www.ntmdt.

com

Modular AFM / STM System

SOLVER Nano

Leading With Innovation

NEXT

XRD

his 5th generation

benchtop diffraction
system is a perfect XRD
solution for R&D, QA/QC and
teaching. Available highspeed detector, samplechanger and monochromator
make it incredibly flexible.

ntelligent X-ray
diffraction system.
Powder diffraction, thin film
diffraction, SAXS, in-plane
scattering

Suitable for both scientific research and nanotechnology education

AFM / STM atomic resolution

All AFM / STM modes and nanolithography
New digital controller
Closed-loop scanner
Easy Laser - Photodiode alignment
Remote control via the Internet
Data sharing via iPhone and iPad

Ultimate automation

he Ultima IV represents
the state-of-the-art in
multipurpose X-ray diffraction
(XRD) systems. Incorporating
Rigaku's patented cross beam
optics (CBO) technology for
permanently mounted,
permanently aligned and
user-selectable parallel and
focusing geometries, the
Ultima IV X-ray diffractometer
can perform many different
measurements...fast.

NEXT provides motorized sample positioning and integrated

high resolution optical microscope positioning, motorized
continuous zoom and focusing of the optical microscope.
But AFM automation is more than just motorization. Powerful
Nova PX software algorithms remove a gap between optics
and AFM providing continuous zoom from huge panoramic
optical view down to atomic resolution.

S-MAX3000

www.navas-instruments.com

mall molecule
crystallography was
never easier to do or own.
The XtaLAB mini is a fully
functional benchtop system
that gives you the ability to
generate 3D structures in
your lab.

XRF Fluxer
AFS-5000 Series

he Navas Instruments AFS-5000

Automatic Fusion System allows
analysis of loss on ignition and the
preparation of beads of multiple samples
simultaneously to be used in XRF
spectrometer without the need for constant
operator attention.
(SIMPLE - MODULAR AND COST
EFFECTIVE SOLUTION)

Your partner in high end instrumentation

www.labsystematic.com

acromolecular
crystallography and
NMR are two of the most
important techniques for
furthering our understanding
o f s t r u c t u r a l b i o l o g y.
However, the fact remains
that three-dimensional
structures derived from NMR
and single crystal analysis
are difficult to achieve at best
and quite often the analyses
fail. The time, energy and
money spent on cloning,
expressing and purifying
proteins that refuse to
crystallize or are
inappropriate for NMR
analysis, drive up the overall
cost of structural biology
research and if a project is
abandoned when a structure
cannot be produced, the
efforts are totally wasted.

Handheld RAMAN Spectrometer

FirstGuard Advanced

PT. LABSISTEMATIKA INDONESIA

Jl. Raya Pondok Gede No. 5 & 10A
Dukuh - Kramat Jati, Jakarta Timur 13550
Tlp. +62-21-70416622
email : info@labsystematic.com

BioSAXS-1000

Ergonomic handheld design

- No sample prep
- Ruggedized and ergonomic design
- Fast and accurate chemical identification
- Open spectral library
- Direct shooting or integrated vial holder
- USB and Bluetooth interface
- Microsoft Windows computer platform

irstGuard is a new breed of

handheld instrumentation,
designed to be taken into the
factory warehouse or the field for
real-time, fast sample
measurements. Equipped with an
integrated vial holder, switchable
lithium ion battery, and optional
barcode reader, the FirstGuard is
ideal for GMP facilities and is
configured with secure software
for 21 CRF part 11 compliance.
Bringing analysis to the point of
need, the FirstGuard can
significantly cut the time and
costs associated with lab testing,
ensure product quality and
provide a rapid return on
investment

XantusTM2

he Xantus-2 is the industrys

first dual wavelength
handheld Raman analyzer. It is
equipped with 785 and1064nm
lasers stabilized for Raman
spectroscopy, giving it a unique
combination of high sensitivity
Need the sensitivity of 785nm,
but sometimes have fluorescence
issues? XantusTM2 is the
worlds first dual wavelength
handheld Raman analyzer. It is
designed specifically to overcome
the intrinsic fluorescence issues
found in many materials. Its two
wavelengths give you the largest
array of materials analysis device
on the market today.

www.rigakuraman.com

Leading With Innovation

Leading With Innovation

www.rigaku.com

WDXRF
Supermini200

High-power Benchtop Sequential

WDXRF Spectrometer
Elemental analysis of solid, liquids, powder

Thermal Analysis (TA) products

he new Supermini200 has

improved software
capabilities as well as a better
footprint. As the world's only highpower benchtop sequential
wavelength dispersive X-ray
fluorescence (WDXRF)
spectrometer for elemental
analysis of oxygen (O) through
uranium (U) of almost any
material, the Rigaku
Supermini200 uniquely delivers
low cost-of-ownership (COA)
with high resolution and lower
limits-of-detection (LLD).

igaku ZSX Primus II

delivers rapid quantitative
determination of major and
minor atomic elements, from
beryllium (Be) through uranium
(U), in a wide variety of sample
types with minimal standards.
ZSX Primus II features an
innovative optics-above
configuration. Never again worry
about a contaminated beam
path or down time due to sample
chamber maintenance. The
optics-above geometry
eliminates cleaning worries and
increases up time.

