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North-Holland, Amsterdam
Y. S H I G E S A T O , A. M U R A Y A M A , T. K A M I M O R I a n d K. M A T S U H I R O
R&D Division, Asahi Glass Co. Ltd., Hazawa-cho, Kanagawa-ku, Yokohama 221, Japan
The crystallinity of the frame work structure of evaporated amorphous tungsten oxide films
was investigated using Raman spectroscopy. It was found from the deconvolution analysis of two
W-O stretching modes that the full width at half maximum (FWHM) of the peak at 807 cm-1
was sensitive to the degree of crystallinity of a - W O 3. The FWHM of the 807 cm- ~ peak decreased
by 35% as the substrate temperature was raised from 40 to 145 o C. This change seems to be
caused by the growth of clusters constituting the FWS. A characteristic splitting of the absorption
peak of the O-H stretching mode was observed using FTIR spectroscopy for films deposited at
substrate temperatures higher than 145 C and annealed subsequently at 150 C for 1 h. This was
interpreted to be caused by the formation of structurally involved water molecules such as seen in
c r y s t a l l i n e M o O 3. 2H20.
1. Introduction
air. Moreover we measured the density of the film which reflects porosity and
observed how the clusters were dense-packed to form the film. The bonding
state of water in the film was also investigated by applying F T I R spec-
troscopy; the results will be discussed as they relate to the structure.
2. Experimental
Ts = 3 . 7 0 " c _ / ~
%-
c
= Ts=3
Z
Ts=3
LIJ
}--
_z
Z
,< Ts = 290"c./
re Ts=I '
Ts = 40"c / ~ " ~ /
14'''" I I
1200 800 400
RAMAN SHIFT (cm-~)
Fig. 1. Raman spectra of a-WO3 films deposited at different substrate temperatures.
nents. Fig. 2 shows the result. Observed curves were satisfactorily fitted by
assuming appropriate Raman intensities and full widths at half maximum
( F W H M ) values. The effect of the presence of the 960 cm 1 peak from the
W=O stretching mode was also taken into account. Comparing the position of
the two gaussian components constituting the broad W - O stretching peak in
amorphous material with the two W - O stretching peaks of the crystalline
phase, it was found that in amorphous WO 3 only the lower energy peak shifted
towards lower wavenumbers by about 20 cm -1. On the other hand, the
F W H M of the 807 cm 1 component showed a steady decrease by 35% without
changing its position over the ~ range of 40 to 145 C. The F W H M of the 700
cm-1 component did not change up to below the crystallization temperature.
This result is in good agreement with the study of Salije et al. [8,9]. They
reported the change in the RS of c-WO 3 to be caused by a phase transition.
The location of the peak at 807 c m - I was hardly changed by the phase
transition, while the peak at 719 cm -1 splitted into more than two peaks
whose position shifted to lower energies. Therefore, it is reasonable to assume
that in c-WO 3 the 719 cm -a mode is highly sensitive to the changes in crystal
symmetry as well as to lattice distortion. However, this peak may not be
suitable for the evaluation of the FWS of a-WO 3 because this peak is sensitive
only to the structural change from crystalline to amorphous. On the other
Y. Shigesato et aL / Characterization of evaporated amorphous WO3 films 807
I I I
: EXPERIMENTAL
CALCULATED .A.,'~ ~.
Ts=4o.c
-'- ---.-. 2"'"-, "~
:'5.J, i,
,- ,
~ II /
Z
ud
Z
_ Ts=145"c ~'~
< [", / \A
" y
/\
/\
s I
~s s \
Fig. 2. Deconvohition analysis of the R a m a n spectra of a-WO 3 films. Solid lines show calculated
curves which were obtained by the synthesis of three gaussian components. Triangles show the
observed spectra.
hand, the 807 c m - 1 peak was found to be sensitive in the sense that the shape
becomes narrower when some improvement in crystallinity occurs.
The 35% decrease of the F W H M of the 807 cm -1 peak reflects a consider-
able improvement in the structural order in terms of bond length and angle of
the W - O - W bonding. This change can be attributed to the growth of clusters.
It is necessary to find some reference value which is independent of changes
inside the bulk in order for this to be conclusive. Gabrusenoks et al. have
pointed out that the W = O mode at 960 cm-1 arises from W = O bonds at the
surface of clusters [7]. Actually, the F W H M of the 960 c m - 1 peak did not
show any dependence on T, or on annealing. This seems to confirm their
consideration. A higher crystallinity of the film corresponds to a smaller
integrated intensity ratio of the two stretching modes W = O / W - O .
The changes in the F W H M with T~ and Ta, are shown in fig. 3 for the three
deconvoluted gaussian components. As for the dependence on T,, the F W H M
showed no change up to 1 5 0 C and a decrease of roughly 10% at 300C.
Thus, subsequent annealing up to 150 C gave no appreciable change in the
F W H M , irrespective of T,. The change is small even upon annealing at
300 C. The RS of a sample annealed at 350 o C, the crystallization tempera-
ture of a-WO3, is shown in fig. 4. This spectrum can be understood as a
808 Y. Shigesato et al. / Characterization of evaporated amorphous I4/03 films
I I I I
1
- A'%, 700cm- ,IL--A
200
E w-o ~ .... , ',
v .m--ram I ,,
100 W=O 960cm-1 ~
G_
L9 as,flq., \0
Z
tO 0
0 1 00 200 300 400
Ts;SUBSTRATE TEMPERATURE(c)
~0
0
200 ._,VV-0 , , A ~ ~ .~--" -A (AMORPHOUS
7
/ H*SE
O
100 W=0 960cm" ~,,
Ts 40'(: x~-- CRYSTALLINE
PHASE
0 I ] I I
n-
0 100 200 300 400
Ta ;ANNEALING TEMPERATURE (C)
Fig. 3. Change ot full width at half m a x i m u m (FWHM) of the gaussian components having peaks
at 700, 807 and 960 cm i as a function of T~ and Ta.
I I I I I
~" Ta=350. c
D ]~ L I N E PHASE
Z
ILl
_z
7
<
<
r~ AMORPHOUSPHASE
I I I I I
1000 800 600 400 200
RAMAN SHIFT (cm "1)
Fig. 4. Raman spectrum of the a-WO 3 films post-annealed at 350 C . Both crystalline and
amorphous phase can be observed.
Y. Shigesato et al. / Characterization of evaporated amorphous WO3 films 809
I i I I I I I I
Ts = 1415'c as depo Ts=290"c as depo
J
I I I
annealed at 150C annealed at 150"C annealed at 150"C
r i i
4000 3500 3000 2500 4000 3500 3000 2500 4000 3 5I0 0 3 0I0 0 25'00
WAVENUMBER (cm"~)
Fig. 5. FTIR spectra, before and after annealing at 150 C for 1 h, of a-WOa films deposited at
different Ts.
810 1I. Shigesato et al. / Characterization of evaporated amorphous WO3 films
4. Conclusion
Acknowledgments
The authors are grateful to Dr. M. Mizuhashi for making valuable sugges-
tions and for a critical reading of the manuscript. They also thank Professor J.
Nakahara, Professor Y. Oka and Professor K. Tanaka for their helpful
discussions and encouragement, and Mr. A. Masui for the measurement of
F T I R spectra.
Y. Shigesato et al. / Characterization of evaporated amorphous WO3 films 811
References