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sources of precursors usually have dierent vaporisation rates and decomposition
temperatures which tend to give rise to non-stoichiometric lms. If the generation of vapour reactants require the gas source to be heated above room temperature, the gas lines require heating in order to prevent condensation. 5.2. CVD reactor In general a CVD reactor consists of a reaction chamber equipped with a loadlock for the transport and placement of the substrate into the chamber, a substrate holder, and a heating system with temperature control. The main function of the CVD reactor is used to heat the substrate to the deposition temperature. The CVD reactor can be either a hot-wall or cold-wall. A hot-wall reactor uses a heated furnace into which the substrates are placed for indirect heating. A three-zone resistively heated furnace is commonly used to facilitate the control of the outer zones and enable a uniform temperature prole to be maintained in the central deposition zone. Though the hot wall reactor can provide very precise temperature control, the interior of the hot wall reactor is also coated, resulting in maintenance problems and lower deposition eciency. In addition, depletion of gaseous reactants also occurs along the reactor. Therefore, the substrates have to be positioned 45 degree to the gaseous reactants (Figs. 1 and 2). In a cold wall reactor, however, only the substrate is heated, either inductively or resistively, and the wall of the reactor is cold. Most of the CVD reactions are endothermic. Therefore, the deposition reaction will occur on the heated substrate, and negligible deposition on the wall of the reactor. Although these reactors are more complex, they allow greater control over the deposition process, and minimise the deposition onto the walls of the reactor and the depletion of the reactants. However, the thermal convection which occurs in a cold wall reactor can create a concentration gradient of the reactive species and result in non-uniform coatings. This limitation can be overcome by performing the CVD cold wall deposition at a reduced pressure. Factors which determine the heating method are the size and geometry of the substrate, and whether it is conducting or non-conducting. There are various reactor congurations. For examples, horizontal, vertical, semi-pancake, barrel and multiple wafer as shown in Fig. 3. 5.3. The euent gas handling system This component consists of a neutralizing part for the exhaust gases, and/or a vacuum system to provide the required reduced pressure for the CVD process that performs at low pressure or high vacuum during deposition. In general, low pressure CVD requires a simpler vacuum system as compared to those required in the PVD process. Low pressure CVD uses corrosion resistant rotary or vane pump. The main function of the euent gas handling system is to remove the hazardous by-product and the toxic unreacted precursor safely. The unreacted precursors and corrosive byproducts such as HCl are neutralised or trapped using a liquid nitrogen trap to prevent these gases from entering the rotary or diusion pump which can cause