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TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS III)
TPC8014
Lithium Ion Battery Applications
Unit: mm
Portable Equipment Applications
Notebook PC Applications
Note: For (Note 1), (Note 2), (Note 3) and (Note 4), please refer to the
next page.
1 2 3 4
This transistor is an electrostatic sensitive device. Please handle with
caution.
1 2003-02-20
TPC8014
Thermal Characteristics
Marking (Note 5)
TPC8014 TYPE
Lot No.
Note 1: Please use devices on condition that the channel temperature is below 150C.
Note 2: (a) Device mounted on a glass-epoxy board (a) (b) Device mounted on a glass-epoxy board (b)
FR-4 FR-4
25.4 25.4 0.8 25.4 25.4 0.8
(unit: mm) (unit: mm)
(a) (b)
Week of manufacture
(01 for first week of year, continues up to 52 or 53)
Year of manufacture
(One low-order digits of calendar year)
2 2003-02-20
TPC8014
Electrical Characteristics (Ta = 25C)
Rise time tr 9
ID = 5.5 A
VGS 10 V VOUT
Turn-ON time ton 0V 19
RL = 2.7 W
Switching time 4.7 W ns
Fall time tf 20
VDD ~
- 15 V
Turn-OFF time toff < 69
Duty = 1%, tw = 10 ms
Total gate charge
Qg 39
(gate-source plus gate-drain)
VDD ~
- 24 V, VGS = 10 V, ID = 11 A nC
Gate-source charge 1 Qgs1 4
Gate-drain (miller) charge Qgd 9
3 2003-02-20
TPC8014
ID VDS ID VDS
20 10
3.4 3.3 10 3.2
3.1
8
3.5 6
16 4 3.2 8 4 3.3
6 3.0
(A)
(A)
8 3.
10 3.1 3.4
ID
ID
12 6
2.9
Drain current
Drain current
3.0
8 4
2.9
2.8
2.8
4 2 2.7
2.7
2.6
16 0.8
(A)
VDS
ID
12 0.6
Drain-source voltage
Drain current
100
8 0.4
Ta = -55C
25 2.5
4 0.2 5.5
ID = 11A
0 0
0 0.5 1 1.5 2 2.5 3 2.5 4 0 4 8 12 16 20
Ta = 25C
Pulse test
Yfs
Drain-source ON resistance
30
-55C Tc = 100C
RDS (ON) (mW)
VGE = 4.5 V
Forward transfer admittance
10 VGS = 10 V
25C
3
Common source
VDS = 10 V
Pulse test
1
0.1 1 10 100 1 3 10 30 100
4 2003-02-20
TPC8014
5
ID = 11, 5.5, 2.5 A
(A)
20 10
Drain-source ON resistance
15 VGS = 4.5 V
10
5
Common source Common source
Ta = 25C
Pulse test
Pulse test
0 0.1
-80 -40 0 40 80 120 160 0 0.2 0.4 0.6 0.8 1 1.2
2.5
Ciss
(pF)
1000 2
Capacitance C
1.5
Coss
Crss
100 1
Common source
Common source VDS = 10 V
0.5
VGS = 10 V ID = 1 mA
ID = 1 mA
Pulse test Pulse test
10 0
0.1 1 10 100 -80 -40 0 40 80 120
25 25
(V)
(V)
VDS
VGS
1.2 VDS
Drain-source voltage
Gate-source voltage
(2)
15 15
12 6
0.8
12
10 10
6
0.4 VDD = 24 V
5 5
0 0 0
0 50 100 150 200 0 10 20 30 40 50 60
5 2003-02-20
TPC8014
rth - tw
1000
(1) Device mounted on a glass-epoxy board (a)
(Note 2a)
Normalized transient thermal impedance (2)
(2) Device mounted on a glass-epoxy board (b)
(Note 2b)
t = 10 s
100
(1)
rth (C/W)
10
Single pulse
0.1
0.001 0.01 0.1 1 10 100 1000
1 ms*
ID max (pluse) *
10
(A)
10 ms*
ID
Drain current
0.1
* Single pulse
Ta = 25C
Curves must be derated
linearly with increase in VDSS max
temperature.
0.01
0.01 0.1 1 10 100
6 2003-02-20
TPC8014
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the Handling Guide for Semiconductor Devices, or TOSHIBA Semiconductor Reliability
Handbook etc..
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (Unintended Usage). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customers own risk.
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
7 2003-02-20
This datasheet has been download from:
www.datasheetcatalog.com