CX5001 G.8262 SyncE Conformance Testing App Note v10

Application note CX5001
G.8262 SyncE Conformance testing
1.
Hardware and Software required ............................................................................................. 2
2.
Connecting an EEC to the Paragon-X ..................................................................................... 3
3.
How to Configure the Paragon-X for ALL G.8262 Tests .......................................................... 5
4.
Measuring Frequency Accuracy G.8262 Section 6 ............................................................... 9
5.
Pull-in, Hold-in and Pull-out ranges G.8262 Section 7 ........................................................ 11
6.
Wander (Noise) Generation G.8262 Section 8 ................................................................... 15
7.
Jitter Generation G.8262 Section 8.3.................................................................................. 19
8.
Wander (Noise) Tolerance G.8262 Section 9 ..................................................................... 23
9.
Jitter Tolerance G.8262 Section 9.2 ................................................................................... 29
10. Wander (Noise) Transfer G.8262 Section 10 ...................................................................... 35

11. Phase Transient Response G.8262 Section 11 .................................................................. 44
12. Appendix 1 - G.8262 Testing; Practical interpretation guidance............................................. 54
Calnex Solutions Ltd

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1. Hardware and Software required
Paragon-X
o
Option 110 GbE electrical and Optical
Option 111 10GbE interface (optional)
Option 120 Delay and Header Capture
Option 213 Sync-E measurements
Option 223 MTIE/TDEV internal wander generation
Option 207 or 217 Jitter generation & measurement for 100M and 1GbE
Option 208 or 218 Jitter generation & measurement for 10GbE (optional)
Paragon- X Software X.10.14 or higher
Synchronisation (Reference) Frequency Source

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2. Connecting an EEC to the Paragon-X
The front panel of the Paragon-X provides the following interfaces for testing:
1. 100MbE Electrical or Optical (SGMII SFP)
2. 1GbE Electrical or Optical (SFP) with option 110 fitted
3. 10GbE Optical (XFP or SFP+) with option 111 fitted
10GbE Port 1
10GbE Port 2
Status Display
100MbE/1GbE
Port 1
100MbE/1GbE
Port 2
Paragon-X Front Panel Connections

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PC Controller Port
The Paragon-X accepts the following reference clocks which should be applied to one of the
Reference Inputs on the back panel:
1. 2.048MHz
2. 10MHz
3. E1 (2.048Mb/s)
4. DS1 (T1) (1.544Mb/s)
Fig. 1 Paragon-X Reference Inputs (Back Panel)
There are two reference inputs
BNC with 75 impedance (the connector on the left in the figure).
Bantam connector with 100 impedance.

o
o
o

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3 pole bantam jack

4.39mm Diameter
Tip; Positive, Ring; Negative, Sleeve; Ground
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3. How to Configure the Paragon-X for ALL G.8262 Tests

a) Verify your physical connections have been completed per section 2.
b) Start the Paragon-X GUI
c) Select the Operating Mode
button.
d) Select Sync-E then select Close
e) Click
f)
Select Tx + Rx mode

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g) Verify that the SyncE Clock Rx > Tx is not checked

h) Select the reference clock source.
i)
Select the line rate and Electrical/Optical (100M/1GbE/10GbE).

Note: If using SFPs, XFPs or SFP+s, BOTH Port 1 and Port 2 optical transceivers must be
inserted into the Paragon-X.
j)
Select the Close button to close the Physical Settings window, and then select Close again to
close the setup interface window.
Note: once you have selected Sync-E mode, the Paragon-X GUI will display SYNCE LOCK as
grey (This verifies that the SyncE Rx > Tx box is unchecked, meaning that the Paragon-x is using
its internal or external clock. If the SyncE Rx>Tx box were checked in the required Tx+Rx mode,
there would be no clock).

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ESMC Generation
Ethernet Synchronisation Message Channel (ESMC) is a Point to Point Protocol in which each
EEC generates and terminates an ESMC PDU. This ESMC PDU is normally transmitted once per
second on the Slow Protocol Channel and contains the Quality Level (QL) of the associated clock
. The receiving EEC uses this QL to select the best quality clock. The EEC then regenerates the
ESMC PDU with the appropriate QL TLV value to indicate the quality of the clock being
transmitted to the next EEC.
If the EEC supports ESMC, it is possible for the Paragon-X to use this functionality to indicate if
an EEC switches clock reference or goes into holdover.
The Paragon-X can generate ESMC messages on both Ports 1 and 2. For G.8262 conformance
testing, ESMC messages are generated on Port 2 with a user- defined Quality Level (QL) such as
PRC.
a) Generate ESMC messages by selecting the
button. The following window will
open.
b) Check the box Enable TX+Rx Mode. This sets the instrument in terminate mode.

