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IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 49, NO.

6, JUNE 2002 379

Palmo: Pulse-Based Signal Processing for


Programmable Analog VLSI
Konstantinos Papathanasiou, Member, IEEE, Thomas Brandtner, Student Member, IEEE, and Alister Hamilton

Abstract—This paper presents novel signaling and circuit tech- working VLSI implementations of these circuits are presented
niques for the implementation of programmable analog and mixed demonstrating the validity of the technique.
signal very large scale integration (VLSI). The signaling technique
uses pulsewidth modulated digital signals to convey analog signal
information between programmable analog cells. A circuit for a II. PRINCIPLES OF OPERATION
generic programmable analog cell is introduced and is analyzed for
harmonic distortion performance. The equivalence of the cell to a A. Signaling Mechanism
switched-capacitor (SC) Miller integrator is proven. Voltage- and
current-mode (CM) implementations of the generic programmable The programmable analog signal processing technique
analog cell are introduced; an elegant-fast current controlled com- we have developed uses time rather than voltage or current,
parator is presented, and results from working analog VLSI im- to encode analog signal information to be carried between
plementations provided. programmable analog cells. It makes use of a noise robust
Index Terms—Field programmable analog array (FPAA), mixed digital signal to encode analog information by modulating the
signal very large scale integration (VLSI), palmo, programmable width of a digital pulse or pulses. This sampled data approach
analog VLSI, pulse-based signal processing. produces a pulse to encode the analog information at every
sample epoch. Variants of it have been seen elsewhere [5]–[7].
I. INTRODUCTION Since analog signals may have either positive or negative
polarities, we have extended this basic concept to include a

T HE field programmable analog array (FPAA) has made a


recent appearance in the market place in a variety of forms
[1]–[4]. This variety is due to the wide range of circuit specifi-
sign clock whose frequency is matched to the sample clock. A
pulse occurring when the sign clock is high encodes a positive
analog quantity, while a pulse occurring when the sign clock
cations and circuit realization techniques that face the analog
is low encodes a negative one.
circuit designer. The analog domain is much more diverse than
Fig. 1 illustrates our pulse-based signaling methodology. Two
the digital one and implementing generic field programmable
pulsewidth modulated (PWM) signal strategies are shown, the
analog parts is a considerable challenge.
choice of which depends on circuit implementation issues. The
In this paper, an entirely new range of signaling techniques
signal PWM (a) represents the sampled analog quantity as de-
and programmable circuits that are ideally suited to a pro-
scribed earlier. In signal PWM (b), the sampled analog quan-
grammable analog and mixed signal very large scale integration
tity is represented by the sum of the pulsewidths in any period
(VLSI) environment are presented in detail.
of the sign clock. Either signaling mechanism may be used to
A pulse-based signaling technique used for communicating
connect programmable analog cells together. The signal inputs
analog signals around the programmable device is presented.
to these programmable analog cells are digital PWM signals,
A generic programmable analog cell is described and the
as are signal outputs from these cells. Thus, standard digital
equivalence of a Miller integrator implemented using this
techniques may be used to route PWM signals between pro-
cell to the switched-capacitor (SC) implementation is demon-
grammable analog cells in a completely flexible way. Although
strated. The sources of total harmonic distortion (THD) within
we use a digital signaling method, the analog signal information
the programmable analog cell are presented and analyzed.
conveyed by the PWM signal is not quantized in a digital sense,
Voltage- and current-mode (CM) circuit implementations of the
but continuously variable with the width of the PWM pulse or
programmable analog cell are introduced. Finally, results from
pulses.
This use of pulses to encode analog signal quantities has led to
Manuscript received November 21, 2000; revised June 11, 2002. This work our name for this technique—Palmo, from the Hellenic
was supported by the U.K. Engineering and Physical Sciences Research Council
(EPSRC) under Grant GR/L36031. This paper was recommended by Associate which means pulse beat, pulse palpitation, or series of pulses.
Editor R. Geiger.
K. Papathanasiou was with the Department of Electronics and Electrical En-
gineering, University of Edinburgh, Edinburgh EH9 3JL, U.K. He is now with
B. Palmo Cell
RF Magic, San Diego, CA 92121 USA. The programmable analog cell we have chosen to implement
T. Brandtner was with the Department of Electronics and Electrical Engi-
neering, University of Edinburgh, Edinburgh EH9 3JL, U.K. He is now with the is an analog integrator. Integrators with controllable gain are
RF Group, Infineon Technologies Development Center, A-8010 Graz, Austria. versatile building blocks which may be used directly to im-
A. Hamilton is with the Department of Electronics and Electrical En- plement filters, but which may also implement analog mem-
gineering, University of Edinburgh, Edinburgh EH9 3JL, U.K. (e-mail:
Alister.Hamilton@ee.ed.ac.uk). ories (by integrating a single input) or scaling functions and,
Digital Object Identifier 10.1109/TCSII.2002.802341. therefore, may be used in different sampled data applications,
1057-7130/02$17.00 © 2002 IEEE
380 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 49, NO. 6, JUNE 2002

