Analytical Instruments for Material Characterizations

Material Characterizations for Compliance with EU Regulations on RoHS

3-5 The flowchart is based on the EU administrative test method that was originally proposed by
Material Characterizations for Compliance with EU Regulations on RoHS
Non-Destructive Simultaneous Screening & Measurements for the six substances the JBCE (Japan Business Council in Europe) in 2003 to the EU for the public administration of
6-9 testing the six substances regulated under RoHS.
Energy Dispersive X-Ray Fluorescence Spectrometer EDX

10 - 11 • Effect of clarifications to applicable exemption status of restricted brominated flame retardants

Wavelength Dispersive X-Ray Fluorescence Spectrometer WDX • Clarification of criteria when evaluating by bromine content in brominated flame retardants
Since RoHS is subject to Article 95 of the EU Treaty, lobbying to harmonize content inspection methods
12 - 16
Optical Emission Spectrometer OES among all EU member countries continues. However, with little progress from the EU itself, the IEC is
considering standardizing inspection methods.
17 - 19
Electron Probe Micro Analyser EPMA

20 - 23 Regulated Substances and

X-Ray Photoelectron Spectrometer XPS EDX EDX maximum Allowable Concentration ELV RoHS Remarks
EDX Levels (Threshold Values)
300ppm>Br Br30000ppm
Cd, Pb, Hg
24 - 26
Scanning Probe Microscope SPM Yes Cd<100ppm Total Br Total Cr No
Cadmium (Cd) 100ppm 100ppm • Of the 6 substances regulated by RoHs, the applicable
exemption status of deca-BDE was decided.
Pb, Hg<1000ppm Cr<1000ppm
(PBB/PBDE) (October 15, 2005)
27 - 29 Lead (Pb) 1000ppm 1000ppm • Threshold values were decided by the committee.
X-Ray Diffractometer XRD 300ppmBr<30000ppm ELV (June 29, 2002) and RoHs (August 29, 2002) and RoHs.
(August 19, 2005)
Mercury (Hg) 1000ppm 1000ppm • The threshold value denominator for both ELV and RoHs is
“homogeneous material”, but this has not been clearly
defined. Therefore, separate guidance notes to provide
Hexavalent Chromium (Cr6+) 1000ppm 1000ppm clarification for RoHs are expected.
No Yes • Board decision regarding ELV appendix II revision

OK OK
(September 30, 2005) eliminated the ELV prerequisite
Failed Polybrominated Biphenyls (PBB) Exempt 1000ppm prohibiting intentional use, Currently, RoHs does not have
Yes No regulations prohibiting intentional use.

OK Polybrominated Diphenyl Ethers

(PBDE)
Exempt 1000ppm
• Be aware that both ELV and RoHs include definitions of
applicable exemption status.

Confirmation analysis performed

when necessary
FTIR
No PBB, PBDE?

NEW
Three Screening Analysis Kits are available to suit
different applications.
Yes
Yes
UV RoHS Screening Analysis Kit
Selective measurement of
Kit for screening cadmium, lead, mercury, chromium, and bromine. Polyethylene samples containing these five elements are
Cr6+ using diphenylcarbazide method supplied in the kit for instrument management.
Failed Cr6+<1000ppm
RoHS and Halogen Screening Analysis Kit
No In addition to cadmium, lead, mercury, chromium, and bromine, this kit also supports the screening of chlorine in plastics.

ICP-AES/MS, AA Yes No
Polyethylene samples containing these six elements are supplied in the kit for instrument management.

Precise measurement of
Cd, Pb and Hg
GCMS RoHS, Halogen, and Antimony Screening Analysis Kit
Precise measurement of
Cd<100ppm PBB and PBDE Failed In addition to cadmium, lead, mercury, chromium, and bromine, this kit also supports the screening of chlorine and antimony
Pb, Hg<1000ppm PBB, PBDE<1000ppm in plastics. Polyethylene samples containing these seven elements are supplied in the kit for instrument management.

