Documente Academic
Documente Profesional
Documente Cultură
NOTE: When ordering, use the entire part number. Add the suffix 9A to
obtain the TO-252AA variant in the tape and reel, i.e., RFD14N05LSM9A. S
Packaging
JEDEC TO-251AA JEDEC TO-252AA
JEDEC TO-220AB
SOURCE
DRAIN
GATE
DRAIN (FLANGE)
www.DataSheet4U.com
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. TJ = 25oC to 150oC.
Thermal Resistance Junction to Ambient RθJA TO-251 and TO-252 - - 100 oC/W
Diode Reverse Recovery Time trr ISD = 14A, dISD/dt = 100A/µs - - 125 ns
NOTES:
2. Pulse Test: Pulse Width ≤300ms, Duty Cycle ≤2%.
3. Repetitive Rating: Pulse Width limited by max junction temperature. See Transient Thermal Impedance Curve (Figure 3) and Peak Current
Capability Curve (Figure 5).
1.2 16
POWER DISSIPATION MULTIPLIER
1.0
0.6 8
0.4
4
0.2
www.DataSheet4U.com
0 0
0 25 50 75 100 125 150 175 25 50 75 100 125 150 175
TC , CASE TEMPERATURE (oC) TC, CASE TEMPERATURE (oC)
FIGURE 1. NORMALIZED POWER DISSIPATION vs CASE FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs
TEMPERATURE TEMPERATURE
1
THERMAL IMPEDANCE
0.5
Zθ JC, NORMALIZED
0.2
PDM
0.1
0.1
0.05 t1
0.02 t2
0.01
NOTES:
SINGLE PULSE DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x Zθ JC x Rθ JC + TC
0.01
10-5 10-4 10-3 10-2 10-1 100 101
t, RECTANGULAR PULSE DURATION (s)
100 200
TC = 25oC TRANSCONDUCTANCE FOR TEMPERATURES
ABOVE 25oC DERATE PEAK
IDM, PEAK CURRENT CAPABILITY (A)
100 175 - TC
I = I25
150
100µs
10
1ms
10ms
OPERATION IN THIS
AREA MAY BE 100ms VGS = 5V
1
LIMITED BY rDS(ON) DC VGS = 10V
TC = 25oC
0.5 10
1 10 100 10 -5 10-4 10-3 10-2 10-1 100 101
VDS, DRAIN TO SOURCE VOLTAGE (V) t, PULSE WIDTH (s)
FIGURE 4. FORWARD BIAS SAFE OPERATING AREA FIGURE 5. PEAK CURRENT CAPABILITY
50 35
VGS = 10V VGS = 5V
IAS, AVALANCHE CURRENT (A)
30 VGS = 4.5V
VGS = 4V
15
STARTING TJ = 150oC
10 VGS = 3V
If R = 0
tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD)
5 VGS = 2.5V
If R ≠ 0
tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS-VDD) +1]
1
www.DataSheet4U.com 0
0.01 0.1 1 10 0 1.5 3.0 4.5 6.0 7.5
tAV, TIME IN AVALANCHE (ms) VDS, DRAIN TO SOURCE VOLTAGE (V)
35 250
IDS(ON), DRAIN TO SOURCE CURRENT (A)
-55oC ID = 28A
ID = 7A ID = 14A
30
25oC 175oC rDS(ON) , DRAIN TO SOURCE 200
ON RESISTANCE (mΩ)
25
150
20
15 ID = 3.5A
100
10
PULSE DURATION = 80µs 50
5 DUTY CYCLE = 0.5% MAX.
PULSE DURATION = 80µs
VDD = 15V
DUTY CYCLE = 0.5% MAX.
0 0
0 1.5 3.0 4.5 6.0 7.5 2.5 3.0 3.5 4.0 4.5 5.0
VGS, GATE TO SOURCE VOLTAGE (V) VGS , GATE TO SOURCE VOLTAGE (V)
160 2.5
VDD = 25V, ID = 14A, RL = 3.57Ω td(OFF) PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX.