Fig. 1. Pulsed-based signal representations, PWM (a) and PWM (b), of a sampled analog signal. The magnitude of the analog signal is encoded in the width of
the pulse or pulses at each sample epoch. The sign of the analog signal is encoded in the relationship between the pulses and the state of the sign clock. Pulses
occurring while the sign clock is high represent positive analog signals, while those occurring while the sign clock is low represent negative analog signals.

(a) (b) (c)


Fig. 2. Typical Palmo programmable analog integrator cell. (a) Palmo unipolar signal integrator. (b) Palmo bipolar signal integrator. (c) Complete Palmo cell.

analog-to-digital (A/D) converters or as a delay ( ) in digital been added to the circuit of Fig. 2 to set or to a reference
signal processing algorithms. voltage ( ).
The Palmo cells make use of the digital PWM signals de- As we shall see, control over the signal and ramp circuits
scribed earlier and analog functionality to implement such an gives accurate programmable control over the overall gain ( )
integrator (Fig. 2). The input pulse [Fig. 2(a)] controls the of the Palmo integrator cell.
switch . When this switch is closed the capacitor ( ) is
charged by constant current ( ) to a voltage C. Miller Integrator
, where denotes the duration of the input pulse In this section, we demonstrate the equivalence of a Palmo
representing the magnitude of the analog signal. A complemen- integrator implementation of a Miller integrator to the SC active
tary structure is added to discharge the capacitor [Fig. 2(b)] if the RC filter implementation. In doing so, we also demonstrate how
input signal is negative. Digital circuitry may be used to route the gain of the Palmo cell may be programmed.
the input pulses to either or control line depending upon In the SC active RC filter implementation of the Miller in-
the sign of the input signal. tegrator a SC replaces the resistor, R [8]–[11] and the transfer
The accumulated charge on , representing the result of the function is
integration process, may be converted back to a pulsed PWM
signal to produce the output signal from the Palmo cell. To
(1)
achieve this an identical circuit [Fig. 2(c)] is used to generate
a ramp signal (Fig. 3). The , signals which control the
ramp generating circuit are derived from the digital signals that In a differential Miller integrator, the effect of a signal on
generate the sign clock. A comparator detects when the two volt- the non inverting input is apparent at the output after a delay
ages ( and ) meet and the exclusive OR of the comparator of one clock period; while a signal on the inverting input is ap-
output and the sign clock generates a signed PWM output from parent after a one-half clock period delay. The charge accumu-
the Palmo cell. A typical waveform diagram showing the sig- lated on the integrating capacitor ( ) of a Palmo Miller inte-
nals within the Palmo cell for the PWM (b) signals of Fig. 1 is grator [Fig. 2(c)] during one cycle is
shown in Fig. 3 for both positive and negative accumulated sig-
nals on the integrating node, . Two reset switches have also (2)
PAPATHANASIOU et al.: PALMO: PULSE-BASED SIGNAL PROCESSING FOR ANALOG VLSI 381

(a) (b)
Fig. 3. Signals within the Palmo cell used to produce PWM (b) output signals. (a) Positive value on signal integrator output. (b) Negative value on signal integrator
output.