Excellence in Science 4 Excellence in Science 5

 Energy
EDX Energy Dispersive X-Ray Fluorescence Spectrometer EDX

Dispersive
X-Ray WINNER OF IBO 2014 GOLD AWARD
Fluorescence
Spectrometer EDX-7000/8000 EDX-7000/8000 NEW No Experience Necessary
Perfect for Beginners
EDX
One EDX over all others Meet FDA 21 CFR Part 11 Requirements
√ Security Functions
NO Liquid nitrogen required • Unique user authentication by ID/password, operation logging and screen locking.

Key Features and Capabilities

√ Operation Log Output Functions
• High performance Silicon Drift Detector (SDD)
• High sensitivity, high resolution & high speed • Allows authorized personnel to output history of user operations or changes of system configuration
• Sleek design with small footprint setting as audit trail logs.
• Solid, liquid, powder & thin film
• Analysis in air, vacuum*, helium-purged* environment
√ PDF Output Functions NO Liquid nitrogen required
• 12-sample turret* for solid & liquid samples
• New intuitive software for RoHS*, halogen*, antimony*,
tin* screening & general applications Model specifically for
• Minimum maintenance required √ Validation Functions RoHS/ELV screening
• Coating thickness measurement • Integrity-checking software is built-in to identify any tempering.
• NO liquid nitrogen required
Elemental Analysis
How It Works
Measurement Range
• EDX-7000 11Na to 92U
EDX Applications for Pharmaceutical Industry
• EDX was adopted as a general analytical method of USP from 1 May 2015.
• Described in USP<735> X-Ray Fluorescence Spectrometry
EDX-LE
An X-ray source irradiates a sample, which in turn emits fluorescent • EDX-8000 6C to 92U
x-rays. The fluorescent X-rays are characteristic of the material. This • Main focus is analysis of impurity Key Features and Capabilities
information is used to identify an unknown sample. • Advantages: No sample preparation, non-destructive analysis and few easy steps (as shown below)
• Solid, liquid, powder & thin film*
• Intuitive software for RoHS, halogen*, antimony*,
The intensity of the X-rays is indicative of the concentration of the
tin* screening & general applications*
material within a sample. If a standard is available, a calibration curve
• Analysis in air environment
can be developed to measure the concentration accurately.
• Minimum maintenance required

NEW
• Coating thickness measurement*
On the other hand, it is possible to estimate the concentration using
• NO liquid nitrogen required
theoretical method in the absence of a standard.

Major Advantages Areas of Application Measurement Range

EDX-7000
Assemble Sample Cup Pack Sample Set Sample for Analysis Select Program & Start • EDX-LE 13AI to 92U
Unlike ICP analysis or AAS analysis • Electrical & Electronic Materials
which requires meticulous sample • Chemical industry
pre-treatments, EDX analysis requires • Petroleum & Petrochemicals Detection Limit of EDX Unit : μg/g
minimum or no sample pre-treatment. • Building & Construction Materials
Quantitation is possible in the absence • Medical Supplies Integration Time Cr Ni As Ru Pd Pt
of a standard. This Is accomplished using • Agriculture and Food Products 300sec 0.4 0.4 0.09 0.6 1.1 0.3
theoretical approximation. • Iron, Steel & Non-Ferrous Metals
• Machinery & Automobiles 1,200sec 0.2 0.3 0.03 0.3 0.5 0.2
• Environment EDX-LE * Optional Item
It was calculated from standard deviation after 10 repeat measurements using cellulose blank sample.

6 Excellence in Science Excellence in Science 7 Excellence in Science 8 Excellence in Science 9

 Wavelength
Dispersive
X-Ray
Fluorescence
Spectrometer

WDX

High Resolution Elemental Analysis

How It Works
An X-ray source irradiates a sample, which in turn emits fluorescent
x-rays. The fluorescent X-rays are characteristic of the material. This
information is used to identify an unknown sample. The intensity of the
X-rays is indicative of the concentration of the material within a sample.
If standards are available, a calibration curve can be developed to
measure the concentration accurately. On the other hand, it is possible to
use theoretical method to estimate the concentration, if a standard is not
available.

