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MINISTRY OF EDUCATION, MALAYSIA

COURSE INFORMATION

PROGRAMME : ELECTRICAL TECHNOLOGY

COURSE NAME : BASIC OF ELECTRONIC ENGINEERING

CODE NAME : ETE 3022

LEVEL : 2 SEMESTER 3

CREDIT UNIT : 2.0

CONTACT HOUR : FACE TO FACE : 4.0 HOURS/WEEK

NON FACE TO FACE :

COURSE TYPE : VOCATIONAL

PREREQUISITE : -

CORE REQUISITE : -

COURSE OUTCOMES

At the end of the course, students should be able to:-

1. Explain the semiconductor theory.

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2. Practice proper handling of semiconductor devices.
3. Identify semiconductor components and explain its operation and application.
4. Utilise data sheet to select semiconductor devices.
5. Test semiconductor components using various test equipments to ensure proper functionality.
6. Analyze the current-voltage (I-V) characteristics of a PN junction.
7. Construct, measure using the correct test equipments and tabulate data of an analogue circuit.

COURSE DESCRIPTION

Basic of Electronic Engineering provides the fundamental knowledge of semiconductor devices such as diodes, bipolar junction transistors
(BJTs), field effect transistors (FETs) and thyristors. This course stresses on hand-on component testing and circuit constructions which include
the use of circuit assembly, testing methods, recording measurements and analysis of analogue circuits.

CONTENT AND LEARNING STANDARDS

PROGRAMME : ELECTRICAL TECHNOLOGY

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COURSE NAME : BASIC OF ELECTRONIC ENGINEERING
CODE NAME : ETE 3022

CONTENT STANDARD LEARNING STANDARD PERFORMANCE CRITERIA

1. EXPLAIN THE 1.1 Describe 1.1.1 Cla


SEMICONDUCTOR THEORY the types of semiconductor. ssify types of material according to Bohr atomic model
and Energy Band diagram.

1.1.2 Stat
e the difference between intrinsic and extrinsic
semiconductor according to its characteristic shown in
the band diagram and bonding diagram.

1.1.3 Stat
e the purpose of doping according to semiconductor
characteristics.

1.1.4 Defi
ne doping process of intrinsic semiconductor according
to its characteristic.

1.1.5 List
three types of impurities for P type and N type
according to the impurities characteristic (pentavalent
and trivalent).

1.1.6 Des
cribe the P type and N type semiconductors and their
current flows according to their atomic structures.

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CONTENT AND LEARNING STANDARDS

PROGRAMME : ELECTRICAL TECHNOLOGY


COURSE NAME : BASIC OF ELECTRONIC ENGINEERING
CODE NAME : ETE 3022

CONTENT STANDARD LEARNING STANDARD PERFORMANCE CRITERIA

2. PRACTICE PROPER 2.1 Use proper grounding, antistatic 2.1.1 Define electrostatic discharge according to the
HANDLING OF wrist strap and proper storage effect of semiconductor devices.
SEMICONDUCTOR device. Implement ESD prevention
DEVICES procedures. 2.1.2 Identify anti static control products according to its
method to discharge electrostatic.

2.1.3 Apply proper work procedures for handling


semiconductor devices according to industry accepted
standard for eliminating static electricity.

2.2 Describe proper soldering 2.2.1 Ide


techniques when soldering ntify proper soldering techniques for semiconductors
semiconductors. according to the manufacturer specification and
industry accepted standard.

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CONTENT AND LEARNING STANDARDS

PROGRAMME : ELECTRICAL TECHNOLOGY


COURSE NAME : BASIC OF ELECTRONIC ENGINEERING
CODE NAME : ETE 3022

CONTENT STANDARD LEARNING STANDARD PERFORMANCE CRITERIA

3. IDENTIFY 3.1 Identify semiconductors 3.1.1 State the names of the


SEMICONDUCTOR components. semiconductor according to the given actual
COMPONENTS AND ITS components - diode, BJTs, FETs, thyristors and UJT.
OPERATION AND
APPLICATION 3.1.2 Sketch and label the symbols
of the semiconductor components according to the DIN
/ ASA standards.

3.2 Explain the operation of diode 3.2.1 Describe the formation of depletion region at
and its application. the PN junction according to its band diagram.

3.2.2 Sketch the construction of diode according to


its standard structural block diagram.

3.2.3 Describe forward bias and reverse bias on PN


junction according to its biasing characteristics.

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3.2.4 Sketch and label the IV curve to differentiate
between the silicon and germanium diode according to
its characteristic.

3.2.5 List and explain 5 types of diodes according to


its applications.

3.3 Explain transistor operation and 3.3.1 Sketch the construction of NPN and PNP transistor
its application. according to its standard structural block diagram.

3.3.2 State the 3 transistor configurations according to its


input and output connections.

3.3.3 Describe the DC biasing of NPN and PNP


transistors according to CE amplifier biasing
requirements.

3.3.4 Identify 3 transistor currents and its relationship


according to its characteristic.

3.3.5 Define current, Beta and Alpha according to its


current ratio.