(a) (b) (c)


Fig. 4. Harmonic distortion due to comparator delays. (a) Ideal output signal, 1T cos(!t). (b) Error signal introduced by comparator delays, 1T f (t).
(c) Resultant distorted output signal.

The voltage ( ) on the integrating capacitor at the end of an SC (or switched current) techniques [14]–[16]. Since the ratio
integrating cycle is given by the following equations: of capacitors in (4) can be modified by switching between the
elements of a capacitor array and the ratio of the currents can
be electrically modified with sufficient accuracy [17]–[20]; the
gain of a Palmo cell is fully digitally programmable and in-
sensitive to absolute values [21]–[23].

where and are the widths of the pulses on the III. HARMONIC DISTORTION
inverting and noninverting inputs to the integrator. The voltage The main factors that contribute to the THD in Palmo circuits
( ) accumulated on the integrating capacitor [Fig. 2(c)] is are the nonidealities of the comparator and the differences be-
compared with the ramp ( ) in order to regenerate the pulsed tween the charging and discharging currents in the circuits of
output. When the voltage becomes equal to the voltage , Fig. 2(c) [24], [25].
the comparator output will change state, defining the end of the Offsets introduced by the comparator of a typical Palmo cell
pulsewidth output. At this time the voltage on the ramp capacitor can be easily cancelled by post processing. However, propaga-
is tion delays result in harmonic distortion when the positive and
negative switching response times of the comparator output are
unequal. Such comparator delays are due to the parasitic capac-
itances which need to be charged (or discharged) when the com-
and . Thus parator output changes state. The effect of these inevitable de-
lays is to make the output pulsewidths longer than they should
(3) be adding to the PWM output. Therefore, the ideal cosine
output [Fig. 4(a)] with a magnitude will be distorted, be-
It is noticeable from (3) and (1) that both the SC and the Palmo cause of the signal [Fig. 4(b)], resulting in the signal
Miller integrators have identical transfer functions where the shown in Fig. 4(c), which is given by
corresponding gains ( ) are
(5)
(4)
where , when
Due to this similarity, existing SC synthesis techniques and tools or otherwise.1 The Fourier transform of the output
may be applied to the Palmo realization [12], [13]. In a Palmo signal given by (5) [Fig. 4(c)] is equal to the sum of the Fourier
implementation, scaling ( ) is a product of the ratio of two series of the two signals shown in Fig. 4(a) and (b) namely
capacitances and the ratio of two currents, resulting in greater 1Our systems are sampled-data ones, therefore, the output is discrete, how-
dynamic range of filter coefficients, compared to conventional ever, for simplicity, we will consider them continuous during this THD analysis.
382 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 49, NO. 6, JUNE 2002

(a) (b) (c)


Fig. 5. Harmonic distortion due to current differences.

and , because the signal is an even func- Therefore, if


tion of the resultant Fourier series is a Fourier cosine series,
thus
(8)

where , are the currents driven by the transistors ,


. For small values of and the THD of the Palmo
The overall harmonic distortion, due to the propagation delay circuit (THD) can be approximated by adding (6) and (8), thus
of the comparator ( ), for , is given by the
equation [25] (9)