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c) Select Port 2 tab (the output from the Paragon and input to EEC)
d) Select SSM code QL-PRC, which tells the EEC that the clock from the Paragon-X is of PRC
quality.
e) Set IPG (inter-packet gap) rate to 1000mS. This makes the instrument send ESMC packets once
per second.
f)
Click
and then
g) The ESMC Generation button will go red to indicate the Paragon-X is generating ESMC packets.
After any setup changes to the Paragon-X, please ensure the EEC has had time to settle
before making any measurements

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4. Measuring Frequency Accuracy G.8262 Section 6
Input Stimulus
Pass/Fail Criteria
EEC Option 1
Free run
+/- 4.6 ppm
Recommend to test for

an hour, longer if close
to limits
+/- 4.6 ppm
Recommend to test for

an hour, longer if close
to limits
EEC Option 2
Hold over
Notes
Measurement Setup
a) Connect the EEC to Paragon-X as shown above
b) Set up the Paragon-X GUI as per Section 3.
Measurement Process
a) Select the Start Capture
button to start measurement.
b) To stop the measurement after a pre-defined period for running the test, select Stop Capture
button.

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c) Paragon-X will provide the ppm frequency accuracy at the bottom of the graph in red text (as
shown in the screen shot at the top of the next page).

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5. Pull-in, Hold-in and Pull-out ranges G.8262 Section 7
Pullin Range (G.8262 Section 7.1)

The Pull-in range is defined as the largest offset between a slave clock's reference frequency and
a specified nominal frequency, within which the slave clock will achieve locked mode.
Input Stimulus
EEC
Option 1
and
EEC
Option 2
Pass/Fail Criteria
Apply a large Frequency

offset ensuring EEC is in
holdover. Reduce offset
until EEC locks.
EEC starts unlocked with

large offset applied
EEC locks before offset

reaches +/- 4.6ppm
Notes
Lock can also be
monitored by using
ESMC (if supported)
Holdin Range (G.8262 Section 7.2)

Hold-in range is defined as the largest offset between a slave clock's reference frequency and a
specified nominal frequency, within which the slave clock maintains lock as the frequency varies
arbitrarily slowly over the frequency range.
Input Stimulus
Pass/Fail Criteria
EEC
Option 1
EEC
Option 2

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Notes
Not Applicable
EEC is locked to the clock
from the Paragon-X. The
Frequency is then offset
to +/-4.6ppm
EEC should remained

locked at an offset at
+/-4.6ppm
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Lock can also be

monitored by using
ESMC (if supported)
Pullout Range (G.8262 Section 7.3)

Pull-out range is defined as the offset between a slave clock's reference frequency and a
specified nominal frequency, within which the slave clock stays in the locked mode and outside of
which the slave clock cannot maintain locked mode, irrespective of the rate of the frequency
change.
Input Stimulus
EEC
Option 1
Pass/Fail Criteria

until the EEC unlocks
EEC
Option 2
EEC should remain locked

at an offset at +/-4.6ppm
but lock should extend
beyond this.
Notes
G.8262 states this is for
further study
Not Applicable
Measurement Setup
a) Connect the EEC to Paragon-X to EEC as shown in the diagram at the beginning of this section
b) Set up the Paragon-X GUI as per Section 3, including setting up ESMC with QL=PRC if using
ESMC to monitor which clock the EEC is locked to.
Measurement Process
a) select the Start Capture
b) Select the Wander button. Select the Frequency Offset tab

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c) In the Frequency Offset window, add the Frequency Offset required and click the Apply Offset
button
d) To remove the Frequency Offset and return it back to 0ppm click the Remove Offset
button
e) To stop the measurement after a pre-defined period for running the test, select Stop Capture
button.
f) The Paragon-X TIE graph indicates if the EEC is in or out of lock as shown in the screenshot
below

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6. Wander (Noise) Generation G.8262 Section 8
Input Stimulus
Pass/Fail Criteria
EEC Option 1
- Locked Mode
(Constant Temp)
- Wander Free reference

- Constant temperature
EEC Option 1
- Locked Mode
(Temp effects)

- Temperature effects
EEC Option 2
- Locked Mode
(Constant Temp)

