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Epiretinal Implant :
Epiretinal implants sit in the inner surface of the retina. They are advantageous as they bypass a large portion of the retina. It could provide visual
perception to individuals with retinal diseases extending beyond the photoreceptor layer. The implants receive input from a camera and processing unit
(E.g. on glasses). Electrodes from the implants electrically stimulate
Subretinal implants sit on the outer surface of the retina, between the photoreceptor layer and the retinal pigment epithelium, directly stimulating reti- nal
cells and relying on the normal processing of the inner and middle retinal layers. It
has a simpler design .It replace damaged rods and cones by Silicon plate carrying
1000s of light-sensitive micro photodiodes each with a stim- ulation electrode.
Light from image activates the micro photodiodes, the electrodes inject currents
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Subretinal Implant :
the ganglion cells and axons at the start of the optic nerve.
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Chapter 2
ARTIFICIAL RETINA
USING THIN FILM
TRANSISTORS
2.1 Operation
Artificial Retina using Thin-Film Transistors (TFTs) is fabricated on transparent and exible substrates; it uses the same fabrication processes as conventional poly-Si TFTs and encapsulated using SiO2, in order to perform in
corrosive environments. Although the artificial retina is fabricated on the glass
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plastic substrate. The artificial retina using TFTs is shown in Figure 2.1.
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high efciency, and the current mirror and load resistance are designed by
current mirror, and load resistance. The photo transis- tor is optimized to achieve
Electronic photo devices and circuits are integrated on the artificial retina,
which is implanted on the inside surface of the living retina at the back part of the
human eyeballs. Since the irradiated light comes from one side of the artificial
and exible substrate and implanted using epiretinal implant is shown in Figure 2.2.
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retina and the stimulus signal goes out of the other side, the transparent substrate
also required because of their small parasitic capacitance which can re- alize high
speed operation. Since ion implantation is one of the key factors in fabricating such
as TFTs and CMOS configurations, several non-mass- separated I/D techniques are
proposed. These techniques, however, are not suitable for conventional poly-Si
TFT processes and cannot be applied to
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active matrix LCDs with integrated drivers on large glass substrates. For in-
With this system, impurities can be implanted over the entire 300 mm
square substrate with a maximum accelerating voltage of over 110 KeV which is
sufcient for implanting impurities through the 150nm SiO2 gate insulator. On the
other hand, the conventional non-mass-separated I/D techniques are severely
limited in beam area, which is about 150 mm in diameter. Further- more, they are
incapable of implanting impurities through the gate insulator
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technique. Boron ions are implanted through the gate insulator with a dose of 5 x
1015 cm-2 at energy of 80 keV. N-channel gate electrodes are also formed and
phosphorus ions are implanted with a dose of 3x1015 cm-2 at energy of 110 keV
by the new I/D technique Impurities are activated by a XeCl excimer laser.
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The next step is to form source and drain regions of p-channel TFTs by the new I/D
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Cr film is deposited at 180 oC. First, only p-channel gate electrodes are formed.
keV with a dose of 1.5 1015 cm-2 to form a p-type cathode region. Finally, watervapor heat treatment is performed at 400 oC for 1 h to thermally activate the
dopant ions and simultaneously improve the poly-Si film, control-insulator film,
and their interfaces.The p/i/n TFPT must be illuminated from the backside of
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anode region, and boron ions are also implanted through a photo resist mask at 25
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through a photo resist mask at 55 keV with a dose of 2 1015 cm-2 to form an n-type
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illuminance.
w
hen Vctrl and Vapply are large.
When Vctrl 0, since Vctrl in the entire intrinsic region, a hole channel
is induced, and a pseudo p/n junction appears near the anode region. Since a
depletion layer is narrowly formed there, where carrier generation occurs due to
cathode region, the hole density is low there, which is sim- ilar to the pinchof
phenomena in the saturation region of MOSFETs. Since another depletion layer is
widely formed there, Idetect is large. When 0 Vctrl Vapply, since Vctrl on the
side of the cathode region, an electron channel is induced there. At the same time,
since Vctrl on the side of the anode region, a hole channel is still induced there.
