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Hans Wenzel
Ferdinand-Braun-Institut
Ferdinand-Braun-Institut
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G. V Erbert
Lawrence Livermore National Laboratory
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1. INTRODUCTION
The ideal broad area laser source has the highest possible reliable power and power conversion efficiency, a high quality
emission beam (narrow far field angle with minimal modal content), a narrow spectrum suitable for pumping narrow
absorption lines and longest possible lifetime. One current application that clearly demonstrates the importance of these
performance parameters is pump diodes for fiber lasers (another relevant application is the direct use of diode lasers [1]).
Diode Laser
Optical Fiber
95%
Fig. 1. (Left) Spectral absorption and emission cross-sections of Yb-doped glass [2] (Right) Schematic representation of
the coupling of a diode pump laser into an optical fiber. Ideally all (>95%) of the power would be coupled into the
fiber core, (none in the cladding), without any need for additional coupling optics.
Ytterbium (Yb) doped germano-silicate glass, as used in many fiber laser systems, absorbs in the 880-990 nm
wavelength range, and provides gain in the 980-1100 nm wavelength range, as illustrated in Fig. 1. Broad area diode
lasers are used as pump sources for this glass, typically emitting in the 910-940 nm range [2].
Improvements in diode laser performance help fiber laser systems in multiple ways. Firstly, when the reliable output
power per diode pump laser is increased, higher overall powers can be delivered by the complete system. Secondly,
higher power conversion efficiency pump diodes require less cooling (more of the energy is emitted as light), which
*
paul.crump@fbh-berlin.de
Tel: +49.30.6392.3291
www.fbh-berlin.de
Technologies for Optical Countermeasures VI, edited by David H. Titterton, Mark A. Richardson,
Proc. of SPIE Vol. 7483, 74830B 2009 SPIE CCC code: 0277-786X/09/$18 doi: 10.1117/12.829617
helps to achieve higher reliable optical output powers and ultimately reduces system size and cost. Thirdly, the light from
the pump diodes must be coupled into the fiber laser, typically via additional 100 m core fibers that are themselves
coupled via various techniques into the fiber laser cladding-layer. Conventional 100 m stripe pump lasers have an
emission angle of ~ 30 FWHM (~ 60 with 95% power content) in the vertical direction and ~ 8-10 FWHM in the
lateral direction (~ 14 with 95% power content) . Such emission angles do not match ideally with a typical 100 m core
commercial fiber with NA = 0.12 (FWHM = 14), so must be coupled using a lens align stage. Smaller emission angles
from the diode pump lasers potentially allow the use of lower NA fibers and the elimination (or simplification) of the
lens-align process, saving costs. Ideally, the diode lasers would emit all power (95% or more) in an emission angle
smaller than the acceptance angle of core of the optical fiber, as illustrated in Fig. 1, where unwanted pumping of the
fiber cladding is avoided.
Fig. 1 also illustrates one further benefit. Typical diode pump lasers today emit within a spectral line-width of 2-3 nm,
and the center wavelength sifts rapidly with temperature (it also shifts with heating due to changes in drive current). Such
a broad spectral width means (in practice) that narrow absorption lines like that seen at 975 nm in Fig. 1 cannot be
pumped, compromising the overall system efficiency (the difference between the absorbed and emitted wavelength
mostly generates heat in the fiber). Diode pump lasers with narrow, temperature stable wavelengths would therefore be
advantageous.
Recent work at the Ferdinand Braun Institut fr Hchstfrequenztechnik (FBH) has lead to significant improvements in
all of these areas. Examples include:
1.
808 nm single emitter diode lasers with 100 m stripes (for direct use or as Nd:YAG pumps)
o
2.
808 nm TM polarized laser bars lasers with 100 m stripes (for direct use or as Nd:YAG pumps)
o
3.
4.
980 nm single emitter diode lasers with 90-100 m stripe width (for direct use or as Yb: or Er:YAG pumps)
o
Operation without failure for > 4000 hours with continuous wave power close to 20 W [4]
28 9.9 far field (vertical lateral with 95% power content) at 7 W with 58% power conversion
efficiency
Devices with built-in gratings that operate with line widths of < 0.4nm from 15C to 100C [6,7]
10xx nm single emitter diode lasers (for direct use e.g. illumination, material processing)
o
200 m stripe devices with reliable 300 ns 1 kHz pulsed operation: 3x107 shots at 46 J per pulse [8]
100 m stripe devices with narrow vertical far field of just 15 with 95% power content [9]
In the following sections, we give an overview of the measured performance at the FBH and discuss how this can be
further improved1. The discussion is organized by performance parameter, detailing in turn advances in reliable
continuous wave power, short pulse power, narrow far field operation, narrow line-width operation and high power
conversion efficiency operation.