Unlike EDX spectrometers, WDX spectrometers use crystals to diffract the

wavelengths of fluorescent X-rays before they reach detectors. As a
result, the WDX spectrometers typically have better resolution several
times over EDX spectrometers.
XRF-1800

Major Advantages Areas of Application

Unlike ICP analysis or AAS analysis
which requires meticulous sample
pre-treatments, WDX analysis requires
minimum or no sample pre-treatment.
For example, grinding a solid sample to
homogenize the compound. Quantitation
is possible in the absence of a standard.
This Is accomplished using theoretical
approximation.
• Electrical & Magnetic Materials
• Chemical industry
• Petroleum & Coal Industry
• Ceramic, Building &
Construction Materials
• Papers & Pulps
• Agriculture and Food Products
• Iron, Steel & Non-Ferrous Metals
MXF-2400
• Environment Pollutants

10 Excellence in Science
 Wavelength Dispersive X-Ray Fluorescence Spectrometer
WDX

Sequential XRF Spectrometer

XRF-1800
Key Features and Capabilities
• Solid, liquid, powder & thin film • World-first 250µm mapping
• Air, vacuum and helium-purged* environment • Qualitative / quantitative analysis using higher order X-rays
• 4kW generator mated to a high performance X-ray tube • Film thickness measurement
• Two detectors (ie. Scintillation Counter & Flow Proportion Counter) • Inorganic component analysis for high-polymer thin film
• Wide-area analysis (ie. 10mm-30mm) • Integrated instrument and workbench design
• Local-area analysis (ie. 500µm-3mm) • High-speed sample loading system

Measurement Range • Standard 8O to 92U • Optional 4Be to 92U

Position 1 Mapping of Rare Earth Ore by XRF-1800

Position 2

Ba Ce La Ca

Multi-Channel XRF Spectrometer

MXF-2400
Key Features and Capabilities
• High throughput with high level of automation • Spectrometer with scanning monochromator*-One detector
• Solid, liquid & powder (ie. Scintillation Counter)
• Air, vacuum and helium-purged* environment • Small foot-print with compact design
• 4kW generator mated to a high performance X-ray tube • High sensitivity
• Simultaneous analysis of up to 36 elements • High precision
• Spectrometer with fixed monochromator-Two types of detector
(ie. Gas Sealed Detector & Flow Proportion Counter)

Measurement Range • 4Be to 92U (Maximum)

Excellence in Science 11
 Optical
Emission
Spectrometer

OES

Highly accurate elemental analysis

of ferrous & non-ferrous metals PDA-8000

How It Works
This analytical technique is commonly known as “arc spark spectrometry”.
This is because it uses a short pulse of electrical spark to transfer energy
to the atoms in the metal samples, which in turn emits lights that are
characteristic of the material. This information is used to identify its
chemical composition. The intensity of the light is indicative of the
concentration of the material within a sample. With standard samples
available, a calibration curve can be developed to measure the PDA-7000
concentration accurately.

Optical emission spectrometers use diffracting grating to diffract the

wavelengths of light before they reach detectors. As there is an array of
detectors, an analysis of tens of elements can be performed within a
minute. Optical emission spectrometers typically are capable of low
detection limit. In Shimadzu’s optical emission spectrometers, various
unique features, such as the time-resolution analysis and pulse distribution
analysis (PDA) photometry, make them the most sensitive and precise
OES on the market. PDA-5500 S

Major Advantages Areas of Application

Unlike ICP analysis or AAS analysis • Steel Industry
which requires meticulous sample • Cast Iron Industry
pre-treatments, OES analysis requires • Aluminium Ingot and
minimum sample pre-treatment. Only Rolling Industry
need to polish the sample surface to • Machinery Manufacturing Industry
make sure it is free from contaminants • Automobile Industry
and is uniformly flat. The analysis is non • Ship-building Industry
PDA-5000
destructive. • Testing Service Industry

12 Excellence in Science
 Optical Emission Spectrometer
OES

PDA-8000
Key Features and Capabilities Time Resolution Pulse Distribution Analysis (PDA)
• Top-tier spectrometer
Photometry
• Paschen-Runge Spectrometer with 1000mm focal length • The discharge conditions to obtain the optimal measurement
providing high resolution measurements sensitivity differ for each spectral line
• Time-Resolution PDA Photometry (Patented Technique) • The table below compares the Background Equivalent
• Temperature-controlled chamber for spectrometer Concentration (BEC) values for a conventional method and
• Vacuum spectrometer enhances sensitivity and the PDA-series
low running cost
• Novel excitation unit with real-time energy monitoring Element C P S B
• Ultra-trace Analysis of high purity materials
Conventional Method (ppm) 160 150 100 80
• Feature-rich software with intuitive interface
• Energy efficient design with “Eco-friendly” label PDA Method (ppm) 80 75 50 40

