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Abstract—High quality power delivery for high performance in- Low-dropout (LDO) regulators suitable for on-chip integra-
tegrated circuits is a significant design challenge. To provide high tion have recently been proposed [7]–[17], exhibiting fast load
quality power, the on-chip power needs to be regulated with ultra- regulation, high power efficiency, as well as stability over a wide
small locally distributed power efficient converters. While the qual-
ity of the power supply can be efficiently addressed with distributed range of current loads and process, voltage, and temperature
on-chip power supplies, the stability of these parallel connected (PVT) variations. The LDO is, therefore, a key component in
voltage regulators is a primary concern. A passivity-based stabil- on-chip power management. A distributed system with multiple
ity criterion is proposed for maintaining a stable power delivery LDO regulators delivering power to a single grid may, however,
system composed of multiple regulators. To evaluate the proposed exhibit degraded stability due to complex interactions among
approach, a fully integrated power delivery system with distributed
on-chip low-dropout (LDO) regulators has been fabricated in a the LDO regulators, power distribution network, and current
28 nm CMOS process. The experimental results of a distributed loads. To provide a stable distributed power delivery system, a
power delivery system composed of six on-chip LDO regulators sat- stability analysis criterion is necessary.
isfy this stability criterion, yielding a stable system response within The stability of a single closed loop system is traditionally de-
−25◦ C to 125◦ C, 10% voltage variations, and 50% to 200% load termined by the phase margin (PM) of the open loop response. In
sharing variations. The system is believed to be one of the first
successful silicon demonstrations of stable parallel analog LDO systems with multiple dependent loops, the open loop approach
regulators. is, however, not practical since no straightforward method ex-
ists to identify unstable loops. A computer-aided design (CAD)
Index Terms—Distributed power delivery, low-dropout (LDO),
on-chip voltage regulators, stability. framework based on the passivity and gain of a power grid has
recently been proposed for evaluating the stability of distributed
I. INTRODUCTION power delivery systems with LDO regulators [18], [19]. While
recognition of the stability challenge is an important cornerstone
ELIVERING high quality power to support power effi-
D cient systems is a fundamental requirement of all inte-
grated circuits (ICs) [1]. While the quality of the power supply
to the distributed power grid design process, the accuracy and
efficiency of the approach requires demonstration on practical
power delivery systems. In this paper, an alternative passivity-
can be efficiently addressed with a point-of-load (POL) power
based stability criterion (PBSC) is proposed to use with existing
delivery system [2]–[6], the complexity of a dynamically con-
CAD tools and design flows, and is not limited to LDO based
trollable distributed POL power supply system is a significant
power delivery systems.
design issue. Hundreds of on-chip power regulators need to be
A distributed power delivery system based on the proposed
co-designed with billions of nonlinear current loads within a
stability criterion has been fabricated in an advanced 28 nm
power domain, imposing a critical stability challenge on a dis-
CMOS technology, and exhibits stable voltage regulation over
tributed power delivery system.
a wide range of temperature, voltage, and load sharing con-
With the increasing diversity of modern systems, dynamic
ditions. The power delivery system with six ultra-small LDO
voltage scaling and fine grain power management are becom-
regulators features an adaptive current boost bias and an adap-
ing increasingly common. These modern heterogeneous sys-
tive RC compensation network controlled individually within
tems are partitioned into a fine grain structure and the power
each LDO regulator, increasing the power efficiency and stabil-
is individually delivered and dynamically managed within each
ity of the overall system over a wide range of load currents and
domain. With dynamic voltage scaling, maintaining the stabil-
PVT variations. The distributed power delivery system has been
ity of distributed power delivery systems has become even more
tested under a wide range of PVT variations, yielding a stable
challenging.
loop response and 99.49% current efficiency.
Manuscript received March 25, 2015; revised July 15, 2015 and September 3, The rest of the paper is organized as follows. The stability
2015; accepted October 5, 2015. Date of publication October 26, 2015; date of criterion is introduced in Section II. A power delivery system
current version March 2, 2016. This work was supported in part by the Binational for evaluating the proposed stability criterion with six fully in-
Science Foundation under Grant 2012139, by the National Science Foundation
under Grants CCF-1329374, CCF-1526466, and CNS-1548078, by the IARPA tegrated LDO regulators, adaptive current boost bias, and RC
under Grant W911NF-14-C-0089, and by Grants from Cisco Systems and Intel. compensation networks is described and evaluated based on the
Recommended for publication by Associate Editor J. A. Cobos. proposed stability criterion in Section III. Simulation results
The authors are with the Department of Electrical and Computer Engi-
neering, University of Rochester, River Campus, University of Rochester, exhibit strong correlation between the stability of a distributed
Rochester, NY 14620 USA (e-mail: vaisband@ece.rochester.edu; friedman@ power delivery system and the proposed PBSC criterion. Ex-
ece.rochester.edu). perimental results for a distributed power delivery system with
Color versions of one or more of the figures in this paper are available online
at http://ieeexplore.ieee.org. six on-chip LDOs are presented in Section IV. The paper is
Digital Object Identifier 10.1109/TPEL.2015.2493512 concluded in Section V.
