Sunteți pe pagina 1din 7

Advanced Power MOSFET SFP9620

FEATURES
BVDSS = -200 V
Avalanche Rugged Technology
Rugged Gate Oxide Technology
RDS(on) = 1.5
Lower Input Capacitance ID = -3.5 A
Improved Gate Charge
Extended Safe Operating Area
Lower Leakage Current : -10 A (Max.) @ VDS = -200V
TO-220
Low RDS(ON) : 1.111 (Typ.)
1
2
3

1.Gate 2. Drain 3. Source

Absolute Maximum Ratings


Symbol Characteristic Value Units
VDSS Drain-to-Source Voltage -200 V
o
Continuous Drain Current (TC=25 C) -3.5
ID o A
Continuous Drain Current (TC=100 C) -2.2
IDM Drain Current-Pulsed O
1 -14 A
VGS Gate-to-Source Voltage +
_ 30 V
EAS Single Pulsed Avalanche Energy O
2 327 mJ
IAR Avalanche Current O1 -3.5 A
EAR Repetitive Avalanche Energy O1 3.8 mJ
dv/dt Peak Diode Recovery dv/dt O3 -5.0 V/ns
o
Total Power Dissipation (TC=25 C) 38 W
PD o
Linear Derating Factor 0.3 W/ C
Operating Junction and
TJ , TSTG - 55 to +150
Storage Temperature Range
o
Maximum Lead Temp. for Soldering C
TL 300
Purposes, 1/8 from case for 5-seconds

Thermal Resistance
Symbol Characteristic Typ. Max. Units
RJC Junction-to-Case -- 3.29
RCS o
Case-to-Sink 0.5 -- C/W
RJA Junction-to-Ambient -- 62.5

Rev. B

1999 Fairchild Semiconductor Corporation


P-CHANNEL
SFP9620 POWER MOSFET

Electrical Characteristics (TC=25oC unless otherwise specified)


Symbol Characteristic Min. Typ. Max. Units Test Condition
BVDSS Drain-Source Breakdown Voltage -200 -- -- V VGS=0V,ID=-250A
BV/TJ Breakdown Voltage Temp. Coeff. -- -0.18 --
o
V/ C ID=-250A See Fig 7
VGS(th) Gate Threshold Voltage -2.0 -- -4.0 V VDS=-5V,ID=-250A
Gate-Source Leakage , Forward -- -- -100 VGS=-30V
IGSS nA
Gate-Source Leakage , Reverse -- -- 100 VGS=30V
-- -- -10 VDS=-200V
IDSS Drain-to-Source Leakage Current A o
-- -- -100 VDS=-160V,TC=125 C
Static Drain-Source
RDS(on) -- -- 1.5 VGS=-10V,ID=-1.8A O
4
On-State Resistance
gfs Forward Transconductance -- 2.3 -- VDS=-40V,ID=-1.8A O
4

Ciss Input Capacitance -- 415 540


VGS=0V,VDS=-25V,f =1MHz
Coss Output Capacitance -- 70 105 pF
See Fig 5
Crss Reverse Transfer Capacitance -- 26 40
td(on) Turn-On Delay Time -- 12 35
VDD=-100V,ID=-3.5A,
tr Rise Time -- 22 55
ns RG=18
td(off) Turn-Off Delay Time -- 33 75
See Fig 13 4 O
tf Fall Time -- 15 40 O 5

Qg Total Gate Charge -- 15 19 VDS=-160V,VGS=-10V,


Qgs Gate-Source Charge -- 3.3 -- nC ID=-3.5A
Qgd Gate-Drain( Miller ) Charge -- 7.5 -- See Fig 6 & Fig 12 4 O
O 5

Source-Drain Diode Ratings and Characteristics


Symbol Characteristic Min. Typ. Max. Units Test Condition
IS Continuous Source Current -- -- -3.5 Integral reverse pn-diode
A
ISM Pulsed-Source Current O
1 -- -- -14 in the MOSFET
o
VSD Diode Forward Voltage O4 -- -- -5.0 V TJ=25 C,IS=-3.5A,VGS=0V
o
trr Reverse Recovery Time -- 125 -- ns TJ=25 C,IF=-3.5A
Qrr Reverse Recovery Charge -- 0.59 -- C diF/dt=100A/s O
4

Notes ;
O Repetitive Rating : Pulse Width Limited by Maximum Junction
1
o
Temperature
O2 L=40mH, I =-3.5A, V =-50V, R =27*, Starting T =25 C
AS DD G J

O3 ISD <_ -3.5A, di/dt _< 300A/s, VDD_<BVDSS , Starting T J =25oC


O4 Pulse Test : Pulse Width = 250 s, Duty Cycle < _ 2%
O5 Essentially Independent of Operating Temperature
P-CHANNEL
POWER MOSFET SFP9620
Fig 1. Output Characteristics Fig 2. Transfer Characteristics

101 V GS
101
Top : - 15 V
[A]

[A]
- 10 V
- 8.0 V
- 7.0 V
-ID , Drain Current

-ID , Drain Current


- 6.0 V
- 5.5 V
- 5.0 V
Bottom : - 4.5 V
100
100 150 oC

25 oC @ Notes :
1. VGS = 0 V
@ Notes : 2. VDS = -40 V
10-1 1. 250 s Pulse Test 3. 250 s Pulse Test
- 55 oC
2. TC = 25 oC
10-1
10-1 100 101 2 4 6 8 10
-VDS , Drain-Source Voltage [V] -VGS , Gate-Source Voltage [V]
[A]

Fig 3. On-Resistance vs. Drain Current Fig 4. Source-Drain Diode Forward Voltage
Drain-Source On-Resistance

