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Objectives
This course has been prepared for ECE and CSE students of B.Tech with the
following objectives:
(i)
(ii)
To know about various random life length models and their uses in
finding the reliability of different electronic devices.
To learn about basic properties and characteristics of various random
processes with reference to signal and trunk processes.
Learning Outcomes
After learning this course the students will be able to
(i)
(ii)
(iii)
Teaching Plan
Weeks
I, II&III
IV &V
VIII,IX&X
XI &XII
XIII &XIV
Books
1. T. Veerarajan ,Probability, Statistics and Random Processes, Tata McGraw
Hill.
2. J.J. Aunon & V. Chandrasekhar, Introduction to Probability and Random
Processes, Mc-Graw Hill International Ed.
3. A. Papoulis & S.U. Pillai, Probability, Random Varibles and Stochastic
Processes, Mc-Graw Hill.
4. H. Stark, and J.M. Woods, Probability and Random Processes with
Applications to Signal Processing, Pearson Education.
Methodology
The course will be covered by lectures and tutorials. Assignments and quizzes
will be given to test their comprehensibility.
Evaluation plan :
Tests
Marks
Duration of test
Test-I
15
1 hour
Test2
25
1 hour 30 minutes
Test-3
35
2 hour
Assignments
10
10
Regularity
Course Coverage
Syllabus covered upto Test-1
Syllabus covered upto Test-2
Full Syllabus