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DO-35
DO-214
Diac
HT and ST Series RoHS
E8
General Description
Teccor’s HT and ST Series of bilateral trigger diacs offer a range
of voltage characteristics from 27 V to 70 V.
A diac semiconductor is a full-wave or bidirectional thyristor. It is
triggered from a blocking state to a conduction state for either Features
polarity of applied voltage whenever the amplitude of applied
voltage exceeds the breakover voltage rating of the diac. • RoHS Compliant
The Teccor line of diacs features glass-passivated junctions to • Bilateral triggering device
ensure long-term reliability and parameter stability. Teccor’s • Glass-passivated junctions
glass offers a rugged, reliable barrier against junction • Wide voltage range selections
contamination.
The diac specifications listed in this data sheet are for standard
products. Special parameter selections such as close tolerance
ST Series
voltage symmetry are available. Consult the factory for more
• Epoxy SMT package
information about custom design applications.
• High-temperature, solder-bonded die attachment
HT Series
• DO-35 trigger package
• Pre-tinned leads
General Notes
Current
• Lead solder temperature is +230 °C for 10-second maximum;
≥1/16" (1.59 mm) from case.
10 mA
• See “Package Dimensions” section of this catalog. V
(2) See Figure E8.4 and Figure E8.5 for test circuit and waveforms. Voltage
DO-35 DO-214
LOAD — Up to 1500 W
3.3 k
Triac MT2
Q2015L5
200 k
120 V ac G
60 Hz MT1
HT-35
Bilateral
0.1 µF Trigger
100 V Diac
10
5.0
3.0
Repetitive Peak On-state Current (ITRM) – Amps
2.0
1.0
HT-32x, -34x, -35, -36x, -40
0.5 HT-5761, -5761A, -5762
0.3 ST-32x, -34x, -35, -36x, -40
0.2
0.1 HT-60
0.05
0.03 Safe Operating
0.02 Area
.01
.005
.003
.002 PULSE REPETITION RATE = 120 pps
TA = 40 ˚C
.001
1 2 4 6 10 20 40 60 100 200 400 6001000 2000 4000 10000
+8
47 k *
+6
Percentage of VBO Change – %
+4 100 k
D.U.T.
+2
HT Series
RL
0
ST Series CT
VC
-2
0.1 µF IL
20 Ω
-4 1%
120 V rms
-6 60 Hz
-8
-40 -20 0 +20 +40 +60 +80 +100 +120 +140
* Adjust for one firing in each half cycle. D.U.T. = Diac
Junction Temperature (TJ) – ˚C
Figure E8.3 Normalized VBO Change versus Junction Temperature Figure E8.5 Circuit Used to Measure Diac Characteristics
(Refer to Figure E8.4.)
V
C
300
+V
BO
∆V+
0 t
200
∆V- e)
-V vic
BO 150 De
V
(35
al
pic
I
L 100 Ty
+I
PK
50
0 t
0
-I .01 .02 .03 .04 .05 .06 .07 .08 .09 .10
PK
Triggering Capacitance (CT) – µF
Typical pulse base width is 10 µs
Figure E8.4 Test Circuit Waveforms (Refer to Figure E8.5.) Figure E8.6 Peak Output Current versus Triggering Capacitance
(Per Figure E8.5 with RL of 20 Ω)