1) Discussion: The comparator delays are independent


(6) (to a first approximation) to the frequency of operation, how-
ever, its size increases proportionally to the output ( ) at high
sampling frequencies. Current matching on the other hand de-
where is the magnitude of the ideal signed PWM cosine pends heavily to the size of the currents. As a result distortion
signal and is the size of the comparator delay. introduced by the comparator ( ) is expected to dominate
As shown in (3) capacitor or current mismatches generate at high frequencies, while the use of small and, therefore, less
gain mismatches or offsets. These mismatches do not generate well-matched integrating currents will introduce most of the dis-
distortion. Differences between the charging and discharging tortion ( ) at low frequencies.
currents ( or ) used in the Palmo cell of Fig. 2(c) will gen- Another source of nonlinearities in pulse-based signal
erate harmonic distortion. A typical charge/discharge circuit is processing circuits is clock jitter; this can be viewed as a
shown in Fig. 5(a), where and represent charging and dis- quantization error signal added to the input of the analog to
charging currents of different magnitudes. Assuming the voltage pulse converter and would directly add to the noise floor of the
to PWM converter of Fig. 5(b) were the ramp voltage is com- Palmo signal. Such a noise effect may be shaped and pushed
pared to the input voltage ; if is generated to higher frequencies by the means of a converter, or can
by two different current sources then were be suppressed to a lower level that the analog information of
is the mismatched positive or negative sampling current interest. Recently, the development of spread spectrum commu-
and is the resultant positive or negative output pulse, respec- nications, which impose strict jitter requirements, encouraged
tively. The discrete output will be treated as a continuous the advancement of low-jitter clock generation [26]–[28] which
function for the purpose of this analysis [Fig. 5(c)] and is has yielded on chip frequency synthesizers with an effective
given by the equation peak to peak jitter of 240 ps at 10 MHz (or SNR of 53 dB if
used in a palmo system) and 81 ps at 100 MHz (or SNR of 42
(7) dB). Other commercially available surface mountable devices
otherwise [29] produce 8.5 ps jitter at 10 MHz (or SNR of 81 dB) and
discrete component-based VCOs for CDMA phones would
where and are unequal peak magnitudes of the output
produce a 5 ps jitter at 10 MHz (or SNR of 85 dB) and 1.68 ps
signal caused by the mismatch in and . This generates
jitter at 100 MHz (or SNR of 75 dB).
a second THD component given by the Fourier transformation
of (7). The Fourier coefficients are
IV. IMPLEMENTATIONS
The principles presented in the previous sections were used
to design several test chips.
and A. Voltage Domain Circuits
A voltage domain Palmo FPAA contained eight Palmo cells
each with a dedicated DAC and programmable capacitor array
PAPATHANASIOU et al.: PALMO: PULSE-BASED SIGNAL PROCESSING FOR ANALOG VLSI 383

Fig. 6. Voltage domain palmo cell with dedicated DAC and programmable capacitor array.

(Fig. 6) to set the cell gain. The integrating and ramp gener- B. CM Palmo Cells
ating current sources of Fig. 2(c) are combined into a single cir- CM circuits offer a large dynamic range that is not limited by
cuit that is multiplexed in time to perform either integration or power supply voltage so that it is possible to use a dual-slope
ramp generation depending on the state of the digital control current ramp waveform and the signaling technique PWM(b)
line . The gain is set by the ratio of currents mul- of Fig. 1. Due to the high switching speeds of continuous time
tiplexed into the current DAC ( and ) and by the setting current controlled comparator circuits the sampling frequency
of individual elements of a 3 by 3 capacitor array assigned to of CM Palmo circuits is more than an order of magnitude greater
or depending upon the state of the digital control word than the voltage domain implementations [31].
. The signal defines whether current will be The schematic diagram of the CM Palmo cell is shown in
dumped or removed from the appropriate capacitor. The input Fig. 7. It consists of three parts: a digital logic block, an inte-
signal Pulse is either the PWM input signal, or the signal that grator, and a current comparator. The logic converts the input
controls the ramp waveform. The gain of the analog Palmo cell pulses and the sign signal into two differential input currents
has 9 b of resolution. Since this 9 b resolution is a product of a that form the input to the integrator. The pulsed output is gener-
6 b current ratio and a 3 b capacitor ratio, the chip area occu- ated by a current controlled comparator (CCC) which compares
pied by the cell is much less than the equivalent resolution in the integrator output current to a current ramp produced by a
a SC implementation where 512 elementary capacitors would second identical integrator.
be required. Analog to PWM conversion was facilitated by con- Here, two different integrator circuits that perform the dif-
necting the node on one of the Palmo cells to an analog ferential integration function shown in Fig. 7 are introduced; a
input pad to the chip. PWM to analog conversion was imple- log-domain integrator and a square-root-domain integrator with
mented by buffering the node through an on chip unity its associated geometric mean circuit. The current controlled
gain buffer so the signal could be read off chip. All interconnec- comparator circuit of Fig. 7 is also introduced.
tion and digital control was implemented using a separate field 1) Log-Domain Integrator: The principal circuit of the log-
programmable gate array (FPGA). domain integrator used in our Palmo cell is shown in Fig. 8. It
Characterization of similar fabricated devices (Fig. 6) [12], is based on [32]–[35], but has improved linearity over a bigger
[13], [30] highlighted several possible improvements: the use current range, due to the use of cascode current mirrors and sta-
of wide swing cascoded current mirrors, accurate thermometer bilising transistors, M13 and M14 [30], [31]. The integrator is
coded dynamic current DACs and faster continuous time voltage fully differential; the input value is the difference of the two
comparator implementations. This experience led to the realiza- currents and . First the input currents are compressed into
tion that the use of CM techniques would offer significant ad- log-domain by Q1 (Q8); Q2 and C1 (Q7, C2) perform integra-
vantages in the implementation of Palmo cells. tion in the log-domain. The integrated value is scaled by Q3
384 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 49, NO. 6, JUNE 2002