Constant Regulative Spark (CRS)

Photomultiplier
Discharge
Tube
Defect

Exit Slit Toroidal Mirror Realtime Energy Monitoring Conventional Arc-Like Discharge

Newly Designed Spectrometer A Novel Excitation Unit Light Receptor Constant Monitoring of Ultra Trace Analysis of
Achieves Higher Stability Condensing System the Discharge Status High Purity Materials

Wavelength Range | •120 to 550 nm (ferrous metals) •120 to 700 nm (non-ferrous metals)
Metal Base | • Fe / Al / Cu / Zn / Pb / Sn / Mg / Ni / Ti etc • Single or multi-element base

Excellence in Science 13
 OES

PDA-7000
Key Features and Capabilities
• Mid-tier spectrometer
• Paschen-Runge Spectrometer with 600mm focal length
• Vacuum spectrometer enhances sensitivity and low running cost
• Time-Resolution PDA Photometry (Patented Technique)
• Ultra-trace Analysis of high purity materials
• Choice of discharge types to suit elements and analysis ranges
• High-sensitivity analysis of nitrogen in steel
• Simple operation software with intuitive interface

Wavelength Range • 121 to 481 nm (ferrous metals) • 121 to 589 nm (non-ferrous metals)
Metal Base • Fe / Al / Cu / Zn / Pb / Sn / Mg / Ni / Ti etc • Single or multi-element base

14 Excellence in Science
 Optical Emission Spectrometer
OES

TOP-SELLING MODEL
PDA-5500S
Key Features and Capabilities
• High performance at affordable price
• Great value
• Paschen-Runge Spectrometer with 600mm focal length
• Vacuum spectrometer enhances sensitivity and low running cost
• Time-Resolution PDA Photometry (Patented Technique)
• Ultra-trace Analysis of high purity materials
• Choice of discharge types to suit elements and analysis ranges
• Simple operation software with intuitive interface
• Maximum 24 channels of light receptors
• Three types of factory calibration

Wavelength Range • 121 to 481 nm (ferrous metals)

• 121 to 589 nm (non-ferrous metals)

Metal Base • Fe, AI & Cu based

Excellence in Science 15
 OES

WINNER OF

PDA-5000
NEW
Key Features and Capabilities
• Trace analysis of steel and cast iron
• Software-guided maintenance procedures
• High performance at affordable price
• Paschen-Runge Spectrometer with 600mm focal length
• Vacuum spectrometer enhances sensitivity and low running cost
• New digital excitation source with better performance and less maintenance
• Maximum 24 channels of light receptor
• Simple operation software with intuitive interface

Wavelength Range • 170 to 485 nm

Metal Base • Fe

Summary of Comparisons
PDA-8000 PDA-7000 PDA-5500S PDA-5000
Focal Length 1000 mm 600 mm 600 mm 600 mm

Light Receptors (Max) 64 Channels 64 Channels 32 Channels 24 Channels

Gas Channels Available Available Not Available Not Available

120 to 550 nm (Ferrous)

121 to 481 and 121 to 481 and
Wavelength Range 120 to 700 nm 178 to 481 nm
589 nm 589 nm
(Non ferrous)

Metal Base Single or Multi Single or Multi Fe, Al & Cu Fe

Factory Calibration Various Types Various Types Various Types Various Types

Time-Resolution Time-Resolution Time-Resolution Intensity Integration

Measurement Method
PDA Method PDA Method PDA Method Method

Real-Time Energy Monitoring Available Not Available Not Available Not Available

PDA-R Software Available Not Available Not Available Available

16 Excellence in Science
 Electron
Probe
Micro
Analyser
EPMA

A powerful tool capable of high resolution imaging

and high resolution analysis of chemical composition,
chemical state and even crystalline structure. A far
more superior instrument than scanning electron
microscope with EDX (SEM + EDX).

