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2 degrees
CHARACTERIZATION OF THE STRUCTURE OF SOLIDS
X-rays interact with electrons in matter, i.e. are scattered by the electron clouds of
atoms
The angles at which x-rays are diffracted depends on the distance between adjacent
layers of atoms or ions.
Scattering of x-rays by crystallographic planes
We need to consider how x-rays are diffracted by parallel crystallographic planes
lattice planes d
atoms on
lattice planes
X-rays diffracted in phase will give a signal. “In phase” means that the peak of one
wave matches the peak of the following wave
A single monochromatic wave (of any type) is incident on aligned planes of lattice
points, with separation d, at angle θ,
The two separate waves will arrive at a point with the same phase, and hence
undergo constructive interference, if and only if this path difference is equal to any
integer value of the wavelength
n = 2dsin
AB = BC = d/sin
AC = 2d/tan
AC' = (2d/sin)cos2
2d/sin(1-cos2) = n
2dsin = n
Inter-Planar Spacing, dhkl, and Miller Indices
Distances between planes defined by the same set of Miller indices are
unique for each material
dhkl
d'h’k’l’
Distances between planes defined by the same set of Miller indices are
unique for each material
dhkl
The expressions for the remaining crystal systems are more complex
ICDD
Systematic Absences
Permitted Reflections
Essentially there are six affecting the relative intensity of the diffraction lines on a
powder pattern:
1 cos 2 2 2 M
I F p 2 e
2
sin cos
Structure Factor
1 cos 2 2 2 M
I F p 2 e
2
sin cos
Fhkl f n e
N
2i ( hu n kvn lwn )
n i
To calculate F is necessary to account for the scattering waves generate for each
individual atoms of the unit cell and the scattering waves resulting from the
arrangement of the same in the diffracting planes
Structure Factor (atoms scattering)
the coherent scattering, not from an isolated atom, but from all the atoms making up
the crystal, means that the scattered radiation is severely limited to certain definite
directions and is now referred to a set of diffracted beams.
2’ (h00)
2 '1' 2d h 00 sin
1’
M
A C
a
d h 00 AC
h
N
1
2
a
x
Atom A is radiated by beam 1, at an angle , in such a way there is coherent
diffraction at h00, meaning that Bragg’s law is fulfill by the interplanar distance 2’1’
Structure Factor (atoms scattering)
How is this reflection affected by x-rays scattered in the same direction by atom B,
located at a distance x from A?
If the same analysis is done for (0h0) and (00h): 2 hu kv lw
Structure Factor (plane scattering)
Not only beam interaction with atoms may change de direction of diffraction but also
affect the amplitude (electric field) of the diffracted beam; the electric field intensity is
defined as:
E2 A2 sin 2t 2
and in phase .
E1 A1 sin 2t
E1 E2 E3
Structure Factor (plane scattering)
Being E3 a sine function it may be expressed by either identities:
Ae i A cos Ai sin
Since the intensity of a wave is proportional to the square of its amplitude,
we now need an expression for A2
Ae i 2
Ae i Ae i A2
The term A2 is the wave amplitude due to the interaction of the incident beam with
the atom in the plane, is value is given by (atomic scattering factor)
Intensity of diffracted beam
The factors governing diffracted intensity in the powder method is similar to the one
of monochromatic radiation.