Fig. 7. CM Palmo cell and typical waveform diagram.

Fig. 8. Log-domain integrator.

(Q6), the scaling factor depends on the current . Finally, Q4 current of , and is the current gain of the bipolar transistors.
(Q5) expands the compressed signal. The output is represented The output currents and are given by the equations
by the difference of the currents and . Additional cur-
rent mirrors are necessary for producing the output current (not i
i
shown).
The following translinear equations [36] for the integrator cir- i
i
i

cuit of Fig. 8 may be derived from the relationship


i
of the bipolar transistor i

i i (12)
i

(10)
where is the thermal voltage (26 mV at 300 K), is the
biasing voltage (Fig. 8). Subtracting the two (10), substituting
where is the collector current of transistor . The currents
from (11) and i from (12), while assuming
(and similarly ) are given by the fol-
and results in the final equation:
lowing equations:

(11)

where is the mirroring ratio of the current mirror M5-8, is the


mirroring ratio of the current mirror M9-12, is the charging
i
(13)
PAPATHANASIOU et al.: PALMO: PULSE-BASED SIGNAL PROCESSING FOR ANALOG VLSI 385

Fig. 9. Square-root-domain integrator with transistor W/L ratios.

where are due to the early voltage effect, The integrator is reset by connecting nodes 1 and 2 together,
is the collector-base voltage of transistor and is or by increasing the base compensating current, .
the early voltage. 2) Differential Square-Root Translinear Circuit: The inte-
The first term on the right side of (13) shows that the differ- grator is shown in Fig. 9. Transistor is a current source
ence of the output currents ( ) is proportional to the controlled by . This current source generates variable
integral of . The integration constant is . It magnitude current pulses , depending upon the sam-
can be controlled by changing the current or the capacitor C. pling rate (the shorter the sampling time, the larger the current).
However, it is a function of temperature. The overall gain of the This current is integrated on capacitor . The transistor
Palmo cell (4) is [12], [13] introduce some common mode feedback [37], which,
along with , defines the circuit operating point. The transis-
(14) tors are used to form wide swing cascoded current sources.
A square-law expanded current is derived from
and, therefore, temperature dependency has been removed from the integrated voltage on the gate of . This current
the gain of the cell. is compressed and scaled by the use of complementary
In practice, the scaling current should be proportional to metal–oxide–semiconductor (CMOS) geometric mean circuit
temperature. The accuracy of temperature tracking is not critical [38] ( ) (Fig. 10), to produce an overall linear V–I
to the accuracy of the integrator gain, but it is beneficial for relationship. The transfer function of the differential integrator
achieving the maximum dynamic range; because temperature of Fig. 9 (assuming well-matched transistors, capacitors, and
variations will alter the currents and , thus, changing currents) is given by
the dynamic range, while the current ratio will remain the same
over temperature variations.
The second term occurs because of the base currents of Q3
and Q5 which introduce a leakage current on the integrating where is the differential output current ( ),
nodes. This is a particular problem for sampled data systems is the differential input current ( ), the scaling cur-
because the integrated value should remain constant between rent, is the transconductance parameter of , is the in-
samples. Since the collector current of these transistors is always tegrating capacitance.
equal to this term can be easily cancelled by introducing two The linearity of the circuit depends on the accuracy of the V–I
additional current sources of . These current sources characteristic of saturated MOS transistors and the quality of
are derived from the base current of a single bipolar transistor the geometric mean circuit. The frequency of operation depends
with a collector current of . on the delays posed by the feedback loop and can be designed
The reason for the third term is the difference of the mirroring to be arbitrarily small, with a tradeoff in power consumption.
ratios of the two current mirrors M5-8 and M9-12. The two cur- Delays in the geometric mean circuit influence the response of
rents and which are mirrored are not the same, there- the circuit, however, since these circuits are not in the feedback
fore, the mirroring ratio should be constant with respect to the loop, they do not degrade the sampling frequency.
mirrored current. To maximize the dynamic range of the cir- The overall gain of the Palmo cell is [30], [31]
cuit at the expense of operating frequency, operating voltage and
power, a cascode current mirror is used.
The last term is due to the early effect. The collector voltages (15)
of Q4 and Q5 vary due to output current changes. Transistors
M13 and M14 stabilize the collector voltages of Q4 and Q5 to The gain is dependent on capacitor and current ratios, which can
minimize this term. be accurately realized in silicon. Furthermore, since the gain
386 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 49, NO. 6, JUNE 2002

