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Understanding structured
surfaces
The large field of view and high resolution
of the CCI MP enable the understanding
of complex structured surfaces.
2
CCI MP offers a wide range of advanced analysis tools
Air
Top surface
Film
Bottom
Substrate surface
High lateral resolution over large areas is perfect Using a white light source it is possible to measure
for 3D texture direction analysis. A combination film thickness of multilayer thick films. The unbeatable
of fine detail and advanced analysis offers critical sensitivity of the CCI algorithm gives unrivalled
assessment of advanced engineered surfaces. thickness and interface data.
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Serving a global market Taylor Hobson UK
(Global Headquarters) DiskArt 1988
www.taylor-hobson.com