Operating Instructions for the Jiggle Cell

Overview:

The J iggle cell is an especially useful test device for controlling and/or trouble-shooting
all types of electrolytic nickel plating solutions. It is also uniquely well suited for
comparing the relative performance characteristics of different addition agent systems.

Perhaps the major advantage of the J iggle cell is that it uses a bent cathode test panel,
rather than a flat panel. The obvious benefit of this configuration is that it creates shelf
areas and recesses that correlate much more closely with the situations platers actually
encounter in production.

Another benefit is that the J iggle cell utilizes a convenient solution volume of 1000 ml.
Thus, computing additions is straight-forward: a 1 ml. addition to the J iggle cell is
equivalent to adding 1 gallon of material to a 1000 gallon production tank. Similarly,
adding 7.5 grams of a powder is equivalent to adding 1 oz/gal to the main solution. The
larger cell volume also allows for more testing to be done on a single sample of solution
without significantly changing operating conditions such as bath pH and addition agent
concentrations.

The J iggle cell can be used with just mechanical agitation, just air agitation, or a
combination of both types.


Equipment Required:

1000 ml J iggle cell
0-10 amp Lab Rectifier
Aquarium Size Air Agitator (for Air Agitated Plating
Baths)
Electrolytic Nickel Anode -- 1.5" x 8"
Polypropylene Anode Bag
180 Grit Waterproof Silicon Carbide Sandpaper (such as
3M #9047)
Zinc Coated Steel J iggle Cell Panels
Polished Brass J iggle Cell Panels

Test Procedure:

1. Pour 1,000 ml. of solution to be tested into J iggle cell.

2. Plug in heater and agitation motor (and air source, if air agitation is to be used),
and allow solution to reach normal operating temperature used in production.

3. Attach red lead from rectifier to the anode, and the black lead from the rectifier to
the cathode holder.

4. If leveling is to be measured, scratch test panel (without removing protective zinc
coating) over entire surface that will face the anode in the cell. Use sufficient
pressure to ensure that the scratches are through the zinc coating and into the base
metal. If leveling is of no concern, or if tests must be run over a polished
surface, omit this step.

5. Bend test panel to approximately duplicate configuration shown in Figure 1.

6. Remove protective zinc coating by immersing panel in a 30-50% vol.
Hydrochloric Acid solution. Be sure all zinc is removed; otherwise it will create
erroneous test results.

7. Wipe panel with a small wet sponge to remove any smut on the surface of the
cathode. Pay particular attention to the recessed areas, since residual smut in
these areas will lead to erroneous results. Rinse well.

8. Attach cleaned cathode to cathode holder and submerge in solution.

9. Turn on rectifier and immediately adjust to proper amperage. Typically, a
current of 3.5 amps will provide the most meaningful results. If production
conditions are atypical, i.e., significantly higher or lower than normal current
densities are used, select an amperage that corresponds to actual plant conditions.

10. Plate panel for ten minutes, adjusting current as needed to maintain the initial
preferred amperage during this time period. Normally the current will increase
slightly from the initial setting once the cathode surface is completely coated with
nickel.

11. Turn off rectifier at the end of the plating cycle, and remove panel.

12. Rinse panel in fresh running water, and dry.

13. Examine panel for overall appearance and changes from previous panel(s).

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14. Label panel listing any additions made or changes in operating conditions
compared to last panel run. This will facilitate selecting the optimum additions
to be made in production.






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2
4
2
4
Area #1 Intermediate current density area
(35-40 ASF). Demonstrates
leveling with moderate thicknesses
of nickel.



Area #2 Low current density area (5-20
ASF). Shows leveling with thin
nickel deposits. Bottom shelf area
also useful for determining the
presence of suspended solids.
1



Area #3 Very low current density area (<5
ASF). Shows presence of
metallic and organic impurities as
well as low current density
brightness and leveling charac-
teristics. Effects of excess
secondary brightener are most
evident in this area.



Area #4 Extreme low current density area
(<2 ASF). Shows same effects as
Area #3, but at even lower current
densities.



Area #5 High current density area (50-70
ASF). Demonstrates leveling with
heavier nickel deposits.
5





Figure 1 - Explanation of J iggle cell Panel


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