This review is restricted to recent results from the FBH, and there is unfortunately not space to discuss all recent work by other
groups working in the same area. A more detailed discussion can be found within the references.
2.0
voltage U / V
20
1.5
15
1.0
10
15C
CCP / CuD
Rth = 2.0K/W
MK / CuD
Rth = 1.5K/W
0.5
0.0
10
15
20
25
currentI A
30
35
0
40
20
96 m Stripe
15
60 m Stripe
10
1000
2000
3000
4000
5000
Time (hours)
Fig. 2: (Left) CW electric-optic characteristics of 980 nm broad area lasers with 96 m stripe width mounted onto CCP
or microchannel (MK) cooler, with CuD inserts. The inset notes the thermal resistance [4,5]. (Right) Extended
CW test results at 21C for two 60 m stripe devices at 10 W and two 96 m stripe devices close to 20W. All
devices are mounted on CCP with CuD inserts. One 60 m stripe device has been in operation for just 2000 hours,
marked with an arrow [4].
In order to further increase the maximum power, a water-cooled copper micro-channel (here abbreviated as MK)
cooler was used instead of the CCP heatsink. In such MK-products, cooling water runs in channels a few 100 m from
the diode laser. The thermal resistance was reduced from 2 K/W to 1.5 K/W, and a peak CW output power of 25 W was
subsequently achieved from a single 96 m stripe laser [5]. At such high power levels, basic physical effects begin to
limit the peak achievable performance. As noted in [5], the rollover seen in the light current curves is no longer mainly
temperature limited, and instead is a result of carriers escaping from the active region at high bias levels. Careful design
optimization is expected to mitigate this carrier escape and lead to further increases in peak and peak reliable power
levels.
2.2 808 nm Broad Area Diode Lasers with 100 m Stripes: 8 W Reliable Power
808 nm diode lasers are in wide use as pumps for Neodymium-doped YAG crystals (Nd:YAG), with bulk crystals
typically pumped by 1 cm diode laser bars [3,11,12]. 808 nm single emitters are useful for diverse direct and pump
applications. One example is as pumps for microchip:YAG systems [13]. Commercial devices at the time of writing are
supplied with powers in the 2-5 W per 100 m.
In previous work at the FBH, 808 nm diode laser designs with 33 vertical far field (95% power content) were processed
into broad area lasers with 200 m stripe and 4mm cavity length. Facets were passivated, then coated with 96% and 2%
reflectivities on the rear and front facets respectively. When mounted onto CCP heatsinks using CuW carriers and AuSn
solder, such designs were found capable of operating at CW power levels of up to 10 W for several 1000 hours without
failure [14]. The emission was TM polarized.
In more recent work, we have assessed the limits to reliable CW power in 100 m stripe width devices. All other design
and process parameters apart from the stripe width were left unchanged. The results are summarized in Fig 3. Extended
operation up to 10000 hours was observed from single emitters operated at 5 W. When this operation power was
increased to 7 W, failure was first observed at close to 4000 hours operation time. CW operation at 8 W was also
possible, for a maximum operation time of close to 3000 hours. When the measurements were repeated using a different
batch of laser material (using a refined vertical design with comparable far field), 100 m stripe devices were found to
operate out to more the 8000 hours at 7 W CW, and 5000 hours at 8W. As noted in [15], failure in these 808 nm diode
lasers is often due to the growth of bulk defects, especially in structures where the facets are appropriately passivated.
Minimizing the defect concentration is expected to help further improve the peak reliable output power.
2.0
1.0
5
1.0
4
3
0.5
Voltage, U / V
0.6
0.4
0.2
1
0.0
Current, I /A
0.0
0.8
1.5
(a)
(b)
10
10
Fig. 3: (left) Typical 25C light-current characteristic of a 100 m stripe, 4 mm cavity length 808 nm laser mounted
junction down on a CCP heatsink. (Right) Extended CW 25C lifetest characteristics of (a) devices as depicted on
the left and (b) devices that incorporate design improvements.