0885-8993 © 2015 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
See http://www.ieee.org/publications standards/publications/rights/index.html for more information.
5626 IEEE TRANSACTIONS ON POWER ELECTRONICS, VOL. 31, NO. 8, AUGUST 2016
Fig. 1. Power delivery system (a) with n ≥ 2 distributed power supplies, and
(b) reduced single port network.
TABLE I
DC GAIN AND CLOSED LOOP BANDWIDTH OVER A RANGE OF LOAD
CURRENTS AT SLOW (SS, −30◦ C), TYPICAL (TT, 25◦ C), AND FAST (FF,
105◦ C) CORNERS
ILOAD = 1.8 μA (see Fig. 9), enhancing the performance (volt- block, exhibiting a bias current between (N0 /MB )IBIAS and
age droop, slew rate, and current efficiency) and stability of the ((N0 + N )/MB )IBIAS through the differential pair. Simulation
system, as described, respectively, in Sections III-C, and III-D. results for each of the modes are shown in Fig. 10.
Due to enhanced biasing, the voltage droop is decreased by
C. Adaptive Bias 35% (from 43 mV to 25 mV) at the expense of a significant
increase of 137% in current consumption. The bias current is
A self-adaptive bias current mechanism is described in this
adaptively enhanced under light loads, exhibiting an 18.6% de-
section that temporarily boosts the bias current to mitigate fast
crease in voltage droop while avoiding excessive power loss
fluctuations while lowering power losses. The current boost
over time.
circuit is composed of a sensor block that follows the output
A power delivery system in modern high performance circuits
voltage at the drain of transistor MP , and a current boost block
draws significant leakage current from the power regulators.
that controls the current through the differential pair, as shown
Minimum load currents of 1 mA, 3 mA, and 70 mA are assumed
in Fig. 8. The current boost transistor NBo ost is connected in
for a single LDO regulator for, respectively, the slow, typical,
parallel with the bias transistor N0 , and controlled by the Boost
and fast corners. Quiescent current simulations for different load
line. During the boost mode of operation (the Boost voltage is
currents are listed in Table II with and without adaptive biasing.
high), the current into the differential pair is raised, increasing
Without adaptive biasing, an average quiescent current of 423
the slew rate of the LDO. Alternatively, during regular mode (the
μA with less than 2% variations is demonstrated at 25◦ C for all
Boost voltage is low), transistor NBo ost is off and no additional
load currents. This current is increased to 1 mA by adaptively
current flows into the differential pair, enhancing the power
biasing at light loads at the slow, typical, and fast corners.
efficiency of the LDO. The Boost line is controlled by the sensor
block, and is activated when the load current drops below a
D. Adaptive Compensation Network
threshold current of 3.8 mA, exhibiting faster regulation and
a lower voltage droop at the output of the LDO. To prevent The large gate capacitance of the pass transistor together
oscillations at the threshold current, a hysteretic mechanism with the wide range of possible values of CLoad produce a com-
is used. The Boost line is, therefore, deactivated when the load plicated system transfer function of poles and zeros. The low
current increases above 1.8 mA, improving the power efficiency frequency non-dominant poles within the unity gain frequency
of the LDO. of the feedback loop create a negative phase shift, degrading the
To evaluate the performance of the adaptive biasing tech- stability of the overall system. To compensate for the negative
nique, the load current is switched in 10 ns from 3 mA to phase shift, the Miller compensation technique [17] is used. The
100 mA. The voltage droop ΔVOUT and quiescent current IQ wide range in load capacitance and currents and significant PVT
are recorded for three different adaptive modes. In the first variations, however, make compensation with fixed RC values
mode, the current boost mechanism is disabled, limiting the impractical in nanoscale technologies. A digitally configurable
bias current through the differential pair to (N0 /MB )IBIAS . compensation network is, therefore, used that adaptively modi-
In the second mode, the Boost line is maintained at a high fies the dominant pole, maintaining system stability for all val-
voltage, boosting the current through the differential pair at ues of CLoad and ILoad . Due to complex interactions among the
a constant rate to ((N0 + N )/MB )IBIAS . In the third mode, parallel connected LDO regulators, shared power grid, and cur-
the Boost line is adaptively boosted in real time by the sensor rent loads, this compensation network is necessary to maintain
5630 IEEE TRANSACTIONS ON POWER ELECTRONICS, VOL. 31, NO. 8, AUGUST 2016
TABLE II
QUIESCENT CURRENT WITH AND WITHOUT ADAPTIVE BIASING
Fig. 9. Load current tracking through the boost signal, (a) transient response,
and (b) DC response.