How It Works
EPMA has an electron gun and a sophisticated optics system. By
varying energy of electron beams, interactions between incident electron
beam and sample produce signals. These signals are captured with
appropriate detectors to yield backscatter images and secondary
electron images. With the presence of an optical microscope, optical
images complement the information provided by electron images.

Wavelength dispersive X-ray fluorescence (WDX) spectrometry is typically

an integral part of EPMA. Instead of X-ray photons as the excitation
energy as in the case of a standalone WDX system, EPMA uses electron
beams to generate the effects. Additional analytical techniques such EPMA-8050G
as energy dispersive X-ray (EDX) fluorescence spectrometry and cathode-
luminescence attachment can be added.

Major Advantages Areas of Application

The superb WDX resolution is the
source of EPMA advantages. It
enables wide range of elemental
analysis and mapping, as well as
chemical state analysis. The latter is
not possible in a SEM with EDX.
• Metal Industry
• Machinery Manufacturing Industry
• Ship-building Industry
• Chemical Industry
• Aerospace Industry
• Materials R&D Industry
• Resources & Energy Industry
EPMA-1720 Series
• Semiconductor & Electronic Industry

Excellence in Science 17
 EPMA

NEW
CUTTING-EDGE FE ELECTRON
OPTICAL SYSTEM

EPMA-8050G
Key Features and Capabilities
• High brightness Schottky electron source (ie. Field Emission or FE)
• 3nm - highest Secondary Electron Image resolution for an EPMA
• Ultra high sensitivity analysis
• Ultra high resolution mapping
• Chemical State Analysis
• Wavelength Dispersive X-Ray (WDX) Spectrometer
• Secondary Electron Imaging
• Backscatter Electron Imaging
• Optical Microscope Imaging
• Mapping
• Magnification 400,000x
• Cathode-Luminescence attachment*

Unprecedented Spatial Resolution Ultra-High Sensitivity

FE CeB6 Tungsten

100nA
10nA

5µm

500nA
100nA

5µm

This current This current

1µA cannot be set cannot be set 1.5µA

5µm
Comparison of Electron Gun Beam Characteristics (10 kV accelerating voltage)
Mapping Analysis of 1% Si in Stainless Steel
(10 kV accelerating voltage)

Elemental Range • Standard 5B to 92U • Optional 4Be to 92U

18 Excellence in Science
 Electron Probe Micro Analyser EPMA

EPMA-1720 Series
Key Features and Capabilities
• 5nm - Secondary Electron Image Resolution • Backscatter Electron Imaging
• High resolution mapping • Optical Microscope Imaging
• Chemical State Analysis • Mapping
• Wavelength Dispersive X-Ray (WDX) Spectrometer • Magnification 400,000x
• Secondary Electron Imaging • Cathode-Luminescence attachment*

Maintains the 52.5° X-ray take-off angle that is fundamental to analytical performance. SEM Observation Mapping Analysis

❶ ❷

Analysis data for foreign matter in a pit. ① is the distribution of iron (Fe); ② is the distribution of titanium (Ti). Image of Tin Balls Analysis of solder
The high take-off angle used by the EPMA-1720 ensures highly accurate analysis of rough samples. Magnification: 10,000x Element: Pb; region 14 × 14 μm

Elemental Range • Standard 5B to 92U • Optional 4Be to 92U

Excellence in Science 19
 X-Ray
Photoelectron
Spectrometer

XPS

X-Ray Photoelectron Spectrometer (XPS) analyses

the chemical compositions and chemical state in a
material. Sampling depth is typically 10nm. It is
a critical tool for material failure analysis as well
as cutting-edge material innovation and
development. XPS is also known as Electron
AXIS SUPRA
Spectroscopy for Chemical Analysis (ESCA).

How It Works
An X-ray source imparts photons of energy onto sample. The
absorbed energy causes some electrons to break free from its shell and
eject out. They are guided and assisted towards a detector by electrostatic
and magnetic lens in a ultra high vacuum atmosphere. XPS has
spectroscopy and imaging capabilities. It can measure all the elements
except hydrogen (Z=1) and helium (Z=2). Modern XPS is also capable of
multiple analytical techniques, eg. auger electron spectroscopy (AES)
AXIS NOVA
and ultra-violet photoelectron spectroscopy, that increase its
functionality.