3.1 1100 nm Broad Area Diode Lasers with 200 m Stripes: 124 W (46 J) Reliable 300 ns Pulsed Power
150
240A
100
output power / W
output power / W
150
180A
120A
50
60A
10
20
100
50
30
50
100
time / hour
150
200
250
current / A
Fig. 4: 300ns 1kHz lifetest assessment of 200 m stripe broad area lasers operating at 1100 nm, soldered onto c-mount.
(Left) Step stress test results for an example 200 m stripe laser, operated in successive 8 hour steps at 60 A, 120
A, 180 A and 240 A. (Right) power current characteristics before the step stress test, after the 120 A step and after
the 240 A step show no sign of degradation [8].
For the assessment of peak power under short pulse conditions, a laser design operating at 1100 nm was selected with a
vertical far field of 35 (95% power content). The chosen design used a large number (4) of quantum wells in order to
mitigate the effects of high current injection. The finished material was fabricated into 4 mm long, 60 m and 200 m
wide broad area single emitter devices. After cleaving, the facets were, as normal, passivated, then optically coated to
yield reflectivities of 1.5% and 95%, for front and back facets respectively. All devices were soldered junction side down
with AuSn onto copper c-mounts, using CuW for stress-matching. Fig. 4 shows the results of a reliability assessment of
an example 200 m stripe device under short pulse condition. 300ns pulses at currents up to 240A were supplied at a
frequency of 1kHz using a compact commercial current source (PicoLAS LDP-V240-100 OEM). The device was driven
at a fixed current for 8 hours, corresponding to 3107 pulses. After 8 hours, the current was increased. Four steps in total
per device were measured, at 60 A, 120 A, 180 A and 240 A, with the last step corresponding to 124 W peak power. No
degradation was observed, confirmed by comparing measurements taken before and after the lifetest. Several devices
were tested, including devices with stripe widths of 60 m, and none degraded. The 60 m devices reached a maximum
power of 88 W, limited by rollover [8].
1,25
240A
0,2
0,1
0,0
300
600
time / ns
rel. intensity / a. u.
W = 200m
rel. intensity / a. u.
output power / a. u.
0,3
= 1.63nm
60A
100A
160A
200A
1085
1090
1095
1100
1105
1110
wavelength / nm
1115
1,00
60A
240A
95% = 34.3
95% = 36.7
0,75
0,50
0,25
0,00
-60
-30 0
30
angle /
Fig 5: Detailed performance characteristics under short pulse operation of an example 200 m stripe width diode laser.
(Left) Measured optical pulse profile at 240 A drive current. The shaded region represents an ideal 300 ns square
wave pulse (Center) Normalized spectrum as a function of current. A small shift to higher wavelengths is visible
as current increases, due to some residual current heating in the laser. (Right) Vertical far field profiles as a
function of current (240A results are offset upwards for clarity).
60
Fig. 5 gives some additional details of the laser performance. The optical pulses at 240 A have a FWHM ~ 300 ns, and
are slightly broadened. The broadening is attributed to residual inductance in the circuit. The 200 m stripe material
delivers 46 J per pulse at this 240 A condition. Both the laser spectrum and far field remain stable to maximum drive
current, also illustrated in Fig. 5. Increased power per pulse would be possible with increased drive current. As for CW
980 nm devices, carrier escape effects also limit the maximum power. Careful design optimization is also expected to
help further improve performance.
1.5
1.0
0.5
0.0
0
10
15
20
25
0
30
0.8
0.6
0.4
0.2
0.0
1.0
Relative Intensity
2.0
1.0
Power conversion efficiencncy
L=4mm W=100m
Voltage, U / V
2.5
Current, I / A
0.8
W=100m
L=4000m
7.5A 3.8W
Vertical
FWHM=8.6
95% = 15
Lateral
FWHM=7.0
95% = 7.75
0.6
0.4
0.2
0.0
-20
-10
0
10
20
Propagation Angle, /
Fig. 6: QCW (500s 20Hz) performance characteristics of 1060 nm diode lasers with extremely narrow vertical
far field. (Left) Electro-optic characteristics at 25C (Right) Vertical and lateral and far field profiles at
peak efficiency [9].
4.2 980 nm Broad Area Diode Lasers with 90 m Stripes: 58% Efficient, with 30 9.9 Far Field (95% power)
In earlier FBH designs, 1100 nm diode lasers were found to be capable of operating with 30 vertical far field angle
(95% power content) and 50% wallplug efficiency [17]. These vertical designs have recently been transferred to 980 nm.