NORMALIZED DRAIN TO SOURCE
140
VGS = 10V, ID = 14A
2.0
120
SWITCHING TIME (ns)
ON RESISTANCE
100 1.5
tr
80
tf
1.0
60
40
td(ON) 0.5
20
0 0
0 10 20 30 40 50 -80 -40 0 40 80 120 160 200
RGS , GATE TO SOURCE RESISTANCE (Ω) TJ, JUNCTION TEMPERATURE (oC)
FIGURE 10. SWITCHING TIME vs GATE RESISTANCE FIGURE 11. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
2.0 2.0
VGS = VDS, ID = 250µA ID = 250µA
1.5 1.5
NORMALIZED GATE
1.0 1.0
0.5 0.5
www.DataSheet4U.com
0 0
-80 -40 0 40 80 120 160 200 -80 -40 0 40 80 120 160 200
TJ, JUNCTION TEMPERATURE (oC) TJ , JUNCTION TEMPERATURE (oC)
FIGURE 12. NORMALIZED GATE THRESHOLD VOLTAGE vs FIGURE 13. NORMALIZED DRAIN TO SOURCE BREAKDOWN
JUNCTION TEMPERATURE VOLTAGE vs JUNCTION TEMPERATURE
800 50 5
VDS
BVDSS
L tP
VDS
tP
0V IAS
0
0.01Ω
tAV
FIGURE 16. UNCLAMPED ENERGY TEST CIRCUIT FIGURE 17. UNCLAMPED ENERGY WAVEFORMS
tON tOFF
td(ON) td(OFF)
VDS
tr tf
VDS
90% 90%
RL
VGS
+ 10% 10%
VDD 0
-
DUT 90%
RGS
www.DataSheet4U.com VGS 50% 50%
PULSE WIDTH
VGS 10%
0
FIGURE 18. SWITCHING TIME TEST CIRCUIT FIGURE 19. RESISTIVE SWITCHING WAVEFORMS
VDS
RL VDD Qg(TOT)
VDS
VGS = 10V
VGS Qg(5)
+
VDD
- VGS VGS = 5V
DUT VGS = 1V
IG(REF) 0
Qg(TH)
IG(REF)
0
FIGURE 20. GATE CHARGE TEST CIRCUIT FIGURE 21. GATE CHARGE WAVEFORMS
S1A 6 12 13 8 S1AMOD
S1B 13 12 13 8 S1BMOD
S2A 6 15 14 13 S2AMOD
S2B 13 15 14 13 S2BMOD
VBAT 8 19 DC 1
VTO 21 6 0.485
.MODEL DBDMOD D (IS = 2.23e-13 RS = 1.15e-2 TRS1 = 1.64e-3 TRS2 = 7.89e-6 CJO = 6.83e-10 TT = 3.68e-8)
.MODEL DBKMOD D (RS = 3.8e-1 TRS1 = 1.89e-3 TRS2 = 1.13e-5)
.MODEL DPLCAPMOD D (CJO = 25.7e-11 IS = 1e-30 N = 10)
.MODEL MOSMOD NMOS (VTO = 1.935 KP = 18.89 IS = 1e-30 N = 10 TOX = 1 L = 1u W = 1u)
.MODEL RBKMOD RES (TC1 = 7.18e-4 TC2 = 1.53e-6)
.MODEL RDSMOD RES (TC1 = 4.45e-3 TC2 = 2.9e-5)
.MODEL RSCLMOD RES (TC1 = 2.8e-3 TC2 = 6.0e-6)
.MODEL RVTOMOD RES (TC1 = -1.7e-3 TC2 = -2.0e-6)
.MODEL S1AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -3.55 VOFF= -1.55)
.MODEL S1BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -1.55 VOFF= -3.55)
.MODEL S2AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -2.55 VOFF= 2.45)
.MODEL S2BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = 2.45 VOFF= -2.55)
.ENDS
NOTE: For further discussion of the PSPICE model, consult A New PSPICE Sub-circuit for the Power MOSFET Featuring Global
Temperature Options; authored by William J. Hepp and C. Frank Wheatley.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or 2. A critical component is any component of a life
systems which, (a) are intended for surgical implant into support device or system whose failure to perform can
the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life
failure to perform when properly used in accordance support device or system, or to affect its safety or
with instructions for use provided in the labeling, can be effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Advance Information Formative or This datasheet contains the design specifications for
In Design product development. Specifications may change in
any manner without notice.
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Rev. I13