Major Advantages Areas of Application

High resolution analysis of surface • Semiconductor • Biotechnology
of materials. Wide applications • Catalyst • Fabric
in various industries. • Thin film coating • Glass
• Polymer & plastic • Battery
• Magnetic memory • Cosmetics
Amicus
• Nanotechnology

20 Excellence in Science
 X-Ray Photoelectron Spectrometer
XPS

NEW

ARGUABLY THE BEST XPS

ON THE MARKET

AXIS SUPRA
Key Features and Capabilities
• State-of-the-art specifications in the XPS world
• Unrivalled automated sample handling and ease of use
• High resolution and high sensitivity spectroscopy
• New Windows-based control software - ESCApe
• Small spot size: < 15µm
• Lateral resolution: 1µm
• Delay-Line Detector (DLD) with 128 detector channels
• 180º Hemispherical analyser (HSA) for spectroscopy
• Spherical mirror analyser (SMA) for parallel imaging
• High power Al monochromator X-ray source with 500mm Roland circle
• Fully automatic electron-only charge neutralizer
• Scanned and snapshot spectroscopy modes
• 2D imaging
• Multi-technique capabilities including Scanning Auger Microscopy (SAM)
Schottky Field Emission Source, Ion Scattering Spectroscopy (ISS),
Secondary Ion Mass Spectrometry (SIMS) & Ultraviolet Photoelectron Spectroscopy (UPS)

Excellence in Science 21
 XPS

AXIS NOVA
Key Features and Capabilities
• Superb automated sample handling with the best specifications in the world
• Ideal for QA and problem solving tasks
• Delay-Line Detector with 128 detector channels
• 180° Hemispherical analyser (HSA)
• Spherical mirror analyser (SMA)
• High resolution and high sensitivity spectroscopy
• Small spot size, < 15µm
• High power Al monochromator with 500mm Rowland circle
• Fully automatic charge neutralizer
• Scanned & snapshot spectroscopy modes
• 2D imaging mode
• Compact footprint

22 Excellence in Science
 X-Ray Photoelectron Spectrometer XPS

LOW COST, HIGH PERFORMANCE XPS

Amicus
Key Features and Capabilities
• Compact & versatile XPS ideal for routine laboratory analysis
• Rapid sample introduction system
• Automated carousel for multiple samples
• Dual anode (Mg & Al source)
• Single channeltron detector with low/high pass filter
• Integrated ion etching source
• Single technique system

Excellence in Science 23
 Scanning
Probe
Microscope

SPM

Sample observation down to atomic resolution.

It is used for surface morphologic and topographic
study.

How It Works
SPM consists of a cantilever with a sharp tip at its end that is used to scan
the sample surface. When the tip is brought into close range of a surface,
forces between the tip and surface cause a deflection of the cantilever. A
laser spot is used to measure the deflection by reflecting it off the top
surface of the cantilever onto a detector. Several forces can be imaged,
measured and even manipulated. Some common examples are mechanical
contact force, magnetic force, electric current etc. Measurements can be
done in air, vacuum or liquid environment. Effects of temperature,
humidity, gas and electrochemistry on samples can be studied.

Major Advantages
Ultra high resolution analysis
of surface of materials.
A wide variety of sample
characteristics can be
analysed. Relevant to a
big spectrum of industry.
SPM-8000FM
Areas of Application
• Living organisms, eg. E.coli bacteria
• Metals, eg. boundary surface of plating layer
• Non metals, eg. ferroelectric domains
• Minerals, eg. observation of calcite in solution
• Ceramics, eg. film dispersed with silica
• Polymers, eg. Li-ion battery separator
• Powders, eg. toner particle
• Nanotechnology, eg. rendering images using
electric potential
• Thin films, eg. cross-section of the film
• Semiconductors, eg. electric potential analysis of
organic thin film transistor
SPM-9700
• Coatings, eg. baking finished surface