Essentially there are six affecting the relative intensity of the diffraction lines on a
powder pattern:
1 cos 2 2 2 M
I F p 2 e
2
sin cos
Structure Factor and Symmetry Absences
a) Primitive cell
1 cos 2 2 2 M
I F p 2 e
2
sin cos
Fhkl f n e
N
2i ( hu n kvn lwn )
000
n i
F fee 2i ( 0 )
f
F f
2 2
Fhkl f n e
b) Base centered N
2i ( hu n kvn lwn )
n i
F f ee 2i ( 0 )
fee 2i ( h 2 k 2 )
000
½½0 F f 1 e i ( hk )
n i
000
F f 1 e i ( hk l )
Fhkl f n e
0½½ N
2i ( hu n kvn lwn )
½0½
000 n i
½½0
F f ee 2i ( 0 )
fee 2i ( h 2 k 2 )
fee 2i ( k 2 l 2 )
fee 2i ( h 2 l 2 )
F f 1 e i (hk )
e i ( k l )
e i ( hl )
(h,k), (h,l), (k,l) mixed (h,k), (h,l), (k,l) unmixed ei e 3i e 5i 1
1
F 0, F 0
e e e
F 4 f , F 2 16 f
2i 4i 6i
2 2
e i e i 2 cos x
Structure Factor calculations
(NaCl)
Na Cl
000 ½½½
½½0 00½
½0½ 0½0
0½ ½ ½00
F f Na (1 e i ( h k ) fe i(k l )
fe i(h l )
f Cl 1 fe i(h k l )
fe il
fe ik
fe ih
Structure Factor calculations
(NaCl)
F 1 ei(hk) ei(kl) ei(hl ) fNa fClei(hkl)
F 0 F 0
F 4 f
2
mixed
unmixed Na f Cl e i ( h k l )
F 4 f Na f Cl
(h+k+l) even
F 4 f Na f Cl
(h+k+l) odd
F 16 f Na f Cl F 16 f Na f Cl
2 2 2 2
Intensity of diffracted beam
The factors governing diffracted intensity in the powder method is similar to the one
of monochromatic radiation.
Essentially there are six affecting the relative intensity of the diffraction lines on a
powder pattern:
1 cos 2 2 2 M
I F p 2 e
2
sin cos
Multiplicity Factor
Essentially there are six affecting the relative intensity of the diffraction lines on a
powder pattern:
1 cos 2 2 2 M
I F p 2 e
2
sin cos
Lorentz Polarization Factor
1 cos 2 2
LPF
sin cos
Intensity of diffracted beam
The factors governing diffracted intensity in the powder method is similar to the one
of monochromatic radiation.
Essentially there are six affecting the relative intensity of the diffraction lines on a
powder pattern:
1 cos 2 2 2 M
I F p 2 e
2
sin cos
Temperature factor
f f 0e M
For cubic crystal structures where
x
A
x sin
x 4
x m
6h T 2
M T N
mk 6h T 11500T
mk
A
x
T
1 cos 2 2 2 M
I F p 2 e
2
Fhkl f n e
x sin
x
6 h T
2
2
N
1 cos 2 2 e mk 4
2i ( hu n kvn lwn )
LPF
From tables
sin cos
n i From tables
Tables
Intensity calculation for Cu
Smaller Crystals Produce Broader XRD Peaks
Scherrer’s Formula
K
t
B cosB
t = thickness of crystallite
K = constant dependent on crystallite shape (0.89)
= x-ray wavelength
B = FWHM (full width at half max) or integral breadth
B = Bragg Angle
Scherrer’s Formula
What is B?
Peak
B is the difference in
angles at half max Noise
When to Use Scherrer’s Formula
No Strain 2
Uniform Strain
d strain 2
Non-uniform Strain
2
d
Broadeing b 2 2 tan
d
Typical artifacts and
mistakes on XRD
operation and analysis
1. Irradiated area and
penetration depth
Slit Settings
Slit Settings, effect on the XRD
profile
How to avoid irradiated area problems, sample
preparation
2. Equipment geometry
3. Sample Preparation
(Common Mistakes and Their Problems)
• Z-Displacements
– Sample height matters
– Causes peaks to shift
• Sample orientation of single crystals
– Affects which peaks are observed
• Inducing texture in powder samples
– Causes peak integrated intensities to vary
Z-Displacements
Detector
011
θ
Disp 2θ
110
111
200
002
111 002/200
Z-Displaced Fit
Disp.=1.5mm
Disp
200
220
111 222
311
2
At 27.42 °2, Bragg’s law The (200) planes would diffract at 31.82 The (222) planes are parallel to the (111)
fulfilled for the (111) planes, °2; however, they are not properly planes.
producing a diffraction peak. aligned to produce a diffraction peak
For phase identification you want a random powder
(polycrystalline) sample
200
220
111 222
311
2 2 2
• When thousands of crystallites are sampled, for every set of planes, there will be a small
percentage of crystallites that are properly oriented to diffract
• All possible diffraction peaks should be exhibited
• Their intensities should match the powder diffraction file
Sample Preparation