MTIE & TDEV Pass/Fail

masks shown in G.8262
Section 8.1.1
MTIE Pass/Fail masks
shown in G.8262
Section 8.1.2.
Section 8.1.2
Notes
(G.8262 masks)
MTIE Table 1/ Figure 1
TDEV Table 3/ Figure 2
TDEV G.8262 states
for further study
G.8262 Section 8.2 also mentions measurements in Non-locked mode and refers to section 11.2
Long-term phase transient response (Holdover) and will not be covered in this section.
Measurement Setup
b) Set up the Paragon-X as described in section 3, including setting up ESMC with QL=PRC if
using ESMC to monitor which clock the EEC is locked to.
Measurement Process
a) Select the Start Capture

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b) To stop the measurement, select Stop Capture.
. It is suggested that the test
should run for approx 3,000 seconds
c) The graph will show the captured TIE
d) To display the MTIE and TDEV graphs click
on the bottom right hand side of the
graph and then MTIE/TDEV Analysis from the displayed menu.
e) A separate window will open showing the TIE in graphical form at the top, with an MTIE/TDEV
graph at the bottom.

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f)
The MTIE/ TDEV analysis can be carried out against the G.8262 masks for Wander
Generation which can be selected from the measurement mask pull down selection in the left
hand window.
g) Pass/Fail indication against the masks is shown also in this left hand window and will have a
green background for Mask Pass and a red background for Mask Fail

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7. Jitter Generation G.8262 Section 8.3
Input Stimulus
Pass/Fail Criteria
Notes
i. Measurement
filter bandwidths
specified in
G.8262.
All Sync-E
interface
rates
None, unless
device requires
packet stream to
function
Output jitter <=0.5UIpp

in 60-second window,
as G.8262 8.3 table 6
ii. G.8262 treats 1G

electrical as for
further study.
Calnex
recommends to
use the same
0.5UIpp limit until
further defined by
ITU.
a) Operating mode must be set to Sync-E, and Sync-E jitter selected as a measurement.

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Interface rate choice will then automatically be restricted to 1Gbit/s (Electrical or optical) or
10Gbit/s (100Mbit/s excluded).
For 10Gbit/s optical, device type is automatically restricted to SFP+ (XFP excluded).
Normally, the operating configuration is set to Tx+Rx mode.
b) Configure capture contains a jitter measurement threshold setting. If the checkbox is ticked, the
capture (result) screen will indicate pass/fail of the peak-peak jitter result currently selected,
relative to this limit. Note that the threshold result is compared to the instantaneous graph result
and so its behaviour is different between long-term and short-term peak-to-peak graph selections.
c) G.8262 specifies a pp jitter measurement time of 60s. The global default capture configuration in
the Paragon-X is manual (indefinite). Selecting Sync-E jitter measurement under operating
mode forces the configure capture timing control to timed mode, 60s. Select other periods or
manual if required, eg for experimentation and observing long-term device behaviour. However,
60s must be selected for making a G.8262 compliance measurement.

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d) Initiate jitter measurement using the start capture key. This automatically displays the statistics
window, jitter measurement tab. This tab shows long-term (ie over the total elapsed time) pp and
RMS jitter results. It also shows the measurement bandwidth, which is fixed depending on
interface type selected. Limit checking is not applied to the jitter measurement tab. The tab can
be closed, and re-opened any time via the Statistics and Results key.
e) The main capture screen shows table entries updated once per second for long-term pp, longterm RMS and short-term (one second) pp jitter results.
On the graph, use Graph Display Mode to select a result for graphing. The measurement
bandwidth is also displayed alongside the Y-axis legend on the graph.
Note that sample periods (1-second intervals) are numbered based on the start time of each onesecond period (ie, starting from 0), so for example a 60-second total measuring period will show
as containing sample periods 0-59.
Compare the 60s long-term peak-to-peak value to the G.8262 0.5UI limit.

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8. Wander (Noise) Tolerance G.8262 Section 9
Input Stimulus
EEC Option 1
Pass/Fail Criteria
The EEC is;
MTIE Wander
Table 7/Figure 5
TDEV Wander
Table 8/Figure 6
Sinusoidal Wander
Table 9/Figure 7
i. Maintaining the clock

within performance limits.
ii. Not causing any alarms.
iii. Not causing the clock to
switch reference.
iv. Not causing the clock to
go into holdover.
The EEC is;.
EEC Option 2
TDEV Wander
Table 10/Figure 8
i. Maintaining the clock

within performance limits
ii. Not causing any alarms.
iii. Not causing the clock to
switch reference.
iv. Not causing the clock to
go into holdover.
Notes
To Check whether the
EEC is switching
references or going
into holdover, the
Paragon can measure
the wander and/or
ESMC QL of the EEC
output.
EEC is switching
references or going
into holdover, the
Paragon can measure
the wander and/or
ESMC QL of the EEC
output.
Measurement Setup
b) Set up the Paragon-X as described in section 3, including setting up ESMC with QL=PRC if using
ESMC to monitor if the EEC is switching clock references or going into holdover.

