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devices,
microres-
I. I NTRODUCTION
441
(a)
(b)
Fig. 1.
(c)
(d)
Fig. 2.
(a) Schematic diagram of the device structure along with the
measurement setup. (b) SEM image of a fabricated device. (c) Piezoresistively
detected frequency response of the cantilever. (d) Frequency response after
subtracting the background.