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3 authors, including:
Jui-Sheng Chou
Yian Tai
SEE PROFILE
SEE PROFILE
National Taiwan University of Science and Technology, 43 Section 4, Keelung Road, Taipei 106, Taiwan
Contrel Technology Corporation, Taiwan
a r t i c l e in fo
abstract
Article history:
Received 17 March 2009
Accepted 14 July 2010
Available online 23 July 2010
Accurately and timely estimating product costs is extremely benecial to corporate survival. This study
assesses the reliability of multiple regression analysis (MRA), articial neural networks (ANNs), casebased reasoning (CBR), and hybrid intelligence (Hi) to forecast costs of thin-lm transistor liquid-crystal
display (TFT-LCD) equipment. Newly completed equipment-development projects are provided by
departments in a Taiwanese high-tech company, which is a top global producer of TFT-LCD equipment.
The cross-fold validation method is applied to measure model performance, reliability, and prediction
ease. Through comparison of various performance indices, the Hi method outperforms MRA, ANNs and
CBR when used for cost prediction during conceptual stages. Although it is well developed in academia,
articial intelligence (AI) is rarely applied in practical project management. This study successfully
describes an actionable knowledge-discovery process using a real-world data mining approach for the
high-tech equipment manufacturing industry. Project managers (PMs) can benet from applying the Hi
approach to establish latent non-linear cost estimation relationships. The Hi approach is empirically
proven an effective prediction technique for PMs considering overall evaluation criteria when
determining the best selling prices of TFT-LCD manufacturing equipment to clients.
& 2010 Elsevier B.V. All rights reserved.
Keywords:
TFT-LCD industry
Manufacturing
Project management
Forecasting
Articial intelligence
1. Introduction
The rst impression of a display device is based on its design,
quality and presentation in an advertisement. The span of devices
ranges from simple displays in watches to complex technologies
in computers. More than 500 million displays for televisions and
computers were produced in 2008. Roughly 90% of these displays
were cathode ray tubes (CRTs) in 1999. However, more than 60%
of displays are now at panels (e.g., liquid crystal displays (LCDs),
plasma screens). The global market for panels, which was worth
over US $70 billion in 2006, is predicted to reach US $92 billion in
2011 (ITIS, 2008). Therefore, thin-lm transistor-LCDs (TFT-LCDs)
now play a leading role in various at-panel display devices
(Menozzi et al., 2001), as TFT-LCDs have excellent features such as
low proles, low operating voltage, low power consumption, fullcolor capabilities, large visible area, and high-quality resolution.
Prices of TFT-LCDs are strongly inuenced by the high degree
of uncertainty in research and development (R&D). In practice, a
at panels functions and specications cannot be completely
determined during the early R&D stages; thus, initial cost
estimation (ICE) is generally based on the subjective judgment
of experienced engineers. This ICE is only a quoted price for
Corresponding author. Tel.: +886 2 2737 6321; fax: + 886 2 2737 6606.
E-mail address: jschou@mail.ntust.edu.tw (J.-S. Chou).
0925-5273/$ - see front matter & 2010 Elsevier B.V. All rights reserved.
doi:10.1016/j.ijpe.2010.07.031
Table 1
Cost estimation techniques at various product development phases.
Estimating techniques
Planning phase
Detailed design
Contracting
& mass production
341
1. Routine visits
2. Observe the dynamic global
market
3. Acquire conceptual product
attributes
Marketing department
Seek & identify for potential
customers & market places
Lose order
Offer accepted
After-sale
service
Procurement/legal affairs/design/
production departments
Make to order by conducting
detailed design
Product delivery
Project close-out
Array Process
In
Process
Cell Process
Inspection
TFT Array
Mount
LC fill
Seal
Panel
assembly
Module
assembly
Final
Inspection
CF Array
In
Process
Inspection
343
N
X
bi xi ep
i1
Input layer
Hidden layer
Output layer
x1
x2
Y
xp
Input
layer
Summation
layer
Output
layer
y1
x1
y2
N
x2
xp
Y
D
yn
Fig. 4. MLFN and GRNN topology: (a) MLFN and (b) GRNN.
Problem
statement
Historical
case input
Case
indexing
Case
saving
Case
retrieval
Similarity
measure
Case base
Case
mapping
Case
adaptation
Determination
of
attribute weights
Case
testing
Fig. 5. CBR owchart.
min9fjI 9,9fijR 9
max9fjI 9,9fijR 9
345
industry report indicates there will be 1.2 billion LCD TVs in 2015
(PIDA, 2008). The study company fabricates more than 15 types of
manufacturing equipment for TFT-LCD production. The laser
repair (Repair), light-on-text (LOT), and macro inspection systems
(Macro) account for 48% of total revenue over the last three years.