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Measurement Process
a) Select the Wander and Jitter Generation
button on the Paragon-X GUI.
b) The Following window will now be open.
c) Select the Wander Tolerance Tab and the following window will open

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d) There are three methods of generating wander into the EEC:
e)
i.
MTIE/TDEV Wander Fastest and most effective way to evaluate EEC
ii.
Table Sinusoidal Wander Can be used for finding Maximum Tolerable Wander
iii.
Single Sinusoidal Wander Can be used for troubleshooting

MTIE/TDEV Wander
The Paragon-X generates MTIE and TDEV wander as defined in G.8262.
i. Select the wander mask required from the drop down list. The mask and the maximum
running time will be shown on the right hand side of the window.
G.8262 Option 1 MTIE - Running Time is 1000s
G.8262 Option 1 TDEV - Running Time is 12000s
G.8262 Option 2 TDEV - Running Time is 12000s
ii. Click Generate Wander to start the test. The elapsed time will be displayed on the
bottom right hand side of the window.
iii. The test will stop after the max running time has elapsed, the test can also be stopped
manually by clicking Stop Wander.
f) Table (Sinusoidal)
Can be used to test Maximum Tolerable Wander

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The user can enter up to 10 different wander parameter sets in the table. The Paragon-X will
then automatically add each of the specified wander sets in turn giving full indication of progress
in the Status column. Switching between the different sets is always done at a zero crossing to
prevent phase steps.
i.
Enter the frequency, amplitude, and dwell time (number of cycles the
frequency/amplitude pair will be run) for each wander test point.
The same frequency with different amplitudes can be entered to find maximum
tolerable wander
The Restore Defaults button when checked will restore the values to that defined
in table 9 in G.8262.
Only rows that have the enable check box ticked will be executed in the test. To
skip over a selection, un-tick the enable box for that selection.
ii.
Click Generate Wander to start the test
iii.
Click Stop Wander to stop the test. The test will terminate at the next zero crossing
iv.
A pop up box stating how long to the next zero crossing is displayed, click the Stop
Immediate button if it is desired to stop the test instantly.
g) Single Sinusoidal Wander

Can be used for troubleshooting issues at a specific frequency

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i. Enter the frequency and amplitude of the desired wander

ii. Click Generate Wander to start the test
iii. Click Stop Wander to stop the test. The test will terminate at the next zero crossing of the
wander frequency
A pop up box stating how long to the next zero crossing is displayed.
h)
G.8262 states that with the wander applied that the EEC should
i. Maintain the clock within the prescribed performance limits (the exact performance limits
are for further study)
ii. Not cause any alarms
iii. Not cause the clock to switch references
iv. Not cause the clock to go into holdover
For further insight, use the Paragon-X ESMC generation/capture capability and TIE graph
to check whether the EEC is switching clock reference or going into holdover.
i)
Ensure the Paragon-X has been set up to Generate ESMC messages with QL=PRC as
described in section 3 of this document.
j)
Select the Start Capture
k)
To show both the TIE and ESMC graph at the same time click
button to start the measurement.

and then Show 2
Graph and then select ON

l)
To change what a graph is displaying,

i. click one of the graphs (the selected graph will be non-Grey
ii. Click

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and then Graph Display Mode, finally select the graph to display
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nd
Time Interval Error (TIE) vs Nominal

ESMC Rx Quality vs Time: (Port 1 Rx)
The screenshot above shows an EEC that has switched references or gone into holdover (top
graph is ESMC, bottom graph shows the difference in Frequency between the reference and the
recovered clock from the EEC)
m) To stop the measurement, select Stop Capture.

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9. Jitter Tolerance G.8262 Section 9.2
Input Stimulus
EEC Option 1
and option 2

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Test packet stream

from Paragon-X or
thru-mode traffic
Superimpose jitter to
G.8262 9.2 fig 9
Pass/Fail Criteria
Notes
Either as pass/fail with

presented jitter values at
the mask, or a margin test
with jitter values above
mask.
Allow settling time at each

measurement point
The EEC does not drop

packets for all jitter
values presented
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Measurement Setup
a) Open Operating Mode dialog, change Operating Mode to Sync-E

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b) Open Setup Interface dialog

c)
Select Tx+Rx Mode
d)
Select 1GbE or 10GbE Line Rate

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e) Open Jitter dialog and select the Table tab

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f)
From the TestPackets tab, the user configures the test packet they wish to generate.
g) From the Jitter Tolerance Table tab, the user enters the Frequency, Amplitude, and
Dwell Time for each row.
h) From the Jitter Tolerance Table tab, the user clicks the Start Test button. Test Packet
generation will be automatically controlled as each row in the Jitter table is executed.
i)
The Jitter and Test Packet generation will automatically stop after all the enabled table
rows have been executed.
j)
A PASS or FAIL result for each executed row will appear on the Jitter Tolerance Table
tab. The result will indicate if any Dropped packets were detected during the test.