24 Excellence in Science
 Scanning Probe Microscope
SPM

SPM-8000FM
NEW
Observation and measurement of hydration /
solvation are possible now

Key Features and Capabilities

• Ultra-high resolution observation in air or liquids
• Performance level on par with a vacuum-type SPM
• Uses Frequency Modulation method
• Headslide mechanism gives stability
• Headslide mechanism enhances efficiency
• Small footprint

SPM-9700
Key Features and Capabilities
• Highly versatile with a wide range of scanning modes
• Headslide mechanism gives high stability
• Headslide mechanism enhances efficiency
• Design is resistant to vibration, wind & noise without a need for a special external enclosure
• Wide variety of 3D rendering functions using mouse operations
• SPM observation in liquid medium
• SPM observation in humidity, gas, temperature, lighting controlled environment
• Small footprint

Excellence in Science 25
 SPM

NANO SEARCH MICROSCOPE

NEW
OLS-4500
3-in-1 Integrated Microscope:
Optical / Laser / Probe

Key Features and Capabilities

• Integrated Optical / Laser Scanning / Scanning Probe Microscope
• Seamless Accurate Measurement from millimeters to nanometers
• Never lose sight of target when switching from one microscopic observation
to another
• Significant reduction in measurement time
• Ultra-wide range of observations

20 µm 5 µm

64 µm 1280 µm

256 µm 640 µm

26 Excellence in Science
 X-Ray
Diffractometer

XRD

To study crystallographic properties such as

phases, angles and distance between planes etc.
These pieces of information are useful as they
indicate properties such as strengths, chemical
signature, ease of dissolvation etc. OneSight

How It Works
This analytical technique is non destructive. X-rays focused on a sample
fixed on the axis of the goniometer are diffracted by the sample. The
changes in the diffracted X-ray intensities are measured and plotted
against the incident angles of the sample. Qualitative and quantitative
analysis can be performed.

Major Advantages Areas of Application XRD-7000

X-Ray diffractometry offers • Metal Industry

critical information that no
other techniques could match.
It is easy to set-up and operate.
Interpretation of results is
boosted with commercially
available databases.
• Machinery Industry
• Ship-building Industry
• Chemical Industry
• Cement, Ceramic & Glass Industry
• Pharmaceutical Industry
• Resources & Energy Industry
• Electrical & Electronic Industry
• Construction & Engineering Industry
• Environment & Waste Management Industry
XRD-6100
• Testing Service Industry

Excellence in Science 27
 XRD

OneSight Wide-Range
High-Speed Detector
High-Speed Detector With 1280 Channels Achieves
High-Speed, High-Sensitivity Performance

The OneSight consists of a semiconductor Si sensor array. It achieves an intensity
approximately 100 times higher than that obtained by a scintillation detector. The
OneSight can also perform wide-angle range measurement without a scanning
goniometer for significantly higher throughput. It can be easily mounted on existing
XRD-6100/7000 units at customers’ sites*.

*It is necessary to set up the OneSight parameters during the initial installation. It may be necessary
to update the software and hardware. For more details, please contact your representative.

ONE SHOT Function Achieves

Simultaneous Measurement of
Diffration Profile at a Wide
Range Angle

The OneSight can perform a simultaneous
diffraction profile measurement at more than
10 deg. angle range without a scanning
goniometer. This is useful for quantitative
when using a specified diffraction peak.

NEW Standard Sample Data of Asbestos (Chrysotile)

(30 sec. measurement time per sample)

High-Speed Quantitative
Analysis using Three
Types of measurement
Modes

The OneSight features three kinds
of measurement modes: High
Solution, Standard, and Fast. It
enables measurement speed 10
times faster (high resolution), 15
times faster (standard), and 25
times faster (fast) than those
attained with a scintillation detector.

