Research on Model of Circuit Fault Classification

Based on Rough Sets and SVM

Fu Yu, Zheng Zhi-song, and Wu Xiao-ping
College of Electronic Engineering, Naval Univ. of Engineering, Wuhan 430033 China

Abstract. Aiming at the characteristic of lacking swatches and paroxysmal

faults, A fault classification model based on rough sets and SVM is put forward.
The pretreatment of diagnosis data is constructed by attribute reduction in rough
sets. Redundancy attribute is deleted from the diagnosis decision-making table
without losing useful information, and the reduced diagnosis decision-making
table is used as original training sets of classification sub-system. The dimension
of fault symptom and the capability of classification is balanced. Finally an
example shows the model is effective and reasonable.
Keywords: rough sets, support vector machine, fault classification.

1 Introduction
In recent years, support vector machine (SVM) has been successfully applied to data
mining, machine learning and pattern recognition by virtue of solid theoretical base,
good generalization performance and broad application prospects of widespread
concern. SVM could solve the problem of small samples of machine learning, which
based multi-classifier has high classification accuracy and good generalization ability,
So SVM has been as a new method of intelligent diagnosis classification used in circuit
fault with high research value [1-3].
Circuit fault diagnosis in most cases is a small sample of machine learning problem.
There are two reasons: on the one hand, the circuit fault occurs with a certain surprise
which is not repeated and simulation. On the other hand, compared with the speech
recognition and image recognition and other issues, which have thousands of samples
and hundreds of feature dimension, the circuit failure mode is not only a relatively
small number of samples, but also the nodes which could obtain diagnostic information
are limited. Therefore the dimensions of fault samples are relatively small, so SVM
could fast fault classification[4-5]. In addition, the size of fault samples and normal
samples is imbalance, which causes "a bias" using the common effect of classifier.
While SVM can take effective measures to reconcile such a bias to ensure the
accuracy of diagnosis with the minority class samples based on the minimization
structure risk[6]. Therefore, the article chose SVM to create a circuit fault classification
model, which is a good solution to the problem of circuit fault classification. In the
model, the different points of failure could produce the same fault characterization,
which could bring the uncertainty. To solve this problem, the method of rough set
theory and machine learning technology is introduced.
D. Jin and S. Lin (Eds.): Advances in CSIE, Vol. 1, AISC 168, pp. 433439.
Springer-Verlag Berlin Heidelberg 2012
springerlink.com

434

Y. Fu, Z. Zheng, and X. Wu

2 A Fault Classification Model Based on SVM

Support vector machines applied to the circuit fault classification, which is established
in the diagnostic process model of support vector machine classification process. The
modeling process is: support vector machine classifier corresponds to the fault
classifier; training sample can be corresponded to fault circuit, and the voltage or
current value of the node consists of test vectors (usually obtained through fault
simulation); test samples and the corresponding circuit to be diagnosed node consist of
voltage and current values of test vectors. Classifier training process fault diagnosis
device corresponds to the establishment and initialization process, the sample testing
process to be diagnostic fault classifier corresponds to the fault diagnosis process [7].
The model is shown in Fig. 1.

Fig. 1. The frame of circuit fault diagnosis based on SVM

Model of treatment process: firstly to capture the signal flow of circuit system by the
data acquisition module, so the characteristic parameters could be extracted by the
parameters of the signal; secondly the characteristic parameters will be pretreated as the
input vector of the SVM. If it is in state of training, characteristic parameters will be
trained through the support vector machine modules, and the training results, ie a set of
support vector, will be storaged into the database; If it is in the state of predicting, the
input vector will be predicted through module of SVM to get the output value. When
the circuit is abnormal the failure event has occurred.

3 Major Steps in Fault Classification

The main steps of system fault classification are showed in figure 2 based on SVM and
rough set.