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k) In the Max tolerable jitter mode, operation is similar except a percentage above or below
mask can be set for the generated jitter amplitudes.

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10. Wander (Noise) Transfer G.8262 Section 10
Input Stimulus
EEC Option
1
EEC Option
2
Not defined
TDEV Wander
Table 10/Figure 8
Pass/Fail Criteria
Notes
The phase gain of the

EEC should be smaller
than 0.2 dB (2.3%).
There is no definition of the

input stimulus to be used in
G.8262. Without further
guidance from the
Standards, it is suggested
that the amplitude and
frequency values associated
with mask points labelled f1,
f2 & f3 on G.8262 Section
9.1.1, Table 9 & Figure 7 are
used.
Measure EEC output

against TDEV
Pass/Fail masks
shown in G.8262
Section 10..2 Table
13/Figure 11
Measurement Setup
a) Connect the EEC to Paragon-X to EEC as shown in the diagram at the beginning of this
section

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b) Set up the Paragon-X as described in section 3, including setting up ESMC with QL=PRC if
using ESMC to monitor which clock the EEC is locked to.
Measurement Process
a) Select the Wander and Jitter Generation
button on the Paragon-X GUI.
b) The Following window will now be open.
c) Select the Wander Transfer Tab and the following window will open

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G.8262 Option 1 Wander Transfer Test: Paragon-X automated testing

a) Select the Table tab.

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b) Enter the frequency, amplitude, and dwell time (number of cycles the frequency/amplitude pair
will be run) for each wander test point.
i. The Restore Defaults button when checked will restore the values to that defined in table 9 in
G.8262.
ii. Only rows that have the enable check box ticked will be executed in the test. To skip over a
selection, un-tick the enable box for that selection.
iii. Be careful to choose a dwell time of 300 cycles for any wander frequency of 1Hz or higher.
Additionally, choose the shortest sample period (configure capture button) available for
calibration and definitive measurement runs.
c) To calibrate the Paragon-X, connect a short Ethernet cable between Port 1 and Port 2 and click
the
button.
d) When the calibration is finished the Status window will show

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e) Remove the short Ethernet cable between Port 1 and Port 2 and connect the EEC under test as
shown in the setup diagram at the start of this section.
f)
Click the Generate Wander
button to start the test.
g) The Paragon-X will show the status of the test, the measured Gain (dB) value and also a
Pass/Fail indication on the right hand side of the window.

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G.8262 Option 1 Wander Transfer Test: Paragon-X single frequency test

This capability can be used for fault finding issues at specific frequencies
a) Select the Single tab.
b) Enter the frequency and amplitude of the wander to be generated
c) To calibrate the Paragon-X, connect a short Ethernet cable between Port 1 and Port 2 and click
the
button.
d) When the calibration is finished the Status window will show

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e) Remove the short Ethernet cable between Port 1 and Port 2 and replace with the EEC under test.
f)
Click the Generate Wander
g) The GUI will show the estimated completion time at the bottom of the screen. The measured Gain
(dB) value and also a Pass/Fail indication (Green/Red background) will be displayed.

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G.8262 Option 2 Wander Transfer Test:

a) Select the G.8262 Option 2 tab.
b) Press Generate Wander
c) The amount of the time until completion of the test is shown at the bottom right hand side of the
screen.
d) At any time during the test, it is possible to view an updated output TDEV graph by clicking the
TDEV Results button. The TDEV graph will then be displayed.

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e) At the end of the test the Paragon-X will automatically show the final MTIE graph and show
Pass/Fail against the MTIE mask.

