Documente Academic
Documente Profesional
Documente Cultură
Q2 : We insert BIST logic to Test Memories ,So how to test that bist logic inserted?
Ans : Bist logic consists of flipflops and combi logic, so this bist logic becomes a part of
scan chain and is tested during scan test mode.
Ans : No Timing : Basically no timing simulations are done to check the Design(setup)
related errors.In this, we test for zero delay and unit delay conditions , for this we consider
SDC.
Timing : Timing simulations are done to check where our design is able to meet all the timing
constraints properly or not. For this we consider SDF file(delay information file) which is
provided by STA team
Q4 : Consider Two flops and specify where there is chance for delays and what type of
delays?
Ans : A path has a start point and an end point.
Start point - All input ports/pins or clock ports/pins of sequential cells are considered
as start points.
End points - All output ports/pins or D pin of sequential cells are considered as end
points.
Based on the above mentioned start point and end point, there are four types of timing
paths based on direction.
1. Input to Register - Start point is an input pin/port and end point is the D pin/port of a
register (flipflop). It might include both combinational and sequential cells.
2. Register to Register - Start point is the CLK pin/port of a register (flipflop) and end point
is the D pin/port of next register (flipflop). Also, this type of path might include
combinational and sequential cells.
3. Register to Output - Start point is the CLK pin/port of a register (flipflop) and end point is
an output pin/port. Both sequential and combinational cells are included here.
4. Input to Output - Start point is an input pin/port and end point is an output pin/port. It
includes combinational cells only.
5. Clock path - The timing path which is fully traversed by clock signals is called as Clock
path. In a clock path, there could only be clock inverters or clock buffers.
Clock paths are further categorized into two types.
Launch path - The timing path which is traversed by the clock signal from source pin
to launch register (flipflop) CLK pin (FF1 in Figure).
Capture path - The timing path which is traversed by the clock signal from source pin
to capture register (flipflop) CLK pin (FF2 in Figure).
6. Data path - The timing path which is fully traversed by data signals is called as Data path.
In a data path, there could be combinational cells, data buffers etc.,
7. Cell delay : CMOS transistors inside a standard cell takes finite amount of time to
switch from one logic state to another. This time taken is called as the cell delay or
the propagation delay of a cell which is typically specified in the cell timing library
8. Net delay : Interconnect delay or net delay is due to the physical wire (metal traces
having resistances and capacitances) of a logical net (i.e. between a driver and
load/loads). All net timing arcs are positive unate. This is because there can be either
rise-rise transition from driver to load or fall-fall transition from driver to load.
Q5 : What is PVT ?
Ans : PVT is abbreviation for Process, Voltage and Temperature. In order to make our chip to
work in all possible conditions, like it should work in Siachen Glacier at -40°C and also in
Sahara Desert at 60°C, we simulate it at different corners of process, voltage and temperature
which IC may face after fabrication. These conditions are called as corners. All these three
parameters affect the delay of the cell.
Q6 : Best and worst Conditions for PVT ? / What Specifies Max and Min ?
Process : 1 Process : 1
Ans :
Ans: In DFT, we test for the manufacturing faults. To detect these manufacturing faults there
are different fault models,Based on algorithms we determine the various faults that can arise
when the chip fabricated in the fabrication labs. SAF and TDF are two such models
Stuck-at Fault model tells us that a particular net/wire is either stuck-at 0 (connected to
ground/VSS) or stuck-at 1 (connected to Power/VDD)
Transition fault model falls under the delay fault model which tells us that a particular node is
able to make a transition from 0->1 or vice-verse at maximum operating frequency of design
. The two possible faults are slow-to-fall and slow-to-rise.
DFT : Dft is used to detect the manufacturing defects by adding an extra logic to the design to
attain controllability and observability over the design
Hold Time: the amount of time the data at the synchronous input (D) must be stable after the
active edge of clock
Q14 : What are the scan violations you faced and how did you debug them?
Ans: I have faced uncontrolled clock and uncontrolled set/reset violations. When all the flops
in design are not controlled globally then we get these violations because for a design to be
DFT ready we should have global controllability and observability. For debugging these
violations we need to check the dft drc’s using the command check_dft_rules(cadence). Once
you have known that there are internally driven clocks there are two major ways of getting
back the controllability.
a. Auto fixing the issue using the command fix_dft_violations.
b. Inserting a test point so as to bypass the logic while testing.
