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2SD669, 2SD669A

Silicon NPN Epitaxial

Application

Low frequency power amplifier complementary pair with 2SB649/A


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Outline

TO-126 MOD

1. Emitter
2. Collector
3. Base
1
2
3
2SD669, 2SD669A

Absolute Maximum Ratings (Ta = 25C)


Ratings
Item Symbol 2SD669 2SD669A Unit
Collector to base voltage VCBO 180 180 V
Collector to emitter voltage VCEO 120 160 V
Emitter to base voltage VEBO 5 5 V
Collector current IC 1.5 1.5 A
Collector peak current I C(peak) 3 3 A
Collector power dissipation PC 1 1 W
1
PC * 20 20 W
Junction temperature
www.DataSheet4U.com Tj 150 150 C
Storage temperature Tstg 55 to +150 55 to +150 C
Note: 1. Value at TC = 25C.

2
2SD669, 2SD669A

Electrical Characteristics (Ta = 25C)


2SD669 2SD669A
Item Symbol Min Typ Max Min Typ Max Unit Test conditions
Collector to base V(BR)CBO 180 180 V I C = 1 mA, IE = 0
breakdown voltage
Collector to emitter V(BR)CEO 120 160 V I C = 10 mA, RBE =
breakdown voltage
Emitter to base V(BR)EBO 5 5 V I E = 1 mA, IC = 0
breakdown voltage
Collector cutoff current I CBO 10 10 A VCB = 160 V, IE = 0
1
DC current transfer ratio hFE1* 60 320 60 200 VCE = 5 V, IC = 150 mA*2
www.DataSheet4U.com hFE2 30 30 VCE = 5 V, IC = 500 mA*2
Collector to emitter VCE(sat) 1 1 V I C = 500 mA,
saturation voltage I B = 50 mA*2
Base to emitter voltage VBE 1.5 1.5 V VCE = 5 V, IC = 150 mA*2
Gain bandwidth product f T 140 140 MHz VCE = 5 V, IC = 150 mA*2
Collector output Cob 14 14 pF VCB = 10 V, IE = 0,
capacitance f = 1 MHz
Notes: 1. The 2SD669 and 2SD669A are grouped by h FE1 as follows.
2. Pulse test.

B C D
2SD669 60 to 120 100 to 200 160 to 320
2SD669A 60 to 120 100 to 200

Maximum Collector Dissipation


Curve
Area of Safe Operation
30
Collector power dissipation PC (W)

3
(13.3 V, 1.5 A)
Collector current IC (A)

1.0
20
(40 V, 0.5 A)
0.3

DC Operation(TC = 25C)
10 0.1
(120 V, 0.04 A)
0.03 (160 V, 0.02A)
2SD669 2SD669A
0.01
0 50 100 150 1 3 10 30 100 300
Case temperature TC (C) Collector to emitter voltage VCE (V)

3
2SD669, 2SD669A

Typical Output Characteristecs Typical Transfer Characteristics


1.0 500
5
5. 5.40.5 .0
4 VCE = 5 V
TC = 25C 200
3.5

Collector current IC (mA)


0.8
Collector current IC (A)

3.0 P
C 100
=
2.5 20
0.6 W 50

Ta = 75C
2.0

25
25
1.5 20
0.4
10
1.0
5
0.2 0.5 mA
2
IB = 0
1
0 10 20 30 40 50 0 0.2 0.4 0.6 0.8 1.0
www.DataSheet4U.com Collector to emitter voltage VCE (V) Base to emitter voltage VBE (V)

DC Current Transfer Ratio Collector to emitter saturation voltage VCE(sat) (V) Collector to Emitter Saturation Voltage
vs. Collector Current vs. Collector Current
300 1.2
5C IC = 10 IB
Ta=7
DC current transfer ratio hFE

250 1.0

25
200 0.8

150 25 0.6

C
5
100 0.4

=7
2 25
5
C
50 VCE = 5 V 0.2 T

1 0
1 3 10 30 100 300 1,000 3,000 1 3 10 30 100 300 1,000
Collector current IC (mA) Collector current IC (mA)

4
2SD669, 2SD669A

Base to Emitter Saturation Voltage Gain Bandwidth Product


vs. Collector Current vs. Collector Current
Base to emitter saturation voltage VBE(sat) (V)

1.2 240
IC = 10 IB VCE = 5 V

Gain bandwidth product fT (MHz)


Ta = 25C
1.0 200

25C
0.8 TC = 160
25
0.6 75 120

0.4 80

0.2 40

0 0
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1 3 10 30 100 300 1,000 10 30 100 300 1,000
Collector current IC (mA) Collector current IC (mA)

Collector Output Capacitance


vs. Collector to Base Voltage
200
Collector output capacitance Cob (pF)

f = 1 MHz
100 IE = 0

50

20

10

2
1 2 5 10 20 50 100
Collector to base voltage VCB (V)

5
Unit: mm

8.0 0.5 2.7 0.4


3.1 +0.15
0.1

12
12

11.0 0.5
2.3 0.3

3.7 0.7
120

1.1

15.6 0.5
0.8

2.29 0.5 2.29 0.5 0.55 1.2

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Hitachi Code TO-126 Mod
JEDEC
EIAJ
Weight (reference value) 0.67 g
Cautions

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traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
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for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-
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products.

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