28 Excellence in Science
 X-Ray Diffractometer
XRD

XRD-7000
Key Features and Capabilities
• Theta-theta goniometer
• High-speed rate (1000°/min)
• Ultra-precision angle reproducibility (0.0002°)
• X-Rays are turned on during analysis ONLY
• Compact design
• Simple operation with intuitive interface
• Wide range of optional attachments for
conceivable applications

W
NE XRD-7000 & XRD-6100
Meet FDA 21 CFR Part 11 Requirements

XRD- 6100
Key Features and Capabilities
• Theta-Two theta goniometer
• High-speed rate (1000°/min)
• High-precision angle reproducibility (0.001° for two theta)
• X-Rays are turned on during analysis ONLY
• Compact design
• Simple operation with intuitive interface
• Wide range of optional attachments for
conceivable applications

Excellence in Science 29
 Our Partners
Bangladesh
AQ Chowdhury Science & Synergy
Baridhara Central Plaza, Floor 2,
87 Suhrawardy Avenue, Baridhara,
Dhaka – 1212, Bangladesh
Tel: (880-2) 986 2272
Fax: (880-2) 885 4428
Email: aqcss@citech-bd.com
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Asterix United (B) SDN BHD
Unit 8, 1st Floor, Block A,
Complex Sutera, SPG 68,
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Negara Brunei Darussalam
Tel: (673) 2333 832 / 2333 833
Fax: (673) 2333 831
Email: asterixub@brunet.bn
India
Shimadzu Analytical (India) Pvt. Ltd.
1 A/B Rushabh Chambers,
Makwana Road, Marol, Andheri (E),
Mumbai 400 059, India
Tel: (91-22) 2859 5696
Fax: (91-22) 2859 5679
Perfomax Analytical
704, Crystal Paradise,
Veera Desai Road Andheri (W),
Mumbai - 400053, India
Tel.: (022) 26731868
Fax: (022) 26731869
Email: nainesh@perfomaxtech.com
www.perfomaxtech.com
Indonesia
PT Ditek Jaya
Kedoya Elok Plaza, Blok DA No, 12,
Jl Pangjang, Kebon Jeruk, J
arkarta – 11520,Indonesia
Tel: (62-21) 580 6862
Fax: (62-21) 580 7161
30 Excellence in Science
Malaysia Sri Lanka
QC Scienctific (M) Sdn Bhd Hayleys Lifesciences (Pvt) Limited
11A Jalan PBP11, 25 Foster Lane, Colombo 10,
Taman Industrian PBP, 47100 Puchong, Sri Lanka.
Selangor Darul Ehsan, Malaysia Tel: (94) 11 269 9100
Tel/Fax: (60-3) 8062 3988 (94) 11 267 4578
www.qcscientific.com.my
Thailand
Myanmar Bara Scientific Co., Ltd.
Amtt Co., Ltd 968 Rama 4 Road, Silom Bangrak,
5/ Sah-B Aung Mingalar Street, 4 Qtr, Bangkok 10500, Thailand
Mayangone 11061, Yangon, Myanmar Tel: (66-2) 632 4300
Tel: (951) 666 802, 656 453 Fax: (66-2) 637 5497
(951) 656 819 www.barascientific.com
Fax: (951) 667 609
Vietnam
Nepal TECOTEC Co
Pacific Commercial Company (P) Ltd 2nd Floor, CT3A Building,
Pacific Building Ramshah Path Me Tri Thuong Urban Zone Tu Liem,
P.O.Box 347 Kathmandu, Nepal Hanoi, Vietnam
Tel: (977 1) 4430525 /1525 Tel: (84-4) 3576-3500
Fax: (977 1) 4430413 Fax: (84-4) 3576-3498
Email: bijendra@pacific.nepal.com Email: hanoi@tecotec.com.vn
www.pacific-nepal.com www.tecotec.com.vn
Pakistan
Technology Links Pvt Ltd
4/11-12 Rimpa Plaza,
MA Jinnah Road, Karachi – 744002,
Pakistan
Tel: (92-21) 273 4260/1
(92-21) 272 2047/9426
Fax: (92-21) 273 0728
Tlx: 25513 MTL PK
Philippines
Shimadzu Philippines Corporation
11/F Sun Life Centre,
5th Avenue corner Rizal Drive,
Bonifacio Global City, Taguig City 1634,
Philippines
Tel: (632) 869-9563 
Fax: (632) 519-9285
Notes:

Excellence in Science 31
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TEL: 6778-6280 FAX: 6779-2935 Enquiry: sales@shimadzu.com.sg
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