Q16 : If we insert Test point by keeping always test enable high then do functionality
verification effect or not?
Ans : Yes it effects functional verification , we cant perform functional verification when test
enable is high.
Q24 : Rather than blackboxes and unwanted Pin constraints did you notice any other low
coverage issues ?
Ans : AU , ND faults
If the enable signal is driven by a large cone of logic, you can increase the coverage
by adding a "force transparent on" gate close to the enable of the latch, and add an observe
flip-flop just before the added gate, so that most of the faults in the logic cone can be
recovered.
Without modifying the circuitry, recovering fault coverage in ATPG really depends on how
these latches are used in the functional path.
Q26 : Did you face clock as data violation anytime ? How did you debug it?
Ans : Yes, A clock that affects the data input of a register reduces the fault coverage.
By inserting test point you can avoid this violation.
Q27 : Do there is need of checking Stuck-at even after transition patterns are detected at each
node?
Ans : if you attain 100% coverage for transition faults then no need to do stuck-at or else you
have to check for stuckat fault also.
Q28 : Even though your scan insertion is perfect why scan chain tracing issues will come in
atpg?
Ans : After Scan insertion , the scan inserted netlist will go to P&R team for scan chain re-
ordering ,so due to this we get scan chain tracing issue
Ans :
Q38 : Why opcg and explain it with wave forms how two pulses are generated?
Ans : OCC is on chip clock, which is mainly used generate atspeed pulses to detect
transition faults
LOS LOC
It is necessary that the timing path should be same as the functional path. i.e., clocks should
be the same in both functional & at-speed test mode. Whatever methodology (Launch On
Shift / Launch On Capture) is required to meet this requirement should be implemented.
There are other critical factors that will also drive to LOS / LOC implementation.
2. Whether, tester can support multiple waveforms on the same clock pin.
3. How do you handle scan enable to switch between shift & capture modes.
Most of the designs that have internal clock generators implement LOC method for testing.
a) For LOS the scan enable has to closed at functional frequency (which may result in gate
count increase with addition of large buffers), whereas in LOC the timing on scan enable can
relaxed between the last shift and launch cycle.
b) LOS atpg run time is less compared to the LOC for pattern generation.
I) Launch on last shift - In this method, during the last shift itself, we will shift in the required
value in to the flop which will create the required transition on the intended node.
Advantages: 1) Tool has the controllability to put the required value in to the flop to cause
transition.
2) We will get good coverage as we are launching the value through SD path.
II) Launch on capture - In this method, the flop which creates the launch on the intended node
will get the value through D path. Scan-enable will be low during this time.
Disadvantages: 1) We may loose some coverage as the value is launched through D path.
Its always better to go with LOS, The major advantage with LOS is increased coverage and
reduction in number of patterns. When the no of patterns decreases, the test time reduces,
which in turn reduces the cost for test time to a great extend.
Q44 : Is there any possibility of using one occ if you have two clocks other than testclock
Ans : Yes, (Refer : http://ijrect.com/issues/vol3issue3/ramkumar.pdf)
Q49 : What are the signals that we define while we insert opcg ?
Ans : opcg enable,opcg load,opcg load clock.
Q51 : How you are giving the controlling information for the clock to toggle in atspeed
pulses if two or more clocks are present?
Ans : By defining load-unload,capture procedures in spf
Q57 : How many blocks in your Design and how many did you handle ?
Ans : In our Design we have 8 blocks and I have worked on 2blocks
Q65 : What was your coverage for stuck at and transition faults?
Ans : stuck at : 99 , transition : 91
Q66 : How many capture cycles initially?
Ans : 2
Lfsr is the technique used in Mentor Graphics (EDT Architecture) which is designed with
flops and logic gates
Q72 : What happens if we have positive triggered flops followed by negative triggered flops?
Ans : In single cycle loading and unloading of data happens so to avoid this we use lockup
latch and provide half cycle delay so as to attain good capture of data
Q73 : if serial fails chain test also fails ,what is the reason?
Ans : chain consist of scan flops which are connected in series,so if serial fails chain test
fails.
Q79 : If you have 2 clocks with 55mhz, 1ghz ,which frequency will u use for shifting and
why?
Ans we use low frequency for shifting to avoid power desipation