Further optimization of the refractive index and doping profile enabled us to achieve both increase power conversion
efficiency and reduce vertical far field, as shown in Fig. 7. The measured devices were broad area laser diodes that
operated at 975 nm and had 90 m stripe width and 3 mm cavity length. As normal, the facets were passivated and then
coated with high and low reflectivity dielectric layers. The diode lasers were mounted on CuW carriers and measured
under CW conditions at 25C. The vertical far field was 28 at 95% power content, and peak wall-plug efficiency was
58% at 7 W operation power.
1.00
12
(a)
60
1.0
0.5
10W
25C
4
2
0.0
(nm)
Current / A
10
0
12
50
40
30
20
10
0
Vertical
Lateral
(b)
0.75
Relative Intensity
Intensity (a.u.)
Volts
1.5
10
2.0
15 (FWHM)
6.5 (FWHM)
0.50
0.25
28 (95%
Power)
0.00
-30
-20
9.9 (95%
Power)
-10
10
20
30
Propagation Angle /
Fig. 7 (a) CW 25C light-current characteristic for a passively cooled 90 m stripe, 3 mm cavity length
broad area laser (inset: 7 W spectrum) (b) Measured CW lateral and vertical far fields at 7 W.
For ideal fiber coupling or for wavelength stabilization with an external grating, narrow lateral far fields are also sought.
In the simplest designs, broad area lasers are defined in the lateral direction only by the electrical contact there is no
intentional lateral refractive index profile. As such designs are driven to higher currents, electrical heating in the pumped
area leads to a lateral refractive index profile. Higher drive currents lead to a stronger index profile and successively
wider lateral far fields. Such lasers are also prone to modal instability, for example the formation of filaments. To reduce
the lateral far field angle, additional techniques required. Earlier generations of high power 980 nm lasers at FBH with
90-100 m stripe width operated with lateral far fields in the 15-17 range (95% content), as seen in section 2. After
further optimisation and the use of in-built mode control techniques, a reduced lateral far field was achieved, as shown in
Fig. 7. At 7 W CW operation power, a lateral far field of 9.9 was achieved (with 95% power content). Further
improvements in far field angle and power conversion efficiency are required. Further design optimization and the use of
more sophisticated lateral structures are expected to lead to higher performance.
Fig. 8: CW Spectral characteristics of 975 nm broad area lasers with 1300 m cavity length and 50 m
stripe width. (Left) Spectrum of a diode laser without grating as a function of current. Inset: 2A
spectrum. (Right) Spectrum of the DFB laser. Inset: spectra at 140 mA and 2 A [7].
The benefit of the in-built grating is demonstrated in Fig. 8, which compares the optical spectra of devices constructed
with and without a built-in grating, but otherwise to the same design. The spectral width is reduced < 0.5 nm. The
devices presented in Fig. 8 have a cavity length of 1300 m and a stripe width of 50 m and were measured CW at 25C.
The devices were mounted junction side down with AuSn on c-mounts, with CuW carriers used for stress matching.
To achieve higher CW powers, devices with 2000 m cavity length and 100 m stripe width were also assessed, and
typical performance characteristics are shown in Fig. 9. At 25C, peak power conversion efficiency is 36% and occurs at
3 A, 2 W. The temperature stability of the laser was also assessed as function of temperature, also as shown in Fig. 9. At
a fixed current of 4 A, the spectral width was found to remain < 0.4 nm to 100C.
Fig. 9: Performance characteristics of a 975 nm broad area DFB diode laser over temperature. (Left)
CW Electro-optic characteristics. (Right) Wavelength and spectral width [7].
Although a peak DFB power conversion efficiency of 36% was achieved from the 2000 m cavity length devices (39.5%
for 1300 m cavity length), this is substantially reduced in comparison to reference devices without gratings [6,7]. Here,
the built in grating was constructed with a relatively large coupling strength to enable wide temperature range operation,
which leads to a reduction in peak power conversion efficiency. Additionally, the material properties of the re-grown
grating are non-ideal and lead to additional optical losses and increased operation voltage. Further improvements in
performance will require improvements in both design and material characteristics.