DSC 8230/8270

TXRF
Differential scanning calorimeter system

Simultix 14

High throughput elemental

analysis
Capable of analyzing elements
from beryllium through uranium,
the spectrometer was designed to
have the smallest possible
footprintmaking it the definitive
choice where space is at a
premium. With its sophisticated
hardware and multi-tasking
software, the Simultix 14 offers
the most effective elemental
analysis tool to satisfy the needs
of all fields of industrial
applications.

EDXRF

nlike conventional EDXRF

analyzers, the NEX CG was
engineered with a unique closecoupled Cartesian Geometry
(CG) optical kernel that
dramatically increases signalto-noise. By using secondary
target excitation, instead of
convention direct excitation,
sensitivity is further improved.
The resulting dramatic reduction
in background noise, and
simultaneous increase in
element peaks, result in a
spectrometer capable of routine
trace element analysis even in
difficult sample types.

compact furnace features

the fastest ever cooling rate.
The DSC 8230 cools from 400 to
50 in less than 4 minutes (with a
cooling fan unit). This rapid
cooling abilitycoupled with the
quick gas substitution offered by
the compact furnaceleads to a
drastic reduction in the wait time
between measurements, thus
offering an effective operational
environment for performing
repetitive measurements quickly
and efficiently. An automatic
sample changer can be mounted.
Design consideration is given
also to possible installation in
various surroundings.

he newest version of our

popular multi-channel
simultaneous wavelength
dispersive X-ray fluorescence
(WDXRF) spectrometer system is
the Simultix 14. Based on over 30
years of accumulated experience,
the Simultix 14 stands out as the
most advanced, fully automated
system available designed to
meet today's analytical needs for
utmost sensitivity, throughput,
and versatility.

Sensitivity on par with ICP-OES without

wet chemistry
With sensitivity on par with inductively
coupled plasma optical emission
spectroscopy (ICP-OES), NANOHUNTER
provides part-per-billion (PPB) level detection
limits in a fully automated tool. Direct
measurement of residues on a smooth
surface provides freedom from complex
sample digestion or preparation and makes
this spectrometer suitable for replacing or
supplementing traditional atomic
spectroscopy methods. Compared to other
trace level atomic spectroscopy techniques,
the revolutionary aspect of NANOHUNTER is
in the minimal level of sample preparation
required. It liberates the operator from
ancillary equipment like fume hoods and
microwave digesters associated with trace
element analysis in a wet laboratory

inner of the 2007 R&D

100 award, a mark of
excellence known to industry,
government, and academia as
proof that the winner is one of the
most innovative products of the
y e a r, t h e R i g a k u
NANOHUNTER benchtop total
reflection X-ray fluorescence
(TXRF) spectrometer was
specifically designed to offer
comprehensive trace element
and materials characterization
analysis capabilities to a broader
range of research disciplines,
and in more diverse analytical
settings, than was possible with
previous technology. Whether
for geologists, chemists,
biochemists, biologists,
materials scientists and
engineers, non-destructive trace
element analysis is attainable,
with minimal to no sample
preparation, for applications that
span from metallo-protein
research to environmental
assessment and semiconductor
wafer metrology.

s a premium low cost

benchtop Energy Dispersive
X-ray Fluorescence (EDXRF)
elemental analyzer, the Rigaku
NEX QC delivers wide elemental
coverage with an easy-to-learn
software interface in a robust
package designed for industrial
at-line quality control
applications. Non-destructively
analyze from sodium (Na)
through uranium (U) in almost
any matrix, from solids and alloys
to powders, liquids and
slurries.and minimized
fluorescence.

Specifically designed for routine

quality control elemental analysis
applications, the new Rigaku
NEX QC features an intuitive
"icon-driven" touch screen
interface for easy operation and a
built-in printer for convenience.

www.rigakuedxrf.com

TMA 8310

Thermomechanical analyzer

he Thermo Plus TMA series

employs a differential
expansion system to realize highprecision measurement.
Rigaku's sophisticated technical
expertise is incorporated in its
c o m p a c t b o d y. D i f f e r e n t
measurement methods required
for TMA can be dealt with simply
by replacing attachments. This
TMA features excellent
functionality and operational
productivity, meeting the high
reliability demands of quality
assurance departments. Design
features such as a sample
alignment mechanism lead to
simple operation.

www.microtac.com

The industry preferred laser diffraction analyzer ideal for particle size analysis

Microtrac S3500

Microtrac S3500
is the first particle size analyzer that uses
three precisely placed red laser diodes to
accurately characterize particles like never
before. The patented Tri-Laser System
provides accurate, reliable and repeatable
particle size analysis for a diverse range of
applications by utilizing the proven theory of
Mie compensation for spherical particles and
the proprietary principle of Modified Mie
calculations for non-spherical particles. The
S3500 measures particle size from 0.02 to
2800 microns

Particle Analyzer

Nanotrac Wave
Particle Size, Zeta Potential
and Molecular Weight Analyzer

The Nanotrac Wave, the newest system in a long line of

innovative particle characterization solutions, provides
the capability to measure three different parameters in
one instrument.
The Wave is able to measure particle size,
molecular weight, and zeta potential.
The core
methodology of the Wave is Dynamic Light Scattering,
however unlike mainstream Photon Correlation
Spectroscopy [PCS], Microtrac utilizes a unique
Controlled Reference Method.