Fig. 2. The realization of fault classification based on SVM and rough set

Research on Model of Circuit Fault Classification Based on Rough Sets and SVM

435

Step 1 Data discrimination

The system parameters of circuit fault diagnosis of state are usually numerical bariables
collected by the data acquisition module, which is not easy to be dealed with by the
rough sets. This paper uses fuzzy C means (FCM) clustering algorithm as a
pretreatment algorithm before reduction of rough set. FCM algorithm was first
proposed by the Bezkek, which is obtained by the iterative algorithm to approximate
the optimal value of the objective function. Consider a sample set X = {x1, x2, ..., xn},
where xi = (xi1, xi2, ..., xik) is a k-dimensional vector, which will be divided into c fuzzy
subsets based on certain criteria where c is the number of clusters given by the user, and
the result of clustering center with a cluster membership matrix vector and expressed
as:
V = (v1 , v2 ," , vc )

(1)

u = [uij ]i =1,",c ; j =1,",n;

Where, uij is the membership which means the degree that xij belong to the category i, uij
meet:
c
uij = 1 j = 1," , n
i =1

n
0 < u < n i = 1," , c
ij

j =1

(2)

Objective function of FCM algorithm is:

c

J (uij , vk ) = uijm x j vi

(3)

i =1 j =1

Equation (3), m is index weight for the matrix of fuzzy degree

n

vi = 1 / (uij ) m x j , i = 1," , c
j
=
1

uij = 1 / x j vi

2 1/ m 1

/ 1/ x j vk
k =1

(4)

2 1/ m 1

Some membership values data can be gotten after the FCM clustering and the greatest
value of the corresponding membership category is selected as the sample
corresponding to discrete categories, which is easy to handle for rough set decision
table.
Step 2 Rough Set Theory
To make each input as the condition attributes and each output as the decision attributes
for the decision table. The discernibility matrix based on logical operation on rough set
attribute reduction algorithm is as follows.

436

Y. Fu, Z. Zheng, and X. Wu

calculated the discernibility matrix M of decision table system S = <U,CD>:

{ ak | ak C ak ( xi ) ak ( x j )}, d ( xi ) d ( x j )
M (i, j ) =
d ( xi ) = d ( x j )
0
i, j = 1, 2," , n

(5)

establish the appropriate expression of disjunctive logic

Lij , Lij = ai , M ij 0, M ij

(6)

ai M ij

calculation of CNF L
L=

make L convert to CNF then

M ij 0, M ij

(7)

Lij

L = Li ;
i

Every item on the results of CNF is corresponding to the attribute reduction,

which contains the least number of attributes are asking for the minimum set of
attributes C [8].
Step 3 Least squares Support Vector Machine (LS-SVM)
The quadratic programming has been required for training solutions SVM. Although
the solution obtained is the only optimal solution, the complexity of the algorithm
depends on the number of sample data. An effective solution is to use least squares
support vector machine (LS-SVM) which can improve the convergence speed by
solving a set of linear equations [9].
Let the training data set {x , y }N , x R is the t sample of the input mode,
t

yt R

t t =1

is the expected output corresponds to the t sample, while N is the number of

training samples. LS-SVM to take the following form:

y( x) = wT ( x) + b

(8)

To map input data into a high dimensional feature space in the equation (8). The
dimension of w is not pre-specified ( which can be infinite dimensional.)
In the LS-SVM, the objective function is described as:
N

min J ( w, e) = (1/ 2) wT w = (1/ 2) et2

(9)

t =1

constraints are: y ( x) = wT ( xt ) + b + et , t = 1,", N

(10)

Research on Model of Circuit Fault Classification Based on Rough Sets and SVM

437

4 Example Calculation
The specific process of the method can be illustrated by the differential circuit.

Fig. 3. Differential circuitry

In the fig. 3 the resistance and the tolerance of capacitance components is 5%, when
there is a single soft fault, we can set the nominal value of resistance fluctuations in Rb
fluctuate to 25%, Rc1 fluctuate to -30%, Rc2 fluctuate to 30% . When a component
fluctuates beyond its tolerance, not only it will cause changes in the voltage across the
device, but also it will lead the other node voltage change, what is more the voltage
values are different in different failure mode. The seven test points are selected as
samples which is Vo1 Vo2 Vo3 Vo4 Vo5 Vo6 and Vo7 shown in Table1.
Table 1. Sample data
Vo1

