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Microelectromechanical Systems
University of Victoria
Dept. of Mechanical Engineering
Lecture 12:
Piezoelectric Sensors & Actuators
Overview
Piezoelectric layer
V
t(piezo)
tb
3 2 Silicon beam
1 w
LA LB
Note: Only the portion of the beam ‘LA’ will be bent due to the
piezoelectric strip.
This is a case of the ‘inverse effect’, therefore:
(In other words, the electric field along direction 3, will cause
strain along direction 1.)
The equation for the strain due to the ‘inverse effect’ can be
written in matrix format as:
Therefore, given the applied electric fields, and assuming the use
of ZnO, the equation for strain due to the ‘inverse effect’ is:
δ(x=LA)
1
where: r
φ
Therefore:
Since the rest of the beam does not bend, the tip deflection of the
entire beam can be defined as:
δ(x=LA)
1
δ(beam)
φ
V
t(piezo)
tb
3 2 Silicon beam
LA LB w
1
L
Top Electrodes
Bottom Electrode
Cross-Section
A-A’
Inside of a typical hard drive, with platter, Multi-platters and Multi-scan heads visible.
voice coil, and scan arm visible. [How Stuff Works.com]
[How Stuff Works.com]
© N. Dechev, University of Victoria 14
Case Study: Hard Drive R/W Head Correction
ENERGY CONTENT
ENERGY DENSITY
TECHNOLOGY (MILLIWATT-HOUR/MILLIGRAM)
Lithium-ion in a chemical battery 0.3
Methanol in a fuel cell* 3
Tritium in a nuclear battery** 850
Polonium-210 in a nuclear battery** 57 000
*Assuming 50 percent efficiency
**Assuming 8 percent efficiency and 4 years of operation
3 When the cantilever bends to the point where the copper 4 The cantilever then oscillates, and the mechanical stress in
sheet touches the radioactive source, the electrons the piezoelectric plate creates an imbalance in its
flow back to it, and the attractive force ceases. charge distribution, resulting in an electric current.