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TestVersusSecurityPastandPresent2014 Phone
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radiation, fault response, and so on. One such important sidechannel is the Re: Test Versus Security Past and Present 2014
designfortestability(DfT)infrastructurepresentforeffectiveandtimelytestingof
VLSI circuits. The attacker can extract secret information stored on the chip by Message
scanningouttestresponsesagainstsomechosenplaintextinputs.Thepurpose
ofthispaperistofirstpresentadetailedsurveyonthestateoftheartinscanbasedsidechannelattacksonsymmetricandpublickey
cryptographichardwareimplementations,bothintheabsenceandpresenceofadvancedDfTstructures,suchastestcompressionand
Xmasking, which may make the attack difficult. Then, the existing scan attack countermeasures are evaluated for determining their
security against known scan attacks. In addition, JTAG vulnerability and security countermeasures are also analyzed as part of the
external test interface. A comparative areatimingsecurity analysis of existing countermeasures at various abstraction levels is
presentedinordertohelpanembeddedsecuritydesignermakeaninformedchoiceforhisintendedapplication.
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