6.1 808 nm TM polarized 1 cm laser bars: 70% power conversion efficiency at 80 W CW output power
In recent years, substantial development has occurred in high efficiency diode lasers [3,19], with power conversion
efficiencies over 70% demonstrated from 800 nm to 980 nm by several groups. The design of these diode lasers lead to
TE-polarized emission (through the use of compressively strained quantum wells as the active region). Many current
commercial Nd:YAG systems are constructed using TM-polarized 808 nm diode pump lasers (which use tensile strained
quantum wells as their active region), but these devices typically have a power conversion efficiency of just 55-63%. The
power conversion efficiency of such diode laser material is typically limited by the material properties of the active
region TM polarized active regions typically lead to higher threshold currents than those achieved in the best TE
polarized material [3].
80
100
Package Resistance Subtracted
80
60
Measured
60
40
40
20
20
0
0
20
40
60
0
80
Through a careful design optimization process, recently the FBH has demonstrated that 808 nm laser bars constructed
using TM polarized active regions can also operate with power conversion efficiency of more than 70% at a CW power
level of more than 80 W [3], as shown in Fig. 10. The 808 nm bar shown in Fig. 10 was produced with 1.5 mm cavity
length and contained 19 100 m broad area lasers. The front and rear bar facets were passivated and optically coated,
then the complete bar was mounted junction side down on a CCP heatsink with AuSn solder, using CuW inserts for
stress matching. Fig. 10 also shows, for reference, earlier FBH results from a 940 nm laser bar, which demonstrated 73%
power conversion at 70 W CW output power. The bar had 1.5 mm cavity length, contained 19 150 m stripes and was
also mounted junction side down on a CCP heatsink with AuSn solder and CuW insert for stress matching. In both the
940 nm and 808 nm cases, further improvements in design and material characteristics are required.
Current (A)
Fig 10: High power conversion efficiency passively cooled 1 cm diode laser bar results. (Left) 940 nm bar
with 19 150 m emitters mounted on CCP [19]. (Right) TM polarized 808 nm bar mounted on
CCP, with 19 100 m emitters [3]. On the right, the efficiency of the bar alone is shown
calculated by subtracting the (known) resistance of the packaging.
7. CONCLUSIONS
High power broad area lasers remain a topic of intense development activity and their performance continues to improve.
Higher reliable powers, smaller far field angles, narrower spectral widths and higher power conversion efficiency have
all recently been demonstrated at the Ferdinand-Braun-Institut fr Hchstfrequenztechnik. Such ongoing improvements
are expected to lead to higher overall system performance for both direct diode applications and diode pumped solid state
and fiber laser systems.
ACKNOWLEDGEMENTS
Work to develop narrow spectral line-width and narrow far field high power 980 nm sources was funded as part of the
German Government (BMBF) development Project, SpektraLas (Project reference number: 13N9725).
Work to advance the peak achievable power in 10xx nm devices was funded under the German Government (BMBF)
development Project, Grundlagen fr Diodenlaser der nchsten Leistungsgeneration (GRUNDILG, Project Reference
Number: 13N9154).
Work to reduce the vertical far field of high power 10xx nm devices was funded under the German Research Foundation
(DFG) Program, SFB 787-C5.
We thank the following colleagues for their kind permission to include examples of their recent work in this review
article: Gunnar Blume, Thomas Hoffmann, Andreas Klehr, Andrea Knigge, Arnim Liero, Katrin Paschke, Agnieska
Pietrzak, Claudia Roder, Christoph Schultz, Ralf Staske, Martin Spreemann, Bernd Sumpf, and Xiaozhuo Wang.
REFERENCES
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
[9]
[10]
[11]
[12]
[13]
[14]
[15]
[16]
[17]
[18]
[19]
Brauch, U., Loosen, P. and Opower, H. , High Power Diode Lasers for Direct Applications in High Power Diode
Lasers, Ed. R. Diehl, Topics Appl. Phys. 78, 303-367 (2000).
Paschotta, R., Nilsson, J., Tropper, A.C. and Hanna, D.C. , Ytterbium-Doped Fiber Amplifiers IEEE Journal of
Selected Topics in Quantum Electronics. 33, 1049-1056 (1997).
Crump, P., Wenzel, H., Erbert, G., Ressel, P., Zorn, M., Bugge, F., Einfeldt, S., Staske, R., Zeimer, U., Pietrzak, A.
and Trnkle, G. , Passively Cooled TM Polarized 808-nm Laser Bars With 70% Power Conversion at 80-W and
55-W Peak Power per 100-m Stripe Width, IEEE Photon. Technol. Lett. 20, 1378-1380 (2008).