(a) (b)
Fig. 10. MOS geometric mean circuit.

(a) (b)
Fig. 11. Current comparator.

is dependent on the product of two different values, high time. The size of the deadband is determined by and is, there-
Q factors can be achieved with reduced area requirements ( fore, process dependent.
80 dB for 250 m 250 m on a 0.8- m process) compared to The comparator used is an improvement of the above circuit
other conventional sampled-data techniques. proposed in [41] [Fig. 11(b)]. It was modified in order to accom-
The signal to noise ratio (SNR) of the integrator is over 65 dB modate the lack of p-wells in the fabrication process used. As the
for a wide range of sampling frequencies (10 kHz to 20 MHz) voltages at nodes (1) and (2) [Fig. 11(b)] are increased toward
and a 5 V supply voltage. This is due to the fact that the magni- , the deadband in the transfer characteristic is reduced by the
tude of the input currents , varies with the frequency of voltage drop on , which is controlled by and . This
operation. A power supply voltage of 3 V gives a dynamic range results in a smaller voltage swing and, thus, a faster response
of 60 dB. The integrator may be reset by connecting integrating (17 ns for a 50 nA swing). The smaller and become,
nodes one and two together temporarily, with virtually no clock the smaller the deadband of the source follower gets, hence the
feed-through effects observable at the output. current comparator gets faster. On the other hand the power con-
sumption increases (2 mW in our circuit) due to the bigger cur-
C. CCC rents in the CMOS inverter stages. In that way the operating
This circuit is mainly responsible for the high sampling fre- frequency and the dynamic range of the Palmo circuit is signif-
quency capability [31] of the Palmo cell because it is faster than icantly improved.
the voltage mode comparators used in former Palmo implemen-
tations [39]. V. RESULTS FROM SILICON
The CCC used was based upon [40] [Fig. 11(a)]. The input
currents are amplified by transistors and , while positive A. Harmonic Distortion
feedback from and further increase transition currents. Fig. 12(a) shows an estimation of , , and THD (12)
However, during the transient period when the current changes calculated using (6) and (8) and measured parameters from a
sign (deadband) the buffer cannot supply the input current, re- voltage domain test chip. Fig. 12(b) shows the harmonic distor-
sulting in a high impedance node and degrading the response tion of the differential circuit measured from silicon. The
PAPATHANASIOU et al.: PALMO: PULSE-BASED SIGNAL PROCESSING FOR ANALOG VLSI 387

Fig. 12. THD for different sampling frequencies. (a) Voltage domain circuits. (b)
px circuits.