Fig. 11. Phase margin with different compensation and load capacitance for
(a) ILoad = 1 mA, and (b) ILoad = 10 mA.
Fig. 10. Voltage droop and quiescent current with and without adaptive biasing
at typical corner (TT, 25◦ C).
Fig. 12. Distributed power delivery system with n LDO regulators driving a
common power grid.
TABLE III
TRANSIENT STEP RESPONSE AT THE LOAD UNDER LINE AND TEMPERATURE VARIATIONS
1.0 V, 25◦ C 699.7 700.8 0.16 697.5 698.9 0.20 64.5 64.9 0.06
1.1 V, 25◦ C 700.6 701.1 0.07 698.4 699.0 0.09 62.0 61.4 0.09
0.9 V, 25◦ C 698.6 698.3 0.04 696.1 696.0 0.01 71.0 71.1 0.01
1.0 V, 125◦ C 698.1 692.3 0.83 695.6 690.0 0.80 47.9 55.0 1.00
1.0 V, −25◦ C 702.4 704.3 0.27 698.7 702.4 0.53 63.1 63.3 0.03
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5634 IEEE TRANSACTIONS ON POWER ELECTRONICS, VOL. 31, NO. 8, AUGUST 2016
Inna Vaisband, Member, IEEE (M’12) received the Eby G. Friedman (S’80–M’81–SM’90–F’00) re-
bachelor’s degree in computer engineering and the ceived the B.S. degree from Lafayette College, Eas-
master’s degree in electrical engineering from the ton, PA, USA, in 1979, and the M.S. and Ph.D. de-
Technion-Israel Institute of Technology, Haifa, Is- grees from the University of California, Irvine, CA,
rael, in 2006 and 2009, respectively, and the Ph.D. USA, in 1981 and 1989, respectively, all in electrical
degree in electrical engineering from the University engineering.
of Rochester, Rochester, NY, USA, in 2015. From 1979 to 1991, he was with Hughes Aircraft
She is currently a post-doctoral researcher with the Company, rising to the position of Manager in the
Department of Electrical Engineering, University of Department of Signal Processing Design and Test,
Rochester, Rochester. Between 2003 and 2009, she responsible for the design and test of high perfor-
held a variety of software and hardware R&D posi- mance digital and analog IC’s. He has been with the
tions at Tower Semiconductor Ltd., G-Connect Ltd., and IBM Ltd., all in Israel. Department of Electrical and Computer Engineering, University of Rochester,
In summer 2015, she was a Visiting Researcher at Stanford University. Her Rochester, NY, USA since 1991, where he is a Distinguished Professor, and the
current research interests include the analysis and design of high performance Director of the High Performance VLSI/IC Design and Analysis Laboratory.
integrated circuits, analog circuits, and on-chip power delivery and manage- He is also a Visiting Professor at the Technion—Israel Institute of Technology,
ment. Haifa, Israel. His current research and teaching interests include high perfor-
Dr. Vaisband is an Associate Editor of the Microelectronics Journal. mance synchronous digital and mixed-signal microelectronic design and anal-
ysis with application to high-speed portable processors and low-power wireless
communications. He is the author of almost 500 papers and book chapters, 13
patents, and the author or editor of 16 books in the fields of high-speed and low-
power CMOS design techniques, 3-D integrations methodologies, high-speed
interconnect, and the theory and application of synchronous clock and power
distribution networks.
Dr. Friedman is the Editor-in-Chief of the Microelectronics Journal, a Mem-
ber of the editorial boards of the Analog Integrated Circuits and Signal Pro-
cessing, the Journal of Low Power Electronics, and the Journal of Low Power
Electronics and Applications, and a Member of the technical program com-
mittee of numerous conferences. He previously was the Editor-in-Chief and
Chair of the steering committee of the IEEE TRANSACTIONS ON VERY LARGE
SCALE INTEGRATION SYSTEMS, the Regional Editor of the Journal of Circuits,
Systems and Computers, a Member of the editorial board of the PROCEEDINGS
OF THE IEEE, the IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II: ANALOG
AND DIGITAL SIGNAL PROCESSING, the IEEE JOURNAL ON EMERGING AND SE-
LECTED TOPICS IN CIRCUITS AND SYSTEMS, and the Journal of Signal Processing
Systems, a Member of the Circuits and Systems Society Board of Governors,
Program and Technical Chair of several IEEE conferences. He received the
IEEE Circuits and Systems 2013 Charles A. Desoer Technical Achievement
Award, a University of Rochester Graduate Teaching Award, and a College of
Engineering Teaching Excellence Award, and is a member of the University of
California, Irvine Engineering Hall of Fame. He is a Senior Fulbright Fellow.