Vo2

Vo3

Vo4

Vo5

Vo6

Vo7

0.082

0.014

0.088

0.112

0.021

6.215

0.015

normal

0.195

0.035

0.062

0.137

0.026

5.242

0.168

normal

0.104

0.101

0.006

0.072

0.051

6.101

0.385

failure

0.015

0.026

0.033

0.092

0.018

5.001

0.069

failure

0.206

0.014

0.128

0.032

0.188

6.284

0.110

failure

0.184

0.087

0.071

0.074

0.029

5.301

0.106

failure

0.274

0.012

0.011

0.165

0.006

3.329

0.076

normal

0.279

0.038

0.010

0.187

0.007

6.469

0.094

normal

0.206

0.022

0.128

0.197

0.171

2.968

0.170

failure

0.082

0.014

0.088

0.112

0.021

6.215

0.015

normal

0.206

0.022

0.128

0.197

0.171

2.968

0.170

failure

438

Y. Fu, Z. Zheng, and X. Wu

The data obtained by FCM is shown in Table 2, then rough set attribute reduction
algorithm can be used for attribute reduction the result after which is that the inputs are
leaving only the {Vo1, Vo2, Vo3, Vo4}. In other words, through the reduction of rough
set input have not been greatly reduced. Simulation results show that the algorithms of
the model can be reduced greatly.
Table 2. The collection sample data
Vo1

Vo2

Vo3

Vo4

Vo5

Vo6

Vo7

5 Conclusion
The fault classification model is established based on rough set theory and SVM in this
paper. In addition, this paper uses the rough set theory get the pre-processor without
loss of valid information, which can remove the diagnostic decision-making table to
solve the problem of dimension and the classification.

References
1. Han, H., Gu, B., Ren, N., et al.: Fault Diagnosis for Refrigeration Systems Based on Principal
Component Analysis and Support Vector Machine. Journal of Shanghai Jiaotong
University 45(9), 13551361 (2011)
2. Ma, C., Chen, X., Xu, Y., et al.: Analog circuit fault diagnosis based on attribute reduct
ensemble of support vector machine. Chinese Journal of Scientific Instrument 32(3),
660665 (2011)
3. Li, F., Tang, B., Zhang, G.: Fault diagnosis model based on least square support vector
machine optimized by leave-one-out cross-validation. Journal of Vibration and Shock 29(9),
170174 (2010)
4. Shen, Y., Meng, C.: Research on Method of Analog Circuit Fault Diagnosis Based on
Information Fusion and SVM. Computer Measurement & Control 17(11), 21772180 (2009)
5. Zhu, B., Hu, S.J.: A New Method of Support Vector Machine (SVM) for Power Electronic
Fault Diagnosis. Control Engineering of China 16(S), 206208 (2009)

Research on Model of Circuit Fault Classification Based on Rough Sets and SVM

439

6. Lin, H., Wang, D.: Optimizing Support Vector Machine Parameters and Application to Fault
Diagnosis. Computer Science 37(4), 255257 (2010)
7. Gu, X., Zhao, J., Wang, S., et al.: Fault Diagnosis Technology Based on Multi-resolution
Analysis and Support Vector Machine in Power Electronic Circuit. Journal of Henan
University (Natural Science) 41(3), 300303 (2011)
8. Cao, C.F., Yang, S.X., Zhou, X.F.: Fault Diagnosis of Rotating Machinery Based on an
Improved Support Vector Machines Model. Journal of Vibration, Measurement &
Diagnosis 29(3), 270274 (2009)
9. Jiang, H., Wu, C., Ma, J.: Design of Cognitive Engine for CR Based on Least Squares SVM.
Journal of University of Electronic Science and Technology of China 40(1), 4145 (2011)