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CHAPTER 4
BASICS OF ACOUSTIC EMISSION TECHNIQUE AND
ULTRASONIC TECHNIQUE
4.1
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operation.
AE Process Chain
As shown in Figure 4.2, mechanical stress has to be produced within
the test object, which is usually done by applying external forces. The
behavior of the material and the starting point of the release of elastic energy,
e.g. by crack formation, are influenced by the material properties and the
environmental conditions. The elastic wave propagating through the material
is detected and converted into the electrical AE signal by the AE sensors. The
AE system processes the AE signal, converts the detected bursts into data
sets, determines the source locations, calculates statistics, and displays them
graphically, and numerically in real time (Vallen 2002).
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External load
(Pressure, force)
Material properties
Mechanical stress
Material
behaviour
Stimulation of AE
source (e.g. crack
formation by release of
elastic energy)
Environmental
conditions
(Temperature, Noise)
Sensor
Propagation of Wave
Detection of AE Signal
AE System
AE Channel
Personal
Computer
Parametric
channel
Evaluation report
compressed under external forces and spring back when released. The higher
the force and, thus, the elastic deformation, the higher is the elastic energy. If
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very close to one another and sometimes even overlapping, in which case it is
termed as continuous emission as the individual bursts are not identifiable.
Thus we can broadly divide AE signals into Burst type and Continuous type.
The AE Hit waveform is shown in Figure 4.3.
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Amplitude (AE):
The largest voltage peak in the AE signal waveform is customarily
expressed in decibels relative to 1 microvolt at the preamplifier input (dbae).
Amplitude Distribution:
A display of the number of AE signals at (or greater than) a
particular amplitude, plotted as a function of amplitude.
Attenuation:
Loss of amplitude with distance as the wave travels through the test
structure.
Burst emission:
It is a qualitative description of the discrete signal related to an individual
emission event.
Channel (AE):
A single AE sensor and the related equipment components for
transmitting, conditioning, detecting and measuring the signals.
Continuous emission:
It is a qualitative description of the sustained signal level
produced by rapidly occurring acoustic emission events.
Counts:
The number of times the AE signal crosses the detection threshold is
also known as ring down counts or threshold crossing counts.
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dbae:
A unit of measurement for AE signal amplitude A, defined by A
(dbae) = 20 log Vp where Vp is the peak signal voltage in micro volts referred
to the preamplifier input.
Detection (AE):
It is the recognition of the presence of signal (accomplished by
signal crossing the threshold).
Event (AE):
It is a local material change giving rise to acoustic emission.
Event Data Set (AE):
The set of numbers used to describe an event, pursuant to data
processing that recognizes that a single event can produce more than one hit.
Event Description:
A
one
or
digital
more
(numerical) description
signal
descriptions
of
an
event, comprising
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Frequency:
Frequency of an oscillating signal or process is the number of cycles
occurring in unit time.
Guard Sensors:
Guard Sensors are sensors whose primary function is the
elimination of extraneous noise based on arrival time differences.
Hit (AE):
The detection and measurement of an AE signal on a channel.
Hit Data Set:
The set of numbers representing signal features and other
information.
Intensity (AE):
A measure of the size of the emission signals detected, such as the
average amplitude, average AE energy or average counts.
Kaiser Effect:
The absence of detectable acoustic emission is at a fixed sensitivity
level, until previously applied stress levels are exceeded.
kHz Kilohertz:
An SI unit of frequency, 1000 cycles per second
Location:
Relating to the use of multiple AE Sensors for determining relative
positions of AE sources
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Noise:
Non relevant indications; signals produced by causes other than
AE, or by AE sources that are not relevant to the purpose of the test.
Non-Destructive Testing (NDT):
The development and application of technical methods to examine
components in ways that do not impair future usefulness and serviceability in
order to detect, locate, measure and evaluate flaws; to assess integrity,
properties and composition; and to measure geometrical characteristics.
