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Chapter- 5

Junctions: MetalSemiconductor junctions

EEE F214/INSTR F214


Lecture 23
DR. NAVNEET GUPTA

Metal-Semiconductor Junctions
Basic Terms
Vacuum level
Workfunction (q)
Electron affinity ()

Isolated metal
Dr. Navneet Gupta

After Joining

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Isolated metal
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After Joining

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Rectifying Contact

Dr. Navneet Gupta

Dr. Navneet Gupta

Charge and field distribution for M-S contacts

Figure (a) Charge distribution and


(b) electric-field distribution in a
metal-semiconductor contact.

Dr. Navneet Gupta

Conduction Mechanisms

Figure Current transport by the thermionic emission process.


(a) Thermal equilibrium; (b) forward bias; and (c) reverse bias.
Dr. Navneet Gupta

J J sm J ms

e
1

2 q B / kT

J AT e
*

J Jo e

qV / kT

qV / kT

I-V characteristics of the Schottky barrier junction is


similar to the pn junction diode. The current mechanism
here, however, is due to the flow of majority carrier
electrons

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Comparison of the Schottky diode and pn


junction diode
Frequency response
Switching characteristics

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Ohmic contacts

EEE C381

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EEE C381

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Fermi Level pinning

EEE C381

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Example
Calculate the theoretical barrier height, built-in potential
barrier, and maximum electric field in a metalsemiconductor diode for zero applied bias. Consider a
contact between tungsten and n-type silicon doped to Nd
= 1016 cm-3 at T = 300 K.

EEE C381

Dr. Navneet Gupta

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