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11. Phase Transient Response G.8262 Section 11

11.1 G.8262 Section 11.1 Short-term phase transient response
Input Stimulus
EEC Option 1
EEC Option 2
Pass/Fail Criteria
EEC input reference

is lost for 15 seconds
and a 2nd reference
input signal, traceable
to the same reference
clock, is available
simultaneously
EEC input reference
and a 2nd reference
clock, is available
simultaneously
Maximum phase
transient at the output
due to reference
switching to meet mask
in G.8262 Figure 12
Notes
To emulate the loss of the
link either
Change ESMC
QL=DNU
Remove the cable

between port 2 and
EEC

link either:
EEC output should meet
MTIE mask defined by
table 15/ Figure 14 in
section 11.4.2 of G.8262
Change ESMC
QL=DNU
Remove the cable

between port 2 and
EEC
Measurement Setup

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b) Set up the Paragon-X as described in section 3 (including ESMC generation if using the ESMC
method of switching clock references, ensuring SSM code is set to PRC)
c) Select Configure Capture
, select 10mSecs sample period and then close.
Measurement Process
a) There are two methods for determining Phase Transient Response with the Paragon-X;
i. Use ESMC Generation (if supported by the DUT).
ii. Remove the link between Port 2 on the paragon-X and the EEC input port.
b) Select the Start Capture
c) If using the Ethernet cable removal method please disconnect cable between port 2 and the EEC.
d) If using ESMC method
i. Select

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button. The following window will open
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ii. Ensure SSM code is set to QL PRC

iii. In the SSM Code drop down menu select QL DNU/DUS and then click
e) To stop the measurement click Stop Capture.
Measuring Results
The switching transient will be seen on the Paragon-X TIE graph.
The Paragon-X graphs can show the TIE and also the ESMC QL for each port
In the screenshot bellow the ESMC graph shows the time and QL change of the ESMC transition
on Port 2 Tx of the Paragon-X. This can then be compared in time to the TIE graph showing the
Transient.
Method of evaluating the capture for phase transient response is dependent upon whether EEC
Option 1 or Option 2 is being evaluated.
EEC Option 1
a) To view the output TIE for EEC Option 1, closely monitor the output TIE graph on Paragon-X for
the duration (15s) of the test. While the slave clock is acquiring the new reference, the output
phase transient should be within the limits of figure 12 of G.8262 (provided below)

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EEC Option 2
a) To view the output MTIE mask for EEC Option 2 ONLY, perform the following:
b) To display the MTIE and TDEV graphs click
on the bottom right hand side of the TIE
graph and then MTIE/TDEV Analysis from the displayed menu.
c) A separate window will open showing the TIE in graphical form at the top, with an MTIE/TDEV
graph at the bottom.

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d) The MTIE analysis can be carried out against the G.8262 masks for Wander Transient which
can be selected from the measurement mask pull down selection in the left hand window.
e) Pass/Fail indication against the masks is shown also in this left hand window and will have a
green background for Mask Pass and a red background for Mask Fail

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11.2 G.8262 Section 11.2 Long-term phase transient response
10.
Input Stimulus
Pass/Fail Criteria
Notes
link either
EEC Option 1
EEC input reference

and a 2nd reference
clock, is available
simultaneously
Maximum phase
transient and excursion
at the output due to
reference switching to
meet mask in G.8262
Figure 13
Change ESMC
QL=DNU
Remove the cable

between port 2 and
EEC
Measure for 10,000

seconds (approx 3hrs)
EEC Option 2
EEC input reference

and a 2nd reference
clock, is available
simultaneously
Maximum phase
transient and excursion
at the output due to
reference switching to
meet mask in G.8262
11.2.2 and table 14,
st
nd
including 1 and 2
derivatives of phase vs
time

link either:
Change ESMC
QL=DNU
Remove the cable

between port 2 and
EEC
Measure for 10,000

seconds (approx 3hrs)
Measurement setup and process: EEC-1

Set the ESMC being generated on port 2 of the paragon to PRC. This will cause the DUT to lock to
this signal and hence to the Synchronisation Source.

Reg. SC299625
Page 50 of 58
After allowing the DUT to settle, leave for at least 900s (15 minutes), measure the wander on Port 1.
The resulting graph should be flat and the Offset measurement at the foot of the Wander TIE graph
should indicate 0.000 ppm. The ESMC received from the DUT on Port 1 should also indicate PRC.
Restart the wander measurement and then set the ESMC on Port 2 to DNU (Do Not Use). This
should cause the the DUT to search for an alternative master clock signal to lock to. If there are no
other external signals then the DUT will use its internal clock. The ESMC messages on port 1 should
reflect this change with the appropriate Quality Level e.g. EEC1.
The TIE graph should show the SyncE signal from the DUT start to drift off. Leave the capture running
for a further 10,000 seconds (approx 3 hrs) minimum. Stop the measurement.
The limits of operation are given by this mask reproduced from G.8262 fig 13:
Check also that the TIE measurement shows a calculated frequency offset (shown at bottom of TIE
graph) within +/-4.6ppm.
For EEC-2, proceed as above, except the limit for TIE is as described in G.8262 11.2.2 and table 14,
illustrated here as a mask:

Reg. SC299625
Page 51 of 58
1.00E+06
G.8262 11.2.2 EEC-2 TIE mask
1.00E+05
1.00E+04
TIE (nS)
1.00E+03
1.00E+02
1.00E+01
10
100
1000
Time S (seconds)
10000 100000 1000000
st
The limits for EEC-2 1 derivative TIE (fractional frequency offset) and 2
nd
derivative TIE (fractional
frequency drift) are also specified in table 14.