Parametric Inputs:
Environmental variables (e.g. load, pressure, temperature) that can
be measured and stored as part of the AE signal description.
Rise time:
The time from an AE signal first threshold crossing to its peak.
Duration:
The elapsed time is between the first thresholds crossing to the last.
Sensor (AE):
It is a device that contains a transducing element that turns AE wave
motion into an electrical voltage.
Signal (AE):
The electrical signal that comes from the transducing element and
passing through the subsequent signal conditioning equipment (amplifiers,
frequency filters).
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Signal Description:
The result of the hit process: a digital (numerical) description of an
AE signal and/or its environmental context.
Signal Features:
Measurable characteristics of the AE signal, such as amplitude, AE
energy, duration, counts, rise time, that can be stored as part of the AE signal
description.
Signal Strength (AE):
It is the strength of the absolute value of a detected AE signal and
also known as Relative energy", MARSE" or "Signal strength".
Source (AE):
The physical origin of one or more AE events, which occurs by
stimulating an element (Mistras 2005).
4.1.4
Applications
Acoustic emission is a very versatile, non-invasive way to gather
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which beams of high frequency sound waves are introduced into materials for
detection of surface and subsurface flaws in the materials. The sound waves
travels through the material with some attendant loss of energy (attenuation)
and are reflected at interfaces. The reflected beam is analysed to define the
presence and location of flaws and discontinuities. The degree of reflection
depends largely on the physical state of materials forming the interface and to
a lesser extent on the specific physical properties of the material.
Cracks, laminations, shrinkage cavities, bursts, flakes, pores,
disbonds and other discontinuities that produce reflective interfaces can be
easily detected. Inclusions and other inhomogeneties can also be detected by
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2.
3.
4.
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4.2.1
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method and the pulse echo method. The primary difference between these two
methods is that the transmission method involves only the measurement of
signal attenuation while the pulse echo method can be used to measure both
transit time and signal attenuation.
The pulse echo method which is most widely used ultrasonic
method involves the detection of echoes produced when an ultrasonic pulse is
reflected from a discontinuity or an interface of test piece. This method is
used in flaw location and thickness measurements. Flaw depth is determined
from the time of flight between the initial pulse and echo produced by the
flaw. Flaw depth may also be determined from the relative time of flight
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between the echo produced by the flaw and the echo from the back surface as
shown in the Figure 4.5.
Data Presentation
Ultrasonic data can be collected and displayed in a number of
different formats. The three most common formats are known in the NDT
world as A-scan, B-scan and C-scan presentations. Each presentation mode
provides a different way of looking at and evaluating the region of material
being inspected. Modern computerised ultrasonic scanning systems can
display data in all three presentation forms simultaneously.
A-scan Presentation:
The A-scan presentation displays the amount of received ultrasonic
energy as a function of time. The relative amount of received energy is plotted
along the vertical axis and the elapsed time (which may be related to the
sound energy travel time within the material) is displayed along the horizontal
axis. Most instruments with an A-scan display allow the signal to be
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the IP signal corresponds to the front surface of the material, this indicates
that flaw B is about halfway between the front and back surfaces of the
sample. When the transducer is moved over flaw C, signal C will appear
earlier in time since the sound travel path is shorter and signal B will
disappear since sound will no longer be reflecting from it.
B-scan Presentation:
The B-scan presentation is a profile (cross-sectional) view of the test
specimen. In the B-scan, the time-of-flight (travel time) of the sound energy is
displayed along the vertical axis and the linear position of the transducer is
displayed along the horizontal axis. From the B-scan, the depth of the
reflector and its approximate linear dimensions in the scan direction can be
determined. The B-scan is typically produced by establishing a trigger gate on
the A-scan. Whenever the signal intensity is great enough to trigger the gate, a
point is produced on the B-scan. The gate is triggered by the sound reflecting
from the backwall of the specimen and by smaller reflectors within the
material.
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