Since the depletion layer
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a hole channel is still induced, since Vctrl is approximately equal to near the
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is widely formed between the electron and hole channels, Idetect is large.
When Vctrl is approximately equal to Vapply, although an electron channel is
further induced, since Vctrl is approximately near the anode region, the electron
density is low there. Since the depletion layer is widely formed there, Idetect is
large. Since generated carriers are transported through the electron channel with
high conductance instead of the hole channel, Idetect becomes maximal. When
Vapply Vctrl, since Vctrl in the entire intrinsic region, an electron channel is
further induced, and a pseudo p/n junction appears near the cathode region. Since
another depletion layer is narrowly formed there, Idetect is small. The anomalous
increases of Idetect when Vctrl and Vapply are large may be caused by the impact
ionization and avalanche breakdown in the depletion layers. The asymmetric
behavior, for example, comparing Vctrl = 2 and + 5 V for Vapply =3 V, may be
occasioned by the diference of electric field because the hole density when Vctrl =
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Chapter 3
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reduction in power transfer to the device. In order to overcome these prob- lems we
propose the use of an intermediate link between the primary and secondary coil as
shown in Figure 3.1. In this figure we show the possible locations for one-pair coils
and a two pair coils system which consists of an additional intermediate link made
out of a pair of serially connected coils. In this method, the secondary coil is
located under the sclera (eye wall) and is connected to the implanted device via
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tion between the primary and secondary coils. The latter problems result in
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we face are large separation between the coils and the constant relative mo-
electrical wires which are embedded under the wall of the eye. By placing these
components under the sclera, we avoid having a permanent wire breaching through
the eye wall. The trans- mit coil is placed on the skin of the head at an
inconspicuous location, for example at the back of the ear. The intermediate coils
are positioned with one end on the sclera over the receive coil and the other end
under the skin beneath the transmit coil. The advantage of this method is
immunity to variation in coupling due to rapid movements of the eye as relative
motion between adjacent coils is restricted. It also has the potential to increase the
power transfer efciency compared to a one-pair coil system.
3.2 Working
The wireless power supply using inductive coupling is shown in Figure 3.2.
The right graph in Figure 3.2. is a measured stability of the supply voltage. This
system includes a power transmitter, power receiver, Diode Bridge, and Zener
diodes. The power transmitter consists of an ac voltage source and induction
coil is an enameled copper wire, the diameter is 1.8 cm, and the winding
number is 370 times. The power receiver also consists of an induction coil,
which is the same as the power transmitter and located face to face. The diode
bridge rectifies the ac voltage to the dc voltage, and the Zener diodes regulate
the voltage value. The Diode Bridge and Zener diodes are discrete devices and
encapsulated in epoxy resin. Although the current system should be downsized
and bio-compatibility has to be inspected, the supply system is in principle very
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coil. The Vpp of the ac voltage source is 10 V, and the frequency is 34 kHz,
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the artificial retina can be correctly operated even using the unstable power
Chapter 4
SUMMARY
The artificial retina using poly-Si TFTs and wireless power supply using
inductive coupling are located in a light-shield chamber, and Vout in each retina
pixel is probed by a manual prober and voltage meter. White light from a metal
halide lamp is diaphragmmed by a pinhole slit, focused through a convex lens,
reected by a triangular prism and irradiated through the glass substrate to the back
surfaces of the artificial retina on a rubber spacer. The real image of the pinhole slit
is reproduced on the back surface. Figure. 4.1 shows the detected result of
irradiated light. It is confirmed that the Lphoto distribution can be reproduced as
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supply system even if it is driven using the unstable power source, although shape
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the Vout distribution owing to the parame- ter optimization of the wireless power
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Chapter 5
REFERENCES
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