Since obtaining a complete collection of data for all previous
projects is unlikely due to the lack of centralized project
management information system (PMIS), the primary goal is to
generalize prediction capability of AI techniques using available
project data. Based on the principle of priority management, these
three systems were treated as the target samples and were
thereafter utilized in prediction model development.
Pn
i 1 Yi,predicted Y predicted Yi,observed Y observed
Ru 1R 1 q
Pn
2 Pn
2
i 1 Yi,predicted Y predicted
i 1 Yi,observed Y observed
6
where n is the number of validation data, Yi is the equipment
development cost and the bar denotes the variable mean.
As the prediction model is trained and tested k times, the
overall performance through cross-validation can be denoted as
Table 2
List of model variables and their Descriptive statistics.
Input variables
Output variable
Parameter
Min
Max
Mean
MRA
ANNs
CBR
Geometrical features
1. Length of fabrication equipment (mm)
2. Width of fabrication equipment (mm)
3. Height of fabrication equipment (mm)
4. Weight of fabrication equipment (ton)
5. Length of glass substrate (mm)
6. Width of glass substrate (mm)
1650
1000
1475
0.3
538
316
5100
4200
29071
15
2500
2200
3233.1
2220.7
2979.0
3.7
1266.6
953.8
V1
V2
V3
V4
V5
V6
X1
X2
X3
X4
X5
X6
Numerical
Numerical
Numerical
Numerical
Numerical
Numerical
Production characteristics
7. Equipment development type
8. Manufacturing process
9. Customer
10. Order type
11. No. of patent
Dummy
Dummy
Dummy
Dummy
V18
X7
X8
X9
X10
X11
String
String
String
String
Numerical
Operations planning
12. No. of orders (NOOs)
13. Down payment
14. Payment conditions
1
26
4.6
(60%, 70%, 80%)
(1-month check, 2-month check)
V19
Dummy (D20)
Dummy (D21)
X12
X13
X14
Numerical
String
String
198
YMRA
YANNs
YCBR
1700
691.7
(D7, D8)
(D9, D10, D11)
(D12, D13, D14, D15, D16)
(D17)
k
X
1
M
ki1 i
347
Table 3
Cross-fold modeling performance with three evaluation measures.
Technique Method
MRA
ANNs
CBR
Hi
19
SMRA
MLFN9
GRNN4
CBREW8
CBREWA2
SMRA-GRNN6
GRNN-CBR3
CBREWA-GRNN-CBR5
GRNN-CBRA1
MAER (%)
sMAER (%)
RMSE (104TWD)
sRMSE (104TWD)
R0
sRu
MNS
21.78
30.88
13.74
18.89
10.56
14.29
12.87
11.66
8.83
5.33
9.35
3.20
8.75
4.10
3.61
6.19
4.97
5.07
165.25
212.48
132.00
174.68
139.64
148.55
126.02
135.87
101.99
63.37
63.90
43.98
56.58
79.15
60.00
64.15
79.34
51.48
0.10
0.15
0.07
0.13
0.06
0.09
0.07
0.09
0.05
0.07
0.07
0.05
0.10
0.04
0.07
0.07
0.11
0.05
0.55
1.00
0.23
0.64
0.17
0.36
0.20
0.28
0.00
250.00
RMSE
MAER
(1-R)
200.00
150.00
100.00
0.40
0.30
0.20
0.10
0.00
MR
ML
MRA
FN
NN
GR
RE
R
R
RA
NN
-CB
-CB
CB
GR
NN
NNN
AA
N
A
R
A
M
WA
RE
CB
WA
CB
CB
RE
CBR
ANNs
Hi
Modeling Technique
Fig. 6. Cross-fold performance measures for various modeling techniques.
60
GRNN-CBRA
CBREWA
Conventional Approach
50
40
Estimating Method
MAER
GRNN-CBRA
10.4%
CBREWA
13.3%
30
20
10
5
6
Test Case
10
Fig. 7. Prediction error of articial intelligence models versus the conventional approach.
time. In this study, most time was spent identifying the optimal
ANN topologies and training to improve the error rate. Nevertheless, an improved ANN technique, namely, GRNN integrated
with CBR to calculate the similarity measure ts data better than
traditional ANNs alone in terms of trade-offs such as time spent,
learning curve and explanatory power. Case-based reasoning
alone and hybrid ANN-CBR models are applicable and superior
AI-based techniques for estimating cost of developing TFT-LCD
equipment. In particular, the accuracy of the proposed hybrid
AI-based technique was up to 35.4% better than that to the
Acknowledgements
The authors would like to thank the National Science Council
of the Republic of China, Taiwan, for nancially supporting this
research. Gratitude is also expanded to the study company whose
generosity in data and experience sharing makes the study
possible.
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