5
-IDR , Reverse Drain Current

101

4
RDS(on) , [ ]

3
VGS = -10 V

100
2
150 oC

@ Notes :
1 25 oC 1. VGS = 0 V
VGS = -20 V 2. 250 s Pulse Test
@ Note : TJ = 25 oC

0 10-1
0 2 4 6 8 10 12 14 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
-ID , Drain Current [A] -VSD , Source-Drain Voltage [V]

Fig 5. Capacitance vs. Drain-Source Voltage Fig 6. Gate Charge vs. Gate-Source Voltage
800
[V]

Ciss= Cgs+ Cgd ( Cds= shorted )


Coss= Cds+ Cgd VDS = -40 V
10
[pF]

-VGS , Gate-Source Voltage

Crss= Cgd VDS = -100 V


600 VDS = -160 V
C iss
Capacitance

400
C oss
5
@ Notes :
1. VGS = 0 V
200 C rss
2. f = 1 MHz

@ Notes : ID =-3.5 A

0 0
100 101 0 3 6 9 12 15
-VDS , Drain-Source Voltage [V] QG , Total Gate Charge [nC]
P-CHANNEL
SFP9620 POWER MOSFET

Fig 7. Breakdown Voltage vs. Temperature Fig 8. On-Resistance vs. Temperature


Drain-Source Breakdown Voltage

1.2 3.0

Drain-Source On-Resistance
-BVDSS , (Normalized)

RDS(on) , (Normalized)
2.5
1.1
2.0

1.0 1.5

1.0
0.9 @ Notes :
@ Notes :
1. VGS = 0 V 0.5 1. VGS = -10 V
2. ID = -250 A 2. ID = -1.8 A

0.8 0.0
-75 -50 -25 0 25 50 75 100 125 150 175 -75 -50 -25 0 25 50 75 100 125 150 175
o
TJ , Junction Temperature [ C] TJ , Junction Temperature [oC]

Fig 9. Max. Safe Operating Area Fig 10. Max. Drain Current vs. Case Temperature
[A]

4
[A]

Operation in This Area


-ID , Drain Current

is Limited by R DS(on)
-ID , Drain Current

101 3
0.1 ms

1 ms

10 ms 2
100 DC
@ Notes :
1. TC = 25 oC
2. TJ = 150 oC 1
3. Single Pulse
10-1

0
100 101 102 25 50 75 100 125 150
-VDS , Drain-Source Voltage [V] Tc , Case Temperature [oC]

Fig 11. Thermal Response


Thermal Response

D=0.5

10 0 @ Notes :
0.2 1. Z J C (t)=3.29 o C/W Max.
2. Duty Factor, D=t1 /t 2
0.1 3. TJ M -T C =P D M *Z J C (t)
P.DM
0.05
(t) ,

0.02 t1.
10- 1
0.01 t2.
JC

single pulse
Z

10- 5 10- 4 10 - 3 10 - 2 10 - 1 100 10 1


t 1 , Square Wave Pulse Duration [sec]
P-CHANNEL
POWER MOSFET SFP9620
Fig 12. Gate Charge Test Circuit & Waveform

Current Regulator
VGS
Same Type
50K as DUT Qg
12V 200nF
300nF -10V

VDS
VGS Qgs Qgd

DUT

-3mA
R1 R2

Current Sampling (IG) Current Sampling (ID)


Charge
Resistor Resistor

Fig 13. Resistive Switching Test Circuit & Waveforms

RL
t on t off
Vout tf
td(on) tr td(off)
Vin VDD
( 0.5 rated VDS ) Vin
10%
RG
DUT

-10V
90%
Vout

Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms


BVDSS
LL 1
EAS = ---- LL IAS2 --------------------
VDS 2 BVDSS -- VDD
Vary tp to obtain ID tp Time
required peak ID
VDD VDS (t)
RG C VDD ID (t)
DUT
-10V IAS
tp BVDSS
P-CHANNEL
SFP9620 POWER MOSFET

Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms

VDS
DUT
--

IS
L

Driver
VGS
Compliment of DUT
RG
(N-Channel) VDD

VGS dv/dt controlled by RG


IS controlled by Duty Factor D

Gate Pulse Width


VGS D = --------------------------
Gate Pulse Period 10V
( Driver )

Body Diode Reverse Current


IRM
IS
( DUT )
di/dt

IFM , Body Diode Forward Current

Vf
VDS
( DUT )
Body Diode VDD
Forward Voltage Drop

Body Diode Recovery dv/dt


TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.

ACEx ISOPLANAR UHC


CoolFET MICROWIRE VCX
CROSSVOLT POP
E2CMOSTM PowerTrench
FACT QS
FACT Quiet Series Quiet Series
FAST SuperSOT-3
FASTr SuperSOT-6
GTO SuperSOT-8
HiSeC TinyLogic

DISCLAIMER

FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER


NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.

LIFE SUPPORT POLICY

FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or 2. A critical component is any component of a life
systems which, (a) are intended for surgical implant into support device or system whose failure to perform can
the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life
failure to perform when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can be effectiveness.
reasonably expected to result in significant injury to the
user.

PRODUCT STATUS DEFINITIONS

Definition of Terms

Datasheet Identification Product Status Definition

Advance Information Formative or This datasheet contains the design specifications for
In Design product development. Specifications may change in
any manner without notice.

Preliminary First Production This datasheet contains preliminary data, and


supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.

No Identification Needed Full Production This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.

Obsolete Not In Production This datasheet contains specifications on a product


that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.

S-ar putea să vă placă și