Fig. 13. Programmable voltage domain circuits: first-, second-, and third- Fig. 14. Third-order Butterworth filter responses in different sampling fre-
order Butterworth filters at cutoff frequencies of 1 and 2 kHz. quencies (100 kHz, 1 MHz, 8 MHz).

innovations introduced by the design are evident. Harmonic dis- cies, limited supply headroom (12 V) and slow voltage com-
tortion is reduced because of the improved matching of the dif- parators.
ferential circuit and the advanced comparator design. Those re-
sults compare favorably with a figure of 0.4% [42] quoted for a C. CM Circuits
mature programmable SC FPAA cell. Both a CM log-domain and a -domain circuit were fabri-
Distortion introduced by the comparator (Fig. 12) is dominant cated. The latter offered higher sampling frequencies and sim-
at high frequencies where the comparator delays become com- ilar dynamic range for a larger power supply voltage (5 V).
parable to the sampling rate. Distortion due to current matching The -domain test chip was used to generate the results pre-
dominates at low frequencies due to small and less well-matched sented in Fig. 14. A third-order low-pass Butterworth filter was
integrating currents. implemented utilising a single test chip to perform the analog
integrator and a digital FPGA to drive the control lines. The bi-
B. Voltage Domain Circuits asing currents were provided externally from tuneable current
Measured results (Fig. 13) from the voltage domain Palmo sources. The biasing current sizes were a function of the fre-
FPAA circuits (Fig. 6) demonstrate the programmability of the quency of operation (the faster the sampling frequency the larger
Palmo circuits. The order and the cutoff frequency of the re- the currents). The resultant output pulse was recorded by a dig-
sponse [13], [39], may be altered by the digital configuration ital signal analyzer with a sampling frequency of 1.5 GHz. It
of the control signals. Other implementations of mixed-mode is clear (Fig. 14) that the CM circuits outperform voltage do-
finite-impulse response filters and more complex system real- main approaches in both SNR and the maximum sampling fre-
izations (such as a modulator) highlighted the advantages quency. The circuit behaves best at a sampling frequency of
of the Palmo approach to programmable analog hardware [30]. about 1 MHz, giving over 60 dB. At 100 kHz the response ap-
Voltage domain circuits offer limited SNR (40–50 dB) and sam- proaches 57 dB; because of matching degradation due to the use
pling frequency (500 kHz). This is due to mirroring inaccura- of smaller biasing currents which lowers the effective voltage of
388 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 49, NO. 6, JUNE 2002

the current sources and, thus, mismatches become more sig- [16] T. Fiez, G. Liang, and D. Allstot, “Switched-current circuit design is-
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PAPATHANASIOU et al.: PALMO: PULSE-BASED SIGNAL PROCESSING FOR ANALOG VLSI 389

Konstantinos Papathanasiou (M’00) received the Alister Hamilton is a Lecturer in the Department of
M.S.degree in electrical engineering from the Univer- Electronics and Electrical Engineering, University
sity of Patras, Patras, Greece, in 1994 and the Ph.D. of Edinburgh, Edinburgh, U.K. His research interests
degree in analog electronics from the University of have spanned neural network implementations
Edinburgh, Edinburgh, U.K., in 1998. in analog VLSI, neuromorphic engineering, pro-
From 1997 to 1998, he was a Research Associate grammable analog VLSI, and on-focal plane analog
at the University of Edinburgh. In 1999, he became processing of image data.
a Research Professor in the Department of Infor-
mation Technology, Danish Technical University,
Lyngby, Denmark. From 2000 to 2001, he worked
for Qualcomm CDMA Technologies, San Diego,
CA. Currently, he is with RF-Magic, San Diego, CA. His research interests
include analog and RF integrated systems, neural network implementations,
implantable low-power devices, field programmable analog and RF arrays,
analog uses of floating gates, device modeling and mismatch.
Dr. Papathanasiou is a Member of the Hellenic Chamber of Engineers.

Thomas Brandtner (S’00) was born in Salzburg,


Austria, in 1974. He received the Dipl.-Ing. degree
from the Graz University of Technology, Graz,
Austria, in 1998, where he is currently and working
toward the Ph.D. degree. He did his Diploma thesis
on log-domain Palmo cells for field programmable
analog arrays at the University of Edinburgh,
Edinburgh, U.K., in 1998.
Currently, he is working in the RF Group, Infineon
Technologies Development Center, Graz, focusing
on modeling and simulation of parasitic effects in
mixed-signal integrated circuits

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