Cryogenic SPM System 160-V01/Mar.

10

Cryogenic
SPM Systems
Low Temperature
3
He & 4He SPM Operation
• Low temperatures of below 500 mK
in High Magnetic Fields • High magnetic fields of up to 12 T
• Cryostat hold time of up to 160 h
• Continuous SPM operation during
magnetic field variation
• Spring suspension for mechanical
decoupling between cryostat and
microscope

Proven Performance
High-performance SPM operation at
low temperatures and high magnetic
fields puts stringent requirements on
instrument design. With the Cryogenic
series, Omicron has developed a sta-
ble and multifunctional platform for
delicate experimental conditions.
SPM operation at cryogenic temperatures is a
well-established technique and known to be
key to observation of topography and elec-
tronic structure of atoms, clusters, molecules,
islands and surfaces in general. A small lateral
and vertical drift as well as the reduced ther-
mal energy broadening of the local density of
states at low temperatures are ideal pre-condi-
tions for long term spectroscopy experiments.
Furthermore, the reduced surface diffu-
sion allows for atom manipulation including
measurements of the involved forces and the
systematic study of the adsorption behavior of
selected atoms and molecules.
2 Omicron NanoTechnology GmbH
Cryogenic UHV “bottom loader” systems:
a 3He-Cryogenic STM system (in the front) and
a 4He-Cryogenic SFM system in the background.
These properties of a low temperature SPM system
in combination with high magnetic fields open up the
access to a larger variety of measurements like Mag-
netic Force Microscopy, Magnetic Exchange Force Mi-
croscopy or Spin Polarized Scanning Tunneling Micro-
scopy and –Spectroscopy, as shown in the example1).
Bottom Loader Concept
The system concept is based on a bottom loader
cryostat from Oxford Instruments with various magnet
configurations and two alternative cooling techniques: a
pumped 4He variable temperature insert for continuous
STM operation from 2.5 K up to 300 K and a 3He insert
for temperatures below 500 mK.
Two different microscopes are available: a Cryogenic
STM for ultimate STM/STS performance and an inter-
ferometer-based Cryogenic SFM for AFM, STM, and
MFM measurements. Using a rigid vertical manipula-
tor, the cryostat insert with attached microscope can
be transferred to the STM chamber for in-situ tip/
sample exchange (situated below the cryostat). A
second custom-tailored chamber with a fast entry
load lock serves for sample preparation purposes and
additional analysis techniques.
www.omicron.de
Versatility and Accessible SPM Techniques:
• Scanning Tunneling Microscopy and –Spectroscopy
• Spin Polarized Tunneling Microscopy and –Spectroscopy
• Inelastic Tunneling Spectroscopy
• Scanning Force Microscopy and -Spectroscopy
• Magnetic Force Microscopy / Magnetic Exchange Force Microscopy
• Electrostatic Force Microscopy / Kelvin Probe
• Atom Manipulation
• Temperature Variation
• Magnetic Field Variation (Single Axis, 2D- or 3D Vector Field)

Fascinating Results on Spin-Polarized STM:

A B C

Spin-Polarized STM measurements obtained with a previous version of a Cryogenic SFM system at the Max-Planck Institute of
Microstructure Physics in Halle, Germany. Local modulation of spin polarization at 8 K1):

a) Topography STM image of a triangular Co island on Cu(111). The Co island is two atomic layers in height (~0.4 nm) and has a base
length of 12 nm. Ugap=-0.1 V, IT=1 nA.
b) and c) Two dI/dV images of the Co island measured at B=-1.1 T but with different magnetization configurations between the magne-
tic tunneling tip (Cr-Co-W) and the Co island: antiparallel and parallel (see insert).
d) dI/dV asymmetry map calculated from b) and c) showing the local modulation of spin polarization which can be ascribed to the
difference between the spatially modulated density of states of the majority spin and the non-modulated minority spin contribution.

Reference: 1)H. Oka, P.A. Ignatiev, S. Wedekind, G. Rodary, L. Niebergall, V.S. Stepanyuk, D. Sander and J. Kirschner, Science 327 (2010) 843

Omicron NanoTechnology GmbH

3
www.omicron.de
How to contact us
Headquarters: Minneapolis Pittsburgh East Grinstead Linköping Moscow Poznan
Omicron NanoTechnology GmbH
Limburger Str. 75 Beijing

65232 Taunusstein, Germany Seoul

Tokyo
Tel. +49 (0) 61 28 / 987 - 0
Taipei
Fax +49 (0) 61 28 / 987 - 185
Web: www.omicron.de or Mumbai

www.omicron-instruments.com Singapore

e-mail: info@omicron.de

We have agents and partners Sales

worldwide – please check our web- Sales & Service
Denver Madrid St. Cannat Rome Bucharest Riyadh Melbourne Headquarters
site to find your nearest contact.

Technical Information:

Cryogenic STM
Scan range: XYZ = 6.5 µm x 6.5 µm x 0.8 µm at RT
XYZ = 1.2 µm x 1.2 µm x 0.15 µm at 4.2 K

Resolution: atomic resolution STM2)

2D coarse positioning: Z: ~6 mm, X: ~4 mm

4 electrical sample contacts

In-situ exchangeable tip carriers with three electrical contacts

Cernox™ temperature sensor

Cryogenic STM
The microscope provides vertical and lateral
coarse positioning, 4 electrical contacts at
the sample plate, and in-situ exchangeable
tip carriers with three electrical contacts.
Atomic resolution on metal surfaces with pm
range stability and meV energy resolution
prove the performance of the system.
Cryogenic SFM
The Cryogenic SFM is a highly sensitive
interferometric AFM with 3D-coarse posi-
tioning designed for STM, AFM and MFM
measurements. The sample plate provides
10 electrical contacts. Exchangeable sensor
carriers feature 4 electrical contacts.
Measurement modes: STM, STS, IETS, SP-STS, etc.
Cryogenic SFM
Scan range: XYZ = 20 µm x 20 µm x 2.2 µm at RT
XYZ = 3.6 µm x 3.6 µm x 0.39 µm at 4.2 K
Resolution: atomic resolution STM and AFM2)

3D coarse positioning: X/Y: ~5 mm ⌀ circle, Z: ~10 mm

Standard Magnet Configuration & Cryostat (others on request): 10 electrical sample contacts
Vertical magnetic field option: 6T Temperature range:
(higher magnetic fields on request) 4
He pumped insert: 2.5 K – 300 K, continuously In-situ exchangeable tip carriers with four electrical contacts
(achieved: 1.8 K)
3D vector field option: 3
He insert: 500 mK – 100 K Cernox™ temperature sensor
1D: BZ=6T, or BX=1T, BY=1T (achieved: < 400 mK)
2D: BZ=2T and BX or BY=1T Measurement modes: NC-AFM, C-AFM, MFM, KPFM, STM, STS,
3D: BZ=2T plus |BXY|=1T Specified 4He hold time: 60 h (achieved >160 h IETS, SP-STS, etc.
- depending on cryostat configuration, magnet
operation and minimum temperature)

2)
Please refer to quaranteed specifications. Depending
on environmental conditions, site evaluation by Omicron.

Specifications and descriptions contained Cryogenic SPM System 160-V01/Mar.10

in this brochure are subject to alteration without notice. Printed by Druckerei und Verlag Klaus Koch GmbH