Documente Academic
Documente Profesional
Documente Cultură
Inventors
John Bardeen
Walter Brattain
William Shockley
Dr. Navneet Gupta
Fundamentals of BJT
Control the junction reverse current simply by varying the rate of minority
carrier injection.
Dr. Navneet Gupta
BJT structure
heavily doped
provides the carriers
lightly doped
NPN BJT
lightly doped
Wb Lp
Doping: E B C
Dr. Navneet Gupta
p ( xn ) C1e
xn
Lp
C2 e
xn
Lp
Boundary Conditions
p ( xn 0) C1 C2 pE
Wb
Wb
p ( xn Wb ) C1e
C2 e
pC
Solve for C1 and C 2 and taking pC 0
Wb
p(xn ) pE
Lp
Lp
xn
Wb
Lp
Lp
e
e
Wb
Wb
Lp
xn
Lp
Lp
Lp
p(xn ) pE
Lp
xn
Wb
Lp
Lp
e
e
Wb
Lp
xn
Lp
Wb
Lp
10
11
Example-1
Find the expression for the current I for the
transistor connection shown if = 1
How does the current I divide between the base
lead and the collector lead?
E
p+
V
-
12
pE
pE
-pn
Wb
Q
p
Q
Wb
xn
0
Dr. Navneet Gupta
Wb
13
Wb nn n
1 p
n
Ln p p p
IC
Wb
B
sec h
I Ep
Lp
p
B
Dr. Navneet Gupta
14
Lecture - 34
Generalized Biasing
15
EEEC381
16
Linear superposition
where
A apn
B bpn
Dr. Navneet Gupta
17
More general:
18
Ebers-Moll model
19
pC pn (eqVCB / kT 1)
EEEC381
20
I C N I E (1 N I ) I CS (e qVCB / kT 1)
I E I I C (1 N I ) I ES (e qVEB / kT 1)
define I CO (1 N I ) I CS collector saturation current with emitter open
I EO (1 N I ) I ES emitter saturation current with collector open
then
I E I I C (1 N I ) I ES (e qVEB / kT 1)
I I C I EO (e qVEB / kT 1)
I C N I E (1 N I ) I CS (e qVCB / kT 1)
Another form
of Ebers-Moll
Equation
N I E I CO (e qVCB / kT 1)
Dr. Navneet Gupta
21
I E I I C I EO (eqVEB / kT 1)
I C N I E I CO (eqVCB / kT 1)
22
Example
23
QN
I CN
QN
tN
I EI
QI
tI
and
and
QI
I EN
QN
tN
I CI
QI
tI
QN
pN
QI
pI
24
tN
I C I CN I CI
QN
tN
QI (
pN
tI
)
1
pI
QI
tI
)
pN
I B I BN I BI
QN
pN
pI
QI
pI
I BN tN
EEEC381
25
tN
iC
iB
QN
tN
QN
pN
pN
QI
tI
dQN
dt
dQI
QI (
)
tI pI
dt
1
QI
pI
dQN dQI
dt
dt
26
Switching
saturation
Cut off
27
Cut-Off
VEB VCB
Carrier distribution
Dr. Navneet Gupta
Ebers-Moll model
28
Lecture - 35
Secondary effects
kT 1 dN ( x)
E ( x) q N ( x) dx
29
If N ( x) N (0)e- ax / Wb
kT a
then E ( x)
q Wb
this built-in field will aid the transport of holes across the base
therefore the transit time is reduced
I c QB / t increase increase
30
2 sVBC 1/ 2
l (
)
qN d
Lb : metallurgical width
Dr. Navneet Gupta
31
Breakdown associated:
Punch through
32
I C ( N I E I CO ) M
Avalanche multiplication
1
M
1 (VBC / BVCBO ) n
33
34