Documente Academic
Documente Profesional
Documente Cultură
2Y J u l j 1991
References
1
4
5
wherc I , , a n d /,,, are the length extensions due to the input and
output capacitances of the FET. respectively.
Length extensions /, , and I, ,, can be calculated by nsing
wherc C, and C,, are optimised to be 0.4781 and 0.1 I I I pF, respectively. The last equation gives /, , = 2.921mm and 1,. = 0.686mm.
Hence, I, = 9.271mm and I2 = I1.506mm.
Finally. the circuit dimensions are optimised using LIBRAm.
This step is critical as the theory regards FETs as entirely unilateral devices in order to simplify the analysis of the circuit. In reality, they have feedback elements which will change the
performance of the designed filter. As the S-parameters of the
bilateral F E T are used during optimisation, these factors will bc
compensated for by the optimised dimensions o f the filter, which
arc found to be: I , = 7.874mm. /! = 10.668mm. .S, = 0.051mm and
S1= I).X64mm.
ELECTRONICS LETTERS
Vol. 30
No. 79
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CD IEE 1994
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C
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References
I2 July 1994
60
A I 0
2
3
185
I n
- _ _ 1 _ _ 1 - : 2 u k3 frequency, GHz
b ?
'
Effects of thin-film nonuniformity on thinfilm open end microstrip line for miniature
multilayer MMlCs
18
Transmission
h Return loss
/nde.ring r e r m ~ Strip
:
lines, Thin j i k circuirs. M M I C T
--
Inrroduction: The recently introduced thin-film microstrip tecbriique has been widely applied to miniature multilayer MMICs [I-31,
where niicrostrips are used for fundamental transmiasion lines.
They are arranged in such a way that niultiple metal layers and
thin dielectric films are deposited onto the wafer, and the thin dielectric lilms serve as the substratc for microstrip lines. This
xrrangeinent allows for a considerable increase in [he packing density and provides a great flexibility of design. In this Letter, a
comprehensive characterisation of the open end of thin-film
microstrip lines is presented. Special attention is paid to the electrical behaviour of the discontinuity when the thin dielectric film is
truncated near the open end.
--
-3 0
0.c
a4
The eflects (11' thin-film nonuniformily on the open end of thinfilm microstrip lines for miniature multilayer MMlCs are
analysed. The formulation is mplemenled hy the 3-D finite
difference method in conjunction with the higher order asymptotic
boundary condition. Special Lredtmcnt o f mesh nodes ;at the
corner and the fringes of the boundary is given by interpolation.
The results presented show that the field distribuiions are highly
disturbed by the nonuniformity of the thin dielcctnc lilm, and
that the elecrrical peribrmance wries as the thin dielectric film is
truncdtcd near the open end.
k W 4
1606
E53
k---Wd+
U/
nonuni-
ELECTRONICS LETTERS
Vol. 30
No. 79