SV TCL and Associates offers a wide array of semiconductor products being utilized in many

popular consumer applications. Here is a continuation of the previous list published on this
website:
1. Vertical Space Transformers - SV TCL's TrioTM vertical and LogicTouchTM fine- pitch vertical
technologies provide an interconnect, also referred to as a space transformer (ST), used
between the printed circuit-board and the probe head. This process transfers the test signal.
SV TCL also provides various types of space transformers, every one of which can be used for
any specific advantage and application. Some options include the following:
- Wired & Advanced Wired (WST or AWST)
- Rigid
- Multi-Layer Ceramic (MLC)
- Multi-Layer Organic (MLO)
- Direct Attach
- Modular (MSTTM)
2. CIS Probe Cards - CMOS Image Sensors (CIS) allow camera functions in high tech tablets and
smart phones. Testing CIS devices utilizes cantilever technology and layering for high density
probe layouts. SV TCL's CIS probe card products employ a wide variety of materials ensuring
they are a durable cost-saving solution that can meet the fine pitch and multi-die challenges of
these devices. Other features include:
- Layering for High Density Probe Layouts
- Alloy Probes
- Tight Pitch

3. LCD Driver Probe Cards - LCD driver cards are used in some of the latest high-definition tech
products such as LCD televisions, high-functioning smar-phones and tablets.ICs utilized in these
cards require high-pin counts, fine pitch and high paralisllism. SV TCL's LCD Probe card products
provide durable, economical solutions to address fine-pitch and multi-die requirements of
these devices. Additional advantages include:
- Maximum Frequency 2GHz
- Minimum Pad Pitch
- 9m Staggered
- 25m Inline
- Stable Contact with Au Bump/Pad
- Ultra Low Pin Force Ensures Longevity
- Minimal Probe
4. Venture Cantilever Probe Cards - SV TCL's VentureTM line of cantilever probe cards provide
the best epoxy technology on the market and are well-designed for logic testing. It includes a
wide range of cantilever cards, single to multi-die for a variety of test systems. Its Venture FX
fine-pitch cantilever cards are well-suited for LCD driver-testing, with higher probe counts for
better density bond-pad layouts. Features include:
- >4,000 Points
- Pad Pitches as Tight as 30m
- Frequency up to 3GHZ
- Shelf Build & LCD Driver
5. Ceramic Blade Cards - SV TCL offers a variety of ceramic blades and blade probe cards. We
have patented ceramic microstrip blade probes available in low leakage and low capacitance for
optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF-testing.
Benefits include:
- RF Modeling Capability Provides Frequency Performance Optimization
- Handling & Testing Capability

6. Metrology - Finally, SV TCL a wide variety of world-class analytical resources, allowing the
firm to visually evaluate wafer-scale features and capture data from bumps, pads, scrub marks
and probe depth. SV TCL's capabilities include:
- Scanning Electron Microscope
- Electron Dispersive Spectrometry
- Profilometery
- Finite Element Analysis
- RF Performance Characterization
- Single Pin Video Capability
All in all, SV TCL's capabilities are clearly seen in its wide range of products that satisfy today's
stringent standards of quality and durability.