Crump, P., Blume, G., Paschke, K., Staske, R., Pietrzak, A., Zeimer, U., Einfeldt, S., Ginolas, A., Bugge, F.,
Husler, K., Ressel, P., Wenzel, H. and Erbert, G. , "20W continuous wave reliable operation of 980nm broad-area
single emitter diode lasers with an aperture of 96m", Proc. SPIE. 7198, 719814 (2009).
Crump, P., Roder, C., Staske, R., Pietrzak, A., Pittroff, W., Ginolas, A., Fricke, J., Paschke, K., Bugge, F., Ressel,
P., Wenzel, H. Erbert, G. , "Limitations to Peak Continuous Wave Power in High Power Broad Area Single Emitter
980 nm Diode Lasers", Conf. Digest CLEO/Europe, CBP33TUE (2009).
Schultz, C.M., Crump, P., Wenzel, H., Brox, O., Bugge, F. and Erbert, G. , "Narrow Vertical Far-Field 975-nm
Broad-Area DFB Lasers for Wide Temperature Range Operation", IEEE Photon. Techn. Lett. 21, 593-595 (2009).
Schultz, C.M., Crump, P., Wenzel, H., Brox, O., Bugge, F. and Erbert, G. , "Wide Temperature Range High Power
Broad Area 975nm DFB Lasers", Conf. Digest CLEO/IQEC, CWF6 (2009).
Wang, X., Crump, P., Pietrzak, A., Schultz, C., Klehr, A., Hoffmann, T., Liero, A., Ginolas, A., Einfeldt, S., Bugge,
F., Erbert, G. and Trnkle, G. , Assessment of the Limits to Peak Power of 1100nm Broad Area Single Emitter
Diode Lasers under Short Pulse Conditions, Proc. SPIE. 7198, 71981G (2009).
Pietrzak, A., Crump, P., Bugge, F., Wenzel, H., Erbert, G. and Trnkle, G. , "1060-nm Multi Quantum Well Diode
Lasers With Narrow Vertical Divergence Angle of 8 and High Internal Efficiency", Conf. Digest CLEO/IQEC,
CWF2 (2009).
Paschke, K., Einfeldt, S., Ginolas, A., Husler, K., Ressel, P., Sumpf, B., Wenzel, H. and Erbert. G. , "15-W reliable
operation of 96-m aperture broad-area diode lasers emitting at 980 nm," Conference Digest CLEO/QELS USA,
CMN4 (2008).
Diehl, R. (Ed.) , High Power Diode Lasers, Topics Appl. Phys. 78, 1 (2000).
Du, K. , Concepts, features and developments of slab laser oscillators and amplifiers, Proc. SPIE, 6871, 68710
(2008).
Fulbert, L., Accomo, R., Molva, E., Besesty, P. and Mouttet, A. , Microchip laser range finder, Conf. Digest
CLEO/IQEC, CTuF6 (1996).
Paschke, K., Einfeldt, S., Fiebig, C., Ginolas, A., Husler, K., Ressel, P., Sumpf, B. and Erbert, G. , 10 W reliable
operation of 808 nm broad-area diode lasers by near field distribution control in a multistripe contact geometry,
Proc. SPIE, 6456, 64560H (2007).
K. Husler, U. Zeimer, B. Sumpf, G. Erbert and G. Trnkle, Degradation model analysis of laser diodes in J.
Mater. Sci.: Mater. Electron. Springer New York, 9534-8 (2008).
Traub, M., Bock, M., Hoffmann, H-D. and Bartram, M. , Novel high peak current pulsed diode laser sources for
direct material processing, Proc. SPIE 6456, 64560J (2007).
Pietrzak, A., Wenzel, H., Erbert, G. and Trnkle, G. , High-power laser diodes emitting light above 1100 nm with a
small vertical divergence angle of 13. Opt. Lett., 33, 2188-90 (2008).
Steckman, G.J., Liu, W., Platz, R., Schroeder, D., Moser, C. and Havermeyer. F. , Volume Holographic Grating
Wavelength Stabilized Laser Diodes, IEEE J Sel. Topics Quantum Electron. 13, 672-678 (2007).
Knigge, A., Erbert, G., Jonsson, J., Pittroff, W., Staske, R., Sumpf, B., Weyers, M. and Trnkle, G. , Passively
cooled 940-nm laser bars with 73% wall-plug efficiency at 70 W and 25C, Electron. Lett. 41, 250251 (2005).