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The optical characterization of solar absorbers for thermal solar collectors is usually performed by
measurement of the spectral reflectance at near-normal angle of incidence and calculation of the solar
absorptance from the measured reflectance. The solar absorptance is, however, a function of the angle
of incidence of the light impinging on the absorber. The total reflectance of two types of commercial
solar-selective absorbers, nickel-pigmented anodized aluminum, and sputtered nickel兾nickel oxide coated
aluminum are measured at angles of incidence from 5° to 80° in the wavelength range 300 –2500 nm by
use of an integrating sphere. From these measurements the angular integrated solar absorptance is
determined. Experimental data are compared with theoretical calculations, and it is found that optical
thin-film interference effects can explain the significant difference in solar absorptance at higher angles
for the two types of absorbers. © 1999 Optical Society of America
OCIS codes: 160.1190, 260.3160, 310.1620, 310.6860, 310.6870, 350.6050.
兰
2 we have shown some selected angles of incidence.
兵1 ⫺ 0.5关Rp共, 兲 ⫹ Rs共, 兲兴其I共兲d Because of the coating thickness, optical thin-film
1 interference within the measured wavelength range
␣ ⫽ , (1)
兰
2 is inevitable.20 The interference maxima and min-
I共兲d ima become very pronounced at high angles of inci-
1 dence. A small shift of the maxima and the minima