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STP8NK100Z
N-CHANNEL 1000V - 1.60 - 6.5A - TO-220 - TO-220FP
Zener-Protected SuperMESH MOSFET
General features
Type
VDSS
RDS(on)
ID
Pw
3
1
TO-220
TO-220FP
Description
The SuperMESH series is obtained through an
extreme optimization of STs well established
stripbased PowerMESH layout. In addition to
pushing on-resistance significantly down, special
care is taken to ensure a very good dv/dt
capability for the most demanding applications.
Such series complements ST full range of high
voltage
MOSFETs
including
revolutionary
MDmesh products.
Applications
Order codes
Sales Type
Marking
Package
Packaging
STF8NK100Z
F8NK100Z
TO-220FP
TUBE
STP8NK100Z
P8NK100Z
TO-220
TUBE
November 2005
Rev 1
1/13
www.st.com
13
STF8NK100Z - STP8NK100Z
1 Electrical ratings
Electrical ratings
Table 1.
Symbol
Parameter
Value
TO-220
VDS
VDGR
VGS
Unit
TO-220FP
1000
Drain-gate Voltage
1000
Gate-Source Voltage
30
ID Note 1
6.5
6.5
ID
4.3
4.3
16
16
160
40
Derating Factor
1.28
0.32
W/C
IDM Note 2
PTOT
VESD(G-S)
Table 2.
Rthj-case
4000
4.5
V/ns
--
2500
-55 to 150
V
C
Thermal data
TO-220
TO-220FP
0.78
3.1
C/W
Rthj-a
62.5
C/W
Tl
300
Table 3.
Avalanche Characteristics
Symbol
Parameter
Value
Unit
IAR
6.5
EAS
320
mJ
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STF8NK100Z - STP8NK100Z
2 Electrical characteristics
Electrical characteristics
(TCASE = 25 C unless otherwise specified)
Table 4.
On/off states
Symbol
Parameter
V(BR)DSS
Drain-Source Breakdown
Voltage
IDSS
IGSS
Test Conditions
ID = 1mA, V GS= 0
Min.
Typ.
Max.
1000
Unit
V
1
50
A
A
VGS = 20V
10
VGS(th)
3.75
4.5
RDS(on)
Static Drain-Source On
Resistance
1.60
1.85
Typ.
Max.
Unit
Table 5.
Symbol
gfs Note 6
Ciss
Coss
Crss
Coss eq.
Note 5
Qg
Qgs
Qgd
Dynamic
Parameter
Forward Transconductance
Test Conditions
VDS =15V, ID=3.15 A
Input Capacitance
VDS =25V, f=1 MHz, V GS=0
Output Capacitance
Reverse Transfer Capacitance
Min.
2180
174
36
pF
pF
pF
pF
Equivalent Output
Capacitance
83
VDD=800V, ID = 6.3A
VGS =10V
73
12
40
102
nC
nC
nC
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STF8NK100Z - STP8NK100Z
2 Electrical characteristics
Table 6.
Symbol
td(on)
tr
td(off)
tf
Table 7.
Switching times
Parameter
Turn-on Delay Time
Rise Time
Test Conditions
Min.
Typ.
Max.
Unit
28
19
ns
ns
59
30
ns
ns
Symbol
Parameter
ISD
ISDM Note 3
Source-drain Current
Source-drain Current (pulsed)
VSDNote 2
Forward on Voltage
ISD=6.3A, VGS=0
620
5.3
17
ns
C
A
840
7.5
18
ns
C
A
trr
Qrr
IRRM
trr
Qrr
IRRM
Table 8.
Symbol
BVGSO
Note 4
Test Conditions
Min.
Typ.
Max.
Unit
6.5
26
A
A
1.6
Test Conditions
Min.
30
Typ.
Max.
Unit
V
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STF8NK100Z - STP8NK100Z
2.1
2 Electrical characteristics
Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Output Characteristics
Figure 6.
Transfer Characteristics
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STF8NK100Z - STP8NK100Z
2 Electrical characteristics
Figure 7.
Transconductance
Figure 8.
Figure 9.
Figure 11. Normalized Gate Threshold Voltage Figure 12. Normalized On Resistance vs.
vs. Temperature
Temperature
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STF8NK100Z - STP8NK100Z
2 Electrical characteristics
7/13
3 Test circuits
STF8NK100Z - STP8NK100Z
Test circuits
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STF8NK100Z - STP8NK100Z
9/13
STF8NK100Z - STP8NK100Z
DIM.
MIN.
4.4
inch
TYP
MAX.
MIN.
TYP.
4.6
0.173
0.181
MAX.
0.106
2.5
2.7
0.098
2.5
2.75
0.098
0.108
0.45
0.7
0.017
0.027
0.75
0.030
0.039
F1
1.15
1.7
0.045
0.067
F2
1.15
1.7
0.045
0.067
4.95
5.2
0.195
0.204
G1
2.4
2.7
0.094
0.106
10
10.4
0.393
0.409
L2
16
0.630
L3
28.6
30.6
1.126
1.204
L4
9.8
10.6
.0385
0.417
L5
2.9
3.6
0.114
0.141
L6
15.9
16.4
0.626
0.645
9.3
0.354
0.366
3.2
0.118
0.126
L7
L3
L6
F2
G1
F1
L7
L2
10/13
L5
1 2 3
L4
STF8NK100Z - STP8NK100Z
mm.
MIN.
TYP
inch
MAX.
MIN.
TYP.
MAX.
4.40
4.60
0.173
0.181
0.61
0.88
0.024
0.034
b1
1.15
1.70
0.045
0.066
0.49
0.70
0.019
0.027
15.25
15.75
0.60
0.620
10
10.40
0.393
0.409
2.40
2.70
0.094
0.106
e1
4.95
5.15
0.194
0.202
1.23
1.32
0.048
0.052
H1
6.20
6.60
0.244
0.256
J1
2.40
2.72
0.094
0.107
0.551
13
14
0.511
L1
3.50
3.93
0.137
L20
16.40
L30
0.154
0.645
28.90
1.137
3.75
3.85
0.147
0.151
2.65
2.95
0.104
0.116
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STF8NK100Z - STP8NK100Z
5 Revision History
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Revision History
Date
Revision
04-Nov-2005
Changes
First release
STF8NK100Z - STP8NK100Z
5 Revision History
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by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
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