Currently it is not possible to compare results against the masks directly in Paragon-X, but two
methods of comparing results to G.8262 limits are available:
Method 1: direct observation of results from the Paragon-X (for EEC-1 and EEC-2 TIE), using marker
functions.
Method 2: export of Paragon-X TIE results as a .csv file, with subsequent processing in Excel. This
st
can be used for all cases, and is the only practical way to compute the 1 and 2
nd
differentials of TIE in
the case of EEC-2.

On Paragon-X, after running the TIE measurement, use FILE, EXPORT to create a .csv file, then open
with Excel and perform the analysis.
Paragon-X exported TIE files show the TIE values as a single series of integers based on 1ns units.
To build a table of TIE versus time (S), compute the S values from the position in the series times the
sampling interval selected (default is 0.033 333 320 seconds, corresponding to 30 samples/s) and the
TIE values from the cumulative value of each series value minus 33333320. Compute derivatives
using the central difference approximation dTIE/dS = (TIE(n+1) - TIE(n-1))/0.066666640. The constants

Reg. SC299625
Page 52 of 58
used in the calculation need to be changed to match the original capture sample rate, if it is varied
from its default 30/s.
See Calnex document CX5001e (on our website) as a practical example in Excel of the use of a
Paragon-x exported TIE file, with central difference differentiation examples.

Reg. SC299625
Page 53 of 58
12. Appendix 1 - G.8262; Practical interpretation guidance

Frequency Accuracy G.8262 Section 6
Input Stimulus
Pass/Fail Criteria
EEC Option 1
Free run
+/- 4.6 ppm
Recommend to test
for an hour, longer if
close to limits
+/- 4.6 ppm
Recommend to test
for an hour, longer if
close to limits
EEC Option 2
Hold over
Notes
Pullin Range (G.8262 Section 7.1)

Input Stimulus
EEC
Option 1
and
EEC
Option 2
Pass/Fail Criteria
Apply a large Frequency

offset ensuring EEC is in
holdover. Reduce offset
until EEC locks.
EEC starts unlocked with

large offset applied
EEC locks before offset

reaches +/- 4.6ppm
Notes
Lock can also be
monitored by using
ESMC (if supported)
Holdin Range (G.8262 Section 7.2)

Input Stimulus
Pass/Fail Criteria
EEC
Option 1
EEC
Option 2

Reg. SC299625
Notes
Not Applicable
to +/-4.6ppm
EEC should remained locked

Page 54 of 58
Lock can also be

monitored by using
ESMC (if supported)
Pullout Range (G.8262 Section 7.3)
Input Stimulus
EEC
Option 1
Pass/Fail Criteria

until the EEC unlocks.
EEC
Option 2
EEC should remain locked

but lock should extend
beyond this.
Notes
G.8262 states this is for
further study
Not Applicable
Wander Generation (G.8262 Section 8)
Input Stimulus
EEC Option 1
- Locked Mode
(Constant Temp)

EEC Option 1
- Locked Mode
(Temp effects)

- Temperature effects
EEC Option 2
- Locked Mode
(Constant Temp)


Reg. SC299625
Pass/Fail Criteria
Section 8.1.1
MTIE Pass/Fail masks
shown in G.8262
Section 8.1.2.
Section 8.1.2
Page 55 of 58
Notes
TDEV G.8262 states
for further study
Wander Tolerance (G.8262 Section 9)
Input Stimulus
EEC Option 1
Pass/Fail Criteria
The EEC is;
MTIE Wander
Table 7/Figure 5
TDEV Wander
Table 8/Figure 6
Sinusoidal Wander
Table 9/Figure 7
v. Maintaining the clock

within performance limits.
vi. Not causing any alarms.
vii. Not causing the clock to
switch reference.
viii. Not causing the clock to
go into holdover.
The EEC is;.
EEC Option 2
TDEV Wander
Table 10/Figure 8
v. Maintaining the clock

within performance limits
vi. Not causing any alarms.
vii. Not causing the clock to
switch reference.
viii. Not causing the clock to
go into holdover.
Notes
EEC is switching
references or going
into holdover, the
Paragon can measure
the wander and/or
ESMC QL of the EEC
output.
EEC is switching
references or going
into holdover, the
Paragon can measure
the wander and/or
ESMC QL of the EEC
output.
Wander Transfer (G.8262 Section 10)