3.3.6 Describe the characteristics of the cut off,


saturation and active regions in transistor operation
according to its location on the load line.

3.3.7 State 2 applications of transistor according to its


circuit diagram.

3.3.8 Sketch the DC load line and Q point of an amplifier


according to its application.

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3.4 Explain the operation of FET 3.4.1 Sketch the construction of JFET and MOSFET
and its operation. according to its standard structural block diagram.

3.4.2 Describe the biasing of JFET and MOSFET


according to its biasing requirements.

3.4.3 Describe the methods used to protect


MOSFETs devices according to industry accepted
standard for eliminating static electricity.

3.4.4 List 2 applications of FETs according to its


circuit diagram.

3.5 Explain the operation of 3.5.1 Sketch the construction of thyristors and UJT
thyristors and UJT. according to its standard structural block diagram.

3.5.2 Describe the operation of thyristors and UJT


according to its characteristic.

3.5.3 Contrast and compare the operations of diacs


and triacs according to their characteristics.

3.5.4 List 3 applications of thyristor and UJT


according to the circuit diagram.

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CONTENT AND LEARNING STANDARDS

PROGRAMME : ELECTRICAL TECHNOLOGY


COURSE NAME : BASIC OF ELECTRONIC ENGINEERING
CODE NAME : ETE 3022

CONTENT STANDARD LEARNING STANDARD PERFORMANCE CRITERIA

4. UTILISE DATA SHEET TO 4.1 Read data sheet. 4.1.1 List three parameters in diode data sheet for
SELECT SEMICONDUCTOR 1N4001 according to the diode characteristic.
DEVICES
4.1.2 State the typical value/measurement and
value/maximum in each parameter according to the
characteristic.

4.2 Determine compatibility of similar 4.2.1 Find the equivalent components for Diode -1N4001,
semiconductor device. BJT- CS945 and TRIAC- BT136 according to the
characteristic.

4.2.2 State three comparable parameters to choose the


equivalent components according to the characteristic.

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CONTENT AND LEARNING STANDARDS

PROGRAMME : ELECTRICAL TECHNOLOGY


COURSE NAME : BASIC OF ELECTRONIC ENGINEERING
CODE NAME : ETE 3022

CONTENT STANDARD LEARNING STANDARD PERFORMANCE CRITERIA

5. TEST SEMICONDUCTOR 5.1 Prepare components test 5.1.1 Apply safety requirements according to safety
COMPONENTS USING equipments and test manual. standard practices.
VARIOUS TEST
EQUIPMENTS TO ENSURE 5.1.2 Apply proper work procedures for handling
PROPER FUNCTIONALITY semiconductor devices according to industry accepted
standard for eliminating static electricity.

5.2 Identify the terminals for 5.2.1 Use analogue or/and digital multi meter to
semiconductor components using determine the terminals for diode, LED, BJTs and SCR
various test equipments. according to standard testing procedures.

5.3 Test the components for 5.3.1 Carry out components serviceability test using the
serviceability. correct test equipments/tools according to testing
procedures.

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CONTENT AND LEARNING STANDARDS

PROGRAMME : ELECTRICAL TECHNOLOGY


COURSE NAME : BASIC OF ELECTRONIC ENGINEERING
CODE NAME : ETE 3022

CONTENT STANDARD LEARNING STANDARD PERFORMANCE CRITERIA

6. ANALYZE THE CURRENT- 6.1 Prepare components, test 6.1.1 Apply safety requirements according to safety standard
VOLTAGE (I-V) equipments and test manual. practices.
CHARACTERISTICS OF A
PN JUNCTION AND 6.1.2 Apply proper work procedures for handling
RECORD THE semiconductor devices according to industry accepted
MEASUREMENT standard for eliminating static electricity.

6.2 Assemble diode circuit to plot IV 6.2.1 Set up circuit for characteristic test using data
characteristic curves. book/chart, reference manual, test equipment, project
board for passive component according to the circuit
diagram.

6.3 Record the measurement and 6.3.1 Measure the current-voltage characteristic, record
analyze the result. and tabulate the result according to the procedures in
the manual book.

6.3.2 Plot the IV curve graph according to the PN junction


characteristic.

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CONTENT AND LEARNING STANDARDS

PROGRAMME : ELECTRICAL TECHNOLOGY


COURSE NAME : BASIC OF ELECTRONIC ENGINEERING
CODE NAME : ETE 3022

CONTENT STANDARD LEARNING STANDARD PERFORMANCE CRITERIA

7. CONSTRUCT, MEASURE 7.1 Prepare components, test 7.1.1 Apply safety requirements according to safety standard
USING THE CORRECT equipments and test procedures. practices.
TEST EQUIPMENTS AND
TABULATE DATA OF AN 7.1.2 Apply proper work procedures for handling
ANALOGUE CIRCUIT semiconductor devices according to industry accepted
standard for eliminating static electricity.

7.2 Construct and measure an 7.2.1 Build an analogue circuit using active components
analogue circuit. and passive components with project board, tools and
test equipments according to its circuit diagram.

7.2.2 Perform circuit board functionality test using test


equipment and test procedures and record results
according to circuit application.

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