Analysis Tech Inc.

is a designer, manufacturer and global supplier of electronic instruments

associated with reliability testing of electronic packaging. Founded in 1983 and headquartered ten
miles north of Boston, Massachusetts, Analysis Tech has developed instruments that have traced
the evolution of electronic packaging technology. For example, in 1983, surface-mount technology
was experiencing a huge growth-surge due to the higher density board-designs that became
possible. This caused two related changes:
a) "Tighter" packaging meant higher heat flux densities which threatened to increase
semiconductor component temperatures and shorten component life.
b) The higher mechanical stresses in surface-mount solder joints (compared to through-hole)
threatened to hasten the mechanical fatigue/fracture failure of the solder joints.
Both of these changes increased the potential for lower reliability. To overcome this, reliability
testing has grown with the progressive evolution of new packaging technology which has been
trending toward "denser and hotter".
Analysis Tech product offerings currently focus on two fundamental electronics-failuremechanisms: elevated semiconductor temperatures and mechanical-stress fatigue/fracture of
electrical interconnects. Our test instruments and their operating features have evolved in direct
response to customer needs. In cases where our standard product offerings do not adequately
satisfy the customer test requirements, Analysis Tech can supply a variety of custom
instrumentation.

Thermal Interface Material Testers perform bulk thermal conductivity measurements on a wide
variety of materials including those used in electronics packaging applications. Material test
services are available for thermal conductivity characterization of customer materials at our factory
test-laboratory. The test method implemented conforms to ASTM D5470.
The TIM Testers are well suited to a development laboratory as well as a factory floor. WinTIM
software license is included with all units with unlimited free upgrades. These robust testers also
include features that are ideal for quality control testing where high accuracy and short test
durations are required.
Contract test services and demonstration tests are also offered using customer-supplied samples.

All Event Detectors and Temperature Modules carry a 1 year calibration interval. Analysis Tech
offers a complete factory calibration service with NIST traceable certifications on a typical 2-3 day
turn-around. All regular calibrations include no-charge modifications to reflect recent designupdates to the Event Detector / Temperature Module equipment, as appropriate.

Event Detector Calibrations

Our calibration service utilizes an automated test system to accurately measure all the operating
parameters of an Event Detector system. These parameters include individual channel
measurements of Event Duration Sensitivity and Resistance Threshold Sensitivity. Precision, highspeed pulses are used to simulate "events" as the associated event detector response is
interrogated by the control computer. In this manner, all channels are accurately characterized and
detailed in a calibration report showing the measured performance of each Event Detector
channel, and the measurement limit criteria for each parameter tested. All Event Detectors that
are returned to the factory for calibration are also thoroughly inspected for damage, loose parts,
dust accumulation, or other condition that could compromise the performance of the instrument.
Periodic Event Detector calibrations ensure that the data collected will have the highest level of
confidence.

Temperature Module Calibrations

The Analysis Tech factory now offers calibration services for all Temperature Modules,
Temperature / Actuator Modules and STD Temperature Modules.

105/106 Event Detector Wiring Harness Adapter

This connector adapter provides a screw-terminal and separable connector combination for
connecting test samples to the 105 and 106 series Event Detectors. Each bank of 16 channels is
conveniently split into 2 separable connectors, each carrying 8 channels. The 8 individual channel
wires from the test sample are fastened to the separable connector body with screw-clamping
connections. In essence, the 16 channel ribbon cable is split into 2 groups of 8 channels, each with
it's own independent connector. The 37D subminiature connector on this adapter is identical to
the connector used on the front panel of the 105 and 106 series Event Detectors.

Features
Robust harnesses to provide reliable test-service
Connector and screw terminals for easy attachment
to test boards
Convenient channel numbering sequence of test
connections
Test wiring can be easily swapped using separable
connectors
Each connector carrying 8 channels also includes one ground wire that can be used for the ground
return although addition grounding is still required as part of the normal Event Detector setup
procedure. This connection adapter should not be located inside a temperature-cycle-chamber or
attached to a vibration / drop stage. Contact the Analysis Tech engineering staff for more details.

The 105/106 Series Event Detectors are the most versatile Event Detectors in the product line.
These Event Detectors monitor the electrical resistance of between 32 and 128 simple continuity
loops, each comprised of single or multiple specimens under test. Each test specimen is
continuously monitored while a selectable DC sense current is passed through each channel testloop; resistance changes exceeding the selected threshold are recorded as an event. Each bank of
32 channels has separate Minimum Event Duration, Channel Current, and Threshold Voltage
settings which allows each bank of 32 channels to be independently configured. The difference
between the 105 and 106 series is simply that the 105 offers four, 32-channel board slots and the
106 only has one. Thus the 128-105 is equivalent to four 32-106 Event Detectors.

Features
Programmable resistance threshold: 0.1 to 2000 ohms
Compatible with HLV Amplifiers
Selectable Minimum Event Duration settings: 0.1, 0.5, 1.0
microseconds; other ranges available, field-changeable
Selection of channel test currents: 1, 5, 10, 20, 50, 100mA
Other test specifications are available to meet custom needs

Features Included with All Event Detectors

WinDatalog data collection/analysis software
RS232C serial port for data transmission to PC computer
Capability to link with other Event Detectors
Test input cables (10 foot length)

The Temperature / Actuator Module accessory adds three distinct features to

Event Detector testing:
Temperature Module Function
The Temperature / Actuator Module adds temperature data to the event/failure data record
produced by WinDatalog Software. The chamber or oven temperature is monitored and included
in the test data when events are detected. The combination of event and temperature data
facilitates the correlation of temperature and peak failure-stresses. In addition, the actual elapsed
thermal cycle count is also recorded for accurate failure analysis statistics.

Mechanical Cycle Counting Function

The Temperature / Actuator Module can also be configured to count
and record digital electrical signals. Some examples include contact
closures on drop-testers or mechanical board-benders, mate-unmate
actuation for separable connector testing, or other digital signals from
accessory equipment. This feature facilitates event-data analysis that is
accurately keyed to the mechanical-cycles-to-failure.

Actuator Module Function

The Temperature / Actuator Module permits WinDatalog Software to synchronize laboratory test
equipment with event data collection by initiating test equipment cycles under software control.

For more information please visit

http://www.analysistech.com