Input Stimulus
EEC Option 1
EEC Option 2

Reg. SC299625
Not defined
TDEV Wander
Table 10/Figure 8
Pass/Fail Criteria
The phase gain of the

EEC should be smaller
than 0.2 dB (2.3%).
Measure EEC output

against TDEV Pass/Fail
Section 10..2 Table
13/Figure 11
Page 56 of 58
Notes
There is no definition of the
input stimulus to be used in
G.8262. Without further
guidance from the Standards,
it is suggested that the
amplitude and frequency
values associated with mask
points labelled f1, f2 & f3 on
G.8262 Section 9.1.1, Table 9
& Figure 7 are used.
Transient Response (G.8262 Section 11)

Input Stimulus
EEC Option 1
EEC Option 2

Reg. SC299625
Pass/Fail Criteria
EEC input reference

and a 2nd reference
clock, is available
simultaneously
EEC input reference
and a 2nd reference
clock, is available
simultaneously
Maximum phase
transient at the output
due to reference
switching to meet mask
in G.8262 Figure 12
Notes
link either
Change ESMC
QL=DNU
Remove the cable

between port 2 and
EEC

link either:
EEC output should meet
MTIE mask defined by
table 15/ Figure 14 in
section 11.4.2 of G.8262
Page 57 of 58
Change ESMC
QL=DNU
Remove the cable

between port 2 and
EEC
For more information on the Calnex Paragon-X and to take advantage of Calnexs extensive experience in
sync and packet testing technologies, please contact Calnex Solutions on +44 (0) 1506 671 416 or email:
info@calnexsol.com

Herkimer House
Mill Road Enterprise Park
Linlithgow
West Lothian EH49 7SF
United Kingdom
Tel: +44 (0) 1506 671 416
Email: info@calnexsol.com
www.calnexsol.com
CX5001 v10 Oct 2012
This information is subject to change without notice
Calnex Solutions Ltd, 2010

CX5001 G.8262 SyncE Conformance Testing App Note v10

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Application note CX5001

G.8262 SyncE Conformance testing

Hardware and Software required ............................................................................................. 2

Connecting an EEC to the Paragon-X ..................................................................................... 3

How to Configure the Paragon-X for ALL G.8262 Tests .......................................................... 5

Measuring Frequency Accuracy G.8262 Section 6 ............................................................... 9

Pull-in, Hold-in and Pull-out ranges G.8262 Section 7 ........................................................ 11

Wander (Noise) Generation G.8262 Section 8 ................................................................... 15

Jitter Generation G.8262 Section 8.3.................................................................................. 19

Wander (Noise) Tolerance G.8262 Section 9 ..................................................................... 23

Jitter Tolerance G.8262 Section 9.2 ................................................................................... 29

10. Wander (Noise) Transfer G.8262 Section 10 ...................................................................... 35

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1. Hardware and Software required

Option 110 GbE electrical and Optical

Option 111 10GbE interface (optional)

Option 120 Delay and Header Capture

Option 213 Sync-E measurements

Option 223 MTIE/TDEV internal wander generation

Paragon- X Software X.10.14 or higher

Synchronisation (Reference) Frequency Source

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2. Connecting an EEC to the Paragon-X

Paragon-X Front Panel Connections

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Fig. 1 Paragon-X Reference Inputs (Back Panel)

There are two reference inputs

BNC with 75 impedance (the connector on the left in the figure).

Bantam connector with 100 impedance.

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3 pole bantam jack

3. How to Configure the Paragon-X for ALL G.8262 Tests

d) Select Sync-E then select Close

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g) Verify that the SyncE Clock Rx > Tx is not checked

Select the line rate and Electrical/Optical (100M/1GbE/10GbE).

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a) Generate ESMC messages by selecting the

button. The following window will

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Calnex Solutions Ltd

4. Measuring Frequency Accuracy G.8262 Section 6

+/- 4.6 ppm

Recommend to test for

+/- 4.6 ppm

Recommend to test for

button to start measurement.

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Calnex Solutions Ltd

5. Pull-in, Hold-in and Pull-out ranges G.8262 Section 7

Pullin Range (G.8262 Section 7.1)

Apply a large Frequency

EEC starts unlocked with

EEC locks before offset

Holdin Range (G.8262 Section 7.2)

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EEC should remained

Lock can also be

Pullout Range (G.8262 Section 7.3)

EEC is locked to the clock

EEC should remain locked

button to start measurement.

b) Select the Wander button. Select the Frequency Offset tab

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