bugs. 8. CONCLUSION The abrasion tester will be a good addition to input quality control department of the transformer and motor manufactures.
It is the incoming inspection type of test. The most important purpose of this testing is to avoid placing a defective component in a motor/transformer assembly where the cost of diagnosis of the manufactured motor may far exceed the cost of incoming inspection of the copper wire. We can greatly control the infant mortality rate of transformer and motors by using proposed Abrasion tester.
The proposed Abrasion Tester has the limitation that it is applied for short wire length about 10 to 15 cm. In future it will be possible to test whole wire by doing certain modification with Abrasion tester.
9. SYSTEM PHOTOGRAPTH
ACKNOWLEDGEMENTS My M.Tech. Project topic is Abrasion and continuity tester. So the resultant parameters are of my own dissertation work. Thus I would like to acknowledge Project guide Prof. R. M. Khaire and Industrial guide Mr. S. S. Kulkarni for their active valuable support and guidance.
References Journal Papers:
[1] Landinger, C.; Cronin, L.D., "Fault tests on embedded copper wire and copper tape shielded single conductor cables," Power Apparatus and Systems, IEEE Transactions on,vol.94, no.3, pp.959,966,May1975 doi: 10.1109/T-PAS.1975.31929 [2] Pops, H.; Walker, J., "Origins of high voltage continuity failures in enamel coated copper magnet wire," Electrical Electronics Insulation Conference International Journal of EmergingTrends & Technology in Computer Science(IJETTCS) Web Site: www.ijettcs.org Email: editor@ijettcs.org, editorijettcs@gmail.com Volume 3, Issue 2, March April 2014 ISSN 2278-6856
Volume 3, Issue 2 March April 2014 Page 84
and Electrical Manufacturing & Coil Winding Conference, 1993. Proceedings., Chicago '93 EEIC/ICWA Exposition , vol., no., pp.457,484, 4-7 Oct 1993 doi: 10.1109/EEIC.1993.631223 [3] Binhai Zhang; Kaiyou Qian; Wang, T.; Yuqi Cong; Zhao, M.; Xiangquan Fan; Jiaji Wang, "Behaviors of palladiumin palladium coated copper wire bonding pr ocess," Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conferenceon,vol.,no.,pp.662,665,10- 13Aug.2009 doi: 10.1109/ICEPT.2009.52706683. [4] Amruta Patil,Prof.R.M.Khaire, " Establishment of evaluation metric and quality analysis of enamel coating thickness and thermal resistivity of copper wire using arm7,"International Journal of Application or Innovation in Engineering & Management2014International Journal,Vol.no.3,Issue 120Feb2014
Datasheets:
[5] Datasheet of LPC2364/65/66/67/68 (ARM) processor [6] Datasheet of ADS 1248 modulator (Analog to Digital Converter)
AUTHOR
Amruta Patil received her BE degree in electronics and telecommunication fromCummins College of Engineering for womens, Pune; in 2009 and she is perceiving her M.TECH. Degree in Electronics and VLSI technology fromBharati Vidyapeeth College of Engineering, Pune; under the guidance of Prof. R. M. Khaire. She has been in teaching since 2010 and is currently an assistant professor in the Department of Electronics and Telecommunication at Bharati Vidyapeeth College of Engineering, Pune. Her research interests are in Embedded systemapplications.
Prof. R. M. Khaire is working as a Head of the Department in E&TC engg. , at Bharati Vidyapeeth College of Engineering, Pune. He has completed his M.Tech from IIT Chennai. He is retired Brigadier from Indian Army.